Dark field detection

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CPC
G01N2021/8822

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/8822Dark field detection

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Patents Grantslast 30 patents

Information Patent Grant
Dark-field confocal microscopic measurement apparatus and method ba...
- Patent number 12,216,264
- Issue date Feb 4, 2025
- Harbin Institute of Technology
- Jian Liu
- G01 - MEASURING TESTING
Information Patent Grant
Vortex dichroism dark-field confocal microscopy measurement apparat...
- Patent number 12,196,686
- Issue date Jan 14, 2025
- Harbin Institute of Technology
- Jian Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting abnormal growth of graphene
- Patent number 12,163,898
- Issue date Dec 10, 2024
- Tokyo Electron Limited
- Ryota Ifuku
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
Laser based inclusion detection system and methods
- Patent number 12,152,999
- Issue date Nov 26, 2024
- Corning Incorporated
- Souma Chaudhury
- G01 - MEASURING TESTING
Information Patent Grant
Method and device determining soiling of a shield
- Patent number 12,099,019
- Issue date Sep 24, 2024
- OTT HydroMet B.V.
- Xander Olivier Van Mechelen
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Dark-field optical inspection device
- Patent number 11,965,834
- Issue date Apr 23, 2024
- UNITY SEMICONDUCTOR
- Mayeul Durand De Gevigney
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for rotating an optical objective
- Patent number 11,733,172
- Issue date Aug 22, 2023
- KLA Corporation
- Anatoly Romanovsky
- G01 - MEASURING TESTING
Information Patent Grant
Metrology method and apparatus, substrate, lithographic system and...
- Patent number 11,526,085
- Issue date Dec 13, 2022
- ASML Netherlands B.V.
- Hendrik Jan Hidde Smilde
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Scanning scatterometry overlay measurement
- Patent number 11,428,642
- Issue date Aug 30, 2022
- KLA Corporation
- Andrew V. Hill
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for photomultiplier tube image correction
- Patent number 11,361,951
- Issue date Jun 14, 2022
- KLA Corporation
- Derek Mackay
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sensitive particle detection with spatially-varying polarization ro...
- Patent number 11,243,175
- Issue date Feb 8, 2022
- KLA Corporation
- Xuefeng Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Passivation of nonlinear optical crystals
- Patent number 11,227,770
- Issue date Jan 18, 2022
- KLA Corporation
- Yung-Ho Alex Chuang
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method and device determining soiling of a shield
- Patent number 11,181,485
- Issue date Nov 23, 2021
- OTT HydroMet B.V.
- Xander Olivier Van Mechelen
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Surface inspection system and method using multiple light sources a...
- Patent number 11,169,095
- Issue date Nov 9, 2021
- BOBST MEX SA
- Matthieu Richard
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting a transparent cylinder
- Patent number 11,125,699
- Issue date Sep 21, 2021
- Becton Dickinson France
- Arnaud Grandvuillemin
- G01 - MEASURING TESTING
Information Patent Grant
Image acquisition apparatus and image acquisition method
- Patent number 11,054,625
- Issue date Jul 6, 2021
- TOSHIBA MEMORY CORPORATION
- Takeshi Yamane
- G02 - OPTICS
Information Patent Grant
Inspection information generation device, inspection information ge...
- Patent number 11,041,815
- Issue date Jun 22, 2021
- HITACHI HIGH-TECH CORPORATION
- Takahiro Urano
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection system and surface inspection method
- Patent number 11,022,553
- Issue date Jun 1, 2021
- BOBST MEX SA
- Matthieu Richard
- G01 - MEASURING TESTING
Information Patent Grant
Darkfield modeling
- Patent number 10,984,209
- Issue date Apr 20, 2021
- Invensense, Inc.
- Sina Akhbari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sensitive particle detection with spatially-varying polarization ro...
- Patent number 10,948,423
- Issue date Mar 16, 2021
- KLA Corporation
- Xuefeng Liu
- G01 - MEASURING TESTING
