Membership
Tour
Register
Log in
for defining in-plane movement of the mass
Follow
Industry
CPC
G01P2015/0808
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01P
MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
Current Industry
G01P2015/0808
for defining in-plane movement of the mass
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
FM inertial sensor and method for operating the FM inertial sensor
Patent number
10,809,280
Issue date
Oct 20, 2020
STMicroelectronics S.r.l.
Alessandro Tocchio
G01 - MEASURING TESTING
Information
Patent Grant
MEMS sensor compensation for off-axis movement
Patent number
10,766,764
Issue date
Sep 8, 2020
Invensense, Inc.
Ilya Gurin
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Proof mass and polysilicon electrode integrated thereon
Patent number
10,505,006
Issue date
Dec 10, 2019
Invensense, Inc.
Bongsang Kim
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
MEMS device with off-axis shock protection
Patent number
10,247,753
Issue date
Apr 2, 2019
NXP USA, INC.
Aaron A. Geisberger
G01 - MEASURING TESTING
Information
Patent Grant
Composite vibratory in-plane accelerometer
Patent number
10,234,477
Issue date
Mar 19, 2019
Google LLC
Ozan Anac
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Chip level sensor with multiple degrees of freedom
Patent number
9,638,524
Issue date
May 2, 2017
Robert Bosch GmbH
Ando Feyh
B81 - MICRO-STRUCTURAL TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
FM INERTIAL SENSOR AND METHOD FOR OPERATING THE FM INERTIAL SENSOR
Publication number
20190064205
Publication date
Feb 28, 2019
STMicroelectronics S.r.l.
Alessandro TOCCHIO
G01 - MEASURING TESTING
Information
Patent Application
MEMS DEVICE WITH OFF-AXIS SHOCK PROTECTION
Publication number
20180231579
Publication date
Aug 16, 2018
NXP USA, Inc.
Aaron A. Geisberger
G01 - MEASURING TESTING
Information
Patent Application
Chip Level Sensor with Multiple Degrees of Freedom
Publication number
20140150552
Publication date
Jun 5, 2014
ROBERT BOSCH GmbH
Ando Feyh
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
ACCELEROMETER
Publication number
20130055813
Publication date
Mar 7, 2013
Hewlett-Packard Development Company, L.P.
Robert Newton Bicknell
G01 - MEASURING TESTING