Carrier modulation in semiconductors

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G01N2021/1719

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

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G01N2021/1719Carrier modulation in semiconductors

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Patents Grantslast 30 patents

Information Patent Grant
Method for testing lifetime of surface state carrier of semiconductor
- Patent number 11,719,739
- Issue date Aug 8, 2023
- Tongji University
- Qian Cheng
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Photoelectric conversion element evaluation apparatus
- Patent number 10,298,174
- Issue date May 21, 2019
- Yokogawa Electric Corporation
- Akishige Ito
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Method and device for characterising a fluid medium using a semi-co...
- Patent number 10,126,261
- Issue date Nov 13, 2018
- Centre National de la Recherche Scientifique
- Sergeii Lytvynenko
- G01 - MEASURING TESTING
Information Patent Grant
Dual-phase interferometry for charge modulation mapping in ICS
- Patent number 9,983,260
- Issue date May 29, 2018
- The United States of America as represented by the Secretary of the Air Force
- Abdulkadir Yurt
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for characterising a fluid medium using a photoel...
- Patent number 9,726,598
- Issue date Aug 8, 2017
- Centre National de la Recherche Scientifique
- Sergeii Lytvynenko
- G01 - MEASURING TESTING
Information Patent Grant
Pump probe measuring device
- Patent number 8,982,451
- Issue date Mar 17, 2015
- Japan Science and Technology Agency
- Hidemi Shigekawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for determining the doping profile of a partially activated...
- Patent number 8,817,262
- Issue date Aug 26, 2014
- IMEC
- Janusz Bogdanowicz
- G01 - MEASURING TESTING
Information Patent Grant
System and method for nondestructively measuring concentration and...
- Patent number 8,804,106
- Issue date Aug 12, 2014
- KLA-Tencor Corporation
- NanChang Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Measuring method, arrangement and software product
- Patent number 8,624,582
- Issue date Jan 7, 2014
- Teknillinen Korkeakoulu
- Hele Savin
- G01 - MEASURING TESTING
Information Patent Grant
Methods for depth profiling in semiconductors using modulated optic...
- Patent number 7,982,867
- Issue date Jul 19, 2011
- KLA-Tencor Corporation
- Alex Salnik
- G01 - MEASURING TESTING
Information Patent Grant
High resolution wafer inspection system
- Patent number 7,973,919
- Issue date Jul 5, 2011
- Applied Materials Israel, Ltd.
- Dan Grossman
- G01 - MEASURING TESTING
Information Patent Grant
Inline stress evaluation in microstructure devices
- Patent number 7,787,108
- Issue date Aug 31, 2010
- GLOBALFOUNDRIES Inc.
- Frank Wirbeleit
- G01 - MEASURING TESTING
Information Patent Grant
High resolution wafer inspection system
- Patent number 7,714,999
- Issue date May 11, 2010
- Applied Materials Israel, Ltd.
- Dan Grossman
- G01 - MEASURING TESTING
Information Patent Grant
Methods for depth profiling in semiconductors using modulated optic...
- Patent number 7,705,977
- Issue date Apr 27, 2010
- KLA-Tencor Corporation
- Alex Salnik
- G01 - MEASURING TESTING
Information Patent Grant
Combined modulated optical reflectance and electrical system for ul...
- Patent number 7,499,168
- Issue date Mar 3, 2009
- KLA-Tencor Corp.
- Alex Salnik
- G01 - MEASURING TESTING
Information Patent Grant
Using a polaron interaction zone as an interface to integrate a pla...
- Patent number 7,495,230
- Issue date Feb 24, 2009
- California Institute of Technology
- David T. Wei
- G01 - MEASURING TESTING
Information Patent Grant
Modulated scatterometry
- Patent number 7,400,402
- Issue date Jul 15, 2008
- KLA-Tencor Corp.
- Walter Lee Smith
- G01 - MEASURING TESTING
Information Patent Grant
Utilizing an integrated plasmon detector to measure a metal deposit...
- Patent number 7,297,966
- Issue date Nov 20, 2007
- California Institute of Technology
- David T. Wei
- G01 - MEASURING TESTING
Information Patent Grant
Modulated scatterometry
- Patent number 7,239,390
- Issue date Jul 3, 2007
- Therma-Wave, Inc.
- Walter Lee Smith
- G01 - MEASURING TESTING
Information Patent Grant
System and method for measuring properties of a semiconductor subst...
- Patent number 7,133,128
- Issue date Nov 7, 2006
- Interuniversitair Microelektronica Centrum (IMEC) VZW
- Trudo Clarysse
- G01 - MEASURING TESTING
Information Patent Grant
Modulated scatterometry
- Patent number 6,888,632
- Issue date May 3, 2005
- Therma-Wave, Inc.
- Walter Lee Smith
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining a material's characteristics b...