Information Patent Grant
Radial polarizer for particle detection
- Patent number 10,942,135
- Issue date Mar 9, 2021
- KLA Corporation
- Jenn-Kuen Leong
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection system
- Patent number 10,887,500
- Issue date Jan 5, 2021
- Hong Kong Applied Science and Technology Research Institute Co., Ltd.
- Changli Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for optically inspecting a mold for manufactur...
- Patent number 10,867,379
- Issue date Dec 15, 2020
- Alcon Inc.
- Fabian Etzold
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Appearance inspection apparatus and appearance inspection method
- Patent number 10,803,572
- Issue date Oct 13, 2020
- JTEKT Corporation
- Jiro Umehara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection method for semiconductor substrates using slope data and...
- Patent number 10,782,242
- Issue date Sep 22, 2020
- Infineon Technologies AG
- Robert Muhr
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Metrology method and apparatus, substrate, lithographic system and...
- Patent number 10,739,687
- Issue date Aug 11, 2020
- ASML Netherlands B.V.
- Hendrik Jan Hidde Smilde
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for focusing in an inspection system
- Patent number 10,724,961
- Issue date Jul 28, 2020
- ASML Holding N.V.
- Yevgeniy Konstantinovich Shmarev
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Surface defect detecting method and surface defect detecting apparatus
- Patent number 10,705,027
- Issue date Jul 7, 2020
- JFE Steel Corporation
- Hiroaki Ono
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detecting die repeating programmed defects located in backgrounds w...
- Patent number 10,677,742
- Issue date Jun 9, 2020
- KLA-Tencor Corp.
- Dhiraj Ramesh Gawhane
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting a transparent cylinder
- Patent number 10,663,409
- Issue date May 26, 2020
- Becton Dickinson France
- Arnaud Grandvuillemin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DUAL LENS INSPECTION DEVICE
- Publication number 20250052690
- Publication date Feb 13, 2025
- SUN YANG OPTICS DEVELOPMENT CO., LTD.
- SHENG CHE WU
- G01 - MEASURING TESTING
Information Patent Application
SURFACE INSPECTION APPARATUS
- Publication number 20250012732
- Publication date Jan 9, 2025
- HITACHI HIGH-TECH CORPORATION
- Toshifumi HONDA
- G01 - MEASURING TESTING
Information Patent Application
DARK-FIELD CONFOCAL MICROSCOPIC MEASUREMENT APPARATUS AND METHOD BA...
- Publication number 20240329377
- Publication date Oct 3, 2024
- HARBIN INSTITUTE OF TECHNOLOGY
- Jian Liu
- G01 - MEASURING TESTING
Information Patent Application
ELECTRODE PLATE INSPECTION METHOD, METHOD FOR FABRICATING POWER STO...
- Publication number 20240302275
- Publication date Sep 12, 2024
- Prime Planet Energy & Solutions, Inc.
- Tomomichi YAMAZAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH CLARITY GEMSTONE FACET AND INTERNAL IMAGING ANALYSIS
- Publication number 20240102937
- Publication date Mar 28, 2024
- GEMOLOGICAL INSTITUTE OF AMERICA, INC. (GIA)
- Tsung-Han TSAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPOSITIONS AND METHODS FOR THE DETECTION AND MOLECULAR PROFILING...
- Publication number 20230324376
- Publication date Oct 12, 2023
- THE UNIVERSITY OF MEMPHIS RESEARCH FOUNDATION
- Xiaohua HUANG
- G01 - MEASURING TESTING
Information Patent Application
DARK FIELD ILLUMINATION BASED ON LASER ILLUMINATED PHOSPHOR
- Publication number 20230251198
- Publication date Aug 10, 2023
- Camtek LTD.
- Amnon Menachem
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING LASER DEFECT INSIDE OF TRANSPAR...
- Publication number 20230221261
- Publication date Jul 13, 2023
- Corning Incorporated
- Chong Pyung An
- G01 - MEASURING TESTING
Information Patent Application
LASER BASED INCLUSION DETECTION SYSTEM AND METHODS
- Publication number 20230020684
- Publication date Jan 19, 2023
- Corning Incorporated
- Souma Chaudhury
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD
- Publication number 20230018318
- Publication date Jan 19, 2023
- NuFlare Technology, Inc.
