Diffuse illumination

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CPC
G01N2021/8812

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/8812Diffuse illumination

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Imaging device, inspection apparatus and inspection method
- Patent number 12,135,294
- Issue date Nov 5, 2024
- Toyo Seikan Co., Ltd.
- Tatsuya Shirasaka
- G01 - MEASURING TESTING
Information Patent Grant
Illuminator for a viewing unit of an optical inspection machine for...
- Patent number 12,099,016
- Issue date Sep 24, 2024
- DOSS VISUAL SOLUTION S.R.L.
- Hemiliano Berselli
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Inspection device and coating apparatus equipped with the same
- Patent number 12,085,514
- Issue date Sep 10, 2024
- Daifuku Co., Ltd.
- Masahiro Ooe
- G01 - MEASURING TESTING
Information Patent Grant
Cleaved semiconductor wafer imaging system
- Patent number 12,019,031
- Issue date Jun 25, 2024
- GlobalWafers Co., Ltd.
- Benjamin Michael Meyer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cleaved semiconductor wafer camera system
- Patent number 11,921,054
- Issue date Mar 5, 2024
- GlobalWafers Co., Ltd.
- Benjamin Michael Meyer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Portable lighting device for workbench
- Patent number 11,859,798
- Issue date Jan 2, 2024
- Dennis Rotim
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Substrate imaging apparatus
- Patent number 11,832,026
- Issue date Nov 28, 2023
- Tokyo Electron Limited
- Norihisa Koga
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surface inspection sensor
- Patent number 11,408,832
- Issue date Aug 9, 2022
- Araz Yacoubian
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system, inspection apparatus, and method using multiple...
- Patent number 11,282,187
- Issue date Mar 22, 2022
- Ricoh Company, Ltd.
- Fumihiro Nakashige
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for investigating bulk material
- Patent number 11,249,006
- Issue date Feb 15, 2022
- Sikora AG
- Klaus Bremer
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspection of a film on a substrate
- Patent number 11,237,117
- Issue date Feb 1, 2022
- BWXT Nuclear Operations Group, Inc.
- Aaron C. Havener
- G01 - MEASURING TESTING
Information Patent Grant
Adaptive diffuse illumination systems and methods
- Patent number 11,181,483
- Issue date Nov 23, 2021
- Radiant Vision Systems, LLC
- Mark Michniewicz
- F21 - LIGHTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 11,143,598
- Issue date Oct 12, 2021
- HITACHI HIGH-TECH CORPORATION
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
Image inspection device
- Patent number 11,022,560
- Issue date Jun 1, 2021
- Omron Corporation
- Yutaka Kato
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Substrate imaging apparatus
- Patent number 10,958,879
- Issue date Mar 23, 2021
- Tokyo Electron Limited
- Norihisa Koga
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for checking tyres
- Patent number 10,935,467
- Issue date Mar 2, 2021
- Pirelli Tyre S.p.A.
- Alessandro Held
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 10,830,706
- Issue date Nov 10, 2020
- HITACHI HIGH-TECH CORPORATION
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspection of a film on a substrate
- Patent number 10,761,032
- Issue date Sep 1, 2020
- BWXT Nuclear Operations Group, Inc.
- Aaron C. Havener
- G01 - MEASURING TESTING
Information Patent Grant
System and method for acquiring images of surface texture
- Patent number 10,724,947
- Issue date Jul 28, 2020
- Cognex Corporation
- Carl W. Gerst
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for checking tyres
- Patent number 10,605,698
- Issue date Mar 31, 2020
- Pirelli Tyre S.p.A.
- Alessandro Held
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Substrate imaging apparatus
- Patent number 10,523,905
- Issue date Dec 31, 2019
- Tokyo Electron Limited
- Norihisa Koga
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image inspection apparatus and image inspection method
- Patent number 10,508,994
- Issue date Dec 17, 2019
- Keyence Corporation
- Daisuke Ando
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vehicle lighting
- Patent number 10,451,558
- Issue date Oct 22, 2019
- Dent Impressions, Inc.
- Brian J. Chenvert
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for measuring physical characteristics of semic...
- Patent number 10,352,877
- Issue date Jul 16, 2019
- Kulicke and Soffa Industries, Inc.
- Deepak Sood
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Visual inspection device and visual inspection method
- Patent number 10,261,024
- Issue date Apr 16, 2019
- JTEKT Corporation
- Jiro Umehara
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method for inspection of the su...
- Patent number 10,215,708
- Issue date Feb 26, 2019
- EyeC GmbH
- Ansgar Kaupp
- G01 - MEASURING TESTING
Information Patent Grant
Reverberation chamber loading
- Patent number 10,145,804
- Issue date Dec 4, 2018
- ETS-Lindgren Inc.
- Bryan Howard Sayler
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Detection system and method of detecting corrosion under an outer p...
- Patent number 9,874,516
- Issue date Jan 23, 2018
- Subterandt Limited
- Christopher Mark Mann
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for selectively inspecting component sidewalls
- Patent number 9,816,938
- Issue date Nov 14, 2017
- Semiconductor Technologies & Instruments Pte Ltd
- Ajharali Amanullah
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Systems and methods for measuring physical characteristics of semic...
- Patent number 9,810,641
- Issue date Nov 7, 2017
- Kulicke and Soffa Industries, Inc.
- Deepak Sood
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
VISUAL INSPECTION SYSTEMS AND METHODS
- Publication number 20240280499
