Determining coordinates of flaws

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G01N2021/8861

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

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G01N2021/8861Determining coordinates of flaws

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Patents Grantslast 30 patents

Information Patent Grant
Broadband wafer defect detection
- Patent number 12,158,434
- Issue date Dec 3, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Nai-Han Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Information processing apparatus, information processing method, an...
- Patent number 12,072,297
- Issue date Aug 27, 2024
- Canon Kabushiki Kaisha
- Shoichi Hoshino
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer surface defect inspection method and apparatus thereof
- Patent number 12,044,631
- Issue date Jul 23, 2024
- GlobalWafers Co., Ltd.
- Shang-Chi Wang
- G01 - MEASURING TESTING
Information Patent Grant
Defective part recognition device and defective part recognition me...
- Patent number 11,953,447
- Issue date Apr 9, 2024
- V Technology Co., Ltd.
- Michinobu Mizumura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Prediction device for predicting a growth direction of a crack in a...
- Patent number 11,913,889
- Issue date Feb 27, 2024
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yuki Maruyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for determining the location of artefacts and/or...
- Patent number 11,898,962
- Issue date Feb 13, 2024
- The Australian National University
- Roland Fleddermann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection device articulation transformation based on image transf...
- Patent number 11,900,590
- Issue date Feb 13, 2024
- Baker Hughes Holdings LLC
- Clark A. Bendall
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Broadband wafer defect detection
- Patent number 11,852,593
- Issue date Dec 26, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Nai-Han Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for inspecting repair or assembly operations
- Patent number 11,828,711
- Issue date Nov 28, 2023
- Virtek Vision International Inc.
- Kurt D. Rueb
- G01 - MEASURING TESTING
Information Patent Grant
Smart coordinate conversion and calibration system in semiconductor...
- Patent number 11,774,372
- Issue date Oct 3, 2023
- Elite Semiconductor Inc.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Smart coordinate conversion and calibration system in semiconductor...
- Patent number 11,774,373
- Issue date Oct 3, 2023
- Elite Semiconductor Inc.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Smart defect calibration system in semiconductor wafer manufacturing
- Patent number 11,761,904
- Issue date Sep 19, 2023
- Elite Semiconductor Inc.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for optimizing inspection of exterior of target object an...
- Patent number 11,747,284
- Issue date Sep 5, 2023
- Koh Young Technology Inc.
- Jin Man Kang
- G01 - MEASURING TESTING
Information Patent Grant
Setting up inspection of a specimen
- Patent number 11,748,872
- Issue date Sep 5, 2023
- KLA Corp.
- Hong Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Information processing apparatus, information processing method, an...
- Patent number 11,733,174
- Issue date Aug 22, 2023
- Canon Kabushiki Kaisha
- Kei Takayama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for performing smart semiconductor wafer defect calibration
- Patent number 11,719,650
- Issue date Aug 8, 2023
- Elite Semiconductor Inc.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for smart conversion and calibration of coordinate
- Patent number 11,719,649
- Issue date Aug 8, 2023
- Elite Semiconductor Inc.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for smart conversion and calibration of coordinate
- Patent number 11,719,648
- Issue date Aug 8, 2023
- Elite Semiconductor Inc.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image inspection apparatus
- Patent number 11,423,528
- Issue date Aug 23, 2022
- Keyence Corporation
- Koji Takahashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Information processing apparatus related to machine learning for de...
