Comparison of products

Industry

CPC
G11C2029/4002

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Parent Industries

GPHYSICS G11Information storage G11CSTATIC STORES

Current Industry

G11C2029/4002Comparison of products

Industries

Patents Grantslast 30 patents

Information Patent Grant
Detect whether die or channel is defective to confirm temperature data
- Patent number 12,148,495
- Issue date Nov 19, 2024
- Micron Technology, Inc.
- Venkata Naga Lakshman Pasala
- G11 - INFORMATION STORAGE
Information Patent Grant
Storage device for generating identity code and identity code gener...
- Patent number 11,984,166
- Issue date May 14, 2024
- Macronix International Co., Ltd.
- Yu-Hsuan Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Test method for control chip and related device
- Patent number 11,862,268
- Issue date Jan 2, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Chuanqi Shi
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device virtual blocks using half good blocks
- Patent number 11,776,655
- Issue date Oct 3, 2023
- Micron Technology, Inc.
- Sri Rama Namala
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for the secured storing of a data element of a predefined da...
- Patent number 11,694,759
- Issue date Jul 4, 2023
- Robert Bosch GmbH
- Martin Assel
- G11 - INFORMATION STORAGE
Information Patent Grant
Method, system and computer program product for introducing persona...
- Patent number 11,675,001
- Issue date Jun 13, 2023
- STMICROELECTRONICS S.r.l.
- Marco Alfarano
- G11 - INFORMATION STORAGE
Information Patent Grant
Detect whether die or channel is defective to confirm temperature data
- Patent number 11,621,049
- Issue date Apr 4, 2023
- Micron Technology, Inc.
- Venkata Naga Lakshman Pasala
- G11 - INFORMATION STORAGE
Information Patent Grant
Remapping bad blocks in a memory sub-system
- Patent number 11,605,439
- Issue date Mar 14, 2023
- Micron Technology, Inc.
- Amit Bhardwaj
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device equipped with global column redundancy
- Patent number 11,574,699
- Issue date Feb 7, 2023
- Micron Technology, Inc.
- Satoshi Morishita
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device virtual blocks using half good blocks
- Patent number 11,475,974
- Issue date Oct 18, 2022
- Micron Technology, Inc.
- Sri Rama Namala
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory test method and related device
- Patent number 11,393,553
- Issue date Jul 19, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Chuanqi Shi
- G11 - INFORMATION STORAGE
Information Patent Grant
Defect detection for a memory device
- Patent number 11,257,564
- Issue date Feb 22, 2022
- Micron Technology, Inc.
- Chun Yi Lu
- G11 - INFORMATION STORAGE
Information Patent Grant
Performance evaluation of solid state memory device
- Patent number 11,158,394
- Issue date Oct 26, 2021
- International Business Machines Corporation
- Thomas J. Griffin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-channel package, and test apparatus and test method of testin...
- Patent number 10,692,583
- Issue date Jun 23, 2020
- Samsung Electronics Co., Ltd.
- Seong-seob Shin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Performance evaluation of solid state memory device
- Patent number 10,658,059
- Issue date May 19, 2020
- International Business Machines Corporation
- Thomas J. Griffin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory devices
- Patent number 10,613,931
- Issue date Apr 7, 2020
- Samsung Electronics Co., Ltd.
- Jeong Yun Cha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device including chips capable of comparing data
- Patent number 10,083,761
- Issue date Sep 25, 2018
- SK hynix Inc.
- Min Chang Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Background memory test apparatus and methods
- Patent number 10,062,451
- Issue date Aug 28, 2018
- Texas Instruments Incorporated
- Prasanth Viswanathan Pillai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Performance evaluation of solid state memory device
- Patent number 9,524,800
- Issue date Dec 20, 2016
- International Business Machines Corporation
- Thomas J. Griffin
