Circuits specially adapted for system specific signal conditioning

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CPC
G01N2021/8896

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/8896Circuits specially adapted for system specific signal conditioning

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Patents Grantslast 30 patents

Information Patent Grant
Self-leveling inspection systems and methods
- Patent number 11,674,906
- Issue date Jun 13, 2023
- SeeScan, Inc.
- Mark S. Olsson
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and electronic apparatus for displaying inspection result of...
- Patent number 11,428,644
- Issue date Aug 30, 2022
- Koh Young Technology Inc.
- Jong Myoung Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Container inspection system with individual light control
- Patent number 11,308,601
- Issue date Apr 19, 2022
- Emhart Glass S.A.
- Joe Dordoni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection device
- Patent number 11,143,600
- Issue date Oct 12, 2021
- HITACHI HIGH-TECH CORPORATION
- Toshifumi Honda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tracking system and method for use in surveying amusement park equi...
- Patent number 10,788,603
- Issue date Sep 29, 2020
- Universal City Studios LLC
- Robert J. Cortelyou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Polarized image acquisition apparatus, pattern inspection apparatus...
- Patent number 10,636,138
- Issue date Apr 28, 2020
- NuFlare Technology, Inc.
- Riki Ogawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection apparatus and detection method
- Patent number 10,620,131
- Issue date Apr 14, 2020
- Mitsubishi Electric Corporation
- Junji Kondo
- G01 - MEASURING TESTING
Information Patent Grant
Self-leveling inspection systems and methods
- Patent number 10,613,034
- Issue date Apr 7, 2020
- SeeScan, Inc.
- Mark S. Olsson
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Structure status determination device, status determination system,...
- Patent number 10,190,992
- Issue date Jan 29, 2019
- NEC Corporation
- Hiroshi Imai
- G01 - MEASURING TESTING
Information Patent Grant
Method of generating a compensation matrix during a substrate inspe...
- Patent number 10,151,705
- Issue date Dec 11, 2018
- Koh Young Technology Inc.
- Seungwon Jung
- G01 - MEASURING TESTING
Information Patent Grant
Tracking system and method for use in surveying amusement park equi...
- Patent number 10,061,058
- Issue date Aug 28, 2018
- Universal City Studios LLC
- Robert J. Cortelyou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Tracking system and method for use in surveying amusement park equi...
- Patent number 10,031,259
- Issue date Jul 24, 2018
- Universal City Studios LLC
- Robert J. Cortelyou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Front quartersphere scattered light analysis
- Patent number 10,018,572
- Issue date Jul 10, 2018
- KLA-Tencor Corporation
- Richard E. Bills
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical metrology using differential fitting
- Patent number 9,995,689
- Issue date Jun 12, 2018
- Nanometrics Incorporated
- Pedro Vagos
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
TDI sensor in a darkfield system
- Patent number 9,891,177
- Issue date Feb 13, 2018
- KLA-Tencor Corporation
- Jijen Vazhaeparambil
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Front quartersphere scattered light analysis
- Patent number 9,528,942
- Issue date Dec 27, 2016
- KLA-Tencor Corporation
- Richard E. Bills
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scattered light measurement system
- Patent number 9,518,930
- Issue date Dec 13, 2016
- KLA-Tencor Corporation
- Neil Judell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Front quartersphere scattered light analysis
- Patent number 9,488,591
- Issue date Nov 8, 2016
- Uster Technologies AG
- Richard E. Bills
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for image based inspection of an object
- Patent number 9,305,345
- Issue date Apr 5, 2016
- General Electric Company
- Ser Nam Lim
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Defect inspection method and device therefor
