Concurrent test

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G11C2029/2602

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GPHYSICS G11Information storage G11CSTATIC STORES

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G11C2029/2602Concurrent test

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Patents Grantslast 30 patents

Information Patent Grant
Test systems for executing self-testing in deployed automotive plat...
- Patent number 11,768,241
- Issue date Sep 26, 2023
- NVIDIA Corporation
- Anitha Kalva
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatuses and methods for parallel writing to multiple memory dev...
- Patent number 11,681,440
- Issue date Jun 20, 2023
- Micron Technology, Inc.
- Jason T. Zawodny
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test systems for executing self-testing in deployed automotive plat...
- Patent number 11,573,269
- Issue date Feb 7, 2023
- NVIDIA Corporation
- Anitha Kalva
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory device and test method thereof
- Patent number 11,437,118
- Issue date Sep 6, 2022
- Samsung Electronics Co., Ltd.
- Sungik Jang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hamming-distance analyzer and method for analyzing hamming-distance
- Patent number 11,195,593
- Issue date Dec 7, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Shih-Lien Linus Lu
- G11 - INFORMATION STORAGE
Information Patent Grant
Test systems for executing self-testing in deployed automotive plat...
- Patent number 11,079,434
- Issue date Aug 3, 2021
- NVIDIA Corporation
- Anitha Kalva
- G01 - MEASURING TESTING
Information Patent Grant
Multi-tier scheme for logical storage management
- Patent number 11,068,170
- Issue date Jul 20, 2021
- Western Digital Technologies, Inc.
- Haining Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods to test a memory device
- Patent number 10,998,071
- Issue date May 4, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Lien Linus Lu
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device
- Patent number 10,964,404
- Issue date Mar 30, 2021
- Renesas Electronics Corporation
- Yoshisato Yokoyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods for parallel writing to multiple memory dev...
- Patent number 10,942,652
- Issue date Mar 9, 2021
- Micron Technology, Inc.
- Jason T. Zawodny
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory circuit and method of operating a memory circuit
- Patent number 10,937,469
- Issue date Mar 2, 2021
- Infineon Technologies AG
- Jan Otterstedt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Byte enable memory built-in self-test (MBIST) algorithm
- Patent number 10,748,641
- Issue date Aug 18, 2020
- QUALCOMM Incorporated
- Greg Seok
- G11 - INFORMATION STORAGE
Information Patent Grant
Systems and methods to test a memory device
- Patent number 10,672,494
- Issue date Jun 2, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Lien Linus Lu
- G11 - INFORMATION STORAGE
Information Patent Grant
Method, apparatus and electronic device for read/write speed testing
- Patent number 10,643,736
- Issue date May 5, 2020
- Zhuhai Juntian Electronic Technology Co., Ltd.
- Zhenbei Yu
- G11 - INFORMATION STORAGE
Information Patent Grant
Arbitration for memory diagnostics
- Patent number 10,622,090
- Issue date Apr 14, 2020
- International Business Machines Corporation
- Aravindan J. Busi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and diagnostic method therefor
- Patent number 10,580,513
- Issue date Mar 3, 2020
- Renesas Electronics Corporation
- Yoichi Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-tier scheme for logical storage management
- Patent number 10,552,055
- Issue date Feb 4, 2020
- Western Digital Technologies, Inc.
- Haining Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hamming-distance analyzer and method for analyzing hamming-distance
- Patent number 10,515,713
- Issue date Dec 24, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Shih-Lien Linus Lu
- G11 - INFORMATION STORAGE
Information Patent Grant
Systems and methods to test a memory device
