Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for

Industry

CPC
H01J43/30

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J43/00Secondary-emission tubes Electron-multiplier tubes

Current Industry

H01J43/30Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle detector
- Patent number 12,224,170
- Issue date Feb 11, 2025
- ADAPTAS SOLUTIONS PTY LTD
- Wayne Sheils
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion detector
- Patent number 12,112,932
- Issue date Oct 8, 2024
- Hamamatsu Photonics K.K.
- Takeshi Endo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron multiplier and photoelectron multiplier including same
- Patent number 11,955,325
- Issue date Apr 9, 2024
- Hamamatsu Photonics K.K.
- Sho Hikosaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for photomultiplier tube image correction
- Patent number 11,361,951
- Issue date Jun 14, 2022
- KLA Corporation
- Derek Mackay
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Discharge reduction in sealed components
- Patent number 11,328,914
- Issue date May 10, 2022
- Baker Hughes Oilfield Operations LLC
- Scot Alan Shermer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion detectors and methods of using them
- Patent number 10,930,480
- Issue date Feb 23, 2021
- PerkinElmer Health Sciences, Inc.
- Urs Steiner
- G01 - MEASURING TESTING
Information Patent Grant
CEM assembly and electron multiplier device
- Patent number 10,685,822
- Issue date Jun 16, 2020
- Hamamatsu Photonics K.K.
- Takeshi Endo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron multiplier for mass spectrometer
- Patent number 10,615,019
- Issue date Apr 7, 2020
- Agilent Technologies, Inc.
- Kazushi Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reducing calibration of components in an imaging plate scanner
- Patent number 10,431,441
- Issue date Oct 1, 2019
- Palodex Group Oy
- Jorma Honkala
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion detectors and methods of using them
- Patent number 10,395,905
- Issue date Aug 27, 2019
- PerkinElmer Health Sciences, Inc.
- Urs Steiner
- G01 - MEASURING TESTING
Information Patent Grant
Adjusting gain of detector
- Patent number 10,006,808
- Issue date Jun 26, 2018
- Shenyang Neusoft Medical Systems Co., Ltd.
- Jian Zhao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Confocal scanning microscope, operating method for same and method...
- Patent number 9,927,603
- Issue date Mar 27, 2018
- Carl Zeiss Microscopy GmbH
- Mirko Liedtke
- G02 - OPTICS
Information Patent Grant
Ion detectors and methods of using them
- Patent number 9,625,417
- Issue date Apr 18, 2017
- PerkinElmer Health Sciences, Inc.
- Urs Steiner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photodetection unit and method for manufacturing same
- Patent number 9,607,814
- Issue date Mar 28, 2017
- Hamamatsu Photonics K.K.
- Takanori Kurouzu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Discrete dynode detector with dynamic gain control
- Patent number 9,293,307
- Issue date Mar 22, 2016
- Thermo Finnigan LLC.
- Viatcheslav Kovtoun
- G01 - MEASURING TESTING
Information Patent Grant
Ion detectors and methods of using them
- Patent number 9,269,552
- Issue date Feb 23, 2016
- PerkinElmer Health Sciences, Inc.
- Urs Steiner
- G01 - MEASURING TESTING
Information Patent Grant
Photomultiplier and detection systems
- Patent number 8,993,970
- Issue date Mar 31, 2015
- Rapiscan Systems, Inc.
- Edward James Morton
- G01 - MEASURING TESTING
Information Patent Grant
Composite gamma-neutron detection system
- Patent number 8,963,094
- Issue date Feb 24, 2015
- Rapiscan Systems, Inc.
- Tsahi Gozani
- G01 - MEASURING TESTING
Information Patent Grant
Photomultiplier and detection systems
- Patent number 8,735,833
- Issue date May 27, 2014
- Rapiscan Systems, Inc.
- Edward James Morton
- G01 - MEASURING TESTING
Information Patent Grant
Stabilized electron multiplier anode
- Patent number 8,637,811
- Issue date Jan 28, 2014
- Bruker Daltonics, Inc.
