Error catch memory

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G11C2029/5606Error catch memory

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Patents Grantslast 30 patents

Information Patent Grant
End of life performance throttling to prevent data loss
- Patent number 11,756,638
- Issue date Sep 12, 2023
- Micron Technology, Inc.
- Sebastien Andre Jean
- G01 - MEASURING TESTING
Information Patent Grant
End of life performance throttling to prevent data loss
- Patent number 10,998,066
- Issue date May 4, 2021
- Micron Technology, Inc.
- Sebastien Andre Jean
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory test apparatus
- Patent number 10,636,509
- Issue date Apr 28, 2020
- TOSHIBA MEMORY CORPORATION
- Tetsuharu Kojima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Arbitration for memory diagnostics
- Patent number 10,622,090
- Issue date Apr 14, 2020
- International Business Machines Corporation
- Aravindan J. Busi
- G01 - MEASURING TESTING
Information Patent Grant
Memory test system and an operating method thereof
- Patent number 10,599,540
- Issue date Mar 24, 2020
- SK Hynix Inc.
- In Ho Choi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor apparatus with reduced risks of chip counterfeiting a...
- Patent number 10,460,824
- Issue date Oct 29, 2019
- Yukihiro Nagai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
End of life performance throttling to prevent data loss
- Patent number 10,453,543
- Issue date Oct 22, 2019
- Micron Technology, Inc.
- Sebastien Andre Jean
- G01 - MEASURING TESTING
Information Patent Grant
Realtime streaming control of an arbitrary waveform generator
- Patent number 10,418,077
- Issue date Sep 17, 2019
- Tektronix, Inc.
- Brandon Z. Fry
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Read mode tuning
- Patent number 10,381,097
- Issue date Aug 13, 2019
- Western Digital Technologies, Inc.
- Nian Niles Yang
- G11 - INFORMATION STORAGE
Information Patent Grant
Device and method for repairing memory cell and memory system inclu...
- Patent number 10,347,355
- Issue date Jul 9, 2019
- Samsung Electronics Co., Ltd.
- Kyo-Min Sohn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Arbitration for memory diagnostics
- Patent number 10,153,055
- Issue date Dec 11, 2018
- International Business Machines Corporation
- Aravindan J. Busi
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory devices and methods of operating the same
- Patent number 9,953,725
- Issue date Apr 24, 2018
- Samsung Electronics Co., Ltd.
- Ye-Sin Ryu
- G11 - INFORMATION STORAGE
Information Patent Grant
Detecting and managing bad columns
- Patent number 9,786,388
- Issue date Oct 10, 2017
- Avago Technologies General IP (Singapore) Pte. Ltd.
- Amir Nassie
- G11 - INFORMATION STORAGE
Information Patent Grant
Device and method for repairing memory cell and memory system inclu...
- Patent number 9,659,669
- Issue date May 23, 2017
- Samsung Electronics Co., Ltd.
- Kyo-Min Sohn
- G11 - INFORMATION STORAGE
Information Patent Grant
Detection system for detecting fail block using logic block address...
- Patent number 9,613,718
- Issue date Apr 4, 2017
- Unitest Inc.
- Young Myoun Han
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for implementing a memory defect map
- Patent number 9,373,362
- Issue date Jun 21, 2016
- Dell Products L.P.
- Mukund P. Khatri
- G11 - INFORMATION STORAGE
Information Patent Grant
Detecting and managing bad columns
- Patent number 9,348,694
- Issue date May 24, 2016
- AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
- Amir Nassie
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus for capturing results of memory testing
- Patent number 9,286,181
- Issue date Mar 15, 2016
- GLOBALFOUNDRIES Inc.
- Craig M. Monroe
- G11 - INFORMATION STORAGE
Information Patent Grant
Seamless fail analysis with memory efficient storage of fail lists
- Patent number 9,251,915
- Issue date Feb 2, 2016
- Advantest Corporation
- Hanh Lai