- Publication date Aug 22, 2024
- Essex Furukawa Magnet Wire USA LLC
- Russell Glenn Post
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
HIGH CLARITY GEMSTONE FACET AND INTERNAL IMAGING ANALYSIS
- Publication number 20240102937
- Publication date Mar 28, 2024
- GEMOLOGICAL INSTITUTE OF AMERICA, INC. (GIA)
- Tsung-Han TSAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE IMAGING APPARATUS
- Publication number 20240022693
- Publication date Jan 18, 2024
- TOKYO ELECTRON LIMITED
- Norihisa KOGA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection Device and Coating Apparatus Equipped With the Same
- Publication number 20230003666
- Publication date Jan 5, 2023
- DAIFUKU CO., LTD.
- Masahiro Ooe
- G01 - MEASURING TESTING
Information Patent Application
IMAGING DEVICE, INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20220244192
- Publication date Aug 4, 2022
- Toyo Seikan Co., Ltd.
- TATSUYA SHIRASAKA
- G01 - MEASURING TESTING
Information Patent Application
Surface Inspection Sensor
- Publication number 20220214286
- Publication date Jul 7, 2022
- Araz Yacoubian
- G01 - MEASURING TESTING
Information Patent Application
ILLUMINATOR FOR A VIEWING UNIT OF AN OPTICAL INSPECTION MACHINE FOR...
- Publication number 20220178839
- Publication date Jun 9, 2022
- DOSS VISUAL SOLUTION S.R.L.
- Hemiliano BERSELLI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INSPECTION APPARATUS, INSPECTION SYSTEM, AND INSPECTION METHOD
- Publication number 20220099587
- Publication date Mar 31, 2022
- RICOH COMPANY, LTD.
- Hidenobu KISHI
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE IMAGING APPARATUS
- Publication number 20210185282
- Publication date Jun 17, 2021
- TOKYO ELECTRON LIMITED
- Norihisa KOGA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION SYSTEM, INSPECTION APPARATUS, AND INSPECTION METHOD
- Publication number 20210056679
- Publication date Feb 25, 2021
- Fumihiro Nakashige
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20210025829
- Publication date Jan 28, 2021
- HITACHI HIGH-TECH CORPORATION
- Toshifumi HONDA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INSPECTION OF A FILM ON A SUBSTRATE
- Publication number 20200400585
- Publication date Dec 24, 2020
- BWXT Nuclear Operations Group, Inc.
- Aaron C. Havener
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INSPECTION OF A FILM ON A SUBSTRATE
- Publication number 20200271591
- Publication date Aug 27, 2020
- Aaron C. Havener
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20200256804
- Publication date Aug 13, 2020
- Hitachi High-Technologies Corporation
- Toshifumi HONDA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR CHECKING TYRES
- Publication number 20200217756
- Publication date Jul 9, 2020
- PIRELLI TYRE S.P.A.
- Alessandro HELD
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ADAPTIVE DIFFUSE ILLUMINATION SYSTEMS AND METHODS
- Publication number 20200103352
- Publication date Apr 2, 2020
- Radiant Vision Systems
- Mark Michniewicz
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE IMAGING APPARATUS
- Publication number 20200084422
- Publication date Mar 12, 2020
- TOKYO ELECTRON LIMITED
- Norihisa KOGA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VEHICLE LIGHTING
- Publication number 20190302030
- Publication date Oct 3, 2019
- DENT IMPRESSIONS, INC.
- Brian J. Chenvert
- G01 - MEASURING TESTING
Information Patent Application
IMAGE INSPECTION DEVICE
- Publication number 20190277771
- Publication date Sep 12, 2019
- Omron Corporation
- Yutaka KATO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Image Inspection Apparatus And Image Inspection Method
- Publication number 20180348144
- Publication date Dec 6, 2018
- KEYENCE CORPORATION
- Daisuke Ando
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTING BOTTLES AND CONTAINERS USING LIGHT
- Publication number 20180143143
- Publication date May 24, 2018
- Industrial Dynamics Company Ltd
- LEON COETZEE
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MEASURING PHYSICAL CHARACTERISTICS OF SEMIC...
- Publication number 20180038806
- Publication date Feb 8, 2018
- KULICKE AND SOFFA INDUSTRIES, INC.
- Deepak Sood
- G01 - MEASURING TESTING
Information Patent Application
DETECTION SYSTEM AND METHOD OF DETECTING CORROSION UNDER AN OUTER P...
- Publication number 20170336323
- Publication date Nov 23, 2017
- SUBTERANDT LIMITED
- Christopher Mark MANN
- G01 - MEASURING TESTING
Information Patent Application
Visual Inspection Device and Visual Inspection Method
- Publication number 20170328838
- Publication date Nov 16, 2017
- JTEKT Corporation
- Jiro UMEHARA
- G01 - MEASURING TESTING
Information Patent Application
REVERBERATION CHAMBER LOADING
- Publication number 20170322164
- Publication date Nov 9, 2017
- ETS-Lindgren Inc.
- Bryan Howard SAYLER
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE IMAGING APPARATUS
- Publication number 20170244936
- Publication date Aug 24, 2017
- TOKYO ELECTRON LIMITED
- Norihisa KOGA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR SELECTIVELY INSPECTING COMPONENT SIDEWALLS
- Publication number 20150138341
- Publication date May 21, 2015
- Semiconductor Technologies & Instruments Pte Ltd
- Ajharali AMANULLAH
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MEASURING PHYSICAL CHARACTERISTICS OF SEMIC...
- Publication number 20150059957
- Publication date Mar 5, 2015
- KULICKE AND SOFFA INDUSTRIES, INC.
- Deepak Sood
- G01 - MEASURING TESTING
Information Patent Application
REVERBERATION CHAMBER LOADING
- Publication number 20140338471
- Publication date Nov 20, 2014
- ETS-Lindgren Inc.
- Bryan Howard SAYLER
- G01 - MEASURING TESTING
Information Patent Application
ILLUMINATION SYSTEM WITH ILLUMINATION SHIELD
- Publication number 20120236557
- Publication date Sep 20, 2012
- Amir Shirkhodaie
- G01 - MEASURING TESTING