- Patent number 10,504,604
- Issue date Dec 10, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Lien Linus Lu
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory circuit including overlay memory cells and method of operati...
- Patent number 10,497,408
- Issue date Dec 3, 2019
- Infineon Technologies AG
- Jan Otterstedt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatuses and methods for parallel writing to multiple memory dev...
- Patent number 10,496,286
- Issue date Dec 3, 2019
- Micron Technology, Inc.
- Jason T. Zawodny
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor memory device
- Patent number 10,468,094
- Issue date Nov 5, 2019
- TOSHIBA MEMORY CORPORATION
- Hayao Kasai
- G11 - INFORMATION STORAGE
Information Patent Grant
Area efficient parallel test data path for embedded memories
- Patent number 10,460,821
- Issue date Oct 29, 2019
- Texas Instruments Incorporated
- Prakash Narayanan
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-volatile memory testing
- Patent number 10,438,680
- Issue date Oct 8, 2019
- Infineon Technologies AG
- Thorsten Bucksch
- G11 - INFORMATION STORAGE
Information Patent Grant
Multi-tier scheme for logical storage management
- Patent number 10,289,314
- Issue date May 14, 2019
- Western Digital Technologies, Inc.
- Haining Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Auxiliary test device, test board having the same, and test method...
- Patent number 10,262,753
- Issue date Apr 16, 2019
- Samsung Electronics Co., Ltd.
- Ungjin Jang
- G01 - MEASURING TESTING
Information Patent Grant
Arithmetic processing device storing diagnostic results in parallel...
- Patent number 10,248,479
- Issue date Apr 2, 2019
- Fujitsu Limited
- Makoto Suga
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device using a parallel bit operation and method of o...
- Patent number 10,224,114
- Issue date Mar 5, 2019
- Samsung Electronics Co., Ltd.
- Je-min Ryu
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor apparatus and test system including the same
- Patent number 10,168,370
- Issue date Jan 1, 2019
- SK hynix Inc.
- Sang Oh Lim
- G01 - MEASURING TESTING
Information Patent Grant
Arbitration for memory diagnostics
- Patent number 10,153,055
- Issue date Dec 11, 2018
- International Business Machines Corporation
- Aravindan J. Busi
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
APPARATUSES AND METHODS FOR PARALLEL WRITING TO MULTIPLE MEMORY DEV...
- Publication number 20230333744
- Publication date Oct 19, 2023
- Micron Technology, Inc.
- Jason T. Zawodny
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST SYSTEMS FOR EXECUTING SELF-TESTING IN DEPLOYED AUTOMOTIVE PLAT...
- Publication number 20210341537
- Publication date Nov 4, 2021
- NVIDIA Corporation
- Anitha Kalva
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUSES AND METHODS FOR PARALLEL WRITING TO MULTIPLE MEMORY DEV...
- Publication number 20210191624
- Publication date Jun 24, 2021
- Micron Technology, Inc.
- Jason T. Zawodny
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Multi-Tier Scheme for Logical Storage Management
- Publication number 20200159418
- Publication date May 21, 2020
- Western Digital Technologies, Inc.
- Haining LIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS TO TEST A MEMORY DEVICE
- Publication number 20200118639
- Publication date Apr 16, 2020
- TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Shih-Lien Linus LU
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY CIRCUIT AND METHOD OF OPERATING A MEMORY CIRCUIT
- Publication number 20200066312
- Publication date Feb 27, 2020
- INFINEON TECHNOLOGIES AG
- Jan OTTERSTEDT
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-TIER SCHEME FOR LOGICAL STORAGE MANAGEMENT
- Publication number 20190227720
- Publication date Jul 25, 2019
- Western Digital Technologies, Inc.
- Haining LIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ARBITRATION FOR MEMORY DIAGNOSTICS
- Publication number 20190035486
- Publication date Jan 31, 2019
- International Business Machines Corporation
- Aravindan J. BUSI