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods for compressing data received over multiple...
- Patent number 9,183,952
- Issue date Nov 10, 2015
- Micron Technology, Inc.
- James S. Rehmeyer
- G11 - INFORMATION STORAGE
Information Patent Grant
Solid state drive tester
- Patent number 9,171,643
- Issue date Oct 27, 2015
- UNITEST INC
- Eui Won Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Error generating apparatus for solid state drive tester
- Patent number 9,153,345
- Issue date Oct 6, 2015
- Unitest Inc.
- Eui Won Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Device and method for repairing memory cell and memory system inclu...
- Patent number 9,087,613
- Issue date Jul 21, 2015
- Samsung Electronics Co., Ltd.
- Kyo-Min Sohn
- G11 - INFORMATION STORAGE
Information Patent Grant
Test circuit, memory system, and test method of memory system
- Patent number 8,918,685
- Issue date Dec 23, 2014
- SK Hynix Inc.
- Hyung-Gyun Yang
- G11 - INFORMATION STORAGE
Information Patent Grant
Electronic measuring device and method of converting serial data to...
- Patent number 8,806,095
- Issue date Aug 12, 2014
- Zeroplus Technology Co., Ltd.
- Chiu-Hao Cheng
- G11 - INFORMATION STORAGE
Information Patent Grant
Yield-enhancing device failure analysis
- Patent number 8,738,977
- Issue date May 27, 2014
- Agere Systems LLC
- David A. Brown
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 8,687,444
- Issue date Apr 1, 2014
- Elpida Memory, Inc.
- Akira Ide
- G11 - INFORMATION STORAGE
Information Patent Grant
Test apparatus
- Patent number 8,677,197
- Issue date Mar 18, 2014
- Advantest Corporation
- Kenichi Fujisaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Test apparatus and test method
- Patent number 8,601,329
- Issue date Dec 3, 2013
- Advantest Corporation
- Masaru Doi
- G11 - INFORMATION STORAGE
Information Patent Grant
Signal capture system and test apparatus including the same
- Patent number 8,476,908
- Issue date Jul 2, 2013
- Samsung Electronics Co., Ltd.
- Woon-sup Choi
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
END OF LIFE PERFORMANCE THROTTLING TO PREVENT DATA LOSS
- Publication number 20200035314
- Publication date Jan 30, 2020
- Micron Technology, Inc.
- Sebastien Andre Jean
- G01 - MEASURING TESTING
Information Patent Application
READ MODE TUNING
- Publication number 20190130989
- Publication date May 2, 2019
- Western Digital Technologies, Inc.
- Nian Niles Yang
- G11 - INFORMATION STORAGE
Information Patent Application
EOL PERFORMANCE THROTTLING TO PREVENT DATA LOSS
- Publication number 20190130984
- Publication date May 2, 2019
- Micron Technology, Inc.
- Sebastien Andre Jean
- G01 - MEASURING TESTING
Information Patent Application
ARBITRATION FOR MEMORY DIAGNOSTICS
- Publication number 20190035486
- Publication date Jan 31, 2019
- International Business Machines Corporation
- Aravindan J. BUSI
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS FOR COMPRESSING DATA RECEIVED OVER MULTIPLE...
- Publication number 20140237305
- Publication date Aug 21, 2014
- Micron Technology, Inc.
- James S. Rehmeyer
- G01 - MEASURING TESTING
Information Patent Application
SOLID STATE DRIVE TESTER
- Publication number 20140047286
- Publication date Feb 13, 2014
- Eui Won LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ERROR GENERATING APPARATUS FOR SOLID STATE DRIVE TESTER
- Publication number 20140047290
- Publication date Feb 13, 2014
- Eui Won LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTING METHOD AND SEMICONDUCTOR INTEGRATED CIRCUIT TO WHICH THE SA...
- Publication number 20140040686
- Publication date Feb 6, 2014
- Fujitsu Limited
- MASAHIRO YANAGIDA
- G11 - INFORMATION STORAGE
Information Patent Application
TEST CIRCUIT, MEMORY SYSTEM, AND TEST METHOD OF MEMORY SYSTEM
- Publication number 20130246867
- Publication date Sep 19, 2013
- Hyung-Gyun YANG
- G11 - INFORMATION STORAGE
Information Patent Application
DEVICE AND METHOD FOR REPAIRING MEMORY CELL AND MEMORY SYSTEM INCLU...
- Publication number 20130227344
