Characteristic

Industry

CPC
G11C2029/5002

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Parent Industries

GPHYSICS G11Information storage G11CSTATIC STORES

Current Industry

G11C2029/5002Characteristic

Industries

Patents Grantslast 30 patents

Information Patent Grant
Memory test circuit, memory array, and testing method of memory array
- Patent number 12,170,123
- Issue date Dec 17, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jui-Jen Wu
- G11 - INFORMATION STORAGE
Information Patent Grant
Mediating directed refresh management induced row hammer and row ac...
- Patent number 12,086,270
- Issue date Sep 10, 2024
- Micron Technology, Inc.
- Yang Lu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for optimizing semiconductor device placement on a substrat...
- Patent number 11,929,139
- Issue date Mar 12, 2024
- Micron Technology, Inc.
- James S. Rehmeyer
- G11 - INFORMATION STORAGE
Information Patent Grant
Systems and methods for correcting data errors in memory
- Patent number 11,755,410
- Issue date Sep 12, 2023
- Taiwan Semiconductor Manufacturing Company Limited
- Yu-Der Chih
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sensor for performance variation of memory read and write character...
- Patent number 11,742,051
- Issue date Aug 29, 2023
- ARM Limited
- Amit Chhabra
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device
- Patent number 11,682,463
- Issue date Jun 20, 2023
- Samsung Electronics Co., Ltd.
- Han Jun Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus, system, and method for trimming analog temperature sensors
- Patent number 11,668,612
- Issue date Jun 6, 2023
- SanDisk Technologies LLC
- Venkata Nittala
- G11 - INFORMATION STORAGE
Information Patent Grant
Systems and methods for correcting data errors in memory
- Patent number 11,429,482
- Issue date Aug 30, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Yu-Der Chih
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Array power supply-based screening of static random access memory c...
- Patent number 11,355,182
- Issue date Jun 7, 2022
- Texas Instruments Incorporated
- Xiaowei Deng
- G11 - INFORMATION STORAGE
Information Patent Grant
Inter-hamming difference analyzer for memory array and measuring an...
- Patent number 11,210,165
- Issue date Dec 28, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- Shih-Lien Linus Lu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of improving read current stability in analog non-volatile m...
- Patent number 11,205,490
- Issue date Dec 21, 2021
- Silicon Storage Technology, Inc.
- Viktor Markov
- G11 - INFORMATION STORAGE
Information Patent Grant
Device and method for data-writing
- Patent number 11,189,325
- Issue date Nov 30, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Po-Hao Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic field generator
- Patent number 11,139,099
- Issue date Oct 5, 2021
- Centre National de la Recherche Scientifique
- Isabelle Joumard
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device for changing pass voltage
- Patent number 11,127,472
- Issue date Sep 21, 2021
- Samsung Electronics Co., Ltd.
- Han Jun Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sensor for performance variation of memory read and write character...
- Patent number 11,069,424
- Issue date Jul 20, 2021
- ARM Limited
- Amit Chhabra
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods for sensing a phase change test cell and de...
- Patent number 11,056,186
- Issue date Jul 6, 2021
- Micron Technology, Inc.
- Jason Brand
- G11 - INFORMATION STORAGE
Information Patent Grant
Structure and method for testing three-dimensional memory device
- Patent number 10,998,079
- Issue date May 4, 2021
- Yangtze Memory Technologies Co., Ltd.
- Jong Jun Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Systems and methods for correcting data errors in memory
- Patent number 10,936,413
- Issue date Mar 2, 2021
- Taiwan Semiconductor Manufacturing Company Limited
- Yu-Der Chih
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for data-writing
- Patent number 10,937,467
- Issue date Mar 2, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Po-Hao Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory array and measuring and testing methods for inter-hamming di...
- Patent number 10,838,809
