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Patents Grantslast 30 patents

Information Patent Grant
Apparatus with circuit-locating mechanism
- Patent number 12,266,411
- Issue date Apr 1, 2025
- Micron Technology, Inc.
- Itamar Lavy
- G11 - INFORMATION STORAGE
Information Patent Grant
On-die testing for a memory device
- Patent number 12,211,571
- Issue date Jan 28, 2025
- Micron Technology, Inc.
- David W. Overgaard
- G11 - INFORMATION STORAGE
Information Patent Grant
Managing memory leakages of a system for evaluating manufactured items
- Patent number 12,190,971
- Issue date Jan 7, 2025
- Applied Materials Israel Ltd.
- Elad Levi
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic prioritization of selector VT scans
- Patent number 12,106,813
- Issue date Oct 1, 2024
- Micron Technology, Inc.
- Pitamber Shukla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus with circuit-locating mechanism
- Patent number 11,967,390
- Issue date Apr 23, 2024
- Micron Technology, Inc.
- Itamar Lavy
- G11 - INFORMATION STORAGE
Information Patent Grant
Systems and methods for correcting data errors in memory
- Patent number 11,755,410
- Issue date Sep 12, 2023
- Taiwan Semiconductor Manufacturing Company Limited
- Yu-Der Chih
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus, system, and method for trimming analog temperature sensors
- Patent number 11,668,612
- Issue date Jun 6, 2023
- SanDisk Technologies LLC
- Venkata Nittala
- G11 - INFORMATION STORAGE
Information Patent Grant
Metal isolation testing in the context of memory cells
- Patent number 11,631,682
- Issue date Apr 18, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Te-Hsin Chiu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus with circuit-locating mechanism
- Patent number 11,551,777
- Issue date Jan 10, 2023
- Micron Technology, Inc.
- Itamar Lavy
- G11 - INFORMATION STORAGE
Information Patent Grant
Information processing apparatus capable of detecting alteration in...
- Patent number 11,443,111
- Issue date Sep 13, 2022
- Canon Kabushiki Kaisha
- Takeshi Aoyagi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for correcting data errors in memory
- Patent number 11,429,482
- Issue date Aug 30, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Yu-Der Chih
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Field recovery of graphics on-die memory
- Patent number 11,302,413
- Issue date Apr 12, 2022
- Intel Corporation
- Altug Koker
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device, test method, and system including the same
- Patent number 11,293,972
- Issue date Apr 5, 2022
- SK hynix Inc.
- Sang Ah Hyun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Anti-hacking mechanisms for flash memory device
- Patent number 11,188,237
- Issue date Nov 30, 2021
- Silicon Storage Technology, Inc.
- Hieu Van Tran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for fabricating a circular printed memory device with rotati...
- Patent number 11,075,210
- Issue date Jul 27, 2021
- Xerox Corporation
- Christopher David Blair
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for correcting data errors in memory
- Patent number 10,936,413
- Issue date Mar 2, 2021
- Taiwan Semiconductor Manufacturing Company Limited
- Yu-Der Chih
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Artificial intelligence based monitoring of solid state drives and...
- Patent number 10,930,365
- Issue date Feb 23, 2021
- Intel Corporation
- Pavel Poliakov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Secure device state apparatus and method and lifecycle management
- Patent number 10,872,154
- Issue date Dec 22, 2020
- Google LLC
- Marius Schilder
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for memory device testing and field applications
- Patent number 10,861,574
- Issue date Dec 8, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Baohua Niu
- G11 - INFORMATION STORAGE
Information Patent Grant
Distributed memory repair network
- Patent number 10,861,578
- Issue date Dec 8, 2020
- Xilinx, Inc.
- Roger D. Flateau
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods for reducing chip testing time using trans-threshold correl...
- Patent number 10,840,157
