Compensate for offset due to probe diameter, detect exact contact point

Follow

Industry

CPC
G05B2219/37218

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G05Controlling systems G05BCONTROL OR REGULATING SYSTEMS IN GENERAL FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS G05B2219/00Program-control systems

Current Industry

G05B2219/37218Compensate for offset due to probe diameter, detect exact contact point

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Method for coordinate measurement of workpieces
- Patent number 5,425,180
- Issue date Jun 20, 1995
- Carl Zeiss Stiftung
- Karl-Hermann Breyer
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents