Crystals

Industry

CPC
G01N33/385

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N33/00Investigating or analysing materials by specific methods not covered by the preceding groups

Current Industry

G01N33/385Crystals

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Electron diffraction holography
- Patent number 11,906,450
- Issue date Feb 20, 2024
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron diffraction holography
- Patent number 11,460,419
- Issue date Oct 4, 2022
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Predicting sediment and sedimentary rock properties
- Patent number 10,725,012
- Issue date Jul 28, 2020
- GEOCOSM, LLC
- Robert H Lander
- G01 - MEASURING TESTING
Information Patent Grant
Predicting sediment and sedimentary rock properties
- Patent number 10,330,658
- Issue date Jun 25, 2019
- GEOCOSM, LLC
- Robert H Lander
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting sapphire structures and method of forming the...
- Patent number 9,863,927
- Issue date Jan 9, 2018
- Apple Inc.
- Dale N. Memering
- G01 - MEASURING TESTING
Information Patent Grant
Stress history measurement method and stress sensor
- Patent number 9,835,611
- Issue date Dec 5, 2017
- Japan Agency for Marine-Earth Science and Technology
- Arito Sakaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Orientation imaging using wide angle convergent beam diffraction in...
- Patent number 9,171,696
- Issue date Oct 27, 2015
- Vineet Kumar
- G01 - MEASURING TESTING
Information Patent Grant
Detection of one or more interstitial constituents in a polycrystal...
- Patent number 9,116,094
- Issue date Aug 25, 2015
- U.S. Synthetic Corporation
- Debkumar Mukhopadhyay
- B24 - GRINDING POLISHING
Information Patent Grant
Detection of one or more interstitial constituents in a polycrystal...
- Patent number 8,888,879
- Issue date Nov 18, 2014
- U.S. Synthetic Corporation
- Debkumar Mukhopadhyay
- C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information Patent Grant
Orientation imaging using wide angle convergent beam diffraction in...
- Patent number 8,748,817
- Issue date Jun 10, 2014
- Vineet Kumar
- G01 - MEASURING TESTING
Information Patent Grant
Frequency characterization of quartz crystals
- Patent number 7,113,051
- Issue date Sep 26, 2006
- Schlumberger Technology Corporation
- Ruvinda Gunawardana
- G01 - MEASURING TESTING
Information Patent Grant
Method and a device for determining the radiation-damage resistance...
- Patent number 6,734,970
- Issue date May 11, 2004
- Carl Zeiss Semiconductor Manufacturing Technologuies AG
- Hexin Wang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
QUANTUM SENSOR
- Publication number 20230341327
- Publication date Oct 26, 2023
- Endress+Hauser SE+Co. KG
- Mohammad Sadegh Ebrahimi
- G01 - MEASURING TESTING
Information Patent Application
QUALITY EVALUATION METHOD, MANUFACTURING SYSTEM OF SILICON FOR EVAL...
- Publication number 20230236165
- Publication date Jul 27, 2023
- Shin-Etsu Chemical Co., Ltd.
- Naruhiro HOSHINO
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
ELECTRON DIFFRACTION HOLOGRAPHY
- Publication number 20230003672
- Publication date Jan 5, 2023
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON DIFFRACTION HOLOGRAPHY
- Publication number 20210302333
- Publication date Sep 30, 2021
- FEI Company
- Alexander Henstra
- G01 - MEASURING TESTING
Information Patent Application
PREDICTING SEDIMENT AND SEDIMENTARY ROCK PROPERTIES
- Publication number 20190257810
- Publication date Aug 22, 2019
- Geocosm, L.L.C.
- Robert H. Lander
- G01 - MEASURING TESTING
Information Patent Application
STRESS HISTORY MEASUREMENT METHOD AND STRESS SENSOR
- Publication number 20160103114
- Publication date Apr 14, 2016
- Japan Agency for Marine-Earth Science and Technology
- Arito SAKAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING SAPPHIRE STRUCTURES AND METHOD OF FORMING THE...
- Publication number 20150226723
- Publication date Aug 13, 2015
- Apple Inc.
- Dale N. Memering
- G01 - MEASURING TESTING
Information Patent Application
ORIENTATION IMAGING USING WIDE ANGLE CONVERGENT BEAM DIFFRACTION IN...
- Publication number 20140346351
- Publication date Nov 27, 2014
- Vineet Kumar
- G01 - MEASURING TESTING
Information Patent Application
ORIENTATION IMAGING USING WIDE ANGLE CONVERGENT BEAM DIFFRACTION IN...
- Publication number 20120025073
- Publication date Feb 2, 2012
- Vineet Kumar
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY CHARACTERIZATION OF QUARTZ CRYSTALS
- Publication number 20050146244
- Publication date Jul 7, 2005
- RUVINDA GUNAWARDANA
- G01 - MEASURING TESTING
Information Patent Application
Method and a device for determining the radiation-damage resistance...
- Publication number 20030223065
- Publication date Dec 4, 2003
- CARL ZEISS SEMICONDUCTOR MANUFACTURING TECHNOLOGIES AG
- Hexin Wang
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Electron diffraction holography

Electron diffraction holography

Predicting sediment and sedimentary rock properties

Predicting sediment and sedimentary rock properties

Method of inspecting sapphire structures and method of forming the...

Stress history measurement method and stress sensor

Orientation imaging using wide angle convergent beam diffraction in...

Detection of one or more interstitial constituents in a polycrystal...

Detection of one or more interstitial constituents in a polycrystal...

Orientation imaging using wide angle convergent beam diffraction in...

Frequency characterization of quartz crystals

Method and a device for determining the radiation-damage resistance...

Patents Applicationslast 30 patents

QUANTUM SENSOR

QUALITY EVALUATION METHOD, MANUFACTURING SYSTEM OF SILICON FOR EVAL...

ELECTRON DIFFRACTION HOLOGRAPHY

ELECTRON DIFFRACTION HOLOGRAPHY

PREDICTING SEDIMENT AND SEDIMENTARY ROCK PROPERTIES

STRESS HISTORY MEASUREMENT METHOD AND STRESS SENSOR

METHOD OF INSPECTING SAPPHIRE STRUCTURES AND METHOD OF FORMING THE...

ORIENTATION IMAGING USING WIDE ANGLE CONVERGENT BEAM DIFFRACTION IN...

ORIENTATION IMAGING USING WIDE ANGLE CONVERGENT BEAM DIFFRACTION IN...

FREQUENCY CHARACTERIZATION OF QUARTZ CRYSTALS

Method and a device for determining the radiation-damage resistance...