- Ryoichi HIRANO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Dark-Field Microscopy Imaging Apparatus
- Publication number 20220365000
- Publication date Nov 17, 2022
- Brookhaven Science Associates, LLC
- Mingzhao Liu
- G01 - MEASURING TESTING
Information Patent Application
SCANNING SCATTEROMETRY OVERLAY MEASUREMENT
- Publication number 20220214285
- Publication date Jul 7, 2022
- KLA Corporation
- Andrew V. Hill
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING ABNORMAL GROWTH OF GRAPHENE
- Publication number 20220155242
- Publication date May 19, 2022
- TOKYO ELECTRON LIMITED
- Ryota IFUKU
- C01 - INORGANIC CHEMISTRY
Information Patent Application
APPARATUS AND METHOD FOR ROTATING AN OPTICAL OBJECTIVE
- Publication number 20210356406
- Publication date Nov 18, 2021
- Anatoly Romanovsky
- G01 - MEASURING TESTING
Information Patent Application
DARK-FIELD OPTICAL INSPECTING DEVICE
- Publication number 20210349037
- Publication date Nov 11, 2021
- Unity Semiconductor
- Mayeul DURAND DE GEVIGNEY
- G01 - MEASURING TESTING
Information Patent Application
SENSITIVE PARTICLE DETECTION WITH SPATIALLY-VARYING POLARIZATION RO...
- Publication number 20210164918
- Publication date Jun 3, 2021
- KLA Corporation
- Xuefeng Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR PHOTOMULTIPLIER TUBE IMAGE CORRECTION
- Publication number 20210104388
- Publication date Apr 8, 2021
- KLA Corporation
- Derek Mackay
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY METHOD AND APPARATUS, SUBSTRATE, LITHOGRAPHIC SYSTEM AND...
- Publication number 20200379359
- Publication date Dec 3, 2020
- ASML NETHERLANDS B.V.
- Hendrik Jan Hidde SMILDE
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Inspecting a Transparent Cylinder
- Publication number 20200232935
- Publication date Jul 23, 2020
- BECTON DICKINSON FRANCE
- Arnaud Grandvuillemin
- G01 - MEASURING TESTING
Information Patent Application
Radial Polarizer for Particle Detection
- Publication number 20200150054
- Publication date May 14, 2020
- KLA Corporation
- Jenn-Kuen Leong
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR OPTICALLY INSPECTING A MOLD FOR MANUFACTUR...
- Publication number 20200051233
- Publication date Feb 13, 2020
- Alcon Inc.
- Fabian ETZOLD
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
INSPECTION OF COMPONENTS FOR IMPERFECTIONS
- Publication number 20190339208
- Publication date Nov 7, 2019
- Redlux Limited
- John Michael NESBITT
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LASER-BASED FOURIER PTYCHOGRAPHIC IMAGING SYSTEMS AND METHODS
- Publication number 20190331902
- Publication date Oct 31, 2019
- California Institute of Technology
- Xiaoze Ou
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SURFACE INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20190178812
- Publication date Jun 13, 2019
- BOBST MEX SA
- Matthieu RICHARD
- G01 - MEASURING TESTING
Information Patent Application
Inspection Method for Semiconductor Substrates Using Slope Data and...
- Publication number 20190178808
- Publication date Jun 13, 2019
- Robert Muhr
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DARKFIELD MODELING
- Publication number 20190180069
- Publication date Jun 13, 2019
- InvenSense, Inc.
- Sina AKHBARI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION INFORMATION GENERATION DEVICE, INSPECTION INFORMATION GE...
- Publication number 20190154593
- Publication date May 23, 2019
- Hitachi High-Technologies Corporation
- Takahiro URANO
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY METHOD AND APPARATUS, SUBSTRATE, LITHOGRAPHIC SYSTEM AND...
- Publication number 20190094712
- Publication date Mar 28, 2019
- ASML NETHERLANDS B.V.
- Hendrik Jan Hidde SMILDE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SURFACE DEFECT DETECTING METHOD AND SURFACE DEFECT DETECTING APPARATUS
- Publication number 20190011375
- Publication date Jan 10, 2019
- JFE STEEL CORPORATION
- Hiroaki Ono
- G01 - MEASURING TESTING
Information Patent Application
INTRAOCULAR LENS INSPECTION
- Publication number 20180306732
- Publication date Oct 25, 2018
- EMAGE VISION PTE. LTD.
- Sergey Smorgon
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Dark field detection