- Urs Steiner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for controlling photomultiplier gain drift and associated me...
- Patent number 8,624,192
- Issue date Jan 7, 2014
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Stéphane Normand
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Drive and measurement circuit for a photomultiplier
- Patent number 8,618,457
- Issue date Dec 31, 2013
- ET Enterprises Limited
- Anthony George Wright
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 8,519,327
- Issue date Aug 27, 2013
- Shimadzu Corporation
- Hideaki Izumi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite gamma-neutron detection system
- Patent number 8,389,941
- Issue date Mar 5, 2013
- Rapiscan Systems, Inc.
- Joseph Bendahan
- G01 - MEASURING TESTING
Information Patent Grant
Photomultiplier and detection systems
- Patent number 8,389,942
- Issue date Mar 5, 2013
- Rapiscan Systems, Inc.
- Edward James Morton
- G01 - MEASURING TESTING
Information Patent Grant
Systems, circuits and methods for extending the detection range of...
- Patent number 7,777,875
- Issue date Aug 17, 2010
- KLA-Tencor Technologies Corp,
- Christian H. Wolters
- G01 - MEASURING TESTING
Information Patent Grant
Inspection systems and methods for extending the detection range of...
- Patent number 7,746,462
- Issue date Jun 29, 2010
- KLA-Tencor Technologies Corporation
- Zhongping Cai
- G01 - MEASURING TESTING
Information Patent Grant
Electron multiplier having electron filtering
- Patent number 7,723,680
- Issue date May 25, 2010
- Agilent Technologies, Inc.
- August Hidalgo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Protective circuitry for photomultiplier tubes
- Patent number 7,679,875
- Issue date Mar 16, 2010
- Leica Microsystems CMS GmbH
- Juergen Schneider
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photomultiplier tube module having high-voltage generating circuit...
- Patent number 7,649,163
- Issue date Jan 19, 2010
- Hamamatsu Photonics K.K.
- Takanori Nakaya
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
PHOTOELECTRIC CONVERSION DEVICE, ELECTROMAGNETIC WAVE DETECTION DEV...
- Publication number 20240355601
- Publication date Oct 24, 2024
- Hamamatsu Photonics K.K.
- Naoya KAWAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SINGLE ELECTRON AND PHOTON RADIO FREQUENCY TIMER
- Publication number 20240274422
- Publication date Aug 15, 2024
- Amur Margaryan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Multiplier Having Improved Voltage Stabilisation
- Publication number 20240258089
- Publication date Aug 1, 2024
- ADAPTAS SOLUTIONS PTY LTD
- Daen Ekers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Precise Tuning of MCP-Based Ion Detector Using Isotope Ratios with...
- Publication number 20240242948
- Publication date Jul 18, 2024
- DH Technologies Development Pte. Ltd.
- Douglas Arnold Simmons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MULTIPLIER AND PHOTOELECTRON MULTIPLIER INCLUDING SAME
- Publication number 20240105434
- Publication date Mar 28, 2024
- Hamamatsu Photonics K.K.
- Sho HIKOSAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSTRUMENTS INCLUDING AN ELECTRON MULTIPLIER
- Publication number 20230015584
- Publication date Jan 19, 2023
- ADAPTAS SOLUTIONS PTY LTD
- Russell Jurek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION DETECTOR
- Publication number 20230005726
- Publication date Jan 5, 2023
- HAMAMATSU PHOTONICS K. K.
- Takeshi ENDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISCHARGE REDUCTION IN SEALED COMPONENTS
- Publication number 20220148865
- Publication date May 12, 2022
- Baker Hughes Oilfield Operations LLC
- Scot Alan Shermer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR PHOTOMULTIPLIER TUBE IMAGE CORRECTION
- Publication number 20210104388
- Publication date Apr 8, 2021
- KLA Corporation
- Derek Mackay
- G01 - MEASURING TESTING
Information Patent Application
IMPROVED CHARGED PARTICLE DETECTOR
- Publication number 20200194246
- Publication date Jun 18, 2020
- ETP ION DETECT PTY LTD
- Wayne Sheils