Diffuse illumination

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Imaging device, inspection apparatus and inspection method

Illuminator for a viewing unit of an optical inspection machine for...

Inspection device and coating apparatus equipped with the same

Cleaved semiconductor wafer imaging system

Cleaved semiconductor wafer camera system

Portable lighting device for workbench

Substrate imaging apparatus

Surface inspection sensor

Inspection system, inspection apparatus, and method using multiple...

Device and method for investigating bulk material

Apparatus and method for inspection of a film on a substrate

Adaptive diffuse illumination systems and methods

Defect inspection apparatus and defect inspection method

Image inspection device

Substrate imaging apparatus

Apparatus for checking tyres

Defect inspection apparatus and defect inspection method

Apparatus and method for inspection of a film on a substrate

System and method for acquiring images of surface texture

Method and apparatus for checking tyres

Substrate imaging apparatus

Image inspection apparatus and image inspection method

Vehicle lighting

Systems and methods for measuring physical characteristics of semic...

Visual inspection device and visual inspection method

Inspection apparatus and inspection method for inspection of the su...

Reverberation chamber loading

Detection system and method of detecting corrosion under an outer p...

Apparatus and method for selectively inspecting component sidewalls

Systems and methods for measuring physical characteristics of semic...

Patents Applicationslast 30 patents

VISUAL INSPECTION SYSTEMS AND METHODS

HIGH CLARITY GEMSTONE FACET AND INTERNAL IMAGING ANALYSIS

SUBSTRATE IMAGING APPARATUS

Inspection Device and Coating Apparatus Equipped With the Same

IMAGING DEVICE, INSPECTION APPARATUS AND INSPECTION METHOD

Surface Inspection Sensor

ILLUMINATOR FOR A VIEWING UNIT OF AN OPTICAL INSPECTION MACHINE FOR...

INSPECTION APPARATUS, INSPECTION SYSTEM, AND INSPECTION METHOD

SUBSTRATE IMAGING APPARATUS

INSPECTION SYSTEM, INSPECTION APPARATUS, AND INSPECTION METHOD

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

APPARATUS AND METHOD FOR INSPECTION OF A FILM ON A SUBSTRATE

APPARATUS AND METHOD FOR INSPECTION OF A FILM ON A SUBSTRATE

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

APPARATUS FOR CHECKING TYRES

ADAPTIVE DIFFUSE ILLUMINATION SYSTEMS AND METHODS

SUBSTRATE IMAGING APPARATUS

VEHICLE LIGHTING

IMAGE INSPECTION DEVICE

Image Inspection Apparatus And Image Inspection Method

SYSTEM AND METHOD FOR INSPECTING BOTTLES AND CONTAINERS USING LIGHT

SYSTEMS AND METHODS FOR MEASURING PHYSICAL CHARACTERISTICS OF SEMIC...

DETECTION SYSTEM AND METHOD OF DETECTING CORROSION UNDER AN OUTER P...

Visual Inspection Device and Visual Inspection Method

REVERBERATION CHAMBER LOADING

SUBSTRATE IMAGING APPARATUS

APPARATUS AND METHOD FOR SELECTIVELY INSPECTING COMPONENT SIDEWALLS

SYSTEMS AND METHODS FOR MEASURING PHYSICAL CHARACTERISTICS OF SEMIC...

REVERBERATION CHAMBER LOADING

ILLUMINATION SYSTEM WITH ILLUMINATION SHIELD