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G01N2021/95638

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/95638for PCB's

Industries

Patents Grantslast 30 patents

Information Patent Grant
Inspection apparatus and inspection method
- Patent number 12,013,349
- Issue date Jun 18, 2024
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Modular optical inspection station
- Patent number 11,989,872
- Issue date May 21, 2024
- Instrumental, Inc.
- Samuel Bruce Weiss
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multimodality multiplexed illumination for optical inspection systems
- Patent number 11,974,046
- Issue date Apr 30, 2024
- Yigal Katzir
- G01 - MEASURING TESTING
Information Patent Grant
Measurement machine and method for detecting a defect in solder joints
- Patent number 11,927,436
- Issue date Mar 12, 2024
- Hewlett Packard Enterprise Development LP
- Jaime E. Llinas
- G01 - MEASURING TESTING
Information Patent Grant
System and method for rapid inspection of printed circuit board usi...
- Patent number 11,906,578
- Issue date Feb 20, 2024
- Battelle Memorial Institute
- Thomas F. Kent
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of automatically setting optical parameters and automated op...
- Patent number 11,788,972
- Issue date Oct 17, 2023
- Industrial Technology Research Institute
- Chi-Chun Hsia
- G01 - MEASURING TESTING
Information Patent Grant
Fiber weave skew assessment for printed circuit boards
- Patent number 11,781,858
- Issue date Oct 10, 2023
- Cisco Technology, Inc.
- Amendra Koul
- G01 - MEASURING TESTING
Information Patent Grant
Fiber weave skew assessment for printed circuit boards
- Patent number 11,761,755
- Issue date Sep 19, 2023
- Cisco Technology, Inc.
- Amendra Koul
- G01 - MEASURING TESTING
Information Patent Grant
Circuit board anomaly indication
- Patent number 11,435,298
- Issue date Sep 6, 2022
- Hewlett Packard Enterprise Development LP
- David A. Moore
- G01 - MEASURING TESTING
Information Patent Grant
Printed circuit board assembly defect detection
- Patent number 11,423,577
- Issue date Aug 23, 2022
- International Business Machines Corporation
- Matthew S. Kelly
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for inspecting mounting state of component, printed circuit...
- Patent number 11,328,407
- Issue date May 10, 2022
- Koh Young Technology Inc.
- Se Rin Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Modular optical inspection station
- Patent number 11,321,824
- Issue date May 3, 2022
- Instrumental, Inc.
- Samuel Bruce Weiss
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fiber weave skew assessment for printed circuit boards
- Patent number 11,293,752
- Issue date Apr 5, 2022
- Cisco Technology, Inc.
- Amendra Koul
- G01 - MEASURING TESTING
Information Patent Grant
Fiber weave skew assessment for printed circuit boards
- Patent number 11,287,245
- Issue date Mar 29, 2022
- Cisco Technology, Inc.
- Amendra Koul
- G01 - MEASURING TESTING
Information Patent Grant
Method for inspecting mounting state of component, printed circuit...
- Patent number 11,244,436
- Issue date Feb 8, 2022
- Koh Young Technology Inc.
- Se Rin Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image inspecting apparatus, image inspecting method and image inspe...
- Patent number 11,080,843
- Issue date Aug 3, 2021
- Omron Corporation
- Shingo Inazumi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Board inspecting apparatus and board inspecting method using the same
- Patent number 10,986,761
- Issue date Apr 20, 2021
- Koh Young Technology Inc.
- Seung Won Jung
- G01 - MEASURING TESTING
Information Patent Grant
System and method for the positioning and optical inspection of an...
- Patent number 10,928,333
- Issue date Feb 23, 2021
- VIT
- Nicolas Guillot
- G01 - MEASURING TESTING
Information Patent Grant
Inspection management system, inspection management apparatuses, an...
- Patent number 10,876,977
- Issue date Dec 29, 2020
- Omron Corporation
- Hiroyuki Mori
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional shape measurement apparatus
- Patent number 10,788,318
- Issue date Sep 29, 2020
- Koh Young Technology Inc.