- Patent number 11,378,522
- Issue date Jul 5, 2022
- Canon Kabushiki Kaisha
- Shoichi Hoshino
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection method and defect inspection device
- Patent number 11,313,806
- Issue date Apr 26, 2022
- The Yokohama Rubber Co., LTD.
- Hirotaro Tada
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting wafer backside defect
- Patent number 11,307,151
- Issue date Apr 19, 2022
- Shanghai Huali Integrated Circuit Corporation
- Zengyi Yuan
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for automatically identifying a point of interest...
- Patent number 11,308,343
- Issue date Apr 19, 2022
- Baker Hughes, a GE company, LLC
- Clark A. Bendall
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for optimizing inspection of exterior of target object an...
- Patent number 11,268,910
- Issue date Mar 8, 2022
- Koh Young Technology Inc.
- Jin Man Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection device
- Patent number 11,143,600
- Issue date Oct 12, 2021
- HITACHI HIGH-TECH CORPORATION
- Toshifumi Honda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High accuracy of relative defect locations for repeater analysis
- Patent number 11,067,516
- Issue date Jul 20, 2021
- KLA-Tencor Corp.
- Shishir Suman
- G01 - MEASURING TESTING
Information Patent Grant
Broadband wafer defect detection
- Patent number 11,060,980
- Issue date Jul 13, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Nai-Han Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Smart defect calibration system and the method thereof
- Patent number 11,016,035
- Issue date May 25, 2021
- Elite Semiconductor Inc.
- Iyun Leu
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing an OSB
- Patent number 10,955,357
- Issue date Mar 23, 2021
- SWISS KRONO TEC AG
- Norbert Kalwa
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for automatically detecting fabric defect, and co...
- Patent number 10,942,133
- Issue date Mar 9, 2021
- The Hong Kong Research Institute of Textiles and Apparel Limited
- Wai Keung Wong
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OVERLAY MEASUREMENT APPARATUS AND OVERLAY MEASUREMENT METHOD
- Publication number 20240410835
- Publication date Dec 12, 2024
- AUROS Technology, Inc.
- Seong Yun CHOI
- G01 - MEASURING TESTING
Information Patent Application
VISUAL INSPECTION APPARATUS AND VISUAL INSPECTION METHOD
- Publication number 20240353347
- Publication date Oct 24, 2024
- Hitachi Astemo, Ltd.
- Shinichi INOUE
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20240337603
- Publication date Oct 10, 2024
- Lasertec Corporation
- Shota FUJIKI
- G01 - MEASURING TESTING
Information Patent Application
UTILIZATION OF IMAGE ANALYTICS TO DETECT ABNORMALITIES ON FAN BLADE...
- Publication number 20240264092
- Publication date Aug 8, 2024
- Raytheon Technologies Corporation
- Jeremiah C. Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR ELECTROMAGNETIC MONITORING OF ACTIVE CRACKS I...
- Publication number 20240219311
- Publication date Jul 4, 2024
- TSINGHUA UNIVERSITY
- Songling Huang
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE DEFECT ANALYSIS
- Publication number 20240175824
- Publication date May 30, 2024
- Applied Materials, Inc.
- Seng Keong Lim
- G01 - MEASURING TESTING
Information Patent Application
CLASSIFICATION OF DEFECT PATTERNS OF SUBSTRATES
- Publication number 20240144464
- Publication date May 2, 2024
- Applied Materials, Inc.
- Chandrani Roy Chowdhury
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and System for Determining the Location of Artefacts and/or...
- Publication number 20240133822
- Publication date Apr 25, 2024
- The Australian National University
- Roland Fleddermann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION DEVICE ARTICULATION TRANSFORMATION BASED ON IMAGE TRANSF...
- Publication number 20240112328
- Publication date Apr 4, 2024
- Baker Hughes Holdings LLC
- Clark A. Bendall
- G01 - MEASURING TESTING
Information Patent Application
LIGHT-BASED FAULT DETECTION FOR PHYSICAL COMPONENTS
- Publication number 20240102939
- Publication date Mar 28, 2024
- Apple Inc.
- Mikael B. MANNBERG