- Publication date Aug 29, 2013
- Kyo-Min Sohn
- G01 - MEASURING TESTING
Information Patent Application
TESTING METHOD, NON-TRANSITORY, COMPUTER READABLE STORAGE MEDIUM AN...
- Publication number 20120221903
- Publication date Aug 30, 2012
- FUJITSU LIMITED
- Tadashi OHNUMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST APPARATUS
- Publication number 20120216086
- Publication date Aug 23, 2012
- Advantest Corporation
- Kenichi FUJISAKI
- G11 - INFORMATION STORAGE
Information Patent Application
ELECTRONIC MEASURING DEVICE AND METHOD OF CONVERTING SERIAL DATA TO...
- Publication number 20120198109
- Publication date Aug 2, 2012
- Zeroplus Technology Co., Ltd.
- CHIU-HAO CHENG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20120198292
- Publication date Aug 2, 2012
- Advantest Corporation
- Akimasa YUZURIHARA
- G11 - INFORMATION STORAGE
Information Patent Application
TEST APPARATUS FOR MULTI-CHIP PACKAGE AND TEST METHOD THEREOF
- Publication number 20120143558
- Publication date Jun 7, 2012
- DAWIN TECHNOLOGY INC.
- Jung Woong Yang
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and manufacturing method thereof
- Publication number 20120075944
- Publication date Mar 29, 2012
- Elpida Memory, Inc.
- Akira Ide
- G11 - INFORMATION STORAGE
Information Patent Application
FAIL ANALYSIS SYSTEM AND METHOD FOR SEMICONDUCTOR DEVICE
- Publication number 20120011421
- Publication date Jan 12, 2012
- Mami KODAMA
- G11 - INFORMATION STORAGE
Information Patent Application
Measuring SDRAM Control Signal Timing
- Publication number 20110267906
- Publication date Nov 3, 2011
- International Business Machines Corporation
- Moises Cases
- G11 - INFORMATION STORAGE
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20110258491
- Publication date Oct 20, 2011
- Advantest Corporation
- Masaru DOI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST APPARATUS
- Publication number 20110167306
- Publication date Jul 7, 2011
- YOKOGAWA ELECTRIC CORPORATION
- Takahiro Kimura
- G11 - INFORMATION STORAGE
Information Patent Application
BURST ADDRESS GENERATOR AND TEST APPARATUS INCLUDING THE SAME
- Publication number 20110158014
- Publication date Jun 30, 2011
- Je-young Park
- G11 - INFORMATION STORAGE
Information Patent Application
SIGNAL CAPTURE SYSTEM AND TEST APPARATUS INCLUDING THE SAME
- Publication number 20110109318
- Publication date May 12, 2011
- Samsung Electronics Co., Ltd.
- Woon-sup Choi
- G11 - INFORMATION STORAGE
Information Patent Application
Apparatus and Method for Manufacturing a Multiple-Chip Memory Device
- Publication number 20100306605
- Publication date Dec 2, 2010
- QIMONDA NORTH AMERICA CORP.
- KoonHee Lee
- G11 - INFORMATION STORAGE
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20100235694
- Publication date Sep 16, 2010
- Advantest Corporation
- Kenichi FUJISAKI
- G11 - INFORMATION STORAGE
Information Patent Application
Fault Diagnosis For Non-Volatile Memories
- Publication number 20100229055
- Publication date Sep 9, 2010
- NILANJAN MUKHERJEE
- G11 - INFORMATION STORAGE
Information Patent Application
ENABLING AN INTEGRATED MEMORY CONTROLLER TO TRANSPARENTLY WORK WITH...
- Publication number 20100169729
- Publication date Jul 1, 2010
- SHAMANNA M. DATTA
- G11 - INFORMATION STORAGE
Information Patent Application
Single event upset (SEU) testing system and method
- Publication number 20100163756
- Publication date Jul 1, 2010
- Custom Test Systems, LLC.
- Richard McPeak
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS
- Publication number 20100148815
- Publication date Jun 17, 2010
- Advantest Corporation
- Makoto TABATA
- G11 - INFORMATION STORAGE
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20100042880
- Publication date Feb 18, 2010
- Advantest Corporation
- Kohji SAKAI
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor testing device and method of testing semiconductor me...
- Publication number 20100034037
- Publication date Feb 11, 2010
- Makota Tabata
- G11 - INFORMATION STORAGE

