Flaw counting

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CPC
G01N2021/8858

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/8858Flaw counting

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for enhanced evaluation of pre-owned electronic...
- Patent number 12,033,477
- Issue date Jul 9, 2024
- A LA CARTE MEDIA, INC.
- Dominique Dion
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and electronic apparatus for displaying inspection result of...
- Patent number 11,428,644
- Issue date Aug 30, 2022
- Koh Young Technology Inc.
- Jong Myoung Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Information processing apparatus related to machine learning for de...
- Patent number 11,378,522
- Issue date Jul 5, 2022
- Canon Kabushiki Kaisha
- Shoichi Hoshino
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for detection of mobile device fault conditions
- Patent number 11,210,777
- Issue date Dec 28, 2021
- BLANCCO TECHNOLOGY GROUP IP OY
- William Fitzgerald
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection and cosmetic grading through image processing system and...
- Patent number 10,753,882
- Issue date Aug 25, 2020
- Amit Anil Mahajan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Crack analysis device, crack analysis method, and crack analysis pr...
- Patent number 10,648,922
- Issue date May 12, 2020
- Kabushiki Kaisha Toshiba
- Yoko Yonekawa
- E01 - CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
Information Patent Grant
Method for adaptive sampling in examining an object and system thereof
- Patent number 10,190,991
- Issue date Jan 29, 2019
- Applied Materials Israel Ltd.
- Yotam Sofer
- G01 - MEASURING TESTING
Information Patent Grant
System and method for self-performing a cosmetic evaluation of an e...
- Patent number 10,007,934
- Issue date Jun 26, 2018
- Greystone Data Technology, Inc.
- Tu Nguyen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method for production line monitoring
- Patent number 9,983,148
- Issue date May 29, 2018
- KLA-Tencor Corporation
- Saravanan Paramasivam
- G05 - CONTROLLING REGULATING
Information Patent Grant
Defect inspection apparatus, defect inspection method, and manufact...
- Patent number 8,270,703
- Issue date Sep 18, 2012
- Fujitsu Semiconductor Limited
- Naohiro Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for determining cumulative foreign object charact...
- Patent number 8,068,659
- Issue date Nov 29, 2011
- The Boeing Company
- Roger W. Engelbart
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Apparatus and method for inspecting a surface of a wafer
- Patent number 7,697,130
- Issue date Apr 13, 2010
- Samsung Electronics Co., Ltd.
- Woo-Seok Ko
- G01 - MEASURING TESTING
Information Patent Grant
Lifetime evaluating system of mechanical element and method for the...
- Patent number 6,993,178
- Issue date Jan 31, 2006
- Mitsubishi Heavy Industries, Ltd.
- Masashi Ozaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of measuring the period of surface defects
- Patent number 4,982,600
- Issue date Jan 8, 1991
- Fuji Photo Film Co., Ltd.
- Takeshi Kiso
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR ENHANCED EVALUATION OF PRE-OWNED ELECTRONIC...
- Publication number 20240312284
- Publication date Sep 19, 2024
- A LA CARTE MEDIA, INC.
- Dominique DION
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF INSPECTING SEMICONDUCTOR DEVICE
- Publication number 20240230554
- Publication date Jul 11, 2024
- Samsung Electronics Co., Ltd.
- Daehyun JUNG
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR ENHANCED EVALUATION OF PRE-OWNED ELECTRONIC...
- Publication number 20220262189
- Publication date Aug 18, 2022
- A LA CARTE MEDIA, INC.
- Dominique DION
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR DETECTION OF MOBILE DEVICE FAULT CONDITIONS
- Publication number 20220122243
- Publication date Apr 21, 2022
- Blancco Technology Group IP Oy
- William Fitzgerald
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND ELECTRONIC APPARATUS FOR DISPLAYING INSPECTION RESULT OF...
- Publication number 20210404973
- Publication date Dec 30, 2021
- KOH YOUNG TECHNOLOGY INC.
- Jong Myoung LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASUREMENT DEVICE AND MEASUREMENT METHOD
- Publication number 20200410664
- Publication date Dec 31, 2020
- Panasonic Intellectual Property Management Co., Ltd.
- TARO IMAGAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROCESSING APPARATUS RELATED TO MACHINE LEARNING FOR DE...
- Publication number 20200300778
- Publication date Sep 24, 2020
- Canon Kabushiki Kaisha
- Shoichi Hoshino
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR DETECTION OF MOBILE DEVICE FAULT CONDITIONS
- Publication number 20180342050
- Publication date Nov 29, 2018
- Yougetitback Limited
- William Fitzgerald
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR ADAPTIVE SAMPLING IN EXAMINING AN OBJECT AND SYSTEM THEREOF
- Publication number 20180306728
- Publication date Oct 25, 2018
- APPLIED MATERIALS ISRAEL LTD.
- Yotam SOFER
- G01 - MEASURING TESTING
Information Patent Application
CRACK ANALYSIS DEVICE, CRACK ANALYSIS METHOD, AND CRACK ANALYSIS PR...
- Publication number 20180195973
- Publication date Jul 12, 2018
- Kabushiki Kaisha Toshiba
- Yoko Yonekawa
- E01 - CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
Information Patent Application
System and Method for Production Line Monitoring
- Publication number 20160377552
- Publication date Dec 29, 2016
- KLA-Tencor Corporation
- Saravanan Paramasivam
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Self-Performing a Cosmetic Evaluation of an E...
- Publication number 20160225036
- Publication date Aug 4, 2016
- GDT, INC.
- Tu Nguyen
- G01 - MEASURING TESTING
Information Patent Application
GLASS SUBSTRATE PRODUCTION MANAGEMENT SYSTEM AND GLASS SUBSTRATE PR...
- Publication number 20160207822
- Publication date Jul 21, 2016
- Nippon Electric Glass Co., Ltd.
- Shinji OHIGASHI
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION APPARATUS, DEFECT INSPECTION METHOD, AND MANUFACT...
- Publication number 20090304261
- Publication date Dec 10, 2009
- Fujitsu Microelectronics Limited
- Naohiro TAKAHASHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING A SURFACE OF A WAFER
- Publication number 20090219520
- Publication date Sep 3, 2009
- Woo-Seok Ko
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DETERMINING CUMULATIVE FOREIGN OBJECT CHARACT...
- Publication number 20090148030
- Publication date Jun 11, 2009
- Roger W. Engelbart
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
Lifetime evaluating system of mechanical element and method for the...
- Publication number 20020146162
- Publication date Oct 10, 2002
- Mitsubishi Heavy Industries, Ltd.
- Masashi Ozaki
- G01 - MEASURING TESTING

