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Discriminating defects on opposite sides or at different depths of sheet or rod
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G01N2021/8967
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PHYSICS
G01
Measuring instruments
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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G01N2021/8967
Discriminating defects on opposite sides or at different depths of sheet or rod
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Patents Grants
last 30 patents
Information
Patent Grant
Region prober optical inspector
Patent number
11,988,615
Issue date
May 21, 2024
Lumina Instruments Inc.
Steven W. Meeks
G01 - MEASURING TESTING
Information
Patent Grant
Lithium ion conducting sulfide glass fabrication
Patent number
11,984,553
Issue date
May 14, 2024
PolyPlus Battery Company
Steven J. Visco
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and apparatus for detecting surface defects on glass sheets
Patent number
11,249,032
Issue date
Feb 15, 2022
Corning Incorporated
Jeffrey Allen Knowles
G01 - MEASURING TESTING
Information
Patent Grant
System and method for in-process inspection within advanced manufac...
Patent number
10,794,836
Issue date
Oct 6, 2020
Triad National Security, LLC
Eric Flynn
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for inspecting defects on transparent substrat...
Patent number
10,732,126
Issue date
Aug 4, 2020
Corning Incorporated
Chong Pyung An
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for inspecting defects on transparent substrate
Patent number
10,677,739
Issue date
Jun 9, 2020
Corning Incorporated
Uta-Barbara Goers
G01 - MEASURING TESTING
Information
Patent Grant
Methods of making and inspecting a web of vitreous lithium sulfide...
Patent number
10,601,071
Issue date
Mar 24, 2020
PolyPlus Battery Company
Steven J. Visco
G01 - MEASURING TESTING
Information
Patent Grant
Optical device for detecting an internal flaw of a transparent subs...
Patent number
10,429,317
Issue date
Oct 1, 2019
Saint-Gobain Glass France
Yuan Zheng
G01 - MEASURING TESTING
Information
Patent Grant
Method for producing a mirror substrate blank of titanium-doped sil...
Patent number
10,016,872
Issue date
Jul 10, 2018
Heraeus Quarzglas GmbH & Co. KG
Klaus Becker
B24 - GRINDING POLISHING
Information
Patent Grant
Substrate mark detection apparatus and substrate mark detection method
Patent number
9,931,675
Issue date
Apr 3, 2018
BOE Technology Group Co., Ltd.
Yangkun Jing
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Grant
Upper surface foreign material detecting device of ultra-thin trans...
Patent number
9,733,196
Issue date
Aug 15, 2017
Nanoprotech Co., Ltd.
Hyung Seok Lee
G01 - MEASURING TESTING
Information
Patent Grant
Method for particle detection on flexible substrates
Patent number
9,588,056
Issue date
Mar 7, 2017
Corning Incorporated
Norman Henry Fontaine
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for identifying defects within the volume of a...
Patent number
9,546,967
Issue date
Jan 17, 2017
Schott AG
Bruno Schrader
G01 - MEASURING TESTING
Information
Patent Grant
Transparent body inspecting device
Patent number
8,648,905
Issue date
Feb 11, 2014
Asahi Glass Company, Limited
Toshihiko Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection method and apparatus for transparent plate-like m...
Patent number
7,796,248
Issue date
Sep 14, 2010
Asahi Glass Company, Limited
Yoshiyuki Sonda
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection method and apparatus for transparent plate-like m...
Patent number
7,420,671
Issue date
Sep 2, 2008
Asahi Glass Company, Limited
Yoshiyuki Sonda
G01 - MEASURING TESTING
Information
Patent Grant
System and method for inspecting a light-management film and method...
Patent number
7,339,664
Issue date
Mar 4, 2008
General Electric Company
Kevin Patrick Capaldo
G01 - MEASURING TESTING
Information
Patent Grant
Confocal scatterometer and method for single-sided detection of par...
Patent number
7,274,445
Issue date
Sep 25, 2007
KLA-Tencor Technologies Corporation
Steven W. Meeks
G01 - MEASURING TESTING
Information
Patent Grant
Process and device for inspecting transparent material
Patent number
5,598,262
Issue date
Jan 28, 1997
Thomson-CSF
Yann Jutard
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for determining the optical quality of a trans...
