especially adapted circuits therefor

Industry

CPC
G01D5/2266

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Parent Industries

GPHYSICS G01Measuring instruments G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS TARIFF METERING APPARATUS MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR G01D5/00Mechanical means for transferring the output of a sensing member Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting Transducers not specially adapted for a specific variable

Current Industry

G01D5/2266especially adapted circuits therefor

Industries

Patents Grantslast 30 patents

Information Patent Grant
Method for testing a sensor
- Patent number 11,441,928
- Issue date Sep 13, 2022
- Continental Teves AG & Co. OHG
- Sören Lehmann
- G01 - MEASURING TESTING
Information Patent Grant
Sensor circuit for detecting rotation of an object and method therefor
- Patent number 10,018,654
- Issue date Jul 10, 2018
- Semiconductor Components Industries, LLC
- Jacques Bertin
- G01 - MEASURING TESTING
Information Patent Grant
Position encoder sample timing system
- Patent number 9,877,042
- Issue date Jan 23, 2018
- Mitutoyo Corporation
- Bjorn Erik Bertil Jansson
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Control surface skew detection systems
- Patent number 9,797,702
- Issue date Oct 24, 2017
- Rosemount Aerospace Inc.
- Magdi A. Essawy
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Amplitude evaluation by means of a goertzel algorithm in a differen...
- Patent number 9,243,933
- Issue date Jan 26, 2016
- Continental Teves AG & Co. oHG
- Sören Lehmann
- G01 - MEASURING TESTING
Information Patent Grant
System and method for position sensing
- Patent number 9,222,804
- Issue date Dec 29, 2015
- Persimmon Technologies Corporation
- Martin Hosek
- G01 - MEASURING TESTING
Information Patent Grant
Detector
- Patent number 9,217,628
- Issue date Dec 22, 2015
- Mark Anthony Howard
- G01 - MEASURING TESTING
Information Patent Grant
LVDT acquisition device with dual demodulation subsystem
- Patent number 7,893,687
- Issue date Feb 22, 2011
- Thales
- Philippe Buisson
- G01 - MEASURING TESTING
Information Patent Grant
Detection device
- Patent number 7,132,825
- Issue date Nov 7, 2006
- Universite de Liege
- Nicolas Martin
- G01 - MEASURING TESTING
Information Patent Grant
System and method for processing a signal
- Patent number 6,864,808
- Issue date Mar 8, 2005
- Goodrich Pump & Engine Control Systems, Inc.
- Gary M. McBrien
- G01 - MEASURING TESTING
Information Patent Grant
Inductive transducer with calibrating balancing core for measuring...
- Patent number 5,117,181
- Issue date May 26, 1992
- Commissariat a l'Energie Atomique
- Henri Clergeot
- G01 - MEASURING TESTING
Information Patent Grant
Monolithic interface circuit for linear variable differential trans...
- Patent number 4,904,921
- Issue date Feb 27, 1990
- Analog Devices, Inc.
- Lawrence M. DeVito
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Differential transformer for detecting the displacement of a probe...
- Patent number 4,896,110
- Issue date Jan 23, 1990
- Man Design Co., Ltd.
- Giichiro Shimizu
- G01 - MEASURING TESTING
Information Patent Grant
Displacement detector with three secondary coils, one of which prov...
- Patent number 4,783,626
- Issue date Nov 8, 1988
- Honda Giken Kogyo Kabushiki Kaisha
- Yasuo Shimizu
- G01 - MEASURING TESTING
Information Patent Grant
AC excited transducer having stabilized phase sensitive demodulator...
- Patent number 4,599,560
- Issue date Jul 8, 1986
- The Warner & Swasey Company
- Norman R. Sanford
- G01 - MEASURING TESTING
Information Patent Grant
Signal conditioning circuit for L/R VDT sensors
- Patent number 4,591,795
- Issue date May 27, 1986
- United Technologies Corporation
- Gary A. McCorkle
- G01 - MEASURING TESTING
Information Patent Grant
High resolution position sensing apparatus with linear variable dif...
- Patent number 4,514,689
- Issue date Apr 30, 1985
- Varian Associates, Inc.
- William A. Gerard
- G01 - MEASURING TESTING
Information Patent Grant
Synchronous oscillator demodulator system
- Patent number 4,335,442
- Issue date Jun 15, 1982
- American Can Company
- Soren B. Backe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High accuracy position indicator
- Patent number 4,140,998
- Issue date Feb 20, 1979
- Sangamo Weston, Inc.
- Richard E. Bettle
- G01 - MEASURING TESTING
Information Patent Grant
Position and velocity sensors
- Patent number 4,100,480
- Issue date Jul 11, 1978
- Dataproducts Corporation
- Dan R. Lytle
- G01 - MEASURING TESTING
Information Patent Grant
Multiplexed transducer
- Patent number 4,092,852
- Issue date Jun 6, 1978
- Hughes Microelectronics Limited
- Albert Lewis Fowler
- G01 - MEASURING TESTING
Information Patent Grant
Differential reluctance motion detector
- Patent number 4,083,237
- Issue date Apr 11, 1978
- Fischer & Porter Co.
- Peter S. Levesque
- G01 - MEASURING TESTING
Information Patent Grant
Bi-directional zero radius auto-fire probe and amplifier
- Patent number 3,956,741
- Issue date May 11, 1976
- Kraus Instruments, Inc.
- Ronald G. Kraus
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR TESTING A SENSOR
- Publication number 20210310837
- Publication date Oct 7, 2021
- Continental Teves AG & Co. OHG
- Sören Lehmann
- G01 - MEASURING TESTING
Information Patent Application
AMPLITUDE EVALUATION BY MEANS OF A GOERTZEL ALGORITHM IN A DIFFEREN...
- Publication number 20140203801
- Publication date Jul 24, 2014
- Continental Teves AG & Co. oHG
- Sören Lehmann
- G01 - MEASURING TESTING
Information Patent Application
Detector
- Publication number 20130082692
- Publication date Apr 4, 2013
- Mark Anthony Howard
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR POSITION SENSING
- Publication number 20130057263
- Publication date Mar 7, 2013
- PERSIMMON TECHNOLOGIES CORPORATION
- Martin Hosek
- G01 - MEASURING TESTING
Information Patent Application
LVDT ACQUISITION DEVICE WITH DUAL DEMODULATION SUBSYSTEM
- Publication number 20090086830
- Publication date Apr 2, 2009
- THALES
- Philippe Buisson
- G01 - MEASURING TESTING
Information Patent Application
Detection device
- Publication number 20040169507
- Publication date Sep 2, 2004
- Nicolas Martin
- G01 - MEASURING TESTING
Information Patent Application
System and method for processing a signal
- Publication number 20030141917
- Publication date Jul 31, 2003
- Gary M. McBrien
- G01 - MEASURING TESTING