- Issue date Nov 17, 2020
- University of Viriginia Patent Foundation
- Christopher J. Lukas
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor memory device and operation setting method thereof
- Patent number 10,817,189
- Issue date Oct 27, 2020
- Winbond Electronics Corp.
- Hiroki Murakami
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Modifying a manufacturing process of integrated circuits based on l...
- Patent number 10,810,345
- Issue date Oct 20, 2020
- International Business Machines Corporation
- Steven B. Gold
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device for supporting error correction code and test method thereof
- Patent number 10,803,971
- Issue date Oct 13, 2020
- Samsung Electronics Co., Ltd.
- Suk-Soo Pyo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Post-packaging environment recovery of graphics on-die memory
- Patent number 10,762,978
- Issue date Sep 1, 2020
- Intel Corporation
- Altug Koker
- G11 - INFORMATION STORAGE
Information Patent Grant
Layered semiconductor device, and production method therefor
- Patent number 10,714,151
- Issue date Jul 14, 2020
- ULTRAMEMORY INC.
- Yasutoshi Yamada
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device, test method, and system including the same
- Patent number 10,679,913
- Issue date Jun 9, 2020
- SK hynix Inc.
- Sang Ah Hyun
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact measurement of memory cell threshold voltage
- Patent number 10,672,500
- Issue date Jun 2, 2020
- Micron Technology, Inc.
- Amitava Majumdar
- G11 - INFORMATION STORAGE
Information Patent Grant
Metal isolation testing in the context of memory cells
- Patent number 10,665,595
- Issue date May 26, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Te-Hsin Chiu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for testing MRAM device and test apparatus thereof
- Patent number 10,665,321
- Issue date May 26, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chia-Yu Wang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
DYNAMIC PRIORITIZATION OF SELECTOR VT SCANS
- Publication number 20250022523
- Publication date Jan 16, 2025
- Micron Technology, Inc.
- Pitamber Shukla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS WITH CIRCUIT-LOCATING MECHANISM
- Publication number 20240265990
- Publication date Aug 8, 2024
- Micron Technology, Inc.
- Itamar Lavy
- G11 - INFORMATION STORAGE
Information Patent Application
MANAGING MEMORY LEAKAGES OF A SYSTEM FOR EVALUATING MANUFACTURED ITEMS
- Publication number 20240233848
- Publication date Jul 11, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Elad Levi
- G11 - INFORMATION STORAGE
Information Patent Application
METAL ISOLATION TESTING IN THE CONTEXT OF MEMORY CELLS
- Publication number 20230255012
- Publication date Aug 10, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Te-Hsin Chiu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS WITH CIRCUIT-LOCATING MECHANISM
- Publication number 20230087823
- Publication date Mar 23, 2023
- Micron Technology, Inc.
- Itamar Lavy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems and Methods for Correcting Data Errors in Memory
- Publication number 20220358013
- Publication date Nov 10, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Yu-Der Chih
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ON-DIE TESTING FOR A MEMORY DEVICE
- Publication number 20220108761
- Publication date Apr 7, 2022
- Micron Technology, Inc.
- David W. Overgaard
- G11 - INFORMATION STORAGE
Information Patent Application
Systems and Methods for Correcting Data Errors in Memory
- Publication number 20210173739
- Publication date Jun 10, 2021
- Taiwan Semiconductor Manufacturing Company Limited
- YU-DER CHIH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS WITH CIRCUIT-LOCATING MECHANISM
- Publication number 20210043267
- Publication date Feb 11, 2021
- Micron Technology, Inc.
- Itamar Lavy
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE, TEST METHOD, AND SYSTEM INCLUDING THE SAME
- Publication number 20200258795
- Publication date Aug 13, 2020
- SK HYNIX INC.
- Sang Ah HYUN
- G11 - INFORMATION STORAGE
Information Patent Application
METAL ISOLATION TESTING IN THE CONTEXT OF MEMORY CELLS
