CPC
B01J2220/825
Information
Patent Grant
GL Sciences Incorporated
Shota Miyazaki
G01 - MEASURING TESTING
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Patent Grant
Hitachi High-Technologies Corporation
Katsutoshi Shimizu
G01 - MEASURING TESTING
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Patent Grant
Merck Patent GmbH
Zöfre Bayram-Hahn
G01 - MEASURING TESTING
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Patent Grant
Regents of The University of Minnesota
Eric F. Funkenbusch
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Grant
Regents of The University of Minnesota
Eric F. Funkenbusch
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Regents of The University of Minnesota
Eric F. Funkenbusch
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
CELLSEED INC.
Kenichi NAGASE
G01 - MEASURING TESTING
Information
Patent Application
CELLSEED INC.
Kenichi Nagase
G01 - MEASURING TESTING
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Patent Application
GL SCIENCE INCORPORATED
Atsushi Sato
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Application
GL SCIENCES INCORPORATED
Shota Miyazaki
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Application
Hitachi-Technologies Corporation
Kiyotoshi MORI
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Hitachi High-Technologies Corporation
Katsutoshi Shimizu
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Zofre Bayram-Hahn
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Agathagelos Kyrlidis
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