especially adapted circuits therefor

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for testing a sensor

Sensor circuit for detecting rotation of an object and method therefor

Position encoder sample timing system

Control surface skew detection systems

Amplitude evaluation by means of a goertzel algorithm in a differen...

System and method for position sensing

Detector

LVDT acquisition device with dual demodulation subsystem

Detection device

System and method for processing a signal

Inductive transducer with calibrating balancing core for measuring...

Monolithic interface circuit for linear variable differential trans...

Differential transformer for detecting the displacement of a probe...

Displacement detector with three secondary coils, one of which prov...

AC excited transducer having stabilized phase sensitive demodulator...

Signal conditioning circuit for L/R VDT sensors

High resolution position sensing apparatus with linear variable dif...

Synchronous oscillator demodulator system

High accuracy position indicator

Position and velocity sensors

Multiplexed transducer

Differential reluctance motion detector

Bi-directional zero radius auto-fire probe and amplifier

Patents Applicationslast 30 patents

METHOD FOR TESTING A SENSOR

AMPLITUDE EVALUATION BY MEANS OF A GOERTZEL ALGORITHM IN A DIFFEREN...

Detector

SYSTEM AND METHOD FOR POSITION SENSING

LVDT ACQUISITION DEVICE WITH DUAL DEMODULATION SUBSYSTEM

Detection device

System and method for processing a signal