- Patent number 9,239,283
- Issue date Jan 19, 2016
- Hitachi High-Technologies Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
Front quartersphere scattered light analysis
- Patent number 9,110,033
- Issue date Aug 18, 2015
- KLA-Tencor Corporation
- Richard E. Bills
- G01 - MEASURING TESTING
Information Patent Grant
System with multiple scattered light collectors
- Patent number 9,103,800
- Issue date Aug 11, 2015
- KLA-Tencor Corporation
- Richard E. Bills
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring defect density of single crystal
- Patent number 8,831,910
- Issue date Sep 9, 2014
- Toyota Jidosha Kabushiki Kaisha
- Yoshitomo Shintani
- G01 - MEASURING TESTING
Information Patent Grant
Method for inspecting defects and defect inspecting apparatus
- Patent number 8,599,379
- Issue date Dec 3, 2013
- National Institute of Advanced Industrial Science and Technology
- Kazufumi Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 8,563,958
- Issue date Oct 22, 2013
- Hitachi High-Technologies Corporation
- Kazuo Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Back quartersphere scattered light analysis
- Patent number 8,553,215
- Issue date Oct 8, 2013
- KLA-Tencor Corporation
- Richard E. Bills
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting a workpiece using scattered light
- Patent number 8,537,350
- Issue date Sep 17, 2013
- KLA-Tencor Corporation
- Neil Judell
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspection of a workpiece surface using multi...
- Patent number 8,497,984
- Issue date Jul 30, 2013
- KLA-Tencor Corporation
- Richard Earl Bills
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for optical edge measurement
- Patent number 8,482,743
- Issue date Jul 9, 2013
- Cognitens Ltd.
- Avner Segev
- G01 - MEASURING TESTING
Information Patent Grant
Method of analyzing an image of hydrides in a metal alloy, notably...
- Patent number 8,374,455
- Issue date Feb 12, 2013
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Stéphane Allegre
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SUBSTRATE INSPECTION DEVICE AND SUBSTRATE INSPECTION METHOD USING T...
- Publication number 20240201100
- Publication date Jun 20, 2024
- SAMSUNG DISPLAY CO., LTD.
- SUNG HUNE YOO
- G01 - MEASURING TESTING
Information Patent Application
ULTRASOUND VIBRATING-TYPE DEFECT DETECTION APPARATUS AND WIRE DEFEC...
- Publication number 20230253266
- Publication date Aug 10, 2023
- Yamaha Robotics Holdings Co., Ltd.
- Michael KIRKBY
- B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Information Patent Application
CONTAMINANT IDENTIFICATION METROLOGY SYSTEM, LITHOGRAPHIC APPARATUS...
- Publication number 20230142459
- Publication date May 11, 2023
- ASML Holding N.V.
- Andrew JUDGE
- G01 - MEASURING TESTING
Information Patent Application
CRACK DETECTION DEVICE, CRACK DETECTION METHOD AND COMPUTER READABL...
- Publication number 20230051683
- Publication date Feb 16, 2023
- Mitsubishi Electric Corporation
- Mitsunobu YOSHIDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND ELECTRONIC APPARATUS FOR DISPLAYING INSPECTION RESULT OF...
- Publication number 20210404973
- Publication date Dec 30, 2021
- KOH YOUNG TECHNOLOGY INC.
- Jong Myoung LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR MONITORING A MOVING WEB
- Publication number 20190049391
- Publication date Feb 14, 2019
- Markus KLEINDORP
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRACKING SYSTEM AND METHOD FOR USE IN SURVEYING AMUSEMENT PARK EQUI...
- Publication number 20180341040
- Publication date Nov 29, 2018
- Universal City Studios LLC
- Robert J. Cortelyou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR COLOR SCANNING A MOVING ARTICLE
- Publication number 20180284033
- Publication date Oct 4, 2018
- CENTRE DE RECHERCHE INDUSTRIELLE DU Quebec
- Yvon Legros
- G01 - MEASURING TESTING
Information Patent Application
DETECTION APPARATUS AND DETECTION METHOD
- Publication number 20180156736
- Publication date Jun 7, 2018
- MITSUBISHI ELECTRIC CORPORATION
- Junji KONDO
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE STATUS DETERMINATION DEVICE, STATUS DETERMINATION SYSTEM,...
- Publication number 20180052117