- G01 - MEASURING TESTING
Information Patent Application
PRINTED-MATTER INSPECTION SYSTEM AND NON-TRANSITORY COMPUTER READAB...
- Publication number 20240094138
- Publication date Mar 21, 2024
- FUJIFILM Business Innovation Corp.
- Yoshie OHIRA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
DEFECT REMOVAL DEVICE, DEFECT REMOVAL METHOD, PATTERN FORMING METHO...
- Publication number 20230395366
- Publication date Dec 7, 2023
- FUJIFILM CORPORATION
- Akihiko OHTSU
- G01 - MEASURING TESTING
Information Patent Application
Foreign Substance Detection Device and Detection Method
- Publication number 20230358688
- Publication date Nov 9, 2023
- LG ENERGY SOLUTION, LTD.
- Jeong Ho Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR PROCESSING SEMICONDUCTOR WAFERS USING FRONT...
- Publication number 20230050442
- Publication date Feb 16, 2023
- GLOBALWAFERS CO., LTD.
- Yung Hsing Chu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFECT POSITION DETERMINATION SYSTEM, APPEARANCE INSPECTION METHOD...
- Publication number 20220392057
- Publication date Dec 8, 2022
- NEC Corporation
- Yuka OSHIMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SURFACE DEFECT MONITORING SYSTEM
- Publication number 20220373473
- Publication date Nov 24, 2022
- NOVI LLC
- Scott Steffan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...
- Publication number 20220373475
- Publication date Nov 24, 2022
- Canon Kabushiki Kaisha
- Shoichi Hoshino
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER SURFACE DEFECT INSPECTION METHOD AND APPARATUS THEREOF
- Publication number 20220307991
- Publication date Sep 29, 2022
- GLOBALWAFERS CO., LTD.
- Shang-Chi Wang
- G01 - MEASURING TESTING
Information Patent Application
DEFECTIVE PART RECOGNITION DEVICE AND DEFECTIVE PART RECOGNITION ME...
- Publication number 20220291136
- Publication date Sep 15, 2022
- V TECHNOLOGY CO., LTD.
- Michinobu MIZUMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS FOR OPTIMIZING INSPECTION OF EXTERIOR OF TARGET OBJECT AN...
- Publication number 20220178841
- Publication date Jun 9, 2022
- KOH YOUNG TECHNOLOGY INC.
- Jin Man KANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION DEVICE ARTICULATION TRANSFORMATION BASED ON IMAGE TRANSF...
- Publication number 20220122242
- Publication date Apr 21, 2022
- Baker Hughes Holdings LLC
- Clark A. Bendall
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...
- Publication number 20220113261
- Publication date Apr 14, 2022
- Canon Kabushiki Kaisha
- Kei Takayama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR INSPECTING REPAIR OR ASSEMBLY OPERATIONS
- Publication number 20220113259
- Publication date Apr 14, 2022
- VIRTEK VISION INTERNATIONAL, ULC
- Kurt D. Rueb
- G01 - MEASURING TESTING
Information Patent Application
QUALITATIVE OR QUANTITATIVE CHARACTERIZATION OF A COATING SURFACE
- Publication number 20220084181
- Publication date Mar 17, 2022
- Evonik Operations GmbH
- Philipp ISKEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Setting Up Inspection of a Specimen
- Publication number 20220067898
- Publication date Mar 3, 2022
- KLA Corporation
- Hong Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ABNORMALITY DETECTING METHOD AND ABNORMALITY DETECTING APPARATUS
- Publication number 20220018790
- Publication date Jan 20, 2022
- TOKYO ELECTRON LIMITED
- Yuka NAKASATO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR GRADING AND STACKING VENEER STRIPS USING NEAR...
- Publication number 20210319548
- Publication date Oct 14, 2021
- BOISE CASCADE COMPANY
- David Bolton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR EVALUATING DEFECTIVE REGION OF WAFER
- Publication number 20210320037
- Publication date Oct 14, 2021
- SK SILTRON CO., LTD.
- Jae Hyeong LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND PLANTS FOR LOCATING POINTS ON COMPLEX SURFACES
- Publication number 20210255117
- Publication date Aug 19, 2021
- GEICO S.p.A.
- Paolo COLOMBAROLI
- G01 - MEASURING TESTING
Information Patent Application
SMART COORDINATE CONVERSION AND CALIBRATION SYSTEM IN SEMICONDUCTOR...
- Publication number 20210231582
- Publication date Jul 29, 2021
- ELITE SEMICONDUCTOR INC.
- IYUN LEU
- G01 - MEASURING TESTING