- Publication number 20200258892
- Publication date Aug 13, 2020
- Taiwan Semiconductor Manufacturing Co., LTD
- Te-Hsin Chiu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROCESSING APPARATUS CAPABLE OF DETECTING ALTERATION IN...
- Publication number 20200160930
- Publication date May 21, 2020
- Canon Kabushiki Kaisha
- Takeshi Aoyagi
- G11 - INFORMATION STORAGE
Information Patent Application
LAYERED SEMICONDUCTOR DEVICE, AND PRODUCTION METHOD THEREFOR
- Publication number 20200090708
- Publication date Mar 19, 2020
- UltraMemory Inc.
- Yasutoshi YAMADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR MEMORY DEVICE TESTING AND FIELD APPLICATIONS
- Publication number 20190385690
- Publication date Dec 19, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Baohua NIU
- G11 - INFORMATION STORAGE
Information Patent Application
CIRCULAR PRINTED MEMORY DEVICE WITH ROTATIONAL DETECTION
- Publication number 20190378847
- Publication date Dec 12, 2019
- Xerox Corporation
- Christopher David Blair
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NON-CONTACT MEASUREMENT OF MEMORY CELL THRESHOLD VOLTAGE
- Publication number 20190341122
- Publication date Nov 7, 2019
- Micron Technology, Inc.
- Amitava Majumdar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MEASURING PROXIMITY EFFECT ON HIGH DENSITY MAGNETIC TUNN...
- Publication number 20190206749
- Publication date Jul 4, 2019
- Spin Memory, Inc.
- Thomas D. Boone
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEMS AND METHODS FOR CORRECTING DATA ERRORS IN MEMORY
- Publication number 20190205208
- Publication date Jul 4, 2019
- Taiwan Semiconductor Manufacturing Company Limited
- YU-DER CHIH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NON-CONTACT MEASUREMENT OF MEMORY CELL THRESHOLD VOLTAGE
- Publication number 20190189237
- Publication date Jun 20, 2019
- Micron Technology, Inc.
- Amitava Majumdar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST INTERFACE BOARD AND SYSTEM INCLUDING THE SAME
- Publication number 20190164851
- Publication date May 30, 2019
- SAMSUNG ELECTRONICS CO., LTD.
- JONGWOON YOO
- G11 - INFORMATION STORAGE
Information Patent Application
TEST CIRCUIT BLOCK, VARIABLE RESISTANCE MEMORY DEVICE INCLUDING THE...
- Publication number 20190157347
- Publication date May 23, 2019
- SK HYNIX INC.
- Seok Joon KANG
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUS FOR MEMORY DEVICE TESTING AND FIELD APPLICATIONS
- Publication number 20190006022
- Publication date Jan 3, 2019
- Taiwan Semiconductor Manufacturing Co, LTD.
- Baohua NIU
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE, TEST METHOD, AND SYSTEM INCLUDING THE SAME
- Publication number 20180342430
- Publication date Nov 29, 2018
- SK HYNIX INC.
- Sang Ah HYUN
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20180315722
- Publication date Nov 1, 2018
- RENESAS ELECTRONICS CORPORATION
- Akira YAJIMA
- G11 - INFORMATION STORAGE
Information Patent Application
METHODS AND APPARATUS FOR DETECTING DEFECTS IN MEMORY CIRCUITRY
- Publication number 20180301201
- Publication date Oct 18, 2018
- Intel Corporation
- Kalyana Ravindra Kantipudi
- G11 - INFORMATION STORAGE
Information Patent Application
SCREENING METHOD FOR MAGNETIC STORAGE DEVICE, SCREENING APPARATUS F...
- Publication number 20180268920
- Publication date Sep 20, 2018
- Toshiba Memory Corporation
- Yosuke KOBAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CIRCULAR PRINTED MEMORY DEVICE WITH ROTATIONAL DETECTION
- Publication number 20180254280
- Publication date Sep 6, 2018
- Xerox Corporation
- Christopher David Blair
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF TESTING SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING...
- Publication number 20180203058
- Publication date Jul 19, 2018
- Jae-hoon KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF DIAGNOSING SEMICONDUCTOR DEVICE
- Publication number 20180080976
- Publication date Mar 22, 2018
- RENESAS ELECTRONICS CORPORATION
- Hisao KOBASHI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20170270993
- Publication date Sep 21, 2017
- Semiconductor Energy Laboratory Co., Ltd.
- Yoshiyuki Kurokawa
- G11 - INFORMATION STORAGE