- Publication date Feb 22, 2018
- NEC Corporation
- Hiroshi Imai
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL METROLOGY USING DIFFERENTIAL FITTING
- Publication number 20160341670
- Publication date Nov 24, 2016
- Nanometrics Incorporated
- Pedro Vagos
- G01 - MEASURING TESTING
Information Patent Application
CONTAINER INSPECTION SYSTEM WITH INDIVIDUAL LIGHT CONTROL
- Publication number 20160321796
- Publication date Nov 3, 2016
- Emhart Glass S.A.
- Joe Dordoni
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF GENERATING A COMPENSATION MATRIX DURING A SUBSTRATE INSPE...
- Publication number 20160223468
- Publication date Aug 4, 2016
- KOH YOUNG TECHNOLOGY INC.
- Seungwon JUNG
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR OPTICALLY SCANNING A SURFACE OF AN OBJECT...
- Publication number 20160153917
- Publication date Jun 2, 2016
- CENTRE DE RECHERCHE INDUSTRIELLE DU Quebec
- Jean-Pierre COUTURIER
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS FOR PARSING MATERIAL PROPERTIES FROM WITHIN SHG SIGNALS
- Publication number 20160131594
- Publication date May 12, 2016
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
TRACKING SYSTEM AND METHOD FOR USE IN SURVEYING AMUSEMENT PARK EQUI...
- Publication number 20150338548
- Publication date Nov 26, 2015
- Universal City Studios LLC
- Robert J. Cortelyou
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE INSPECTION METHOD, SUBSTRATE MANUFACTURING METHOD AND SUB...
- Publication number 20150029324
- Publication date Jan 29, 2015
- HOYA CORPORATION
- Masaru TANABE
- G02 - OPTICS
Information Patent Application
Method And Apparatus For High Speed Acquisition Of Moving Images Us...
- Publication number 20140158864
- Publication date Jun 12, 2014
- KLA-Tencor Corporation
- David L. Brown
- G01 - MEASURING TESTING
Information Patent Application
System With Polarized Scattered Light
- Publication number 20130342833
- Publication date Dec 26, 2013
- KLA-Tencor Corporation
- Neil Judell
- G01 - MEASURING TESTING
Information Patent Application
System With Multiple Scattered Light Collectors
- Publication number 20130335733
- Publication date Dec 19, 2013
- KLA-Tencor Corporation
- Richard E. Bills
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION METHOD AND DEVICE THEREFOR
- Publication number 20130293879
- Publication date Nov 7, 2013
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Application
Back Quartersphere Scattered Light Analysis
- Publication number 20130094023
- Publication date Apr 18, 2013
- KLA-Tencor Corporation
- Richard E. Bills
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20130033705
- Publication date Feb 7, 2013
- Hitachi High-Technologies Corporation
- Koichi TANIGUCHI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20120154797
- Publication date Jun 21, 2012
- Hitachi High-Technologies Corporation
- Kazuo Takahashi
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING DEFECT DENSITY OF SINGLE CRYSTAL
- Publication number 20120016630
- Publication date Jan 19, 2012
- Toyota Jidosha Kabushiki Kaisha
- Yoshitomo Shintani
- G02 - OPTICS
Information Patent Application
Inspecting a Workpiece Using Polarization of Scattered Light
- Publication number 20120013898
- Publication date Jan 19, 2012
- KLA-Tencor Corporation
- Neil Judell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF ANALYZING AN IMAGE OF HYDRIDES IN A METAL ALLOY, NOTABLY...
- Publication number 20110116680
- Publication date May 19, 2011
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Stéphane Allegre
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR INSPECTING DEFECTS AND DEFECT INSPECTING APPARATUS
- Publication number 20110069313
- Publication date Mar 24, 2011
- National Institute of Advanced Industrial Science Technology
- Kazufumi Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20110051131
- Publication date Mar 3, 2011
- Hitachi High-Technologies Corporation
- Koichi TANIGUCHI
- G01 - MEASURING TESTING
Information Patent Application
Back Quartersphere Scattered Light Analysis
- Publication number 20100265518
- Publication date Oct 21, 2010
- KLA-Tencor Corporation
- Richard Earl Bills
- G06 - COMPUTING CALCULATING COUNTING

