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Correcting nonlinearity of signal
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CPC
G01N2021/5949
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G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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G01N2021/5949
Correcting nonlinearity of signal
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Patents Grants
last 30 patents
Information
Patent Grant
Measuring method and instrument comprising image sensor
Patent number
7,274,829
Issue date
Sep 25, 2007
ARKRAY, Inc.
Atsusi Wada
G01 - MEASURING TESTING
Information
Patent Grant
Correction method for sensor output
Patent number
7,110,901
Issue date
Sep 19, 2006
ARKRAY, Inc.
Atsusi Wada
G01 - MEASURING TESTING
Information
Patent Grant
Radiation image read-out apparatus compensating for image distortion
Patent number
5,229,618
Issue date
Jul 20, 1993
Fuji Photo Film Co., Ltd.
Nobuyoshi Nakajima
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Measuring method and instrument comprising image sensor
Publication number
20040076325
Publication date
Apr 22, 2004
Atsusi Wada
G01 - MEASURING TESTING
Information
Patent Application
Correction method for sensor output
Publication number
20040034494
Publication date
Feb 19, 2004
Atsusi Wada
G01 - MEASURING TESTING