Control of temperature, heating, ashing

Industry

CPC
G01N2021/745

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/745Control of temperature, heating, ashing

Industries

Patents Grantslast 30 patents

Information Patent Grant
Method and device for compensating temperature gradient effects
- Patent number 11,740,175
- Issue date Aug 29, 2023
- TDK Corporation
- Matthias König
- G01 - MEASURING TESTING
Information Patent Grant
Atomic absorption spectrophotometer
- Patent number 10,552,965
- Issue date Feb 4, 2020
- SHIMADZU CORPORATION
- Osuke Kobayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Heated wafer carrier profiling
- Patent number 9,653,340
- Issue date May 16, 2017
- Veeco Instruments Inc.
- Vadim Boguslavskiy
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Temperature control method using empirically determined characteris...
- Patent number 5,703,342
- Issue date Dec 30, 1997
- Bodenseewerk Perkin-Elmer GmbH
- Erwin Hoffmann
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and device for analyzing samples by means of atomic absorpti...
- Patent number 5,148,234
- Issue date Sep 15, 1992
- Bodenseewerk Perkin-Elmer GmbH
- Rolf Tamm
- G01 - MEASURING TESTING
Information Patent Grant
Atomic absorption spectrometer
- Patent number 5,094,530
- Issue date Mar 10, 1992
- Bodenseewerk Perkin-Elmer GmbH
- Klaus P. Rogasch
- G01 - MEASURING TESTING
Information Patent Grant
Atomic absorption spectrometer
- Patent number 4,989,975
- Issue date Feb 5, 1991
- Carl G. Dencks
- G01 - MEASURING TESTING
Information Patent Grant
Atomic absorption spectrophotometer
- Patent number 4,890,919
- Issue date Jan 2, 1990
- Hitachi, Ltd.
- Masamichi Tsukada
- G01 - MEASURING TESTING
Information Patent Grant
Atomic absorption spectrophotometer with furnace at pressure equal...
- Patent number 4,840,484
- Issue date Jun 20, 1989
- Hitachi, Ltd.
- Konosuke Oishi
- G01 - MEASURING TESTING
Information Patent Grant
Device for pyrometric temperature measurement
- Patent number 4,730,940
- Issue date Mar 15, 1988
- Gruen Analysengeraete GmbH
- Robert F. M. Herber
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR DETECTING CRACKS IN SAMPLES BY INFRARED RA...
- Publication number 20230086591
- Publication date Mar 23, 2023
- Charles Rimbert-Riviere
- G01 - MEASURING TESTING
Information Patent Application
Method and Device for Compensating Temperature Gradient Effects
- Publication number 20220120666
- Publication date Apr 21, 2022
- TDK Corporation
- Matthias König
- G01 - MEASURING TESTING

Control of temperature, heating, ashing

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and device for compensating temperature gradient effects

Atomic absorption spectrophotometer

Heated wafer carrier profiling

Temperature control method using empirically determined characteris...

Method and device for analyzing samples by means of atomic absorpti...

Atomic absorption spectrometer

Atomic absorption spectrometer

Atomic absorption spectrophotometer

Atomic absorption spectrophotometer with furnace at pressure equal...

Device for pyrometric temperature measurement

Patents Applicationslast 30 patents

APPARATUS AND METHOD FOR DETECTING CRACKS IN SAMPLES BY INFRARED RA...

Method and Device for Compensating Temperature Gradient Effects