- Moon Young Jeon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Board inspecting apparatus and method of compensating board distort...
- Patent number 10,791,661
- Issue date Sep 29, 2020
- Koh Young Technology Inc.
- Seung Won Jung
- G01 - MEASURING TESTING
Information Patent Grant
Modular optical inspection station
- Patent number 10,783,624
- Issue date Sep 22, 2020
- Instrumental, Inc.
- Samuel Bruce Weiss
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of inspecting foreign substance on substrate
- Patent number 10,705,028
- Issue date Jul 7, 2020
- Koh Young Technology Inc.
- Hyun-Seok Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fiber weave skew assessment for printed circuit boards
- Patent number 10,684,123
- Issue date Jun 16, 2020
- Cisco Technology, Inc.
- Amendra Koul
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Solder printing inspection device
- Patent number 10,679,332
- Issue date Jun 9, 2020
- CKD Corporation
- Manabu Okuda
- G01 - MEASURING TESTING
Information Patent Grant
Substrate inspection method and system
- Patent number 10,672,116
- Issue date Jun 2, 2020
- Koh Young Technology Inc.
- Seung Ae Seo
- G01 - MEASURING TESTING
Information Patent Grant
Substrate inspection apparatus and method
- Patent number 10,650,510
- Issue date May 12, 2020
- Koh Young Technology Inc.
- Seung Ae Seo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dye and pry process for removing quad flat no-lead packages and bot...
- Patent number 10,593,601
- Issue date Mar 17, 2020
- International Business Machines Corporation
- Tim A. Bartsch
- G01 - MEASURING TESTING
Information Patent Grant
Method for checking an electronic component
- Patent number 10,571,413
- Issue date Feb 25, 2020
- YXLON International GmbH
- Keith Bryant
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical inspection system for printed circuit board or the like
- Patent number 10,527,559
- Issue date Jan 7, 2020
- Robert Scott Simmons
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MULTIPLEXED PHOTON EMITTER AND CAMERA CONFIGURATION FOR AN IMAGE AC...
- Publication number 20240397185
- Publication date Nov 28, 2024
- ORBOTECH LTD.
- Yigal KATZIR
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS
- Publication number 20240393258
- Publication date Nov 28, 2024
- WICKON HIGHTECH GMBH
- Roman WIESER
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS
- Publication number 20240385125
- Publication date Nov 21, 2024
- WICKON HIGHTECH GMBH
- Roman WIESER
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR THREE-DIMENSIONAL IMAGING OF SAMPLES USING A...
- Publication number 20240378716
- Publication date Nov 14, 2024
- ORBOTECH LTD.
- Chay Goldenberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTIPLEXED PHOTON EMITTER AND CAMERA CONFIGURATION FOR AN IMAGE AC...
- Publication number 20240357221
- Publication date Oct 24, 2024
- ORBOTECH LTD.
- Yigal KATZIR
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240302292
- Publication date Sep 12, 2024
- HAMAMATSU PHOTONICS K. K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
MODULAR OPTICAL INSPECTION STATION
- Publication number 20240265518
- Publication date Aug 8, 2024
- Instrumental, Inc.
- Samuel Bruce Weiss
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BOARD TESTING APPARATUS AND BOARD TESTING METHOD
- Publication number 20240201106
- Publication date Jun 20, 2024
- CKD CORPORATION
- Kazuyoshi Kikuchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR RAPID INSPECTION OF PRINTED CIRCUIT BOARD USI...
- Publication number 20240142516
- Publication date May 2, 2024
- Battelle Memorial Institute
- Thomas F. Kent
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
3D IMAGE ACQUISITION SYSTEM FOR OPTICAL INSPECTION AND METHOD FOR O...
- Publication number 20230204519
- Publication date Jun 29, 2023
- Scuola universitaria professionale della Svizzera italiana (SUPSI)
- Daniele Guido ALLEGRI
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Inspection of Multiple Features of Patterned...
- Publication number 20230105983
- Publication date Apr 6, 2023
- ORBOTECH LTD.
- Vered Gatt
- G01 - MEASURING TESTING
