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Compensate for offset due to probe diameter, detect exact contact point
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CPC
G05B2219/37218
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Parent Industries
G
PHYSICS
G05
Controlling systems
G05B
CONTROL OR REGULATING SYSTEMS IN GENERAL FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
G05B2219/00
Program-control systems
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G05B2219/37218
Compensate for offset due to probe diameter, detect exact contact point
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Patents Grants
last 30 patents
Information
Patent Grant
Method for coordinate measurement of workpieces
Patent number
5,425,180
Issue date
Jun 20, 1995
Carl Zeiss Stiftung
Karl-Hermann Breyer
G05 - CONTROLLING REGULATING
Patents Applications
last 30 patents