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Current Industry

G11C2029/5006Current

Industries

Patents Grantslast 30 patents

Information Patent Grant
Method of determining defective die containing non-volatile memory...
- Patent number 12,020,762
- Issue date Jun 25, 2024
- Silicon Storage Technology, Inc.
- Yuri Tkachev
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of screening non-volatile memory cells
- Patent number 12,014,793
- Issue date Jun 18, 2024
- Silicon Storage Technology, Inc.
- Viktor Markov
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods for optimizing semiconductor device placement on a substrat...
- Patent number 11,929,139
- Issue date Mar 12, 2024
- Micron Technology, Inc.
- James S. Rehmeyer
- G11 - INFORMATION STORAGE
Information Patent Grant
Deterioration detection device
- Patent number 11,862,277
- Issue date Jan 2, 2024
- Samsung Electronics Co., Ltd.
- Youngduk Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device with leakage current verifying circuit for minimizing...
- Patent number 11,798,642
- Issue date Oct 24, 2023
- Winbond Electronics Corp.
- Koying Huang
- G11 - INFORMATION STORAGE
Information Patent Grant
Leakage detection circuit, nonvolatile memory device including leak...
- Patent number 11,791,007
- Issue date Oct 17, 2023
- SK hynix Inc.
- Byoung Sung You
- G11 - INFORMATION STORAGE
Information Patent Grant
NAND flash array defect real time detection
- Patent number 11,710,533
- Issue date Jul 25, 2023
- Micron Technology, Inc.
- Xiaojiang Guo
- G11 - INFORMATION STORAGE
Information Patent Grant
Metal isolation testing in the context of memory cells
- Patent number 11,631,682
- Issue date Apr 18, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Te-Hsin Chiu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of operating storage device for improving reliability, stora...
- Patent number 11,593,242
- Issue date Feb 28, 2023
- Samsung Electronics Co., Ltd.
- Kwangkyu Bang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems, methods, and apparatuses for temperature and process corne...
- Patent number 11,581,889
- Issue date Feb 14, 2023
- Micron Technology, Inc.
- Simon J. Lovett
- G11 - INFORMATION STORAGE
Information Patent Grant
NAND flash array defect real time detection
- Patent number 11,437,117
- Issue date Sep 6, 2022
- Micron Technology, Inc.
- Xiaojiang Guo
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-volatile memory array leakage detection
- Patent number 11,404,138
- Issue date Aug 2, 2022
- SanDisk Technologies LLC
- Aswani Krishna Lakshminarayana Addagalla
- G11 - INFORMATION STORAGE
Information Patent Grant
Voltage or current detector for a memory component
- Patent number 11,378,603
- Issue date Jul 5, 2022
- Micron Technology, Inc.
- Alberto Troia
- G11 - INFORMATION STORAGE
Information Patent Grant
Resistive memory device and reliability enhancement method thereof...
- Patent number 11,362,272
- Issue date Jun 14, 2022
- Winbond Electronics Corp.
- Ping-Kun Wang
- G11 - INFORMATION STORAGE
Information Patent Grant
Plate defect mitigation techniques
- Patent number 11,295,832
- Issue date Apr 5, 2022
- Micron Technology, Inc.
- Simon J. Lovett
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of improving read current stability in analog non-volatile m...
- Patent number 11,205,490
- Issue date Dec 21, 2021
- Silicon Storage Technology, Inc.
- Viktor Markov
- G11 - INFORMATION STORAGE
Information Patent Grant
Chip testing method for testing chips by chip testing system
- Patent number 11,193,971
- Issue date Dec 7, 2021
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Non-volatile memory with a well bias generation circuit
- Patent number 11,145,382
- Issue date Oct 12, 2021
- NXP USA, INC.
- Karthik Ramanan
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic field generator
- Patent number 11,139,099
- Issue date Oct 5, 2021
- Centre National de la Recherche Scientifique
- Isabelle Joumard
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device test system and semiconductor device test method
- Patent number 11,054,466
- Issue date Jul 6, 2021
- Samsung Electronics Co., Ltd.
- Sung-Gu Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-chip package