Circuits specially adapted for system specific signal conditioning

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Self-leveling inspection systems and methods

Method and electronic apparatus for displaying inspection result of...

Container inspection system with individual light control

Defect inspection device

Tracking system and method for use in surveying amusement park equi...

Polarized image acquisition apparatus, pattern inspection apparatus...

Detection apparatus and detection method

Self-leveling inspection systems and methods

Structure status determination device, status determination system,...

Method of generating a compensation matrix during a substrate inspe...

Tracking system and method for use in surveying amusement park equi...

Tracking system and method for use in surveying amusement park equi...

Front quartersphere scattered light analysis

Optical metrology using differential fitting

TDI sensor in a darkfield system

Front quartersphere scattered light analysis

Scattered light measurement system

Front quartersphere scattered light analysis

System and method for image based inspection of an object

Defect inspection method and device therefor

Front quartersphere scattered light analysis

System with multiple scattered light collectors

Method of measuring defect density of single crystal

Method for inspecting defects and defect inspecting apparatus

Inspection apparatus and inspection method

Back quartersphere scattered light analysis

Inspecting a workpiece using scattered light

System and method for inspection of a workpiece surface using multi...

Method and system for optical edge measurement

Method of analyzing an image of hydrides in a metal alloy, notably...

Patents Applicationslast 30 patents

SUBSTRATE INSPECTION DEVICE AND SUBSTRATE INSPECTION METHOD USING T...

ULTRASOUND VIBRATING-TYPE DEFECT DETECTION APPARATUS AND WIRE DEFEC...

CONTAMINANT IDENTIFICATION METROLOGY SYSTEM, LITHOGRAPHIC APPARATUS...

CRACK DETECTION DEVICE, CRACK DETECTION METHOD AND COMPUTER READABL...

METHOD AND ELECTRONIC APPARATUS FOR DISPLAYING INSPECTION RESULT OF...

METHOD AND APPARATUS FOR MONITORING A MOVING WEB

TRACKING SYSTEM AND METHOD FOR USE IN SURVEYING AMUSEMENT PARK EQUI...

SYSTEM AND METHOD FOR COLOR SCANNING A MOVING ARTICLE

DETECTION APPARATUS AND DETECTION METHOD

STRUCTURE STATUS DETERMINATION DEVICE, STATUS DETERMINATION SYSTEM,...

OPTICAL METROLOGY USING DIFFERENTIAL FITTING

CONTAINER INSPECTION SYSTEM WITH INDIVIDUAL LIGHT CONTROL

METHOD OF GENERATING A COMPENSATION MATRIX DURING A SUBSTRATE INSPE...

APPARATUS AND METHOD FOR OPTICALLY SCANNING A SURFACE OF AN OBJECT...

SYSTEMS FOR PARSING MATERIAL PROPERTIES FROM WITHIN SHG SIGNALS

TRACKING SYSTEM AND METHOD FOR USE IN SURVEYING AMUSEMENT PARK EQUI...

SUBSTRATE INSPECTION METHOD, SUBSTRATE MANUFACTURING METHOD AND SUB...

Method And Apparatus For High Speed Acquisition Of Moving Images Us...

System With Polarized Scattered Light

System With Multiple Scattered Light Collectors

DEFECT INSPECTION METHOD AND DEVICE THEREFOR

Back Quartersphere Scattered Light Analysis

INSPECTION DEVICE AND INSPECTION METHOD

INSPECTION APPARATUS AND INSPECTION METHOD

METHOD OF MEASURING DEFECT DENSITY OF SINGLE CRYSTAL

Inspecting a Workpiece Using Polarization of Scattered Light

METHOD OF ANALYZING AN IMAGE OF HYDRIDES IN A METAL ALLOY, NOTABLY...

METHOD FOR INSPECTING DEFECTS AND DEFECT INSPECTING APPARATUS

INSPECTION DEVICE AND INSPECTION METHOD

Back Quartersphere Scattered Light Analysis