Patent number
5,210,592
Issue date
May 11, 1993
Flachglas Aktiengesellschaft
Joachim Bretschneider
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspecting apparatus using multiple color light to detect de...
Patent number
5,072,128
Issue date
Dec 10, 1991
Nikon Corporation
Fuminori Hayano
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SOLID ELECTRODES, ASSEMBLIES AND SOLID STATE BATTERIES THEREOF
Publication number
20240363895
Publication date
Oct 31, 2024
PolyPlus Battery Company
Steven J. Visco
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEVICE FOR INSPECTING THE SURFACE OF A TRANSPARENT OBJECT, AND CORR...
Publication number
20240102940
Publication date
Mar 28, 2024
ISRA VISION AG
Josef DROSTE
G01 - MEASURING TESTING
Information
Patent Application
MAKING AND INSPECTING A WEB OF VITREOUS LITHIUM SULFIDE SEPARATOR S...
Publication number
20220328865
Publication date
Oct 13, 2022
PolyPlus Battery Company
Steven J. Visco
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS AND APPARATUS FOR DETECTING SURFACE DEFECTS ON GLASS SHEETS
Publication number
20200333258
Publication date
Oct 22, 2020
Corning Incorporated
Jeffrey Allen Knowles
G01 - MEASURING TESTING
Information
Patent Application
METHODS OF MAKING AND INSPECTING A WEB OF VITREOUS LITHIUM SULFIDE...
Publication number
20200243902
Publication date
Jul 30, 2020
PolyPlus Battery Company
Steven J. Visco
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR INSPECTING DEFECTS ON TRANSPARENT SUBSTRAT...
Publication number
20190277774
Publication date
Sep 12, 2019
Corning Incorporated
Chong Pyung An
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR INSPECTING DEFECTS ON TRANSPARENT SUBSTRATE
Publication number
20190257765
Publication date
Aug 22, 2019
Corning Incorporated
Uta-Barbara Goers
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR IDENTIFYING DEFECTS WITHIN THE VOLUME OF A...
Publication number
20140347664
Publication date
Nov 27, 2014
Bruno Schrader
G01 - MEASURING TESTING
Information
Patent Application
MULTI-SURFACE SCATTERED RADIATION DIFFERENTIATION
Publication number
20140307255
Publication date
Oct 16, 2014
Zeta Instruments, Inc.
Steven W. Meeks
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR DETECTING THE SURFACE DEFECT OF THE GLASS...
Publication number
20130044209
Publication date
Feb 21, 2013
SAMSUNG CORNING PRECISION MATERIALS CO., LTD.
Gyuhong HWANG
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR DETECTING AND CLASSIFYING A DEFECT OF A SUBST...
Publication number
20120133762
Publication date
May 31, 2012
SAINT-GOBAIN GLASS FRANCE
Jean-Philippe Schweitzer
G01 - MEASURING TESTING
Information
Patent Application
TRANSPARENT BODY INSPECTING DEVICE
Publication number
20110221885
Publication date
Sep 15, 2011
Asahi Glass Company, Limited
Toshihiko SUZUKI
G01 - MEASURING TESTING
Information
Patent Application
GLAZING INSPECTION
Publication number
20090201368
Publication date
Aug 13, 2009
Pilkington Group Limited
Robert William Evans
G01 - MEASURING TESTING
Information
Patent Application
DEFECT INSPECTION METHOD AND APPARATUS FOR TRANSPARENT PLATE-LIKE M...
Publication number
20080278718
Publication date
Nov 13, 2008
Asahi Glass Co., LTD.
Yoshiyuki SONDA
G01 - MEASURING TESTING
Information
Patent Application
DEFECT INSPECTION METHOD AND APPARATUS FOR TRANSPARENT PLATE-LIKE M...
Publication number
20070216897
Publication date
Sep 20, 2007
Asahi Glass Co., LTD.
Yoshiyuki SONDA
G01 - MEASURING TESTING
Information
Patent Application
System and method for inspecting a light-management film and method...
Publication number
20060066845
Publication date
Mar 30, 2006
Kevin Patrick Capaldo
G01 - MEASURING TESTING