Membership
Tour
Register
Log in
for selecting operating means
Follow
Industry
CPC
G01N2021/0175
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
Current Industry
G01N2021/0175
for selecting operating means
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Computer-implemented method of thin-film selection for spectroscopy
Patent number
10,761,012
Issue date
Sep 1, 2020
Michael C. Solazzi
G01 - MEASURING TESTING
Information
Patent Grant
Trace moisture analyzer instrument, gas sampling and analyzing syst...
Patent number
10,739,255
Issue date
Aug 11, 2020
Advanced Micro Instruments, Inc.
Steven Kirchnavy
G01 - MEASURING TESTING
Information
Patent Grant
Data processing apparatus, optical detection system, data processin...
Patent number
10,228,327
Issue date
Mar 12, 2019
Sony Corporation
Naoki Morimoto
G01 - MEASURING TESTING
Information
Patent Grant
Imaging system
Patent number
9,546,947
Issue date
Jan 17, 2017
FUJIFILM Corporation
Takashi Kobayashi
G01 - MEASURING TESTING
Information
Patent Grant
Luminometer apparatus
Patent number
4,818,883
Issue date
Apr 4, 1989
Biolite Ltd.
Joseph C. Anderson
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DATA PROCESSING APPARATUS, OPTICAL DETECTION SYSTEM, DATA PROCESSIN...
Publication number
20160282268
Publication date
Sep 29, 2016
SONY CORPORATION
Naoki Morimoto
G01 - MEASURING TESTING
Information
Patent Application
IMAGING SYSTEM
Publication number
20160153889
Publication date
Jun 2, 2016
FUJIFILM CORPORATION
Takashi KOBAYASHI
G01 - MEASURING TESTING