Determining coordinates of flaws

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Broadband wafer defect detection

Information processing apparatus, information processing method, an...

Wafer surface defect inspection method and apparatus thereof

Defective part recognition device and defective part recognition me...

Prediction device for predicting a growth direction of a crack in a...

Method and system for determining the location of artefacts and/or...

Inspection device articulation transformation based on image transf...

Broadband wafer defect detection

Method and system for inspecting repair or assembly operations

Smart coordinate conversion and calibration system in semiconductor...

Smart coordinate conversion and calibration system in semiconductor...

Smart defect calibration system in semiconductor wafer manufacturing

Apparatus for optimizing inspection of exterior of target object an...

Setting up inspection of a specimen

Information processing apparatus, information processing method, an...

Method for performing smart semiconductor wafer defect calibration

Method for smart conversion and calibration of coordinate

Method for smart conversion and calibration of coordinate

Image inspection apparatus

Information processing apparatus related to machine learning for de...

Defect inspection method and defect inspection device

Method for detecting wafer backside defect

Method and device for automatically identifying a point of interest...

Apparatus for optimizing inspection of exterior of target object an...

Defect inspection device

High accuracy of relative defect locations for repeater analysis

Broadband wafer defect detection

Smart defect calibration system and the method thereof

Method for producing an OSB

Method and system for automatically detecting fabric defect, and co...

Patents Applicationslast 30 patents

OVERLAY MEASUREMENT APPARATUS AND OVERLAY MEASUREMENT METHOD

VISUAL INSPECTION APPARATUS AND VISUAL INSPECTION METHOD

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

UTILIZATION OF IMAGE ANALYTICS TO DETECT ABNORMALITIES ON FAN BLADE...

SYSTEM AND METHOD FOR ELECTROMAGNETIC MONITORING OF ACTIVE CRACKS I...

SUBSTRATE DEFECT ANALYSIS

CLASSIFICATION OF DEFECT PATTERNS OF SUBSTRATES

Method and System for Determining the Location of Artefacts and/or...

INSPECTION DEVICE ARTICULATION TRANSFORMATION BASED ON IMAGE TRANSF...

LIGHT-BASED FAULT DETECTION FOR PHYSICAL COMPONENTS

PRINTED-MATTER INSPECTION SYSTEM AND NON-TRANSITORY COMPUTER READAB...

DEFECT REMOVAL DEVICE, DEFECT REMOVAL METHOD, PATTERN FORMING METHO...

Foreign Substance Detection Device and Detection Method

SYSTEMS AND METHODS FOR PROCESSING SEMICONDUCTOR WAFERS USING FRONT...

DEFECT POSITION DETERMINATION SYSTEM, APPEARANCE INSPECTION METHOD...

SURFACE DEFECT MONITORING SYSTEM

INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...

WAFER SURFACE DEFECT INSPECTION METHOD AND APPARATUS THEREOF

DEFECTIVE PART RECOGNITION DEVICE AND DEFECTIVE PART RECOGNITION ME...

APPARATUS FOR OPTIMIZING INSPECTION OF EXTERIOR OF TARGET OBJECT AN...

INSPECTION DEVICE ARTICULATION TRANSFORMATION BASED ON IMAGE TRANSF...

INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...

METHOD AND SYSTEM FOR INSPECTING REPAIR OR ASSEMBLY OPERATIONS

QUALITATIVE OR QUANTITATIVE CHARACTERIZATION OF A COATING SURFACE

Setting Up Inspection of a Specimen

ABNORMALITY DETECTING METHOD AND ABNORMALITY DETECTING APPARATUS

METHOD AND SYSTEM FOR GRADING AND STACKING VENEER STRIPS USING NEAR...

METHOD FOR EVALUATING DEFECTIVE REGION OF WAFER

METHODS AND PLANTS FOR LOCATING POINTS ON COMPLEX SURFACES

SMART COORDINATE CONVERSION AND CALIBRATION SYSTEM IN SEMICONDUCTOR...