- Patent number 11,017,877
- Issue date May 25, 2021
- Samsung Electronics Co., Ltd.
- Dae Hoon Na
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory programming methods and memory systems
- Patent number 10,991,427
- Issue date Apr 27, 2021
- Micron Technology, Inc.
- Jonathan Strand
- G11 - INFORMATION STORAGE
Information Patent Grant
Error correction code event detection
- Patent number 10,949,300
- Issue date Mar 16, 2021
- Micron Technology, Inc.
- Yihua Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Voltage and temperature adaptive memory leakage reduction bias circuit
- Patent number 10,937,509
- Issue date Mar 2, 2021
- Mentor Graphics Corporation
- Kwan Him Lam
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device, operating method thereof, and memory s...
- Patent number 10,886,003
- Issue date Jan 5, 2021
- SK Hynix Inc.
- Jae Ho Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus for memory device testing and field applications
- Patent number 10,861,574
- Issue date Dec 8, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Baohua Niu
- G11 - INFORMATION STORAGE
Information Patent Grant
Array plate short repair
- Patent number 10,861,579
- Issue date Dec 8, 2020
- Micron Technology, Inc.
- Simon J. Lovett
- G11 - INFORMATION STORAGE
Information Patent Grant
Electronic device with semiconductor memory having increased read m...
- Patent number 10,861,540
- Issue date Dec 8, 2020
- SK hynix Inc.
- Hyuck-Sang Yim
- G11 - INFORMATION STORAGE
Information Patent Grant
Health monitoring for capacitor array in storage devices
- Patent number 10,818,370
- Issue date Oct 27, 2020
- SK Hynix Inc.
- Wenwei Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory storage apparatus and forming method of resistive memory dev...
- Patent number 10,770,167
- Issue date Sep 8, 2020
- Winbond Electronics Corp.
- Ping-Kun Wang
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
TIME DEPENDENT DIELECTRIC BREAKDOWN RELIABILITY TESTING OF A SRAM
- Publication number 20240203519
- Publication date Jun 20, 2024
- International Business Machines Corporation
- Giuseppe La Rosa
- G11 - INFORMATION STORAGE
Information Patent Application
METHODS FOR OPTIMIZING SEMICONDUCTOR DEVICE PLACEMENT ON A SUBSTRAT...
- Publication number 20240177743
- Publication date May 30, 2024
- Micron Technology, Inc.
- James S. Rehmeyer
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD OF SCREENING NON-VOLATILE MEMORY CELLS
- Publication number 20230335212
- Publication date Oct 19, 2023
- Silicon Storage Technology, Inc.
- Viktor Markov
- G11 - INFORMATION STORAGE
Information Patent Application
METAL ISOLATION TESTING IN THE CONTEXT OF MEMORY CELLS
- Publication number 20230255012
- Publication date Aug 10, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Te-Hsin Chiu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of Determining Defective Die Containing Non-volatile Memory...
- Publication number 20230101585
- Publication date Mar 30, 2023
- Silicon Storage Technology, Inc.
- Yuri Tkachev
- G11 - INFORMATION STORAGE
Information Patent Application
DETERIORATION DETECTION DEVICE
- Publication number 20230071135
- Publication date Mar 9, 2023
- Samsung Electronics Co., Ltd.
- Youngduk LEE
- G11 - INFORMATION STORAGE
Information Patent Application
METHODS FOR OPTIMIZING SEMICONDUCTOR DEVICE PLACEMENT ON A SUBSTRAT...
- Publication number 20230068666
- Publication date Mar 2, 2023
- Micron Technology, Inc.
- James S. Rehmeyer
- G11 - INFORMATION STORAGE
Information Patent Application
LEAKAGE DETECTION CIRCUIT, NONVOLATILE MEMORY DEVICE INCLUDING LEAK...
- Publication number 20230060971
- Publication date Mar 2, 2023
- SK HYNIX INC.
- Byoung Sung YOU
- G11 - INFORMATION STORAGE
Information Patent Application
WORDLINE SYSTEM ARCHITECTURE SUPPORTING ERASE OPERATION AND I-V CHA...
- Publication number 20230027165
- Publication date Jan 26, 2023
- GLOBALFOUNDRIES U.S. Inc.
- Ramesh RAGHAVAN
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE WITH LEAKAGE CURRENT VERIFYING CIRCUIT FOR MINIMIZING...
- Publication number 20220383966
- Publication date Dec 1, 2022
- WINBOND ELECTRONICS CORP.
- Koying HUANG
- G11 - INFORMATION STORAGE