Error catch memory

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

End of life performance throttling to prevent data loss

End of life performance throttling to prevent data loss

Memory test apparatus

Arbitration for memory diagnostics

Memory test system and an operating method thereof

Semiconductor apparatus with reduced risks of chip counterfeiting a...

End of life performance throttling to prevent data loss

Realtime streaming control of an arbitrary waveform generator

Read mode tuning

Device and method for repairing memory cell and memory system inclu...

Arbitration for memory diagnostics

Semiconductor memory devices and methods of operating the same

Detecting and managing bad columns

Device and method for repairing memory cell and memory system inclu...

Detection system for detecting fail block using logic block address...

System and method for implementing a memory defect map

Detecting and managing bad columns

Apparatus for capturing results of memory testing

Seamless fail analysis with memory efficient storage of fail lists

Apparatuses and methods for compressing data received over multiple...

Solid state drive tester

Error generating apparatus for solid state drive tester

Device and method for repairing memory cell and memory system inclu...

Test circuit, memory system, and test method of memory system

Electronic measuring device and method of converting serial data to...

Yield-enhancing device failure analysis

Semiconductor device and manufacturing method thereof

Test apparatus

Test apparatus and test method

Signal capture system and test apparatus including the same

Patents Applicationslast 30 patents

END OF LIFE PERFORMANCE THROTTLING TO PREVENT DATA LOSS

READ MODE TUNING

EOL PERFORMANCE THROTTLING TO PREVENT DATA LOSS

ARBITRATION FOR MEMORY DIAGNOSTICS

APPARATUSES AND METHODS FOR COMPRESSING DATA RECEIVED OVER MULTIPLE...

SOLID STATE DRIVE TESTER

ERROR GENERATING APPARATUS FOR SOLID STATE DRIVE TESTER

TESTING METHOD AND SEMICONDUCTOR INTEGRATED CIRCUIT TO WHICH THE SA...

TEST CIRCUIT, MEMORY SYSTEM, AND TEST METHOD OF MEMORY SYSTEM

DEVICE AND METHOD FOR REPAIRING MEMORY CELL AND MEMORY SYSTEM INCLU...

TESTING METHOD, NON-TRANSITORY, COMPUTER READABLE STORAGE MEDIUM AN...

TEST APPARATUS

ELECTRONIC MEASURING DEVICE AND METHOD OF CONVERTING SERIAL DATA TO...

TEST APPARATUS AND TEST METHOD

TEST APPARATUS FOR MULTI-CHIP PACKAGE AND TEST METHOD THEREOF

Semiconductor device and manufacturing method thereof

FAIL ANALYSIS SYSTEM AND METHOD FOR SEMICONDUCTOR DEVICE

Measuring SDRAM Control Signal Timing

TEST APPARATUS AND TEST METHOD

SEMICONDUCTOR TEST APPARATUS

BURST ADDRESS GENERATOR AND TEST APPARATUS INCLUDING THE SAME

SIGNAL CAPTURE SYSTEM AND TEST APPARATUS INCLUDING THE SAME

Apparatus and Method for Manufacturing a Multiple-Chip Memory Device

TEST APPARATUS AND TEST METHOD

Fault Diagnosis For Non-Volatile Memories

ENABLING AN INTEGRATED MEMORY CONTROLLER TO TRANSPARENTLY WORK WITH...

Single event upset (SEU) testing system and method

TEST APPARATUS

TEST APPARATUS AND TEST METHOD

Semiconductor testing device and method of testing semiconductor me...