Eliminating deleterious effects due to thermal effects, electric or magnetic field

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H01J3/026

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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J3/00Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps

Current Industry

H01J3/026Eliminating deleterious effects due to thermal effects, electric or magnetic field

Industries

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Patents Grantslast 30 patents

Information Patent Grant
On-chip micro electron source and manufacturing method thereof
- Patent number 11,355,301
- Issue date Jun 7, 2022
- Peking University
- Xianlong Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
On-chip micro electron source and manufacturing method thereof
- Patent number 11,315,747
- Issue date Apr 26, 2022
- Peking University
- Xianlong Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused ion beam low kV enhancement
- Patent number 9,443,692
- Issue date Sep 13, 2016
- FEI Company
- Mostafa Maazouz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused ion beam low kV enhancement
- Patent number 8,933,414
- Issue date Jan 13, 2015
- FEI Company
- Mostafa Maazouz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of controlling electron beam focusing of pierce-type electro...
- Patent number 8,198,797
- Issue date Jun 12, 2012
- ULVAC, Inc.
- Eiichi Iijima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus
- Patent number 7,427,826
- Issue date Sep 23, 2008
- Canon Kabushiki Kaisha
- Jun Iba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device with cleaning unit and method of opera...
- Patent number 7,355,186
- Issue date Apr 8, 2008
- ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Thomas Jasinski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam directed energy device and methods of using same
- Patent number 7,282,727
- Issue date Oct 16, 2007
- Michael W. Retsky
- F41 - WEAPONS
Information Patent Grant
Insulation diaphragm for getter flash turntable and method of imple...
- Patent number 6,296,538
- Issue date Oct 2, 2001
- Sony Corporation
- Michael J. Chamberlain
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Heater coil for electron tube
- Patent number 5,426,351
- Issue date Jun 20, 1995
- NEC Corporation
- Hironori Imura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Beam generating system for electron tubes, particularly travelling...
- Patent number 4,644,219
- Issue date Feb 17, 1987
- Siemens Aktiengesellschaft
- Erwin Huebner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Insulated elastic support and clamping means for resistance heaters...
- Patent number 4,068,145
- Issue date Jan 10, 1978
- Nihon Denshi Kabushiki Kaisha
- Seiichi Nakagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gridded convergent flow electron gun for linear beam tubes
- Patent number 3,983,446
- Issue date Sep 28, 1976
- Varian Associates
- George V. Miram
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Means and method for suppressing oscillations in electron guns
- Patent number 3,963,955
- Issue date Jun 15, 1976
- Varian Associates
- George V. Miram
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3843902
- Patent number 3,843,902
- Issue date Oct 22, 1974
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3808498
- Patent number 3,808,498
- Issue date Apr 30, 1974
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3769540
- Patent number 3,769,540
- Issue date Oct 30, 1973
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3716739
- Patent number 3,716,739
- Issue date Feb 13, 1973
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3706002
- Patent number 3,706,002
- Issue date Dec 12, 1972
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3631290
- Patent number 3,631,290
- Issue date Dec 28, 1971
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3602765
- Patent number 3,602,765
- Issue date Aug 31, 1971
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3602752
- Patent number 3,602,752
- Issue date Aug 31, 1971
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3461338
- Patent number 3,461,338
- Issue date Aug 12, 1969
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3329849
- Patent number 3,329,849
- Issue date Jul 4, 1967
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3227906
- Patent number 3,227,906
- Issue date Jan 4, 1966
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3135890
- Patent number 3,135,890
- Issue date Jun 2, 1964
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3100273
- Patent number 3,100,273
- Issue date Aug 6, 1963
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3026438
- Patent number 3,026,438
- Issue date Mar 20, 1962
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
2961562
- Patent number 2,961,562
- Issue date Nov 22, 1960
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
2518472
- Patent number 2,518,472
- Issue date Aug 15, 1950
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ON-CHIP MICRO ELECTRON SOURCE AND MANUFACTURING METHOD THEREOF
- Publication number 20210398766
- Publication date Dec 23, 2021
- Peking University
- Xianlong WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Focused Ion Beam Low kV Enhancement
- Publication number 20140239175
- Publication date Aug 28, 2014
- FEI Company
- Mostafa Maazouz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Controlling Electron Beam Focusing of Pierce-Type Electro...
- Publication number 20100026161
- Publication date Feb 4, 2010
- Ulvac, Inc.
- Eiichi Iijima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam directed energy device and methods of using same
- Publication number 20070029497
- Publication date Feb 8, 2007
- Michael W. Retsky
- F42 - AMMUNITION BLASTING
Information Patent Application
Charged particle beam device with cleaning unit and method of opera...
- Publication number 20060231772
- Publication date Oct 19, 2006
- Thomas Jasinski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam apparatus
- Publication number 20060164001
- Publication date Jul 27, 2006
- Canon Kabushiki Kaisha
- Jun Iba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron gun and an electron beam window
- Publication number 20050253496
- Publication date Nov 17, 2005
- Adam Armitage
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GRIDS
- Publication number 20020021076
- Publication date Feb 21, 2002
- DAVID WARD CARR
- H01 - BASIC ELECTRIC ELEMENTS

Eliminating deleterious effects due to thermal effects, electric or magnetic field

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

On-chip micro electron source and manufacturing method thereof

On-chip micro electron source and manufacturing method thereof

Focused ion beam low kV enhancement

Focused ion beam low kV enhancement

Method of controlling electron beam focusing of pierce-type electro...

Electron beam apparatus

Charged particle beam device with cleaning unit and method of opera...

Electron beam directed energy device and methods of using same

Insulation diaphragm for getter flash turntable and method of imple...

Heater coil for electron tube

Beam generating system for electron tubes, particularly travelling...

Insulated elastic support and clamping means for resistance heaters...

Gridded convergent flow electron gun for linear beam tubes

Means and method for suppressing oscillations in electron guns

3843902

3808498

3769540

3716739

3706002

3631290

3602765

3602752

3461338

3329849

3227906

3135890

3100273

3026438

2961562

2518472

Patents Applicationslast 30 patents

ON-CHIP MICRO ELECTRON SOURCE AND MANUFACTURING METHOD THEREOF

Focused Ion Beam Low kV Enhancement

Method of Controlling Electron Beam Focusing of Pierce-Type Electro...

Electron beam directed energy device and methods of using same

Charged particle beam device with cleaning unit and method of opera...

Electron beam apparatus

Electron gun and an electron beam window

GRIDS