Information Patent Application
EXTERNAL APPEARANCE INSPECTION APPARATUS AND EXTERNAL APPEARANCE IN...
- Publication number 20220381700
- Publication date Dec 1, 2022
- Omron Corporation
- Shingo HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20220373480
- Publication date Nov 24, 2022
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
FIBER WEAVE SKEW ASSESSMENT FOR PRINTED CIRCUIT BOARDS
- Publication number 20220128350
- Publication date Apr 28, 2022
- Cisco Technology, Inc.
- Amendra Koul
- G01 - MEASURING TESTING
Information Patent Application
FIBER WEAVE SKEW ASSESSMENT FOR PRINTED CIRCUIT BOARDS
- Publication number 20220120558
- Publication date Apr 21, 2022
- Cisco Technology, Inc.
- Amendra Koul
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHODS AND APPARATUS FOR DETECTING DEFECTS IN SEMICONDUCTOR SYSTEMS
- Publication number 20220120699
- Publication date Apr 21, 2022
- Axiomatique Technologies, Inc.
- Trevor A. NORMAN
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT BOARD ANOMALY INDICATION
- Publication number 20220026375
- Publication date Jan 27, 2022
- HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
- David A. Moore
- G01 - MEASURING TESTING
Information Patent Application
PRINTED CIRCUIT BOARD ASSEMBLY DEFECT DETECTION
- Publication number 20220012917
- Publication date Jan 13, 2022
- International Business Machines Corporation
- Matthew S. Kelly
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTIMODALITY MULTIPLEXED ILLUMINATION FOR OPTICAL INSPECTION SYSTEMS
- Publication number 20210360140
- Publication date Nov 18, 2021
- ORBOTECH LTD.
- Yigal KATZIR
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR RAPID INSPECTION OF PRINTED CIRCUIT BOARD USI...
- Publication number 20210082101
- Publication date Mar 18, 2021
- Battelle Memorial Institute
- Thomas F. Kent
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR INSPECTING MOUNTING STATE OF COMPONENT, PRINTED CIRCUIT...
- Publication number 20210042910
- Publication date Feb 11, 2021
- KOH YOUNG TECHNOLOGY INC.
- Se Rin LEE
- G01 - MEASURING TESTING
Information Patent Application
FIBER WEAVE SKEW ASSESSMENT FOR PRINTED CIRCUIT BOARDS
- Publication number 20200263976
- Publication date Aug 20, 2020
- Cisco Technology, Inc.
- Amendra Koul
- G01 - MEASURING TESTING
Information Patent Application
FIBER WEAVE SKEW ASSESSMENT FOR PRINTED CIRCUIT BOARDS
- Publication number 20200263977
- Publication date Aug 20, 2020
- Cisco Technology, Inc.
- Amendra Koul
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR THE POSITIONING AND OPTICAL INSPECTION OF AN...
- Publication number 20200057004
- Publication date Feb 20, 2020
- VIT
- Nicolas GUILLOT
- G01 - MEASURING TESTING
Information Patent Application
BOARD INSPECTING APPARATUS AND METHOD OF COMPENSATING BOARD DISTORT...
- Publication number 20200045862
- Publication date Feb 6, 2020
- KOH YOUNG TECHNOLOGY INC.
- Seung Won JUNG
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
REMOTE VIDEO INSPECTION SYSTEM
- Publication number 20190349511
- Publication date Nov 14, 2019
- FRONTIER ELECTRONIC SYSTEMS CORP.
- Kurt Ashley McLain
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE-DIMENSIONAL SHAPE MEASUREMENT APPARATUS
- Publication number 20190226837
- Publication date Jul 25, 2019
- KOH YOUNG TECHNOLOGY INC.
- Moon Young JEON
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INSPECTION MANAGEMENT SYSTEM, INSPECTION MANAGEMENT APPARATUSES, AN...
- Publication number 20190219521
- Publication date Jul 18, 2019
- Omron Corporation
- Hiroyuki MORI
- G01 - MEASURING TESTING
Information Patent Application
FIBER WEAVE SKEW ASSESSMENT FOR PRINTED CIRCUIT BOARDS
- Publication number 20190219385
- Publication date Jul 18, 2019
- Cisco Technology, Inc.
- Amendra Koul
- G01 - MEASURING TESTING
Information Patent Application
Inspection Apparatus For Inspecting Electronic Components Of Circui...
- Publication number 20190172190
- Publication date Jun 6, 2019
- INVENTEC (PUDONG) TECHNOLOGY CORPORATION
- Hao Liu
- G06 - COMPUTING CALCULATING COUNTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Inspection apparatus and inspection method