- Issue date Nov 17, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Shih-Lien Linus Lu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for SRAM yield estimation
- Patent number 10,811,117
- Issue date Oct 20, 2020
- Korea University Research and Business Foundation
- Jongsun Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Read circuitry for electrostatic discharge switching memristive ele...
- Patent number 10,811,065
- Issue date Oct 20, 2020
- Hewlett Packard Enterprise Development LP
- Brent Buchanan
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Tamper-proof storage using signatures based on threshold voltage di...
- Patent number 10,740,476
- Issue date Aug 11, 2020
- Apple Inc.
- Assaf Shappir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatuses and methods for sensing a phase-change test cell and de...
- Patent number 10,726,912
- Issue date Jul 28, 2020
- Micron Technology, Inc.
- Jason Brand
- G11 - INFORMATION STORAGE
Information Patent Grant
High speed and high precision characterization of VTsat and VTlin o...
- Patent number 10,718,806
- Issue date Jul 21, 2020
- GLOBALFOUNDRIES Inc.
- Uwe Eckhardt
- G01 - MEASURING TESTING
Information Patent Grant
Method, system and device for testing correlated electron switch (C...
- Patent number 10,714,175
- Issue date Jul 14, 2020
- ARM, Ltd.
- Bal S. Sandhu
- G11 - INFORMATION STORAGE
Information Patent Grant
Erase page check
- Patent number 10,685,731
- Issue date Jun 16, 2020
- Micron Technology, Inc.
- Ting Luo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Structure and method for testing three-dimensional memory device
- Patent number 10,679,721
- Issue date Jun 9, 2020
- Yangtze Memory Technologies Co., Ltd.
- Jong Jun Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for testing MRAM device and test apparatus thereof
- Patent number 10,665,321
- Issue date May 26, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chia-Yu Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Raid data loss prevention
- Patent number 10,635,537
- Issue date Apr 28, 2020
- International Business Machines Corporation
- Matthew G. Borlick
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
- Publication number 20240233854
- Publication date Jul 11, 2024
- SOCIONEXT INC.
- Hideo AKIYOSHI
- G11 - INFORMATION STORAGE
Information Patent Application
METHODS FOR OPTIMIZING SEMICONDUCTOR DEVICE PLACEMENT ON A SUBSTRAT...
- Publication number 20240177743
- Publication date May 30, 2024
- Micron Technology, Inc.
- James S. Rehmeyer
- G11 - INFORMATION STORAGE
Information Patent Application
CONTROL METHOD, SEMICONDUCTOR MEMORY, AND ELECTRONIC DEVICE
- Publication number 20230307083
- Publication date Sep 28, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- YOONJOO EOM
- G11 - INFORMATION STORAGE
Information Patent Application
MEDIATING DIRECTED REFRESH MANAGEMENT INDUCED ROW HAMMER AND ROW AC...
- Publication number 20230268022
- Publication date Aug 24, 2023
- Micron Technology, Inc.
- Yang LU
- G11 - INFORMATION STORAGE
Information Patent Application
METHODS FOR OPTIMIZING SEMICONDUCTOR DEVICE PLACEMENT ON A SUBSTRAT...
- Publication number 20230068666
- Publication date Mar 2, 2023
- Micron Technology, Inc.
- James S. Rehmeyer
- G11 - INFORMATION STORAGE
Information Patent Application
Sensor for Performance Variation of Memory Read and Write Character...
- Publication number 20210343359
- Publication date Nov 4, 2021
- ARM Limited
- Amit Chhabra
- G11 - INFORMATION STORAGE
Information Patent Application
DEVICE AND METHOD FOR DATA-WRITING
- Publication number 20210174841
- Publication date Jun 10, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Po-Hao LEE
- G11 - INFORMATION STORAGE
Information Patent Application
Systems and Methods for Correcting Data Errors in Memory
- Publication number 20210173739
- Publication date Jun 10, 2021
- Taiwan Semiconductor Manufacturing Company Limited
- YU-DER CHIH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTER-HAMMING DIFFERENCE ANALYZER FOR MEMORY ARRAY AND MEASURING AN...
- Publication number 20210042187
- Publication date Feb 11, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Lien Linus LU
- G01 - MEASURING TESTING
Information Patent Application
Sensor for Performance Variation of Memory Read and Write Character...
- Publication number 20200143901
- Publication date May 7, 2020
- ARM Limited
- Amit Chhabra
