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G01G3/1416
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01G
WEIGHING
G01G3/00
Weighing apparatus characterised by the use of elastically-deformable members
Current Industry
G01G3/1416
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Patents Grants
last 30 patents
Information
Patent Grant
Force transducer forming a load cell
Patent number
9,127,995
Issue date
Sep 8, 2015
Siemens Aktiengesellschaft
Dirk Scheibner
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for the hysteresis correction of measured values...
Patent number
6,928,853
Issue date
Aug 16, 2005
Schenck Process GmbH
Hans Guenter Koenig
G01 - MEASURING TESTING
Information
Patent Grant
Sensing system
Patent number
6,177,637
Issue date
Jan 23, 2001
GEC Avery Limited
Jonathan P Evans
G01 - MEASURING TESTING
Information
Patent Grant
Weight measuring method using a plurality of sensors
Patent number
5,805,467
Issue date
Sep 8, 1998
James L. Richards
G01 - MEASURING TESTING
Information
Patent Grant
Weight measuring apparatus using a plurality of sensors
Patent number
5,724,267
Issue date
Mar 3, 1998
James L. Richards
G01 - MEASURING TESTING
Information
Patent Grant
3429391
Patent number
3,429,391
Issue date
Feb 25, 1969
G01 - MEASURING TESTING
Information
Patent Grant
2998090
Patent number
2,998,090
Issue date
Aug 29, 1961
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
WEIGHING DEVICE AND WEIGHING METHOD, WITH CENTRAL DIGITAL MEASURED...
Publication number
20230400344
Publication date
Dec 14, 2023
Schenck Process Europe GmbH
Samuel BOUVRON
G01 - MEASURING TESTING
Information
Patent Application
FORCE TRANSDUCER FORMING A LOAD CELL
Publication number
20140102218
Publication date
Apr 17, 2014
Dirk Scheibner
G01 - MEASURING TESTING
Information
Patent Application
Method and device for the hysteresis correction of measured values...
Publication number
20040059532
Publication date
Mar 25, 2004
Hans Guenter Koenig
G01 - MEASURING TESTING
Information
Patent Application
Weight measuring apparatus
Publication number
20040031310
Publication date
Feb 19, 2004
Shuntaro Shimizu
G01 - MEASURING TESTING