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods for compressing data received over multiple...
- Patent number 9,183,952
- Issue date Nov 10, 2015
- Micron Technology, Inc.
- James S. Rehmeyer
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device and memory system including the same
- Patent number 9,164,139
- Issue date Oct 20, 2015
- Samsung Electronics Co., Ltd.
- Jun Hee Shin
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device and test method thereof
- Patent number 8,913,451
- Issue date Dec 16, 2014
- SK Hynix Inc.
- Hyunsu Yoon
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device and test method thereof
- Patent number 8,867,288
- Issue date Oct 21, 2014
- SK Hynix Inc.
- Hyunsu Yoon
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory error detecting apparatus and method
- Patent number 8,738,976
- Issue date May 27, 2014
- Fujitsu Limited
- Rikizo Nakano
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory corruption detection in engine control systems
- Patent number 8,666,642
- Issue date Mar 4, 2014
- GM Global Technology Operations LLC
- Joseph M. Stempnik
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Memory-daughter-card-testing method and apparatus
- Patent number 8,126,674
- Issue date Feb 28, 2012
- Cray Inc.
- David R. Resnick
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit and method for parallel testing and semiconductor device
- Patent number 8,115,507
- Issue date Feb 14, 2012
- NEC Corporation
- Masayuki Mizuno
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having mount test circuits and mount te...
- Patent number 8,108,741
- Issue date Jan 31, 2012
- Samsung Electronics Co., Ltd.
- Byoung-Sul Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Low cost testing and sorting for integrated circuits
- Patent number 8,059,478
- Issue date Nov 15, 2011
- Kovio, Inc.
- Roger G. Stewart
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of testing data paths in an electronic circuit
- Patent number 7,913,129
- Issue date Mar 22, 2011
- Thales
- Patrick Dervin
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
NONVOLATILE MEMORY PACKAGE, STORAGE DEVICE INCLUDING THE SAME, AND...
- Publication number 20240312551
- Publication date Sep 19, 2024
- Samsung Electronics Co., Ltd.
- Anil Kavala
- G11 - INFORMATION STORAGE
Information Patent Application
STORAGE DEVICE FOR GENERATING IDENTITY CODE AND IDENTITY CODE GENER...
- Publication number 20240242767
- Publication date Jul 18, 2024
- Macronix International Co., Ltd.
- Yu-Hsuan LIN
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY CHIP TEST METHOD AND APPARATUS, MEDIUM, AND DEVICE
- Publication number 20230410929
- Publication date Dec 21, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Beiyou ZHAO
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE VIRTUAL BLOCKS USING HALF GOOD BLOCKS
- Publication number 20230033870
- Publication date Feb 2, 2023
- Micron Technology, Inc.
- Sri Rama Namala
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE EQUIPPED WITH GLOBAL COLUMN REDUNDANCY
- Publication number 20230005565
- Publication date Jan 5, 2023
- Micron Technology, Inc.
- Satoshi Morishita
- G11 - INFORMATION STORAGE
Information Patent Application
STORAGE DEVICE FOR GENERATING IDENTITY CODE AND IDENTITY CODE GENER...
- Publication number 20220359016
- Publication date Nov 10, 2022
- Macronix International Co., Ltd.
- Yu-Hsuan LIN
- G11 - INFORMATION STORAGE
Information Patent Application
REMAPPING BAD BLOCKS IN A MEMORY SUB-SYSTEM
- Publication number 20220319622
- Publication date Oct 6, 2022
- Micron Technology, Inc.
- Amit Bhardwaj
- G11 - INFORMATION STORAGE
Information Patent Application
TEST METHOD FOR CONTROL CHIP AND RELATED DEVICE
- Publication number 20220223219
- Publication date Jul 14, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Chuanqi SHI
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE VIRTUAL BLOCKS USING HALF GOOD BLOCKS
- Publication number 20220199189
- Publication date Jun 23, 2022
- Micron Technology, Inc.
- Sri Rama Namala
- G11 - INFORMATION STORAGE
Information Patent Application
DETECT WHETHER DIE OR CHANNEL IS DEFECTIVE TO CONFIRM TEMPERATURE DATA
- Publication number 20220101940
- Publication date Mar 31, 2022
