Charged particles

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CPC
H01J2231/50047

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2231/00Cathode ray tubes or electron beam tubes

Current Industry

H01J2231/50047Charged particles

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Patents Grantslast 30 patents

Information Patent Grant
Electron multiplier detector formed from a highly doped nanodiamond...
- Patent number 9,035,540
- Issue date May 19, 2015
- Photonis France
- Gert Nuetzel
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for representing the spatial distribution of radioactive ele...
- Patent number 5,432,355
- Issue date Jul 11, 1995
- Georges Charpak
- G01 - MEASURING TESTING
Information Patent Grant
Alpha-ray image detecting apparatus
- Patent number 4,900,930
- Issue date Feb 13, 1990
- Hamamatsu Photonics Kabushiki Kaisha
- Yoshihiro Takiguchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Processor System, Correction Method, and Correction Program
- Publication number 20240222064
- Publication date Jul 4, 2024
- HITACHI HIGH-TECH CORPORATION
- Mayuka OSAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MULTIPLIER DETECTOR FORMED FROM A HIGHLY DOPED NANODIAMOND...
- Publication number 20130146778
- Publication date Jun 13, 2013
- PHOTONIS FRANCE
- Gert Nuetzel
- B82 - NANO-TECHNOLOGY