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Apparatus and system
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Patent number 12,140,716
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Issue date Nov 12, 2024
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Canon Kabushiki Kaisha
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Masato Ofuji
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H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Radiation detector
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Patent number 12,092,775
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Issue date Sep 17, 2024
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Kabushiki Kaisha Toshiba
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Kohei Nakayama
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H01 - BASIC ELECTRIC ELEMENTS
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Radiation detector
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Patent number 11,968,849
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Issue date Apr 23, 2024
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Kabushiki Kaisha Toshiba
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Kohei Nakayama
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G01 - MEASURING TESTING
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Semiconductor x-ray detector
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Patent number 11,947,059
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Issue date Apr 2, 2024
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SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
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Peiyan Cao
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G01 - MEASURING TESTING
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Radiation detector
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Patent number 11,918,394
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Issue date Mar 5, 2024
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SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
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Peiyan Cao
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G01 - MEASURING TESTING
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Circuit for sensing X-ray
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Patent number 11,846,739
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Issue date Dec 19, 2023
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InnoCare Optoelectronics Corporation
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Hsin-Hung Lin
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G01 - MEASURING TESTING
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Photon counting detector
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Patent number 11,828,892
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Issue date Nov 28, 2023
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Teledyne Dalsa B.V.
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Willem Johannes Kindt
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G01 - MEASURING TESTING
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Photon counting detector
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Patent number 11,740,368
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Issue date Aug 29, 2023
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Koninklijke Philips N.V.
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Roger Steadman Booker
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H01 - BASIC ELECTRIC ELEMENTS
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Radiation sensing device
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Patent number 11,686,866
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Issue date Jun 27, 2023
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Innolux Corporation
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Zhi-Hong Wang
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H01 - BASIC ELECTRIC ELEMENTS
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Semiconductor X-ray detector
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Patent number 11,675,095
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Issue date Jun 13, 2023
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SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
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Peiyan Cao
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G01 - MEASURING TESTING
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