Information Patent Application
NAND FLASH ARRAY DEFECT REAL TIME DETECTION
- Publication number 20220367000
- Publication date Nov 17, 2022
- Micron Technology, Inc.
- Xiaojiang Guo
- G11 - INFORMATION STORAGE
Information Patent Application
TEST BOARD
- Publication number 20220238176
- Publication date Jul 28, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Huipeng YANG
- G11 - INFORMATION STORAGE
Information Patent Application
VOLTAGE OR CURRENT DETECTOR FOR A MEMORY COMPONENT
- Publication number 20210405096
- Publication date Dec 30, 2021
- Micron Technology, Inc.
- Alberto Troia
- G11 - INFORMATION STORAGE
Information Patent Application
NAND FLASH ARRAY DEFECT REAL TIME DETECTION
- Publication number 20210375386
- Publication date Dec 2, 2021
- Micron Technology, Inc.
- Xiaojiang Guo
- G11 - INFORMATION STORAGE
Information Patent Application
ARRAY PLATE SHORT REPAIR
- Publication number 20210142862
- Publication date May 13, 2021
- Micron Technology, Inc.
- Simon J. Lovett
- G11 - INFORMATION STORAGE
Information Patent Application
Voltage and Temperature Adaptive Memory Leakage Reduction Bias Circuit
- Publication number 20210065821
- Publication date Mar 4, 2021
- Mentor Graphics Corporation
- Kwan Him Lam
- G11 - INFORMATION STORAGE
Information Patent Application
CHIP TESTING METHOD
- Publication number 20210018558
- Publication date Jan 21, 2021
- ONE TEST SYSTEMS
- CHEN-LUNG TSAI
- G01 - MEASURING TESTING
Information Patent Application
MEMORY STORAGE APPARATUS AND FORMING METHOD OF RESISTIVE MEMORY DEV...
- Publication number 20200265914
- Publication date Aug 20, 2020
- WINBOND ELECTRONICS CORP.
- Ping-Kun Wang
- G11 - INFORMATION STORAGE
Information Patent Application
METAL ISOLATION TESTING IN THE CONTEXT OF MEMORY CELLS
- Publication number 20200258892
- Publication date Aug 13, 2020
- Taiwan Semiconductor Manufacturing Co., LTD
- Te-Hsin Chiu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-CHIP PACKAGE
- Publication number 20200227131
- Publication date Jul 16, 2020
- Samsung Electronics Co., Ltd.
- Dae Hoon NA
- G11 - INFORMATION STORAGE
Information Patent Application
NON-VOLATILE MEMORY AND TESTING METHOD WITH YIELD IMPROVEMENT
- Publication number 20200160933
- Publication date May 21, 2020
- EMEMORY TECHNOLOGY INC.
- Wein-Town SUN
- G11 - INFORMATION STORAGE
Information Patent Application
ERROR CORRECTION CODE EVENT DETECTION
- Publication number 20200073754
- Publication date Mar 5, 2020
- Micron Technology, Inc.
- Yihua Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ARRAY PLATE SHORT REPAIR
- Publication number 20200013478
- Publication date Jan 9, 2020
- Micron Technology, Inc.
- Simon J. Lovett
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE, OPERATING METHOD THEREOF, AND MEMORY S...
- Publication number 20200005886
- Publication date Jan 2, 2020
- SK HYNIX INC.
- Jae Ho LEE
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR FAULT ANALYSIS DEVICE AND FAULT ANALYSIS METHOD THEREOF
- Publication number 20190385695
- Publication date Dec 19, 2019
- Samsung Electronics Co., Ltd.
- Changwook JEONG
- G01 - MEASURING TESTING
Information Patent Application
Enhancing Memory Yield and Performance Through Utilizing Nanowire S...
- Publication number 20190355437
- Publication date Nov 21, 2019
- Synopsys, Inc.
- JAMIL KAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTING METHOD FOR READING CURRENT OF STATIC RANDOM ACCESS MEMORY
- Publication number 20190341121
- Publication date Nov 7, 2019
- Shanghai Huali Integrated Circuit Mfg. Co., Ltd.
- Pinhan CHEN
- G11 - INFORMATION STORAGE
Information Patent Application
Logic Timing and Reliability Repair for Nanowire Circuits
- Publication number 20190333600
- Publication date Oct 31, 2019
- Synopsys, Inc.
- JAMIL KAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DYNAMIC POWER ANALYSIS WITH PER-MEMORY INSTANCE ACTIVITY CUSTOMIZATION
- Publication number 20190295676
- Publication date Sep 26, 2019
- GLOBALFOUNDRIES INC.
- Igor ARSOVSKI
- G11 - INFORMATION STORAGE
Information Patent Application
RESISTIVE MEMORY DEVICE AND OPERATING METHOD THEREOF
- Publication number 20190279709
- Publication date Sep 12, 2019
- SK HYNIX INC.
- Jae-Yeon LEE
- G11 - INFORMATION STORAGE