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Dark-field confocal microscopic measurement apparatus and method ba...

Vortex dichroism dark-field confocal microscopy measurement apparat...

Method and apparatus for detecting abnormal growth of graphene

Laser based inclusion detection system and methods

Method and device determining soiling of a shield

Dark-field optical inspection device

Apparatus and method for rotating an optical objective

Metrology method and apparatus, substrate, lithographic system and...

Scanning scatterometry overlay measurement

System and method for photomultiplier tube image correction

Sensitive particle detection with spatially-varying polarization ro...

Passivation of nonlinear optical crystals

Method and device determining soiling of a shield

Surface inspection system and method using multiple light sources a...

System and method for inspecting a transparent cylinder

Image acquisition apparatus and image acquisition method

Inspection information generation device, inspection information ge...

Surface inspection system and surface inspection method

Darkfield modeling

Sensitive particle detection with spatially-varying polarization ro...

Radial polarizer for particle detection

Optical inspection system

Method and apparatus for optically inspecting a mold for manufactur...

Appearance inspection apparatus and appearance inspection method

Inspection method for semiconductor substrates using slope data and...

Metrology method and apparatus, substrate, lithographic system and...

Method and device for focusing in an inspection system

Surface defect detecting method and surface defect detecting apparatus

Detecting die repeating programmed defects located in backgrounds w...

System and method for inspecting a transparent cylinder

Patents Applicationslast 30 patents

DUAL LENS INSPECTION DEVICE

SURFACE INSPECTION APPARATUS

DARK-FIELD CONFOCAL MICROSCOPIC MEASUREMENT APPARATUS AND METHOD BA...

ELECTRODE PLATE INSPECTION METHOD, METHOD FOR FABRICATING POWER STO...

HIGH CLARITY GEMSTONE FACET AND INTERNAL IMAGING ANALYSIS

COMPOSITIONS AND METHODS FOR THE DETECTION AND MOLECULAR PROFILING...

DARK FIELD ILLUMINATION BASED ON LASER ILLUMINATED PHOSPHOR

APPARATUS AND METHOD FOR INSPECTING LASER DEFECT INSIDE OF TRANSPAR...

LASER BASED INCLUSION DETECTION SYSTEM AND METHODS

PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD

Dark-Field Microscopy Imaging Apparatus

SCANNING SCATTEROMETRY OVERLAY MEASUREMENT

METHOD AND APPARATUS FOR DETECTING ABNORMAL GROWTH OF GRAPHENE

APPARATUS AND METHOD FOR ROTATING AN OPTICAL OBJECTIVE

DARK-FIELD OPTICAL INSPECTING DEVICE

SENSITIVE PARTICLE DETECTION WITH SPATIALLY-VARYING POLARIZATION RO...

SYSTEM AND METHOD FOR PHOTOMULTIPLIER TUBE IMAGE CORRECTION

METROLOGY METHOD AND APPARATUS, SUBSTRATE, LITHOGRAPHIC SYSTEM AND...

System and Method for Inspecting a Transparent Cylinder

Radial Polarizer for Particle Detection

METHOD AND APPARATUS FOR OPTICALLY INSPECTING A MOLD FOR MANUFACTUR...

INSPECTION OF COMPONENTS FOR IMPERFECTIONS

LASER-BASED FOURIER PTYCHOGRAPHIC IMAGING SYSTEMS AND METHODS

SURFACE INSPECTION SYSTEM AND INSPECTION METHOD

Inspection Method for Semiconductor Substrates Using Slope Data and...

DARKFIELD MODELING

INSPECTION INFORMATION GENERATION DEVICE, INSPECTION INFORMATION GE...

METROLOGY METHOD AND APPARATUS, SUBSTRATE, LITHOGRAPHIC SYSTEM AND...

SURFACE DEFECT DETECTING METHOD AND SURFACE DEFECT DETECTING APPARATUS

INTRAOCULAR LENS INSPECTION