Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas

Industry

CPC
H01J41/02

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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J41/00Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas Discharge tubes for evacuation by diffusion of ions

Current Industry

H01J41/02Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Chamber for an ionization vacuum gauge
- Patent number 12,154,771
- Issue date Nov 26, 2024
- INFICON AG
- Urs Wälchli
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate processing apparatus and method of driving relay member
- Patent number 12,027,346
- Issue date Jul 2, 2024
- Tokyo Electron Limited
- Nobutaka Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fast pressure sensing system
- Patent number 11,101,120
- Issue date Aug 24, 2021
- SRI International
- Ashish Chaudhary
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for detecting faults in rails by measuring impedance
- Patent number 10,718,729
- Issue date Jul 21, 2020
- Metrolab
- René Tützauer
- B61 - RAILWAYS
Information Patent Grant
Spark gap device and method of measurement of X-ray tube vacuum pre...
- Patent number 10,605,687
- Issue date Mar 31, 2020
- General Electric Company
- Richard Michael Roffers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ground based systems and methods for testing reaction thrusters
- Patent number 10,590,919
- Issue date Mar 17, 2020
- Aerojet Rocketdyne, Inc.
- David Q. King
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasensitive ion detector using carbon nanotubes or graphene
- Patent number 10,036,728
- Issue date Jul 31, 2018
- Northeastern University
- Bo Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for determining at least one physical parameter using a sens...
- Patent number 9,995,839
- Issue date Jun 12, 2018
- Gerd Reime
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization gauge for high pressure operation
- Patent number 9,952,113
- Issue date Apr 24, 2018
- MKS Instruments, Inc.
- Gerardo A. Brucker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for identifying operating temperatures and modify...
- Patent number 9,625,325
- Issue date Apr 18, 2017
- GLOBALFOUNDRIES Inc.
- Jeanne P. Bickford
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization gauge for high pressure operation
- Patent number 9,593,996
- Issue date Mar 14, 2017
- MKS Instruments, Inc.
- Gerardo A. Brucker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Long lifetime cold cathode ionization vacuum gauge design
- Patent number 9,588,004
- Issue date Mar 7, 2017
- MKS Instruments, Inc.
- Gerardo A. Brucker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization gauge with operational parameters and geometry designed...
- Patent number 9,404,827
- Issue date Aug 2, 2016
- MKS Instruments, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Grant
Ionization gauge with emission current and bias potential control
- Patent number 9,383,286
- Issue date Jul 5, 2016
- MKS Instruments, Inc.
- Larry K. Carmichael
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam instrument
- Patent number 9,318,300
- Issue date Apr 19, 2016
- Jeol Ltd.
- Yasushi Hiroki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization gauge with emission current and bias potential control
- Patent number 8,947,098
- Issue date Feb 3, 2015
- MKS Instruments, Inc.
- Larry K. Carmichael
- G01 - MEASURING TESTING
Information Patent Grant
Ionization gauge with operational parameters and geometry designed...
- Patent number 8,648,604
- Issue date Feb 11, 2014
- Brooks Automation, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Grant
Gas analyzer
- Patent number 8,296,090
- Issue date Oct 23, 2012
- Horiba Stec, Co., Ltd.
- Junji Aoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Molecular shield for an ionizaton vacuum gauge
- Patent number 7,906,971
- Issue date Mar 15, 2011
- ITT Manufacturing Enterprises, Inc.
- Benjamin Aaron Boardwine
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,582,885
- Issue date Sep 1, 2009
- Hitachi High-Technologies Corp.
- Souichi Katagiri
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photo-ionization detector and method for continuous operation and r...
- Patent number 6,734,435
- Issue date May 11, 2004
- RAE Systems, Inc.
- Hong T. Sun
- G01 - MEASURING TESTING
Information Patent Grant
Ionization vacuum gauge
- Patent number 6,515,482
- Issue date Feb 4, 2003
- Anelva Corporation
- Yousuke Kawasaki
- G01 - MEASURING TESTING
Information Patent Grant
Dual-channel photo-ionization detector that eliminates the effect o...
- Patent number 6,313,638
- Issue date Nov 6, 2001
- RAE Systems, Inc.
- Hong T. Sun
- G01 - MEASURING TESTING
Information Patent Grant
Photo-ionization detector for volatile gas measurement and a method...
- Patent number 6,225,633
- Issue date May 1, 2001
- RAE Systems, Inc.
- Hong T. Sun
- G01 - MEASURING TESTING
Information Patent Grant
Miniature ionization gauge utilizing multiple ion collectors
- Patent number 6,198,105
- Issue date Mar 6, 2001
- Helix Technology Corporation
- Daniel Granville Bills
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Extended detection zone in an ionization detector
- Patent number 6,107,805
- Issue date Aug 22, 2000
- Agilent Technologies, Inc.
- Mahmoud F. Abdel-Rahman
- G01 - MEASURING TESTING
Information Patent Grant
Miniature ionization gauge utilizing multiple ion collectors
- Patent number 6,046,456
- Issue date Apr 4, 2000
- Helix Technology Corporation
- Daniel Granville Bills
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Miniature ionization gauge utilizing multiple ion collectors
- Patent number 6,025,723
- Issue date Feb 15, 2000
- Granville-Phillips Company
- Daniel Granville Bills
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photo-ionization detector for volatile gas measurement
- Patent number 5,773,833
- Issue date Jun 30, 1998
- RAE Systems, Inc.
- Peter C. Hsi
- G01 - MEASURING TESTING
Information Patent Grant
Portable device for detecting UV light ionizable gas or vapor
- Patent number 5,572,137
- Issue date Nov 5, 1996
- The Secretary of State for Defence in Her Britannic Majesty's Government of t...
- Christopher D. Jones
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CHAMBER FOR AN IONIZATION VACUUM GAUGE
- Publication number 20250046589
- Publication date Feb 6, 2025
- INFICON AG
- Urs WÄLCHLI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FAST PRESSURE SENSING SYSTEM
- Publication number 20200161109
- Publication date May 21, 2020
- SRI International
- Ashish Chaudhary
- G01 - MEASURING TESTING
Information Patent Application
IONIZATION GAUGE FOR HIGH PRESSURE OPERATION
- Publication number 20150300904
- Publication date Oct 22, 2015
- MKS Instruments, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Instrument
- Publication number 20150137001
- Publication date May 21, 2015
- JEOL Ltd.
- Yasushi Hiroki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IONIZATION GAUGE WITH OPERATIONAL PARAMETERS AND GEOMETRY DESIGNED...
- Publication number 20140152320
- Publication date Jun 5, 2014
- Brooks Automation, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Application
Ionization Gauge With Emission Current And Bias Potential Control
- Publication number 20110163754
- Publication date Jul 7, 2011
- Brooks Automation, Inc.
- Larry K. Carmichael
- G01 - MEASURING TESTING
Information Patent Application
Ionization Gauge With Operational Parameters And Geometry Designed...
- Publication number 20110062961
- Publication date Mar 17, 2011
- Brooks Automation, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Application
MOLECULAR SHIELD FOR AN IONIZATON VACUUM GAUGE
- Publication number 20100090703
- Publication date Apr 15, 2010
- ITT Manufacturing Enterprises, Inc.
- BENJAMIN AARON BOARDWINE
- G01 - MEASURING TESTING
Information Patent Application
GAS ANALYZER
- Publication number 20100076712
- Publication date Mar 25, 2010
- HORIBA STEC, CO., LTD.
- Junji Aoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam apparatus
- Publication number 20060231773
- Publication date Oct 19, 2006
- Souichi Katagiri
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Photo-ionization detector and method for continuous operation and r...
- Publication number 20020179846
- Publication date Dec 5, 2002
- Hong T. Sun
- G01 - MEASURING TESTING
Information Patent Application
Ionization vacuum gauge
- Publication number 20010011890
- Publication date Aug 9, 2001
- ANELVA CORPORATION
- Yousuke Kawasaki
- G01 - MEASURING TESTING

Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Chamber for an ionization vacuum gauge

Substrate processing apparatus and method of driving relay member

Fast pressure sensing system

Device for detecting faults in rails by measuring impedance

Spark gap device and method of measurement of X-ray tube vacuum pre...

Ground based systems and methods for testing reaction thrusters

Ultrasensitive ion detector using carbon nanotubes or graphene

Method for determining at least one physical parameter using a sens...

Ionization gauge for high pressure operation

System and method for identifying operating temperatures and modify...

Ionization gauge for high pressure operation

Long lifetime cold cathode ionization vacuum gauge design

Ionization gauge with operational parameters and geometry designed...

Ionization gauge with emission current and bias potential control

Charged particle beam instrument

Ionization gauge with emission current and bias potential control

Ionization gauge with operational parameters and geometry designed...

Gas analyzer

Molecular shield for an ionizaton vacuum gauge

Charged particle beam apparatus

Photo-ionization detector and method for continuous operation and r...

Ionization vacuum gauge

Dual-channel photo-ionization detector that eliminates the effect o...

Photo-ionization detector for volatile gas measurement and a method...

Miniature ionization gauge utilizing multiple ion collectors

Extended detection zone in an ionization detector

Miniature ionization gauge utilizing multiple ion collectors

Miniature ionization gauge utilizing multiple ion collectors

Photo-ionization detector for volatile gas measurement

Portable device for detecting UV light ionizable gas or vapor

Patents Applicationslast 30 patents

CHAMBER FOR AN IONIZATION VACUUM GAUGE

FAST PRESSURE SENSING SYSTEM

IONIZATION GAUGE FOR HIGH PRESSURE OPERATION

Charged Particle Beam Instrument

IONIZATION GAUGE WITH OPERATIONAL PARAMETERS AND GEOMETRY DESIGNED...

Ionization Gauge With Emission Current And Bias Potential Control

Ionization Gauge With Operational Parameters And Geometry Designed...

MOLECULAR SHIELD FOR AN IONIZATON VACUUM GAUGE

GAS ANALYZER

Charged particle beam apparatus

Photo-ionization detector and method for continuous operation and r...

Ionization vacuum gauge