- G11 - INFORMATION STORAGE
Information Patent Application
DEVICE AND METHOD FOR DATA-WRITING
- Publication number 20200051598
- Publication date Feb 13, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Po-Hao LEE
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY ARRAY AND MEASURING AND TESTING METHODS FOR INTER-HAMMING DI...
- Publication number 20190294498
- Publication date Sep 26, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Lien Linus LU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUSES AND METHODS FOR SENSING A PHASE-CHANGE TEST CELL AND DE...
- Publication number 20190122728
- Publication date Apr 25, 2019
- Micron Technology, Inc.
- Jason Brand
- G11 - INFORMATION STORAGE
Information Patent Application
STRUCTURE AND METHOD FOR TESTING THREE-DIMENSIONAL MEMORY DEVICE
- Publication number 20190057756
- Publication date Feb 21, 2019
- Yangtze Memory Technologies Co., Ltd.
- Jong Jun Kim
- G11 - INFORMATION STORAGE
Information Patent Application
DEVICE AND METHOD FOR DATA-WRITING
- Publication number 20190019541
- Publication date Jan 17, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Po-Hao LEE
- G11 - INFORMATION STORAGE
Information Patent Application
TESTING AND SETTING PERFORMANCE PARAMETERS IN A SEMICONDUCTOR DEVIC...
- Publication number 20180306854
- Publication date Oct 25, 2018
- Darryl G. Walker
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND SYSTEM FOR DETERMINING TEMPERATURE USING A MAGNETIC JUNC...
- Publication number 20180294024
- Publication date Oct 11, 2018
- Samsung Electronics Co., Ltd.
- Sebastian Schafer
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR SRAM YIELD ESTIMATION
- Publication number 20180247698
- Publication date Aug 30, 2018
- Korea University Research and Business Foundation
- Jongsun Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPUTING DEVICE EXECUTING PROGRAM PERFORMING METHOD OF ANALYZING P...
- Publication number 20180224497
- Publication date Aug 9, 2018
- Samsung Electronics Co., Ltd.
- YOUNG HOE CHEON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE AND MEMORY SYSTEM PERFORMING REQUEST-BASED REFRESH, A...
- Publication number 20180190340
- Publication date Jul 5, 2018
- Samsung Electronics Co., Ltd.
- Hyun-Joong KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR PHYSICALLY UNCLONABLE FUNCTION (PUF) FOR A...
- Publication number 20180173900
- Publication date Jun 21, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Joyce Kwong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUSES AND METHODS FOR SENSING A PHASE-CHANGE TEST CELL AND DE...
- Publication number 20180122464
- Publication date May 3, 2018
- Micron Technology, Inc.
- Jason Brand
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS FOR SENSING A PHASE-CHANGE TEST CELL AND DE...
- Publication number 20180122465
- Publication date May 3, 2018
- Micron Technology, Inc.
- Jason Brand
- G11 - INFORMATION STORAGE
Information Patent Application
Array Power Supply-Based Screening of Static Random Access Memory C...
- Publication number 20180068713
- Publication date Mar 8, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Xiaowei Deng
- G11 - INFORMATION STORAGE
Information Patent Application
RAID DATA LOSS PREVENTION
- Publication number 20180067809
- Publication date Mar 8, 2018
- International Business Machines Corporation
- Matthew G. Borlick
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SHAPING CODES FOR MEMORY
- Publication number 20150178158
- Publication date Jun 25, 2015
- Micron Technology, Inc.
- Chandra C. Varanasi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RECOVERY OF INTERFACIAL DEFECTS IN MEMORY CELLS
- Publication number 20140347936
- Publication date Nov 27, 2014
- SEAGATE TECHNOLOGY LLC
- Mai A. Ghaly
- G11 - INFORMATION STORAGE
Information Patent Application
Digital Test System
- Publication number 20140330533
- Publication date Nov 6, 2014
- Matthew Gadlage
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR WRITING PILOT DATA INTERSPERSED WITH USER DAT...
- Publication number 20140325179
- Publication date Oct 30, 2014
- Marvell World Trade Ltd.
- Xueshi Yang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ESTIMATION METHOD, ESTIMATION DEVICE, AND INSPECTION DEVICE FOR VAR...
- Publication number 20140278160
- Publication date Sep 18, 2014
- PANASONIC CORPORATION
- Zhiqiang WEI
- G01 - MEASURING TESTING