- Micron Technology, Inc.
- Venkata Naga Lakshman Pasala
- G11 - INFORMATION STORAGE
Information Patent Application
IN-SITU DETECTION OF ANOMALIES IN INTEGRATED CIRCUITS USING MACHINE...
- Publication number 20220101625
- Publication date Mar 31, 2022
- Intel Corporation
- Sriram R. Vangal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR THE SECURED STORING OF A DATA ELEMENT OF A PREDEFINED DA...
- Publication number 20220028474
- Publication date Jan 27, 2022
- ROBERT BOSCH GmbH
- Martin Assel
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY TEST METHOD AND RELATED DEVICE
- Publication number 20210319844
- Publication date Oct 14, 2021
- Changxin Memory Technologies, Inc.
- Chuanqi SHI
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD, SYSTEM AND COMPUTER PROGRAM PRODUCT FOR INTRODUCING PERSONA...
- Publication number 20210096178
- Publication date Apr 1, 2021
- STMicroelectronics S.r.l.
- Marco Alfarano
- G01 - MEASURING TESTING
Information Patent Application
PERFORMANCE EVALUATION OF SOLID STATE MEMORY DEVICE
- Publication number 20200234783
- Publication date Jul 23, 2020
- International Business Machines Corporation
- Thomas J. Griffin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-CHANNEL PACKAGE, AND TEST APPARATUS AND TEST METHOD OF TESTIN...
- Publication number 20190355436
- Publication date Nov 21, 2019
- Samsung Electronics Co., Ltd.
- Seong-seob SHIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE
- Publication number 20160099076
- Publication date Apr 7, 2016
- SK HYNIX INC.
- Sang-Mook OH
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY TEST SYSTEM AND METHOD
- Publication number 20150162096
- Publication date Jun 11, 2015
- ELITE SEMICONDUCTOR MEMORY TECHNOLOGY Inc.
- Min-Chung Chou
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS FOR COMPRESSING DATA RECEIVED OVER MULTIPLE...
- Publication number 20140237305
- Publication date Aug 21, 2014
- Micron Technology, Inc.
- James S. Rehmeyer
- G01 - MEASURING TESTING
Information Patent Application
MEMORY DEVICE AND TEST METHOD THEREOF
- Publication number 20140126302
- Publication date May 8, 2014
- SK HYNIX INC.
- Hyunsu YOON
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE AND TEST METHOD THEREOF
- Publication number 20140126301
- Publication date May 8, 2014
- SK HYNIX INC.
- Hyunsu YOON
- G11 - INFORMATION STORAGE
Information Patent Application
PERFORMANCE EVALUATION OF SOLID STATE MEMORY DEVICE
- Publication number 20140088920
- Publication date Mar 27, 2014
- International Business Machines Corporation
- Thomas J. Griffin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE AND MEMORY SYSTEM INCLUDING THE SAME
- Publication number 20140043920
- Publication date Feb 13, 2014
- Samsung Electronics Co., Ltd.
- Jun Hee SHIN
- G01 - MEASURING TESTING
Information Patent Application
Low Cost Testing and Sorting of Integrated Circuits
- Publication number 20120026817
- Publication date Feb 2, 2012
- Roger G. Stewart
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY ERROR DETECTING APPARATUS AND METHOD
- Publication number 20110314347
- Publication date Dec 22, 2011
- Fujitsu Limited
- Rikizo Nakano
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY CORRUPTION DETECTION IN ENGINE CONTROL SYSTEMS
- Publication number 20110196597
- Publication date Aug 11, 2011
- GM Global Technology Operations, Inc.
- Joseph M. Stempnik
- B60 - VEHICLES IN GENERAL
Information Patent Application
Low Cost Testing and Sorting for Integrated Circuits
- Publication number 20110122718
- Publication date May 26, 2011
- Roger G. Stewart
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY-DAUGHTER-CARD-TESTING METHOD AND APPARATUS
- Publication number 20100324854
- Publication date Dec 23, 2010
- Cray Inc.
- David R. Resnick
- G11 - INFORMATION STORAGE
Information Patent Application
CIRCUIT AND METHOD FOR PARALLEL TESTING AND SEMICONDUCTOR DEVICE
- Publication number 20100052724
- Publication date Mar 4, 2010
- Masayuki Mizuno
- G01 - MEASURING TESTING
Information Patent Application
Memory writing interference test system and method thereof
- Publication number 20090207678
- Publication date Aug 20, 2009
- Chih-Wei Chen
- G11 - INFORMATION STORAGE

