Correlation between controlling parameters for influence on quality parameters

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G05B2219/32187

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GPHYSICS G05Controlling systems G05BCONTROL OR REGULATING SYSTEMS IN GENERAL FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS G05B2219/00Program-control systems

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G05B2219/32187Correlation between controlling parameters for influence on quality parameters

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Patents Grantslast 30 patents

Information Patent Grant
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Method and apparatus for autonomous tool parameter impact identific...
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Predicted fault analysis
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Run-to-run control utilizing virtual metrology in semiconductor man...
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Process controller having a laboratory data validation model and me...
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Method for monitoring a production process
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Methods and apparatus to predict process quality in a process contr...
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Method for manufacturing a drive from a determined minimum operatio...
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Dynamic control system for manufacturing processes
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Validation of laboratory test data based on predicted values of pro...
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- Issue date Jan 8, 2013
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Process control using process data and yield data
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Patents Applicationslast 30 patents

Information Patent Application
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System and method for manufacturing a product having predetermined...
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CLOUD-BASED ARCHITECTURE FOR ANALYSIS AND PREDICTION OF INTEGRATED...
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METHOD FOR SEARCHING, ANALYZING, AND OPTIMIZING PROCESS PARAMETERS...
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INTEGRATED CIRCUIT PRODUCT YIELD OPTIMIZATION USING THE RESULTS OF...
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VALIDATION OF LABORATORY TEST DATA
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DEVICE FOR SLICING A FOOD PRODUCT AND DEVICE WITH A ROBOT
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ARCHITECTURE FOR ANALYSIS AND PREDICTION OF INTEGRATED TOOL-RELATED...
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METHOD OF CONTROLLING SEMICONDUCTOR PROCESS DISTRIBUTION
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- Ho-Ki LEE
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PREDICTED FAULT ANALYSIS
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Instrumental Support for Monitoring the Color Imprint in the Manufa...
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Method and Assembly for Determining and/or Producing a Drive or Par...
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Substrate Matrix To Decouple Tool And Process Effects
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METHODS AND APPARATUS TO PREDICT PROCESS QUALITY IN A PROCESS CONT...
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METHOD FOR MONITORING A PRODUCTION PROCESS
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- Martin Eckstein
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PROCESS CONTROL USING PROCESS DATA AND YIELD DATA
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- MKS Instruments, Inc.
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Correlation between controlling parameters for influence on quality parameters

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Manufacturing a product using causal models

Golden data for industrial robots

Method and apparatus for configuring processing parameters of produ...

Cloud-based analytics for industrial automation

Cloud-based analytics for industrial automation

Prediction model creation apparatus, production facility monitoring...

Management system and non-transitory computer-readable recording me...

Method for compensating milling cutter deflection

Production system that sets determination value of variable relatin...

Management system and non-transitory computer-readable recording me...

Method and apparatus for autonomous tool parameter impact identific...

Self-learning production systems with good and/or bad part variable...

Metrology sampling method with sampling rate decision scheme and co...

Method and assembly for determining and/or producing a drive or par...

Systems and methods of controlling a manufacturing process for a mi...

System and method for identifying significant and consumable-insens...

Correction value computation device, correction value computation m...

Method and apparatus for autonomous tool parameter impact identific...

Predicted fault analysis

Run-to-run control utilizing virtual metrology in semiconductor man...

Run-to-run control utilizing virtual metrology in semiconductor man...

Integrated circuit product yield optimization using the results of...

Method of controlling semiconductor process distribution

Process controller having a laboratory data validation model and me...

Method for monitoring a production process

Methods and apparatus to predict process quality in a process contr...

Method for manufacturing a drive from a determined minimum operatio...

Dynamic control system for manufacturing processes

Validation of laboratory test data based on predicted values of pro...

Process control using process data and yield data

Patents Applicationslast 30 patents

MANUFACTURING A PRODUCT USING CAUSAL MODELS

Method and System for Improving a Production Process in a Technical...

Method for Monitoring a Production Line for Producing Components, i...

METHOD AND APPARATUS FOR CONFIGURING PROCESSING PARAMETERS OF PRODU...

MANUFACTURING A PRODUCT USING CAUSAL MODELS

CLOUD-BASED ANALYTICS FOR INDUSTRIAL AUTOMATION

System and method for manufacturing a product having predetermined...

GOLDEN DATA FOR INDUSTRIAL ROBOTS

PRODUCTION PLANT WITH CONTROL OF THE PRODUCTION AND/OR CONSUMPTION...

METHOD FOR COMPENSATING MILLING CUTTER DEFLECTION

CLOUD-BASED ARCHITECTURE FOR ANALYSIS AND PREDICTION OF INTEGRATED...

METHOD FOR SEARCHING, ANALYZING, AND OPTIMIZING PROCESS PARAMETERS...

METHOD AND APPARATUS FOR AUTONOMOUS TOOL PARAMETER IMPACT IDENTIFIC...

INTEGRATED CIRCUIT PRODUCT YIELD OPTIMIZATION USING THE RESULTS OF...

Run-to-Run Control Utilizing Virtual Metrology in Semiconductor Man...

Run-to-Run Control Utilizing Virtual Metrology in Semiconductor Man...

Method and Assembly for Determining and/or Producing a Drive or Par...

VALIDATION OF LABORATORY TEST DATA

DEVICE FOR SLICING A FOOD PRODUCT AND DEVICE WITH A ROBOT

ARCHITECTURE FOR ANALYSIS AND PREDICTION OF INTEGRATED TOOL-RELATED...

METHOD OF CONTROLLING SEMICONDUCTOR PROCESS DISTRIBUTION

PREDICTED FAULT ANALYSIS

PROCESS CONTROL USING PROCESS DATA AND YIELD DATA

Instrumental Support for Monitoring the Color Imprint in the Manufa...

Method and Assembly for Determining and/or Producing a Drive or Par...

Substrate Matrix To Decouple Tool And Process Effects

INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND P...

METHODS AND APPARATUS TO PREDICT PROCESS QUALITY IN A PROCESS CONT...

METHOD FOR MONITORING A PRODUCTION PROCESS

PROCESS CONTROL USING PROCESS DATA AND YIELD DATA