Characteristic

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Memory test circuit, memory array, and testing method of memory array

Mediating directed refresh management induced row hammer and row ac...

Methods for optimizing semiconductor device placement on a substrat...

Systems and methods for correcting data errors in memory

Sensor for performance variation of memory read and write character...

Memory device

Apparatus, system, and method for trimming analog temperature sensors

Systems and methods for correcting data errors in memory

Array power supply-based screening of static random access memory c...

Inter-hamming difference analyzer for memory array and measuring an...

Method of improving read current stability in analog non-volatile m...

Device and method for data-writing

Magnetic field generator

Memory device for changing pass voltage

Sensor for performance variation of memory read and write character...

Apparatuses and methods for sensing a phase change test cell and de...

Structure and method for testing three-dimensional memory device

Systems and methods for correcting data errors in memory

Device and method for data-writing

Memory array and measuring and testing methods for inter-hamming di...

Method for SRAM yield estimation

Read circuitry for electrostatic discharge switching memristive ele...

Tamper-proof storage using signatures based on threshold voltage di...

Apparatuses and methods for sensing a phase-change test cell and de...

High speed and high precision characterization of VTsat and VTlin o...

Method, system and device for testing correlated electron switch (C...

Erase page check

Structure and method for testing three-dimensional memory device

Method for testing MRAM device and test apparatus thereof

Raid data loss prevention

Patents Applicationslast 30 patents

SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

METHODS FOR OPTIMIZING SEMICONDUCTOR DEVICE PLACEMENT ON A SUBSTRAT...

CONTROL METHOD, SEMICONDUCTOR MEMORY, AND ELECTRONIC DEVICE

MEDIATING DIRECTED REFRESH MANAGEMENT INDUCED ROW HAMMER AND ROW AC...

METHODS FOR OPTIMIZING SEMICONDUCTOR DEVICE PLACEMENT ON A SUBSTRAT...

Sensor for Performance Variation of Memory Read and Write Character...

DEVICE AND METHOD FOR DATA-WRITING

Systems and Methods for Correcting Data Errors in Memory

INTER-HAMMING DIFFERENCE ANALYZER FOR MEMORY ARRAY AND MEASURING AN...

Sensor for Performance Variation of Memory Read and Write Character...

DEVICE AND METHOD FOR DATA-WRITING

MEMORY ARRAY AND MEASURING AND TESTING METHODS FOR INTER-HAMMING DI...

APPARATUSES AND METHODS FOR SENSING A PHASE-CHANGE TEST CELL AND DE...

STRUCTURE AND METHOD FOR TESTING THREE-DIMENSIONAL MEMORY DEVICE

DEVICE AND METHOD FOR DATA-WRITING

TESTING AND SETTING PERFORMANCE PARAMETERS IN A SEMICONDUCTOR DEVIC...

METHOD AND SYSTEM FOR DETERMINING TEMPERATURE USING A MAGNETIC JUNC...

METHOD FOR SRAM YIELD ESTIMATION

COMPUTING DEVICE EXECUTING PROGRAM PERFORMING METHOD OF ANALYZING P...

MEMORY DEVICE AND MEMORY SYSTEM PERFORMING REQUEST-BASED REFRESH, A...

APPARATUS AND METHOD FOR PHYSICALLY UNCLONABLE FUNCTION (PUF) FOR A...

APPARATUSES AND METHODS FOR SENSING A PHASE-CHANGE TEST CELL AND DE...

APPARATUSES AND METHODS FOR SENSING A PHASE-CHANGE TEST CELL AND DE...

Array Power Supply-Based Screening of Static Random Access Memory C...

RAID DATA LOSS PREVENTION

SHAPING CODES FOR MEMORY

RECOVERY OF INTERFACIAL DEFECTS IN MEMORY CELLS

Digital Test System

SYSTEM AND METHOD FOR WRITING PILOT DATA INTERSPERSED WITH USER DAT...

ESTIMATION METHOD, ESTIMATION DEVICE, AND INSPECTION DEVICE FOR VAR...