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE USING A PARALLEL BIT OPERATION AND METHOD OF O...
- Publication number 20170352434
- Publication date Dec 7, 2017
- Samsung Electronics Co., Ltd.
- Je-min RYU
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS FOR PARALLEL WRITING TO MULTIPLE MEMORY DEV...
- Publication number 20170336989
- Publication date Nov 23, 2017
- Micron Technology, Inc.
- Jason T. Zawodny
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE AND METHOD TO PERFORM A PARALLEL MEMORY TEST
- Publication number 20150063045
- Publication date Mar 5, 2015
- INSIDE SECURE
- Graeme Hickey
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE
- Publication number 20150043289
- Publication date Feb 12, 2015
- SK HYNIX INC.
- Young-Jun KU
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND APPRATUS FOR SHORTENED ERASE OPTION
- Publication number 20140376311
- Publication date Dec 25, 2014
- Macronix International Co., Ltd.
- Chun-Hsiung Hung
- G11 - INFORMATION STORAGE
Information Patent Application
TESTER AND TEST SYSTEM INCLUDING THE SAME
- Publication number 20140375349
- Publication date Dec 25, 2014
- Samsung Electronics Co., Ltd.
- Chang-Hwan Lee
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE
- Publication number 20140369127
- Publication date Dec 18, 2014
- KABUSHIKI KAISHA TOSHIBA
- Tokumasa HARA
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor Device and Test Method Thereof
- Publication number 20140369145
- Publication date Dec 18, 2014
- Naohisa Nishioka
- G11 - INFORMATION STORAGE
Information Patent Application
INTEGRATED CIRCUIT CHIP AND MULTI-CHIP SYSTEM INCLUDING THE SAME
- Publication number 20140354311
- Publication date Dec 4, 2014
- SK HYNIX INC.
- Sang-Jin BYEON
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICES AND SEMICONDUCTOR SYSTEMS INCLUDING THE SAME
- Publication number 20140347940
- Publication date Nov 27, 2014
- SK HYNIX INC.
- Hee Won KANG
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD OF TESTING SEMICONDUCTO...
- Publication number 20140340975
- Publication date Nov 20, 2014
- Keigo NAKATANI
- G11 - INFORMATION STORAGE
Information Patent Application
On-Line Memory Testing Systems And Methods
- Publication number 20140337669
- Publication date Nov 13, 2014
- OMNIVISION TECHNOLOGIES, INC.
- Johannes Solhusvik
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE HAVING ROLL CALL CIRCUIT
- Publication number 20140286113
- Publication date Sep 25, 2014
- Micron Technology, Inc.
- SHUICHI KUBOUCHI
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor Device Performing Stress Test
- Publication number 20140211582
- Publication date Jul 31, 2014
- Yoshiro Riho
- G11 - INFORMATION STORAGE
Information Patent Application
DECREASING POWER SUPPLY DEMAND DURING BIST INITIALIZATIONS
- Publication number 20140189448
- Publication date Jul 3, 2014
- International Business Machines Corporation
- Deepak I. Hanagandi
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20140151703
- Publication date Jun 5, 2014
- Takahiro Koyama
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE
- Publication number 20140098620
- Publication date Apr 10, 2014
- SK HYNIX INC.
- Young-Jun KU
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE AND TEST METHOD THEREOF
- Publication number 20140078843
- Publication date Mar 20, 2014
- Elpida Memory, Inc.
- Naohisa Nishioka
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE AND METHOD OF TESTING THE SAME
- Publication number 20140050035
- Publication date Feb 20, 2014
- SK HYNIX INC.
- Shin Ho CHU
- G11 - INFORMATION STORAGE
Information Patent Application
Storage Medium and Transmittal System Utilizing the Same
- Publication number 20140036603
- Publication date Feb 6, 2014
- Hsu-Ping Ou
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE HAVING RESISTIVE MEMORY CELLS AND METHO...
- Publication number 20140022836
- Publication date Jan 23, 2014
- Hye-Jin KIM
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE AND METHOD OF TESTING THE SAME
- Publication number 20140016416
- Publication date Jan 16, 2014
- SK HYNIX INC.
- Kwang-Hyun KIM
- G11 - INFORMATION STORAGE

