Electromodulation

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CPC
G01N2021/1721

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/1721Electromodulation

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method for fabricating a liquid-crystal-based electro-optical light...
- Patent number 12,259,606
- Issue date Mar 25, 2025
- Orbotech Ltd.
- Jason S. Reid
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for determining the concentration of analytes in...
- Patent number 12,064,765
- Issue date Aug 20, 2024
- Siemens Healthcare Diagnostics Inc.
- Kalpesh Mehta
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for analyzing a material
- Patent number 12,066,378
- Issue date Aug 20, 2024
- DiaMon Tech AG
- Alexander Bauer
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection apparatus
- Patent number 11,867,612
- Issue date Jan 9, 2024
- Samsung Display Co., Ltd.
- Je Won Yoo
- G02 - OPTICS
Information Patent Grant
Apparatus, systems and methods for integrative photo-optical/mechan...
- Patent number 11,815,506
- Issue date Nov 14, 2023
- The Administrators of the Tulane Educational Fund
- Damir Khismatullin
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for analyzing and detecting interactions and reactions of...
- Patent number 11,635,431
- Issue date Apr 25, 2023
- Arizona Board of Regents on behalf of Arizona State University
- Nongjian Tao
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Device and method for analyzing a material
- Patent number 11,280,728
- Issue date Mar 22, 2022
- DiaMonTech AG
- Alexander Bauer
- G01 - MEASURING TESTING
Information Patent Grant
Genetically encoded red fluorescent voltage sensors enabling milliv...
- Patent number 11,275,079
- Issue date Mar 15, 2022
- Massachusetts Institute of Technology
- Edward Boyden
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, systems and methods for integrative photo-optical/mechan...
- Patent number 10,823,723
- Issue date Nov 3, 2020
- The Administration of the Tulane Educational Fund
- Damir Khismatullin
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for drug screening
- Patent number 10,697,882
- Issue date Jun 30, 2020
- Imec VZW
- Veerle Reumers
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Device and method for analyzing a material
- Patent number 10,261,011
- Issue date Apr 16, 2019
- DiaMonTech GmbH
- Alexander Bauer
- G01 - MEASURING TESTING
Information Patent Grant
Methods for obtaining and analyzing digital interferometric data fo...
- Patent number 9,952,161
- Issue date Apr 24, 2018
- Attofemto, Inc.
- Paul L. Pfaff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for analysis of a fluid by means of evanescence f...
- Patent number 9,389,177
- Issue date Jul 12, 2016
- Fraunhofer-Gesellschaft zur Forderung der Angewandten Forschung E.V.
- Markus Holzki
- G01 - MEASURING TESTING
Information Patent Grant
Multiple beam transmission interferometric testing methods for the...
- Patent number 9,250,064
- Issue date Feb 2, 2016
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Grant
Multiple optical wavelength interferometric testing methods for the...
- Patent number 8,879,071
- Issue date Nov 4, 2014
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Grant
Optical sensor and method for detecting molecules
- Patent number 8,823,947
- Issue date Sep 2, 2014
- Fraunhofer Gesellschaft zur Forderung der Angewandten Forschung E.V.
- Helmut Heidrich
- G01 - MEASURING TESTING
Information Patent Grant
System for measuring electro-optic coefficient by using interferenc...
- Patent number 8,724,117
- Issue date May 13, 2014
- Inha-Industry Partnership Institute
- Kyong-Hon Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for simultaneous spectroelectrochemical analysis
- Patent number 8,585,880
- Issue date Nov 19, 2013
- Battelle Memorial Institute
- Sayandev Chatterjee
- G01 - MEASURING TESTING
Information Patent Grant
Microelectronic sensor device for the detection of target particles
- Patent number 8,486,689
- Issue date Jul 16, 2013
- Koninklijke Philips N.V.
- Dominique Maria Bruls
- G01 - MEASURING TESTING
Information Patent Grant
