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Comparing the measuring value with a reference value which periodically or incidentally scans the measuring range
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CPC
G01D3/063
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Parent Industries
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PHYSICS
G01
Measuring instruments
G01D
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS TARIFF METERING APPARATUS MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
G01D3/00
Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
Current Industry
G01D3/063
Comparing the measuring value with a reference value which periodically or incidentally scans the measuring range
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Patents Grants
last 30 patents
Information
Patent Grant
Measurement result display device and measurement result display me...
Patent number
10,279,376
Issue date
May 7, 2019
Anritsu Corporation
Ryota Takasu
G01 - MEASURING TESTING
Information
Patent Grant
Method for determining at least one first internal parameter of a s...
Patent number
8,456,174
Issue date
Jun 4, 2013
Continental Teves AG & Co. oHG
Joerg Eckrich
G01 - MEASURING TESTING
Information
Patent Grant
High accuracy measuring system
Patent number
6,215,319
Issue date
Apr 10, 2001
Kevin G. Hafer
G01 - MEASURING TESTING
Information
Patent Grant
Method for detecting origin point of position sensor
Patent number
6,049,075
Issue date
Apr 11, 2000
Sony Corporation
Akihito Nakayama
G05 - CONTROLLING REGULATING
Information
Patent Grant
Method for detecting origin point of position sensor
Patent number
6,049,087
Issue date
Apr 11, 2000
Sony Corporation
Akihito Nakayama
G05 - CONTROLLING REGULATING
Information
Patent Grant
Method for detecting origin point of position sensor
Patent number
5,955,728
Issue date
Sep 21, 1999
Sony Corporation
Akihito Nakayama
G05 - CONTROLLING REGULATING
Information
Patent Grant
Method for detecting origin point of position sensor
Patent number
5,534,692
Issue date
Jul 9, 1996
Sony Corporation
Akihito Nakayama
G05 - CONTROLLING REGULATING
Information
Patent Grant
Filter with hysteresis for trip point applications
Patent number
5,233,329
Issue date
Aug 3, 1993
Delco Electronics Corporation
Raymond Lippmann
G01 - MEASURING TESTING
Information
Patent Grant
Process for identifying discrete data representative of an input sa...
Patent number
5,214,580
Issue date
May 25, 1993
Hewlett-Packard Company
Richard Aparo
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Programmable multi-channel tool monitor with multiple alarm limits...
Patent number
4,633,424
Issue date
Dec 30, 1986
Santrade Ltd.
Rolf Norberg
G01 - MEASURING TESTING
Information
Patent Grant
Method of setting a reference value, for example to zero-set a sign...
Patent number
4,612,450
Issue date
Sep 16, 1986
Bosch und Pierburg System oHG
Gunter Gilz
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for digitally subdividing analog periodic signals
Patent number
4,594,579
Issue date
Jun 10, 1986
Dr. Johannes Heidenhain GmbH
Walter Schmitt
G01 - MEASURING TESTING
Information
Patent Grant
Digital display measuring apparatus
Patent number
4,593,473
Issue date
Jun 10, 1986
Mitutoyo Mfg. Co., Ltd.
Toshitaka Shimomura
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for reproducing a reference position in an inc...
Patent number
4,530,155
Issue date
Jul 23, 1985
Dr. Johannes Heidenhain GmbH
Horst Burkhardt
G01 - MEASURING TESTING
Information
Patent Grant
Coherent light detecting system including passive averaging network
Patent number
4,515,478
Issue date
May 7, 1985
Systems Research Laboratories, Inc.
Paul T. Ballard
G01 - MEASURING TESTING
Information
Patent Grant
Side scan sonar system
Patent number
4,063,212
Issue date
Dec 13, 1977
Western Marine Electronics, Inc.
Kenneth L. Sublett
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Multi-dimensional precision spot inspection method and system for t...
Publication number
20240280378
Publication date
Aug 22, 2024
Huaneng Jinan Huangtai Power Generation Co., Ltd.
Jun Luan
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC APPARATUS FOR CONTROLLING SENSOR AND OPERATION METHOD TH...
Publication number
20220187100
Publication date
Jun 16, 2022
AGENCY FOR DEFENSE DEVELOPMENT
Chang Min LEE
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR RECALIBRATING A MEASUREMENT INSTRUMENT
Publication number
20180246142
Publication date
Aug 30, 2018
West Energy Support & Technology, Inc.
James Glover
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT RESULT DISPLAY DEVICE AND MEASUREMENT RESULT DISPLAY ME...
Publication number
20180236496
Publication date
Aug 23, 2018
Anritsu Corporation
Ryota TAKASU
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Application
METHOD FOR DETERMINING AT LEAST ONE FIRST INTERNAL PARAMETER OF A S...
Publication number
20110089930
Publication date
Apr 21, 2011
Continental Teves AG & Co. OHG
Joerg Eckrich
G01 - MEASURING TESTING