Concurrent test

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Test systems for executing self-testing in deployed automotive plat...

Apparatuses and methods for parallel writing to multiple memory dev...

Test systems for executing self-testing in deployed automotive plat...

Memory device and test method thereof

Hamming-distance analyzer and method for analyzing hamming-distance

Test systems for executing self-testing in deployed automotive plat...

Multi-tier scheme for logical storage management

Systems and methods to test a memory device

Semiconductor device

Apparatuses and methods for parallel writing to multiple memory dev...

Memory circuit and method of operating a memory circuit

Byte enable memory built-in self-test (MBIST) algorithm

Systems and methods to test a memory device

Method, apparatus and electronic device for read/write speed testing

Arbitration for memory diagnostics

Semiconductor device and diagnostic method therefor

Multi-tier scheme for logical storage management

Hamming-distance analyzer and method for analyzing hamming-distance

Systems and methods to test a memory device

Memory circuit including overlay memory cells and method of operati...

Apparatuses and methods for parallel writing to multiple memory dev...

Semiconductor memory device

Area efficient parallel test data path for embedded memories

Non-volatile memory testing

Multi-tier scheme for logical storage management

Auxiliary test device, test board having the same, and test method...

Arithmetic processing device storing diagnostic results in parallel...

Semiconductor device using a parallel bit operation and method of o...

Semiconductor apparatus and test system including the same

Arbitration for memory diagnostics

Patents Applicationslast 30 patents

APPARATUSES AND METHODS FOR PARALLEL WRITING TO MULTIPLE MEMORY DEV...

TEST SYSTEMS FOR EXECUTING SELF-TESTING IN DEPLOYED AUTOMOTIVE PLAT...

APPARATUSES AND METHODS FOR PARALLEL WRITING TO MULTIPLE MEMORY DEV...

Multi-Tier Scheme for Logical Storage Management

SYSTEMS AND METHODS TO TEST A MEMORY DEVICE

MEMORY CIRCUIT AND METHOD OF OPERATING A MEMORY CIRCUIT

MULTI-TIER SCHEME FOR LOGICAL STORAGE MANAGEMENT

ARBITRATION FOR MEMORY DIAGNOSTICS

SEMICONDUCTOR DEVICE USING A PARALLEL BIT OPERATION AND METHOD OF O...

APPARATUSES AND METHODS FOR PARALLEL WRITING TO MULTIPLE MEMORY DEV...

DEVICE AND METHOD TO PERFORM A PARALLEL MEMORY TEST

SEMICONDUCTOR MEMORY DEVICE

METHOD AND APPRATUS FOR SHORTENED ERASE OPTION

TESTER AND TEST SYSTEM INCLUDING THE SAME

SEMICONDUCTOR MEMORY DEVICE

Semiconductor Device and Test Method Thereof

INTEGRATED CIRCUIT CHIP AND MULTI-CHIP SYSTEM INCLUDING THE SAME

SEMICONDUCTOR DEVICES AND SEMICONDUCTOR SYSTEMS INCLUDING THE SAME

SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD OF TESTING SEMICONDUCTO...

On-Line Memory Testing Systems And Methods

SEMICONDUCTOR DEVICE HAVING ROLL CALL CIRCUIT

Semiconductor Device Performing Stress Test

DECREASING POWER SUPPLY DEMAND DURING BIST INITIALIZATIONS

SEMICONDUCTOR DEVICE

SEMICONDUCTOR MEMORY DEVICE

SEMICONDUCTOR DEVICE AND TEST METHOD THEREOF

SEMICONDUCTOR MEMORY DEVICE AND METHOD OF TESTING THE SAME

Storage Medium and Transmittal System Utilizing the Same

SEMICONDUCTOR MEMORY DEVICE HAVING RESISTIVE MEMORY CELLS AND METHO...

SEMICONDUCTOR MEMORY DEVICE AND METHOD OF TESTING THE SAME