Modular optical inspection station

Multimodality multiplexed illumination for optical inspection systems

Measurement machine and method for detecting a defect in solder joints

System and method for rapid inspection of printed circuit board usi...

Method of automatically setting optical parameters and automated op...

Fiber weave skew assessment for printed circuit boards

Fiber weave skew assessment for printed circuit boards

Circuit board anomaly indication

Printed circuit board assembly defect detection

Method for inspecting mounting state of component, printed circuit...

Modular optical inspection station

Fiber weave skew assessment for printed circuit boards

Fiber weave skew assessment for printed circuit boards

Method for inspecting mounting state of component, printed circuit...

Image inspecting apparatus, image inspecting method and image inspe...

Board inspecting apparatus and board inspecting method using the same

System and method for the positioning and optical inspection of an...

Inspection management system, inspection management apparatuses, an...

Three-dimensional shape measurement apparatus

Board inspecting apparatus and method of compensating board distort...

Modular optical inspection station

Method of inspecting foreign substance on substrate

Fiber weave skew assessment for printed circuit boards

Solder printing inspection device

Substrate inspection method and system

Substrate inspection apparatus and method

Dye and pry process for removing quad flat no-lead packages and bot...

Method for checking an electronic component

Optical inspection system for printed circuit board or the like

Patents Applicationslast 30 patents

MULTIPLEXED PHOTON EMITTER AND CAMERA CONFIGURATION FOR AN IMAGE AC...

INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS

INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS

SYSTEM AND METHOD FOR THREE-DIMENSIONAL IMAGING OF SAMPLES USING A...

MULTIPLEXED PHOTON EMITTER AND CAMERA CONFIGURATION FOR AN IMAGE AC...

INSPECTION APPARATUS AND INSPECTION METHOD

MODULAR OPTICAL INSPECTION STATION

BOARD TESTING APPARATUS AND BOARD TESTING METHOD

SYSTEM AND METHOD FOR RAPID INSPECTION OF PRINTED CIRCUIT BOARD USI...

3D IMAGE ACQUISITION SYSTEM FOR OPTICAL INSPECTION AND METHOD FOR O...

System and Method for Inspection of Multiple Features of Patterned...

EXTERNAL APPEARANCE INSPECTION APPARATUS AND EXTERNAL APPEARANCE IN...

INSPECTION APPARATUS AND INSPECTION METHOD

FIBER WEAVE SKEW ASSESSMENT FOR PRINTED CIRCUIT BOARDS

FIBER WEAVE SKEW ASSESSMENT FOR PRINTED CIRCUIT BOARDS

METHODS AND APPARATUS FOR DETECTING DEFECTS IN SEMICONDUCTOR SYSTEMS

CIRCUIT BOARD ANOMALY INDICATION

PRINTED CIRCUIT BOARD ASSEMBLY DEFECT DETECTION

MULTIMODALITY MULTIPLEXED ILLUMINATION FOR OPTICAL INSPECTION SYSTEMS

SYSTEM AND METHOD FOR RAPID INSPECTION OF PRINTED CIRCUIT BOARD USI...

METHOD FOR INSPECTING MOUNTING STATE OF COMPONENT, PRINTED CIRCUIT...

FIBER WEAVE SKEW ASSESSMENT FOR PRINTED CIRCUIT BOARDS

FIBER WEAVE SKEW ASSESSMENT FOR PRINTED CIRCUIT BOARDS

SYSTEM AND METHOD FOR THE POSITIONING AND OPTICAL INSPECTION OF AN...

BOARD INSPECTING APPARATUS AND METHOD OF COMPENSATING BOARD DISTORT...

REMOTE VIDEO INSPECTION SYSTEM

THREE-DIMENSIONAL SHAPE MEASUREMENT APPARATUS

INSPECTION MANAGEMENT SYSTEM, INSPECTION MANAGEMENT APPARATUSES, AN...

FIBER WEAVE SKEW ASSESSMENT FOR PRINTED CIRCUIT BOARDS

Inspection Apparatus For Inspecting Electronic Components Of Circui...