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CEM ASSEMBLY AND ELECTRON MULTIPLIER DEVICE
- Publication number 20200135439
- Publication date Apr 30, 2020
- HAMAMATSU PHOTONICS K. K.
- Takeshi ENDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION DETECTORS AND METHODS OF USING THEM
- Publication number 20200105512
- Publication date Apr 2, 2020
- PerkinElmer Health Sciences, Inc.
- Urs Steiner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMMON FACTOR MASS MULTIPLICATION CIRCUITRY
- Publication number 20190303748
- Publication date Oct 3, 2019
- Intel Corporation
- Thiam Khean Hah
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REDUCING CALIBRATION OF COMPONENTS IN AN IMAGING PLATE SCANNER
- Publication number 20190237312
- Publication date Aug 1, 2019
- PaloDEx Group Oy
- Jorma Honkala
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION DETECTORS AND METHODS OF USING THEM
- Publication number 20170336353
- Publication date Nov 23, 2017
- PerkinElmer Health Sciences, Inc.
- Urs Steiner
- G01 - MEASURING TESTING
Information Patent Application
Photomultiplier and Detection Systems
- Publication number 20140348293
- Publication date Nov 27, 2014
- Rapiscan Systems, Inc.
- Edward James Morton
- G01 - MEASURING TESTING
Information Patent Application
Method And Apparatus To Enhance Output Current Linearity In Tandem...
- Publication number 20140265829
- Publication date Sep 18, 2014
- EXELIS, INC.
- Joseph K. Hosea
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Discrete Dynode Detector with Dynamic Gain Control
- Publication number 20140239177
- Publication date Aug 28, 2014
- Thermo Finnigan LLC
- Viatcheslav KOVTOUN
- G01 - MEASURING TESTING
Information Patent Application
ION DETECTORS AND METHODS OF USING THEM
- Publication number 20140151549
- Publication date Jun 5, 2014
- Urs Steiner
- G01 - MEASURING TESTING
Information Patent Application
CONFOCAL SCANNING MICROSCOPE, OPERATING METHOD FOR SAME AND METHOD...
- Publication number 20140138517
- Publication date May 22, 2014
- Mirko Liedtke
- G02 - OPTICS
Information Patent Application
Composite Gamma-Neutron Detection System
- Publication number 20140042330
- Publication date Feb 13, 2014
- Rapiscan Systems, Inc.
- Tsahi Gozani
- G01 - MEASURING TESTING
Information Patent Application
PHOTOMULTIPLIER AND DETECTION SYSTEMS
- Publication number 20130299703
- Publication date Nov 14, 2013
- Edward James Morton
- G01 - MEASURING TESTING
Information Patent Application
STABILIZED ELECTRON MULTIPLIER ANODE
- Publication number 20130015767
- Publication date Jan 17, 2013
- Bruker Daltonics, Inc.
- Urs Steiner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer
- Publication number 20120175514
- Publication date Jul 12, 2012
- SHIMADZU CORPORATION
- Hideaki Izumi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE FOR MEASURING AND PROCESSING A HIGH DYNAMIC INPUT SIGNAL, AN...
- Publication number 20110295528
- Publication date Dec 1, 2011
- ADIXEN VACUUM PRODUCTS
- Pascal Jourdan
- G01 - MEASURING TESTING
Information Patent Application
Discrete Dynode Detector with Dynamic Gain Control
- Publication number 20110240857
- Publication date Oct 6, 2011
- Viatcheslav V. KOVTOUN
- G01 - MEASURING TESTING
Information Patent Application
Composite Gamma-Neutron Detection System
- Publication number 20110204243
- Publication date Aug 25, 2011
- Joseph Bendahan
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR CONTROLLING PHOTOMULTIPLIER GAIN DRIFT AND ASSOCIATED ME...
- Publication number 20110186740
- Publication date Aug 4, 2011
- Commissariat a l'energie atomiwque et aux energies altenatives
- Stéphane Normand
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Photomultiplier and Detection Systems
- Publication number 20110182407
- Publication date Jul 28, 2011
- Edward James Morton
- G01 - MEASURING TESTING
Information Patent Application
OPERATING CIRCUIT AND CONTROL METHOD FOR A PHOTOMULTIPLIER
- Publication number 20110149388
- Publication date Jun 23, 2011
- CARL ZEISS MICROIMAGING GMBH
- Mirko LIEDTKE
- G02 - OPTICS

Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Charged particle detector

Ion detector

Electron multiplier and photoelectron multiplier including same

System and method for photomultiplier tube image correction

Discharge reduction in sealed components

Ion detectors and methods of using them

CEM assembly and electron multiplier device

Electron multiplier for mass spectrometer

Reducing calibration of components in an imaging plate scanner

Ion detectors and methods of using them

Adjusting gain of detector

Confocal scanning microscope, operating method for same and method...

Ion detectors and methods of using them

Photodetection unit and method for manufacturing same

Discrete dynode detector with dynamic gain control

Ion detectors and methods of using them

Photomultiplier and detection systems

Composite gamma-neutron detection system

Photomultiplier and detection systems

Stabilized electron multiplier anode

System for controlling photomultiplier gain drift and associated me...

Drive and measurement circuit for a photomultiplier

Mass spectrometer

Composite gamma-neutron detection system

Photomultiplier and detection systems

Systems, circuits and methods for extending the detection range of...

Inspection systems and methods for extending the detection range of...

Electron multiplier having electron filtering

Protective circuitry for photomultiplier tubes

Photomultiplier tube module having high-voltage generating circuit...

Patents Applicationslast 30 patents

PHOTOELECTRIC CONVERSION DEVICE, ELECTROMAGNETIC WAVE DETECTION DEV...

SINGLE ELECTRON AND PHOTON RADIO FREQUENCY TIMER

Electron Multiplier Having Improved Voltage Stabilisation

Precise Tuning of MCP-Based Ion Detector Using Isotope Ratios with...

ELECTRON MULTIPLIER AND PHOTOELECTRON MULTIPLIER INCLUDING SAME

INSTRUMENTS INCLUDING AN ELECTRON MULTIPLIER

ION DETECTOR

DISCHARGE REDUCTION IN SEALED COMPONENTS

SYSTEM AND METHOD FOR PHOTOMULTIPLIER TUBE IMAGE CORRECTION

IMPROVED CHARGED PARTICLE DETECTOR

CEM ASSEMBLY AND ELECTRON MULTIPLIER DEVICE

ION DETECTORS AND METHODS OF USING THEM

COMMON FACTOR MASS MULTIPLICATION CIRCUITRY

REDUCING CALIBRATION OF COMPONENTS IN AN IMAGING PLATE SCANNER

ION DETECTORS AND METHODS OF USING THEM

Photomultiplier and Detection Systems

Method And Apparatus To Enhance Output Current Linearity In Tandem...

Discrete Dynode Detector with Dynamic Gain Control

ION DETECTORS AND METHODS OF USING THEM

CONFOCAL SCANNING MICROSCOPE, OPERATING METHOD FOR SAME AND METHOD...

Composite Gamma-Neutron Detection System

PHOTOMULTIPLIER AND DETECTION SYSTEMS

STABILIZED ELECTRON MULTIPLIER ANODE

Mass Spectrometer

DEVICE FOR MEASURING AND PROCESSING A HIGH DYNAMIC INPUT SIGNAL, AN...

Discrete Dynode Detector with Dynamic Gain Control

Composite Gamma-Neutron Detection System

SYSTEM FOR CONTROLLING PHOTOMULTIPLIER GAIN DRIFT AND ASSOCIATED ME...

Photomultiplier and Detection Systems

OPERATING CIRCUIT AND CONTROL METHOD FOR A PHOTOMULTIPLIER