during or with feedback to manufacture

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Apparatus with circuit-locating mechanism

On-die testing for a memory device

Managing memory leakages of a system for evaluating manufactured items

Dynamic prioritization of selector VT scans

Apparatus with circuit-locating mechanism

Systems and methods for correcting data errors in memory

Apparatus, system, and method for trimming analog temperature sensors

Metal isolation testing in the context of memory cells

Apparatus with circuit-locating mechanism

Information processing apparatus capable of detecting alteration in...

Systems and methods for correcting data errors in memory

Field recovery of graphics on-die memory

Semiconductor device, test method, and system including the same

Anti-hacking mechanisms for flash memory device

Method for fabricating a circular printed memory device with rotati...

Systems and methods for correcting data errors in memory

Artificial intelligence based monitoring of solid state drives and...

Secure device state apparatus and method and lifecycle management

Apparatus for memory device testing and field applications

Distributed memory repair network

Methods for reducing chip testing time using trans-threshold correl...

Semiconductor memory device and operation setting method thereof

Modifying a manufacturing process of integrated circuits based on l...

Device for supporting error correction code and test method thereof

Post-packaging environment recovery of graphics on-die memory

Layered semiconductor device, and production method therefor

Semiconductor device, test method, and system including the same

Non-contact measurement of memory cell threshold voltage

Metal isolation testing in the context of memory cells

Method for testing MRAM device and test apparatus thereof

Patents Applicationslast 30 patents

DYNAMIC PRIORITIZATION OF SELECTOR VT SCANS

APPARATUS WITH CIRCUIT-LOCATING MECHANISM

MANAGING MEMORY LEAKAGES OF A SYSTEM FOR EVALUATING MANUFACTURED ITEMS

METAL ISOLATION TESTING IN THE CONTEXT OF MEMORY CELLS

APPARATUS WITH CIRCUIT-LOCATING MECHANISM

Systems and Methods for Correcting Data Errors in Memory

ON-DIE TESTING FOR A MEMORY DEVICE

Systems and Methods for Correcting Data Errors in Memory

APPARATUS WITH CIRCUIT-LOCATING MECHANISM

SEMICONDUCTOR DEVICE, TEST METHOD, AND SYSTEM INCLUDING THE SAME

METAL ISOLATION TESTING IN THE CONTEXT OF MEMORY CELLS

INFORMATION PROCESSING APPARATUS CAPABLE OF DETECTING ALTERATION IN...

LAYERED SEMICONDUCTOR DEVICE, AND PRODUCTION METHOD THEREFOR

APPARATUS FOR MEMORY DEVICE TESTING AND FIELD APPLICATIONS

CIRCULAR PRINTED MEMORY DEVICE WITH ROTATIONAL DETECTION

NON-CONTACT MEASUREMENT OF MEMORY CELL THRESHOLD VOLTAGE

METHOD FOR MEASURING PROXIMITY EFFECT ON HIGH DENSITY MAGNETIC TUNN...

SYSTEMS AND METHODS FOR CORRECTING DATA ERRORS IN MEMORY

NON-CONTACT MEASUREMENT OF MEMORY CELL THRESHOLD VOLTAGE

TEST INTERFACE BOARD AND SYSTEM INCLUDING THE SAME

TEST CIRCUIT BLOCK, VARIABLE RESISTANCE MEMORY DEVICE INCLUDING THE...

APPARATUS FOR MEMORY DEVICE TESTING AND FIELD APPLICATIONS

SEMICONDUCTOR DEVICE, TEST METHOD, AND SYSTEM INCLUDING THE SAME

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

METHODS AND APPARATUS FOR DETECTING DEFECTS IN MEMORY CIRCUITRY

SCREENING METHOD FOR MAGNETIC STORAGE DEVICE, SCREENING APPARATUS F...

CIRCULAR PRINTED MEMORY DEVICE WITH ROTATIONAL DETECTION

METHOD OF TESTING SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING...

SEMICONDUCTOR DEVICE AND METHOD OF DIAGNOSING SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE