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G01N2030/8648
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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G01N2030/8648
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Patents Grants
last 30 patents
Information
Patent Grant
Methods, mediums, and systems to compare data within and between co...
Patent number
12,163,936
Issue date
Dec 10, 2024
WATERS TECHNOLOGIES IRELAND LIMITED
Scott J. Geromanos
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for performing chromatographic alignment
Patent number
11,454,617
Issue date
Sep 27, 2022
Thermo Finnigan LLC.
Iman Mohtashemi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Cloud-platform based automatic identification system and method of...
Patent number
11,340,201
Issue date
May 24, 2022
CHINESE ACADEMY OF INSPECTION AND QUARANTINE
Guofang Pang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Chromatographic data system, processing apparatus, chromatographic...
Patent number
11,215,591
Issue date
Jan 4, 2022
Hitachi High-Tech Science Corporation
Masahito Ito
G01 - MEASURING TESTING
Information
Patent Grant
Methods for scaling between chromatographic systems using highly co...
Patent number
11,020,687
Issue date
Jun 1, 2021
Waters Technologies Corporation
Jason F. Hill
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Method and apparatus for scaling between chromatographic systems us...
Patent number
10,996,204
Issue date
May 4, 2021
Waters Technologies Corporation
Joseph D. Michienzi
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Analytical method and analytical system
Patent number
10,775,345
Issue date
Sep 15, 2020
ARKRAY, Inc.
Masao Kawano
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for extracting mass traces
Patent number
10,504,707
Issue date
Dec 10, 2019
Thermo Fisher Scientific (Bremen) GmbH
Hans Pfaff
G01 - MEASURING TESTING
Information
Patent Grant
Waveform data processing device and waveform data processing program
Patent number
10,371,676
Issue date
Aug 6, 2019
Shimadzu Corporation
Hiroaki Kozawa
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for extracting mass traces
Patent number
10,347,478
Issue date
Jul 9, 2019
Thermo Fisher Scientific (Bremen) GmbH
Hans Pfaff
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Data processing system for comprehensive two-dimensional chromatograph
Patent number
10,254,258
Issue date
Apr 9, 2019
Shimadzu Corporation
Shinichi Yamaguchi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
A METHOD OF ANALYSIS OF MASS SPECTROMETRY DATA
Publication number
20240094173
Publication date
Mar 21, 2024
Micromass UK Limited
Patrick Boyce
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR DETERMINING SMALL MOLECULE COMPONENTS OF A COMPLEX MIXTU...
Publication number
20230288384
Publication date
Sep 14, 2023
Metabolon, Inc.
Rex A. Dwyer
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CREATING DISCRIMINATOR
Publication number
20220128532
Publication date
Apr 28, 2022
Shimadzu Corporation
Shinji KANAZAWA
G01 - MEASURING TESTING
Information
Patent Application
A CLOUD-PLATFORM BASED AUTOMATIC IDENTIFICATION SYSTEM AND METHOD O...
Publication number
20220050092
Publication date
Feb 17, 2022
CHINESE ACADEMY OF INSPECTION AND QUARANTINE
Guofang PANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CONVERSION OF LONG CELL DATA TO SHORT CELL EQUIVALENT
Publication number
20210405003
Publication date
Dec 30, 2021
Board of Regents, The University of Texas System
Purnendu K. Dasgupta
G01 - MEASURING TESTING
Information
Patent Application
METHODS, MEDIUMS, AND SYSTEMS TO COMPARE DATA WITHIN AND BETWEEN CO...
Publication number
20210333251
Publication date
Oct 28, 2021
WATERS TECHNOLOGIES IRELAND LIMITED
Scott J. Geromanos
G01 - MEASURING TESTING
Information
Patent Application
Methods of Automated Spectral and Chromatographic Peak Detection an...
Publication number
20120089342
Publication date
Apr 12, 2012
David A. Wright
G01 - MEASURING TESTING