Optically enhanced holographic interferometric testing methods for...
- Patent number 8,462,350
- Issue date Jun 11, 2013
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring zeta potential of suspended part...
- Patent number 8,451,434
- Issue date May 28, 2013
- Microtrac Inc.
- Paul J Freud
- G01 - MEASURING TESTING
Information Patent Grant
Surface impedance imaging methods and apparatuses
- Patent number 8,416,417
- Issue date Apr 9, 2013
- Arizona Board of Regents for and on behalf of Arizona State University
- Kyle James Foley
- G01 - MEASURING TESTING
Information Patent Grant
Methods for optically enhanced holographic interferometric testing...
- Patent number 8,139,228
- Issue date Mar 20, 2012
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Grant
Analytical method for optical measurement
- Patent number 8,107,074
- Issue date Jan 31, 2012
- Shimadzu Corporation
- Naoji Moriya
- G01 - MEASURING TESTING
Information Patent Grant
Characterization of non-linear optical materials using bragg coupling
- Patent number 8,009,279
- Issue date Aug 30, 2011
- Corning Incorporated
- Martin Hempstead
- G01 - MEASURING TESTING
Information Patent Grant
Optical measuring device
- Patent number 7,911,610
- Issue date Mar 22, 2011
- Shimadzu Corporation
- Naoji Moriya
- G01 - MEASURING TESTING
Information Patent Grant
Method for optically testing semiconductor devices
- Patent number 7,733,499
- Issue date Jun 8, 2010
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Grant
Method for optically testing semiconductor devices
- Patent number 7,400,411
- Issue date Jul 15, 2008
- Attofemto, Inc.
- Paul Pfaff
- G01 - MEASURING TESTING
Information Patent Grant
Surface-plasmon-resonance sensing technique using electro-optic mod...
- Patent number 7,298,488
- Issue date Nov 20, 2007
- National Taipei University of Technology
- Tzyy-Jiann Wang
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive testing system using a laser beam
- Patent number 7,206,078
- Issue date Apr 17, 2007
- Attofemto, Inc.
- Paul Pfaff
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IMAGING ELEMENT, IMAGING DEVICE, IMAGING SYSTEM, ASSOCIATED ANALYSI...
- Publication number 20240426742
- Publication date Dec 26, 2024
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Benoit RACINE
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION APPARATUS
- Publication number 20240102921
- Publication date Mar 28, 2024
- SAMSUNG DISPLAY CO., LTD.
- Je Won YOO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR FABRICATING A LIQUID-CRYSTAL-BASED ELECTRO-OPTICAL LIGHT...
- Publication number 20240085728
- Publication date Mar 14, 2024
- ORBOTECH LTD.
- Jason S. Reid
- G02 - OPTICS
Information Patent Application
CONDUCTIVE AND TRANSPARENT INTERCONNECTION STRUCTURE, ASSOCIATED MA...
- Publication number 20240069006
- Publication date Feb 29, 2024
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Benoit RACINE
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION APPARATUS
- Publication number 20210396654
- Publication date Dec 23, 2021
- SAMSUNG DISPLAY CO., LTD.
- Je Won YOO
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR DETERMINING THE CONCENTRATION OF ANALYTES IN...
- Publication number 20210291183
- Publication date Sep 23, 2021
- Siemens Healthcare Diagnostics Inc.
- Kalpesh Mehta
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICALLY-MODULATED SURFACE WAVES AND AN ELECTRODE INTERFACE COM...
- Publication number 20210190772
- Publication date Jun 24, 2021
- UNIVERSITY OF LOUISVILLE RESEARCH FOUNDATION, INC.
- Sergio Brito Mendes
- G01 - MEASURING TESTING
Information Patent Application
Electrically-Modulated Biosensors Using Electro-Active Waveguides
- Publication number 20190361015
- Publication date Nov 28, 2019
- UNIVERSITY OF LOUISVILLE RESEARCH FOUNDATION, INC.
- Sergio Brito Mendes
- G01 - MEASURING TESTING
Information Patent Application
GENETICALLY ENCODED RED FLUORESCENT VOLTAGE SENSORS ENABLING MILLIV...
- Publication number 20190004032
- Publication date Jan 3, 2019
- Massachusetts Institute of Technology
- Edward Boyden
- G01 - MEASURING TESTING
Information Patent Application
Device and Method for Analyzing a Material