Comparison of products

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Detect whether die or channel is defective to confirm temperature data

Storage device for generating identity code and identity code gener...

Test method for control chip and related device

Memory device virtual blocks using half good blocks

Method for the secured storing of a data element of a predefined da...

Method, system and computer program product for introducing persona...

Detect whether die or channel is defective to confirm temperature data

Remapping bad blocks in a memory sub-system

Semiconductor device equipped with global column redundancy

Memory device virtual blocks using half good blocks

Memory test method and related device

Defect detection for a memory device

Performance evaluation of solid state memory device

Multi-channel package, and test apparatus and test method of testin...

Performance evaluation of solid state memory device

Memory devices

Semiconductor device including chips capable of comparing data

Background memory test apparatus and methods

Performance evaluation of solid state memory device

Apparatuses and methods for compressing data received over multiple...

Memory device and memory system including the same

Memory device and test method thereof

Memory device and test method thereof

Memory error detecting apparatus and method

Memory corruption detection in engine control systems

Memory-daughter-card-testing method and apparatus

Circuit and method for parallel testing and semiconductor device

Semiconductor memory device having mount test circuits and mount te...

Low cost testing and sorting for integrated circuits

Method of testing data paths in an electronic circuit

Patents Applicationslast 30 patents

NONVOLATILE MEMORY PACKAGE, STORAGE DEVICE INCLUDING THE SAME, AND...

STORAGE DEVICE FOR GENERATING IDENTITY CODE AND IDENTITY CODE GENER...

MEMORY CHIP TEST METHOD AND APPARATUS, MEDIUM, AND DEVICE

MEMORY DEVICE VIRTUAL BLOCKS USING HALF GOOD BLOCKS

SEMICONDUCTOR DEVICE EQUIPPED WITH GLOBAL COLUMN REDUNDANCY

STORAGE DEVICE FOR GENERATING IDENTITY CODE AND IDENTITY CODE GENER...

REMAPPING BAD BLOCKS IN A MEMORY SUB-SYSTEM

TEST METHOD FOR CONTROL CHIP AND RELATED DEVICE

MEMORY DEVICE VIRTUAL BLOCKS USING HALF GOOD BLOCKS

DETECT WHETHER DIE OR CHANNEL IS DEFECTIVE TO CONFIRM TEMPERATURE DATA

IN-SITU DETECTION OF ANOMALIES IN INTEGRATED CIRCUITS USING MACHINE...

METHOD FOR THE SECURED STORING OF A DATA ELEMENT OF A PREDEFINED DA...

MEMORY TEST METHOD AND RELATED DEVICE

METHOD, SYSTEM AND COMPUTER PROGRAM PRODUCT FOR INTRODUCING PERSONA...

PERFORMANCE EVALUATION OF SOLID STATE MEMORY DEVICE

MULTI-CHANNEL PACKAGE, AND TEST APPARATUS AND TEST METHOD OF TESTIN...

SEMICONDUCTOR MEMORY DEVICE

MEMORY TEST SYSTEM AND METHOD

APPARATUSES AND METHODS FOR COMPRESSING DATA RECEIVED OVER MULTIPLE...

MEMORY DEVICE AND TEST METHOD THEREOF

MEMORY DEVICE AND TEST METHOD THEREOF

PERFORMANCE EVALUATION OF SOLID STATE MEMORY DEVICE

MEMORY DEVICE AND MEMORY SYSTEM INCLUDING THE SAME

Low Cost Testing and Sorting of Integrated Circuits

MEMORY ERROR DETECTING APPARATUS AND METHOD

MEMORY CORRUPTION DETECTION IN ENGINE CONTROL SYSTEMS

Low Cost Testing and Sorting for Integrated Circuits

MEMORY-DAUGHTER-CARD-TESTING METHOD AND APPARATUS

CIRCUIT AND METHOD FOR PARALLEL TESTING AND SEMICONDUCTOR DEVICE

Memory writing interference test system and method thereof