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Automatic analysis device
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Patent number 11,073,526
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Issue date Jul 27, 2021
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HITACHI HIGH-TECH CORPORATION
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Akira Joji
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G01 - MEASURING TESTING
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Sample plate systems and methods
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Patent number 10,969,386
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Issue date Apr 6, 2021
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Dynex Technologies, Inc.
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Adrian Bunce
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B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Sample plate systems and methods
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Patent number 10,207,268
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Issue date Feb 19, 2019
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Dynex Technologies, Inc.
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Adrian Bunce
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B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Sample plate systems and methods
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Patent number 9,857,367
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Issue date Jan 2, 2018
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Dynex Technologies, Inc.
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Adrian Bunce
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B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Sample plate systems and methods
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Patent number 9,523,701
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Issue date Dec 20, 2016
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Dynex Technologies, Inc.
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Adrian Bunce
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B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Automatic analyzer
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Patent number 8,278,108
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Issue date Oct 2, 2012
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Hitachi High-Technologies Corporation
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Kentaro Wada
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G01 - MEASURING TESTING
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Slidable autosampler tray
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Patent number 8,262,993
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Issue date Sep 11, 2012
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Elemental Scientific, Inc.
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Daniel R. Wiederin
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G01 - MEASURING TESTING
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Automated sampling device
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Patent number 7,469,606
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Issue date Dec 30, 2008
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Elemental Scientific, Inc.
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Daniel R. Wiederin
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G01 - MEASURING TESTING
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Centrifugal separator
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Patent number 7,150,858
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Issue date Dec 19, 2006
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ARKRAY, Inc.
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Takeshi Matsuda
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B04 - CENTRIFUGAL APPARATUS OR MACHINES FOR CARRYING-OUT PHYSICAL OR CHEMICAL...
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Microarrayer
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Patent number 6,692,701
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Issue date Feb 17, 2004
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V & P Scientific, Inc.
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Patrick H. Cleveland
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G01 - MEASURING TESTING