- Publication number 20180335381
- Publication date Nov 22, 2018
- DiaMonTech GmbH
- Alexander Bauer
- G01 - MEASURING TESTING
Information Patent Application
Optical methods for obtaining digital data to be used in determinin...
- Publication number 20180246045
- Publication date Aug 30, 2018
- Attofemto, Inc.
- Paul L. Pfaff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Device for Drug Screening
- Publication number 20170115201
- Publication date Apr 27, 2017
- IMEC vzw
- Veerle Reumers
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR ANALYSIS OF A FLUID BY MEANS OF EVANESCENCE F...
- Publication number 20140252214
- Publication date Sep 11, 2014
- Institut fur Mikrotechnik Mainz GMBH
- Markus Holzki
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE OPTICAL WAVELENGTH INTERFEROMETRIC TESTING METHODS FOR THE...
- Publication number 20130337585
- Publication date Dec 19, 2013
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR SIMULTANEOUS SPECTROELECTROCHEMICAL ANALYSIS
- Publication number 20130075275
- Publication date Mar 28, 2013
- Battelle Memorial Institute
- Sayandev Chatterjee
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SENSOR AND METHOD FOR DETECTING MOLECULES
- Publication number 20120182552
- Publication date Jul 19, 2012
- Fraunhofer-Gessellschaft zur Forderung der Angewandten Forschung E.V.
- Helmut Heidrich
- G01 - MEASURING TESTING
Information Patent Application
High Frequency Deflection Measurement of IR Absorption
- Publication number 20120167261
- Publication date Jun 28, 2012
- Mikhail Belkin
- G01 - MEASURING TESTING
Information Patent Application
OPTICALLY ENHANCED HOLOGRAPHIC INTERFEROMETRIC TESTING METHODS FOR...
- Publication number 20120127473
- Publication date May 24, 2012
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Application
Surface Impedance Imaging Methods and Apparatuses
- Publication number 20110136102
- Publication date Jun 9, 2011
- Arizona Board of Regents for and on behalf of Arizona State University
- Kyle James Foley
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR OPTICALLY ENHANCED HOLOGRAHIC INTERFEROMETRIC TESTING FO...
- Publication number 20110122415
- Publication date May 26, 2011
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING ZETA POTENTIAL OF SUSPENDED PART...
- Publication number 20110037980
- Publication date Feb 17, 2011
- Microtrac Inc.
- Paul J. Freud
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS FOR MEASURING ELECTRO-OPTIC AND THERMO-OPTIC COEFFICIENTS B...
- Publication number 20100290055
- Publication date Nov 18, 2010
- Kyong-Hon Kim
- G01 - MEASURING TESTING
Information Patent Application
MICROELECTRONIC SENSOR DEVICE FOR THE DETECTION OF TARGET PARTICLES
- Publication number 20100267165
- Publication date Oct 21, 2010
- Koninklijke Philips Electronics N.V.
- Dominique Maria Bruls
- G01 - MEASURING TESTING
Information Patent Application
ANALYTICAL METHOD FOR OPTICAL MEASUREMENT
- Publication number 20100201982
- Publication date Aug 12, 2010
- Naoji Moriya
- G01 - MEASURING TESTING
Information Patent Application
Characterization Of Non-Linear Optical Materials Using Bragg Coupling
- Publication number 20100177301
- Publication date Jul 15, 2010
- Martin Hempstead
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING DEVICE
- Publication number 20090251695
- Publication date Oct 8, 2009
- Naoji Moriya
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for enhancing waveguide sensor signal
- Publication number 20090109441
- Publication date Apr 30, 2009
- Nile Hartman
- G02 - OPTICS
Information Patent Application
METHOD FOR OPTICALLY TESTING SEMICONDUCTOR DEVICES
- Publication number 20080252898
- Publication date Oct 16, 2008
- Attofemto, Inc.
- Paul Pfaff
- G01 - MEASURING TESTING
Information Patent Application
Surface-plasmon-resonance sensing technique using electro-optic mod...
- Publication number 20070064235
- Publication date Mar 22, 2007
- Tzyy-Jiann Wang
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE TESTING SYSTEM
- Publication number 20060244974
- Publication date Nov 2, 2006
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING

Electromodulation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for fabricating a liquid-crystal-based electro-optical light...

Method and device for determining the concentration of analytes in...

Device and method for analyzing a material

Optical inspection apparatus

Apparatus, systems and methods for integrative photo-optical/mechan...

Apparatus for analyzing and detecting interactions and reactions of...

Device and method for analyzing a material

Genetically encoded red fluorescent voltage sensors enabling milliv...

Apparatus, systems and methods for integrative photo-optical/mechan...

Method and device for drug screening

Device and method for analyzing a material

Methods for obtaining and analyzing digital interferometric data fo...

Method and device for analysis of a fluid by means of evanescence f...

Multiple beam transmission interferometric testing methods for the...

Multiple optical wavelength interferometric testing methods for the...

Optical sensor and method for detecting molecules

System for measuring electro-optic coefficient by using interferenc...

Method and apparatus for simultaneous spectroelectrochemical analysis

Microelectronic sensor device for the detection of target particles

Optically enhanced holographic interferometric testing methods for...

Method and apparatus for measuring zeta potential of suspended part...

Surface impedance imaging methods and apparatuses

Methods for optically enhanced holographic interferometric testing...

Analytical method for optical measurement

Characterization of non-linear optical materials using bragg coupling

Optical measuring device

Method for optically testing semiconductor devices

Method for optically testing semiconductor devices

Surface-plasmon-resonance sensing technique using electro-optic mod...

Non-destructive testing system using a laser beam

Patents Applicationslast 30 patents

IMAGING ELEMENT, IMAGING DEVICE, IMAGING SYSTEM, ASSOCIATED ANALYSI...

OPTICAL INSPECTION APPARATUS

METHOD FOR FABRICATING A LIQUID-CRYSTAL-BASED ELECTRO-OPTICAL LIGHT...

CONDUCTIVE AND TRANSPARENT INTERCONNECTION STRUCTURE, ASSOCIATED MA...

OPTICAL INSPECTION APPARATUS

METHOD AND DEVICE FOR DETERMINING THE CONCENTRATION OF ANALYTES IN...

ELECTRICALLY-MODULATED SURFACE WAVES AND AN ELECTRODE INTERFACE COM...

Electrically-Modulated Biosensors Using Electro-Active Waveguides

GENETICALLY ENCODED RED FLUORESCENT VOLTAGE SENSORS ENABLING MILLIV...

Device and Method for Analyzing a Material

Optical methods for obtaining digital data to be used in determinin...

Method and Device for Drug Screening

METHOD AND DEVICE FOR ANALYSIS OF A FLUID BY MEANS OF EVANESCENCE F...

MULTIPLE OPTICAL WAVELENGTH INTERFEROMETRIC TESTING METHODS FOR THE...

METHOD AND APPARATUS FOR SIMULTANEOUS SPECTROELECTROCHEMICAL ANALYSIS

OPTICAL SENSOR AND METHOD FOR DETECTING MOLECULES

High Frequency Deflection Measurement of IR Absorption

OPTICALLY ENHANCED HOLOGRAPHIC INTERFEROMETRIC TESTING METHODS FOR...

Surface Impedance Imaging Methods and Apparatuses

METHOD FOR OPTICALLY ENHANCED HOLOGRAHIC INTERFEROMETRIC TESTING FO...

METHOD AND APPARATUS FOR MEASURING ZETA POTENTIAL OF SUSPENDED PART...

SYSTEMS FOR MEASURING ELECTRO-OPTIC AND THERMO-OPTIC COEFFICIENTS B...

MICROELECTRONIC SENSOR DEVICE FOR THE DETECTION OF TARGET PARTICLES

ANALYTICAL METHOD FOR OPTICAL MEASUREMENT

Characterization Of Non-Linear Optical Materials Using Bragg Coupling

OPTICAL MEASURING DEVICE

Method and apparatus for enhancing waveguide sensor signal

METHOD FOR OPTICALLY TESTING SEMICONDUCTOR DEVICES

Surface-plasmon-resonance sensing technique using electro-optic mod...

NON-DESTRUCTIVE TESTING SYSTEM