- Patent number 5,270,797
- Issue date Dec 14, 1993
- Brooklyn College Foundation
- Fred H. Pollak
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining a material's characteristics b...
- Patent number 5,260,772
- Issue date Nov 9, 1993
- Fred H. Pollak
- G01 - MEASURING TESTING
Information Patent Grant
Modulated high sensitivity infrared polarimeter
- Patent number 5,210,417
- Issue date May 11, 1993
- The United States of America as represented by the Secretary of the Army
- John A. Grisham
- G01 - MEASURING TESTING
Information Patent Grant
Method for in-situ determination of the fermi level in GaAs and sim...
- Patent number 5,159,410
- Issue date Oct 27, 1992
- Fred H. Pollak
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for optically determining defects in a semicon...
- Patent number 4,652,757
- Issue date Mar 24, 1987
- AT&T Technologies, Inc.
- Gary E. Carver
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR TESTING LIFETIME OF SURFACE STATE CARRIER OF SEMICONDUCTOR
- Publication number 20220043049
- Publication date Feb 10, 2022
- Tongji University
- Qian CHENG
- G01 - MEASURING TESTING
Information Patent Application
PUMP PROBE MEASURING DEVICE
- Publication number 20140240710
- Publication date Aug 28, 2014
- Japan Science and Technology Agency
- Hidemi Shigekawa
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD FOR DETERMINING THE DOPING PROFILE OF A PARTIALLY ACTIVATED...
- Publication number 20130335744
- Publication date Dec 19, 2013
- IMEC
- Janusz Bogdanowicz
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING A LUMINESCENT DECAY
- Publication number 20130140431
- Publication date Jun 6, 2013
- YSystems Ltd.
- Lacroix Yves
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR NONDESTRUCTIVELY MEASURING CONCENTRATION AND...
- Publication number 20130003050
- Publication date Jan 3, 2013
- KLA-Tencor Corporation
- NanChang Zhu
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR DEPTH PROFILING IN SEMICONDUCTORS USING MODULATED OPTIC...
- Publication number 20100315625
- Publication date Dec 16, 2010
- KLA-Tencor Corporation
- Alex SALNIK
- G01 - MEASURING TESTING
Information Patent Application
HIGH RESOLUTION WAFER INSPECTION SYSTEM
- Publication number 20100188658
- Publication date Jul 29, 2010
- Dan Grossman
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING THE DOPING PROFILE OF A PARTIALLY ACTIVATED...
- Publication number 20100002236
- Publication date Jan 7, 2010
- Interuniversitair Microelektronica Centrum vzw (IMEC)
- Janusz Bogdanowicz
- G01 - MEASURING TESTING
Information Patent Application
Measuring Method, Arrangement and Software Product
- Publication number 20090160431
- Publication date Jun 25, 2009
- TEKNILLINEN KORKEAKOULU
- Hele Savin
- G01 - MEASURING TESTING
Information Patent Application
HIGH RESOLUTION WAFER INSPECTION SYSTEM
- Publication number 20080231845
- Publication date Sep 25, 2008
- Dan Grossman
- G01 - MEASURING TESTING
Information Patent Application
INLINE STRESS EVALUATION IN MICROSTRUCTURE DEVICES
- Publication number 20080158541
- Publication date Jul 3, 2008
- Frank Wirbeleit
- G01 - MEASURING TESTING
Information Patent Application
Methods for depth profiling in semiconductors using modulated optic...
- Publication number 20080151247
- Publication date Jun 26, 2008
- Alex Salnik
- G01 - MEASURING TESTING
Information Patent Application
Modulated scatterometry
- Publication number 20070188762
- Publication date Aug 16, 2007
- Walter Lee Smith
- G01 - MEASURING TESTING
Information Patent Application
Combined modulated optical reflectance and electrical system for ul...
- Publication number 20070188761
- Publication date Aug 16, 2007
- Alex Salnik
- G01 - MEASURING TESTING
Information Patent Application
Using a polaron interaction zone as an interface to integrate a pla...
- Publication number 20060170926
- Publication date Aug 3, 2006
- David T. Wei
- G01 - MEASURING TESTING
Information Patent Application
Utilizing an integrated plasmon detector to measure a metal deposit...
- Publication number 20060050280
- Publication date Mar 9, 2006
- David T. Wei
- G01 - MEASURING TESTING
Information Patent Application
Modulated scatterometry
- Publication number 20050168759
- Publication date Aug 4, 2005
- Walter Lee Smith
- G01 - MEASURING TESTING
Information Patent Application
Modulated scatterometry
- Publication number 20040169859
- Publication date Sep 2, 2004
- Walter Lee Smith
- G01 - MEASURING TESTING
Information Patent Application
System and method for measuring properties of a semiconductor subst...
- Publication number 20040064263
- Publication date Apr 1, 2004
- Trudo Clarysse
- G01 - MEASURING TESTING