Flaw counting

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems and methods for enhanced evaluation of pre-owned electronic...

Method and electronic apparatus for displaying inspection result of...

Information processing apparatus related to machine learning for de...

System and method for detection of mobile device fault conditions

Inspection and cosmetic grading through image processing system and...

Crack analysis device, crack analysis method, and crack analysis pr...

Method for adaptive sampling in examining an object and system thereof

System and method for self-performing a cosmetic evaluation of an e...

System and method for production line monitoring

Defect inspection apparatus, defect inspection method, and manufact...

Method and system for determining cumulative foreign object charact...

Apparatus and method for inspecting a surface of a wafer

Lifetime evaluating system of mechanical element and method for the...

Method of measuring the period of surface defects

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR ENHANCED EVALUATION OF PRE-OWNED ELECTRONIC...

METHOD OF INSPECTING SEMICONDUCTOR DEVICE

SYSTEMS AND METHODS FOR ENHANCED EVALUATION OF PRE-OWNED ELECTRONIC...

SYSTEM AND METHOD FOR DETECTION OF MOBILE DEVICE FAULT CONDITIONS

METHOD AND ELECTRONIC APPARATUS FOR DISPLAYING INSPECTION RESULT OF...

MEASUREMENT DEVICE AND MEASUREMENT METHOD

INFORMATION PROCESSING APPARATUS RELATED TO MACHINE LEARNING FOR DE...

SYSTEM AND METHOD FOR DETECTION OF MOBILE DEVICE FAULT CONDITIONS

METHOD FOR ADAPTIVE SAMPLING IN EXAMINING AN OBJECT AND SYSTEM THEREOF

CRACK ANALYSIS DEVICE, CRACK ANALYSIS METHOD, AND CRACK ANALYSIS PR...

System and Method for Production Line Monitoring

System and Method for Self-Performing a Cosmetic Evaluation of an E...

GLASS SUBSTRATE PRODUCTION MANAGEMENT SYSTEM AND GLASS SUBSTRATE PR...

DEFECT INSPECTION APPARATUS, DEFECT INSPECTION METHOD, AND MANUFACT...

APPARATUS AND METHOD FOR INSPECTING A SURFACE OF A WAFER

METHOD AND SYSTEM FOR DETERMINING CUMULATIVE FOREIGN OBJECT CHARACT...

Lifetime evaluating system of mechanical element and method for the...