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method of determining defective die containing non-volatile memory...

Method of screening non-volatile memory cells

Methods for optimizing semiconductor device placement on a substrat...

Deterioration detection device

Memory device with leakage current verifying circuit for minimizing...

Leakage detection circuit, nonvolatile memory device including leak...

NAND flash array defect real time detection

Metal isolation testing in the context of memory cells

Method of operating storage device for improving reliability, stora...

Systems, methods, and apparatuses for temperature and process corne...

NAND flash array defect real time detection

Non-volatile memory array leakage detection

Voltage or current detector for a memory component

Resistive memory device and reliability enhancement method thereof...

Plate defect mitigation techniques

Method of improving read current stability in analog non-volatile m...

Chip testing method for testing chips by chip testing system

Non-volatile memory with a well bias generation circuit

Magnetic field generator

Semiconductor device test system and semiconductor device test method

Multi-chip package

Memory programming methods and memory systems

Error correction code event detection

Voltage and temperature adaptive memory leakage reduction bias circuit

Semiconductor memory device, operating method thereof, and memory s...

Apparatus for memory device testing and field applications

Array plate short repair

Electronic device with semiconductor memory having increased read m...

Health monitoring for capacitor array in storage devices

Memory storage apparatus and forming method of resistive memory dev...

Patents Applicationslast 30 patents

TIME DEPENDENT DIELECTRIC BREAKDOWN RELIABILITY TESTING OF A SRAM

METHODS FOR OPTIMIZING SEMICONDUCTOR DEVICE PLACEMENT ON A SUBSTRAT...

METHOD OF SCREENING NON-VOLATILE MEMORY CELLS

METAL ISOLATION TESTING IN THE CONTEXT OF MEMORY CELLS

Method of Determining Defective Die Containing Non-volatile Memory...

DETERIORATION DETECTION DEVICE

METHODS FOR OPTIMIZING SEMICONDUCTOR DEVICE PLACEMENT ON A SUBSTRAT...

LEAKAGE DETECTION CIRCUIT, NONVOLATILE MEMORY DEVICE INCLUDING LEAK...

WORDLINE SYSTEM ARCHITECTURE SUPPORTING ERASE OPERATION AND I-V CHA...

MEMORY DEVICE WITH LEAKAGE CURRENT VERIFYING CIRCUIT FOR MINIMIZING...

NAND FLASH ARRAY DEFECT REAL TIME DETECTION

TEST BOARD

VOLTAGE OR CURRENT DETECTOR FOR A MEMORY COMPONENT

NAND FLASH ARRAY DEFECT REAL TIME DETECTION

ARRAY PLATE SHORT REPAIR

Voltage and Temperature Adaptive Memory Leakage Reduction Bias Circuit

CHIP TESTING METHOD

MEMORY STORAGE APPARATUS AND FORMING METHOD OF RESISTIVE MEMORY DEV...

METAL ISOLATION TESTING IN THE CONTEXT OF MEMORY CELLS

MULTI-CHIP PACKAGE

NON-VOLATILE MEMORY AND TESTING METHOD WITH YIELD IMPROVEMENT

ERROR CORRECTION CODE EVENT DETECTION

ARRAY PLATE SHORT REPAIR

SEMICONDUCTOR MEMORY DEVICE, OPERATING METHOD THEREOF, AND MEMORY S...

SEMICONDUCTOR FAULT ANALYSIS DEVICE AND FAULT ANALYSIS METHOD THEREOF

Enhancing Memory Yield and Performance Through Utilizing Nanowire S...

TESTING METHOD FOR READING CURRENT OF STATIC RANDOM ACCESS MEMORY

Logic Timing and Reliability Repair for Nanowire Circuits

DYNAMIC POWER ANALYSIS WITH PER-MEMORY INSTANCE ACTIVITY CUSTOMIZATION

RESISTIVE MEMORY DEVICE AND OPERATING METHOD THEREOF