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Surveying instrument
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Patent number 11,512,957
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Issue date Nov 29, 2022
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TOPCON Corporation
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Fumio Ohtomo
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G01 - MEASURING TESTING
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Surveying instrument
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Patent number 11,500,096
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Issue date Nov 15, 2022
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TOPCON Corporation
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Nobuyuki Nishita
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G01 - MEASURING TESTING
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Scanning surveying device
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Patent number 11,493,341
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Issue date Nov 8, 2022
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Leica Geosystems AG
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Josef Müller
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G01 - MEASURING TESTING
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Surveying device
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Patent number 11,448,504
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Issue date Sep 20, 2022
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Topcon Corporation
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Nobuyuki Nishita
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G01 - MEASURING TESTING
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Surveying instrument
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Patent number 11,415,414
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Issue date Aug 16, 2022
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TOPCON Corporation
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Fumio Ohtomo
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G06 - COMPUTING CALCULATING COUNTING
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Surveying instrument
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Patent number 11,402,207
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Issue date Aug 2, 2022
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TOPCON Corporation
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Fumio Ohtomo
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G01 - MEASURING TESTING
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Laser level
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Patent number 11,307,032
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Issue date Apr 19, 2022
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Zhejiang Rongsheng Tools Co., Ltd
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Zhiwei Zhuang
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G01 - MEASURING TESTING
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Surveying instrument
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Patent number 11,293,754
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Issue date Apr 5, 2022
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TOPCON Corporation
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Satoshi Hirano
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G01 - MEASURING TESTING
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