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G01N2030/382
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G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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G01N2030/382
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Patents Grants
last 30 patents
Information
Patent Grant
Columns and methods of use for analytical standards and compounds
Patent number
11,998,893
Issue date
Jun 4, 2024
Thomas Jakschitz
G01 - MEASURING TESTING
Information
Patent Grant
Gas chromatograph
Patent number
11,874,205
Issue date
Jan 16, 2024
Shimadzu Corporation
Ayaka Kisaka
G01 - MEASURING TESTING
Information
Patent Grant
Columns and methods of use for analytical standards and compounds
Patent number
11,656,209
Issue date
May 23, 2023
Thomas Jakschitz
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Liquid chromatography systems and methods
Patent number
9,679,757
Issue date
Jun 13, 2017
Waters Technologies Corporation
Jeremy D. Netto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Adjustable open-split interface for a gas chromatograph and a mass...
Patent number
5,281,397
Issue date
Jan 25, 1994
General Electric Company
Woodfin V. Ligon
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring components of an ambient fluid
Patent number
5,257,527
Issue date
Nov 2, 1993
Alan P. Kingsbury
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Columns and Methods of Use for Analytical Standards and Compounds
Publication number
20230278010
Publication date
Sep 7, 2023
Thomas Jakschitz
G01 - MEASURING TESTING
Information
Patent Application
GAS CHROMATOGRAPH
Publication number
20210270786
Publication date
Sep 2, 2021
Shimadzu Corporation
Ayaka Kisaka
G01 - MEASURING TESTING
Information
Patent Application
PREPARATIVE CHROMATOGRAPH
Publication number
20180136174
Publication date
May 17, 2018
Shimadzu Corporation
Takafumi Nakamura
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Gas Chromatographic Analysis of a Gas Mixture
Publication number
20120131987
Publication date
May 31, 2012
SIEMENS AKTIENGESELLSCHAFT
Udo Gellert
G01 - MEASURING TESTING