Determining total density of a zone

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CPC
G01N2021/5919

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/5919Determining total density of a zone

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Patents Grantslast 30 patents

Information Patent Grant
Emissive element harvest
- Patent number 11,929,356
- Issue date Mar 12, 2024
- eLux, Inc.
- Kenji Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for the characterization of emissive elements
- Patent number 11,855,051
- Issue date Dec 26, 2023
- eLux, Inc.
- Kenji Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for the characterization and dispersal of emissiv...
- Patent number 11,315,910
- Issue date Apr 26, 2022
- eLux, Inc.
- Kenji Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reticle transmittance measurement method, projection exposure metho...
- Patent number 9,904,170
- Issue date Feb 27, 2018
- SII Semiconductor Corporation
- Michihiro Murata
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Reticle transmittance measurement method, and projection exposure m...
- Patent number 9,733,567
- Issue date Aug 15, 2017
- SII Semiconductor Corporation
- Michihiro Murata
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for measuring spectroscopic properties of bulk products and...
- Patent number 7,508,501
- Issue date Mar 24, 2009
- Vladimir Aleksandrovich Zubkov
- G01 - MEASURING TESTING
Information Patent Grant
Reflectometry system with compensation for specimen holder topograp...
- Patent number 7,031,508
- Issue date Apr 18, 2006
- E-Y Laboratories, Inc.
- John L. Lawless
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical tomography of small objects using parallel ray illumination...
- Patent number 6,944,322
- Issue date Sep 13, 2005
- Visiongate, Inc.
- Roger H. Johnson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reflectometry system with compensation for specimen holder topograp...
- Patent number 6,584,217
- Issue date Jun 24, 2003
- E-Y Laboratories, Inc.
- John L. Lawless
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical specimen analysis system and method
- Patent number 6,249,593
- Issue date Jun 19, 2001
- EY Laboratories, Inc.
- Albert E. Chu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical specimen analysis system and method
- Patent number 5,717,778
- Issue date Feb 10, 1998
- Albert E. Chu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Video densitometer with determination of color composition
- Patent number 5,420,628
- Issue date May 30, 1995
- Research Development Foundation
- Lawrence L. Poulsen
- G01 - MEASURING TESTING
Information Patent Grant
Video densitometer
- Patent number 5,194,949
- Issue date Mar 16, 1993
- Research Development Foundation
- Lawrence L. Poulsen
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
RETICLE TRANSMITTANCE MEASUREMENT METHOD, PROJECTION EXPOSURE METHO...
- Publication number 20170351180
- Publication date Dec 7, 2017
- SII Semiconductor Corporation
- Michihiro MURATA
- G01 - MEASURING TESTING
Information Patent Application
Method for measuring spectroscopic properties of bulk products and...
- Publication number 20070153282
- Publication date Jul 5, 2007
- Vladimir Aleksandrovich Zubkov
- G01 - MEASURING TESTING
Information Patent Application
Reflectometry system with compensation for specimen holder topograp...
- Publication number 20040071331
- Publication date Apr 15, 2004
- EY Laboratories, Inc.
- John L. Lawless
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Optical tomography of small objects using parallel ray illumination...
- Publication number 20040001618
- Publication date Jan 1, 2004
- Roger H. Johnson
- G06 - COMPUTING CALCULATING COUNTING

Determining total density of a zone

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Emissive element harvest

System for the characterization of emissive elements

System and method for the characterization and dispersal of emissiv...

Reticle transmittance measurement method, projection exposure metho...

Reticle transmittance measurement method, and projection exposure m...

Method for measuring spectroscopic properties of bulk products and...

Reflectometry system with compensation for specimen holder topograp...

Optical tomography of small objects using parallel ray illumination...

Reflectometry system with compensation for specimen holder topograp...

Optical specimen analysis system and method

Optical specimen analysis system and method

Video densitometer with determination of color composition

Video densitometer

Patents Applicationslast 30 patents

RETICLE TRANSMITTANCE MEASUREMENT METHOD, PROJECTION EXPOSURE METHO...

Method for measuring spectroscopic properties of bulk products and...

Reflectometry system with compensation for specimen holder topograp...

Optical tomography of small objects using parallel ray illumination...