Carrier modulation in semiconductors

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for testing lifetime of surface state carrier of semiconductor

Photoelectric conversion element evaluation apparatus

Method and device for characterising a fluid medium using a semi-co...

Dual-phase interferometry for charge modulation mapping in ICS

Method and device for characterising a fluid medium using a photoel...

Pump probe measuring device

Method for determining the doping profile of a partially activated...

System and method for nondestructively measuring concentration and...

Measuring method, arrangement and software product

Methods for depth profiling in semiconductors using modulated optic...

High resolution wafer inspection system

Inline stress evaluation in microstructure devices

High resolution wafer inspection system

Methods for depth profiling in semiconductors using modulated optic...

Combined modulated optical reflectance and electrical system for ul...

Using a polaron interaction zone as an interface to integrate a pla...

Modulated scatterometry

Utilizing an integrated plasmon detector to measure a metal deposit...

Modulated scatterometry

System and method for measuring properties of a semiconductor subst...

Modulated scatterometry

Method and apparatus for determining a material's characteristics b...

Method and apparatus for determining a material's characteristics b...

Modulated high sensitivity infrared polarimeter

Method for in-situ determination of the fermi level in GaAs and sim...

Method and apparatus for optically determining defects in a semicon...

Patents Applicationslast 30 patents

METHOD FOR TESTING LIFETIME OF SURFACE STATE CARRIER OF SEMICONDUCTOR

PUMP PROBE MEASURING DEVICE

METHOD FOR DETERMINING THE DOPING PROFILE OF A PARTIALLY ACTIVATED...

APPARATUS AND METHOD FOR MEASURING A LUMINESCENT DECAY

SYSTEM AND METHOD FOR NONDESTRUCTIVELY MEASURING CONCENTRATION AND...

METHODS FOR DEPTH PROFILING IN SEMICONDUCTORS USING MODULATED OPTIC...

HIGH RESOLUTION WAFER INSPECTION SYSTEM

METHOD FOR DETERMINING THE DOPING PROFILE OF A PARTIALLY ACTIVATED...

Measuring Method, Arrangement and Software Product

HIGH RESOLUTION WAFER INSPECTION SYSTEM

INLINE STRESS EVALUATION IN MICROSTRUCTURE DEVICES

Methods for depth profiling in semiconductors using modulated optic...

Modulated scatterometry

Combined modulated optical reflectance and electrical system for ul...

Using a polaron interaction zone as an interface to integrate a pla...

Utilizing an integrated plasmon detector to measure a metal deposit...

Modulated scatterometry

Modulated scatterometry

System and method for measuring properties of a semiconductor subst...