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G01G23/375
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PHYSICS
G01
Measuring instruments
G01G
WEIGHING
G01G23/00
Auxiliary devices for weighing apparatus
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G01G23/375
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Patents Grants
last 30 patents
Information
Patent Grant
Electronic weighing apparatus
Patent number
4,326,596
Issue date
Apr 27, 1982
Borg-Erickson Corporation
William P. Beck
G01 - MEASURING TESTING
Information
Patent Grant
Electronic weighing apparatus
Patent number
4,303,139
Issue date
Dec 1, 1981
Kubota Ltd.
Masamichi Hino
G01 - MEASURING TESTING
Information
Patent Grant
Optical displacement measuring system
Patent number
4,143,364
Issue date
Mar 6, 1979
Pitney-Bowes, Inc.
Daniel F. Dlugos
G01 - MEASURING TESTING
Information
Patent Grant
Error preventing incremental measuring system
Patent number
4,110,828
Issue date
Aug 29, 1978
Bizerba-Werke Wilhelm Kraut KG
Alfons Baumgartner
G01 - MEASURING TESTING
Information
Patent Grant
Electronic weighing apparatus
Patent number
4,102,421
Issue date
Jul 25, 1978
Kubota Ltd.
Tsutomu Ozaki
G01 - MEASURING TESTING
Information
Patent Grant
Electronic weighing apparatus
Patent number
4,102,420
Issue date
Jul 25, 1978
Kubota Ltd.
Noboru Uyama
G01 - MEASURING TESTING
Information
Patent Grant
Digital display for weighing scales
Patent number
4,094,371
Issue date
Jun 13, 1978
Herbert W. Ferrell
G01 - MEASURING TESTING
Information
Patent Grant
Electronic weighing apparatus
Patent number
4,093,032
Issue date
Jun 6, 1978
Kubota Ltd.
Noboru Uyama
G01 - MEASURING TESTING
Information
Patent Grant
Digital type floor scale with weigh cycle control
Patent number
4,082,153
Issue date
Apr 4, 1978
The Brearley Company
Mike A. Provi
G01 - MEASURING TESTING
Information
Patent Grant
Zero load adjustment apparatus for spring weighing scale
Patent number
4,047,586
Issue date
Sep 13, 1977
Pitney-Bowes, Inc.
Daniel F. Dlugos
G01 - MEASURING TESTING
Information
Patent Grant
Clocked digital counting system
Patent number
4,047,007
Issue date
Sep 6, 1977
Pitney-Bowes, Inc.
Daniel F. Dlugos
G01 - MEASURING TESTING
Information
Patent Grant
Device for the incremental scanning of a line scale
Patent number
3,962,563
Issue date
Jun 8, 1976
Espera-Werke GmbH
Hans-Dieter Schulz-Methke
G01 - MEASURING TESTING
Information
Patent Grant
3923110
Patent number
3,923,110
Issue date
Dec 2, 1975
G01 - MEASURING TESTING
Information
Patent Grant
3906208
Patent number
3,906,208
Issue date
Sep 16, 1975
G07 - CHECKING-DEVICES
Information
Patent Grant
3826318
Patent number
3,826,318
Issue date
Jul 30, 1974
G01 - MEASURING TESTING
Information
Patent Grant
3804188
Patent number
3,804,188
Issue date
Apr 16, 1974
G01 - MEASURING TESTING
Information
Patent Grant
3648792
Patent number
3,648,792
Issue date
Mar 14, 1972
G01 - MEASURING TESTING
Information
Patent Grant
3624644
Patent number
3,624,644
Issue date
Nov 30, 1971
B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information
Patent Grant
3612842
Patent number
3,612,842
Issue date
Oct 12, 1971
G01 - MEASURING TESTING
Information
Patent Grant
3579205
Patent number
3,579,205
Issue date
May 18, 1971
G01 - MEASURING TESTING
Information
Patent Grant
3550705
Patent number
3,550,705
Issue date
Dec 29, 1970
G01 - MEASURING TESTING
Information
Patent Grant
3519094
Patent number
3,519,094
Issue date
Jul 7, 1970
G01 - MEASURING TESTING
Information
Patent Grant
3381288
Patent number
3,381,288
Issue date
Apr 30, 1968
G08 - SIGNALLING
Information
Patent Grant
3268020
Patent number
3,268,020
Issue date
Aug 23, 1966
G01 - MEASURING TESTING
Information
Patent Grant
3238375
Patent number
3,238,375
Issue date
Mar 1, 1966
B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information
Patent Grant
3173503
Patent number
3,173,503
Issue date
Mar 16, 1965
G01 - MEASURING TESTING
Information
Patent Grant
3115201
Patent number
3,115,201
Issue date
Dec 24, 1963
G01 - MEASURING TESTING
Information
Patent Grant
3108648
Patent number
3,108,648
Issue date
Oct 29, 1963
G01 - MEASURING TESTING
Information
Patent Grant
2944157
Patent number
2,944,157
Issue date
Jul 5, 1960
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
2938126
Patent number
2,938,126
Issue date
May 24, 1960
G01 - MEASURING TESTING
Patents Applications
last 30 patents