TREA

for simultaneous focalisation and deflection of ray or beam

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Industry

  • CPC
  • H01J29/465
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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J29/00Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00

Current Industry

H01J29/465for simultaneous focalisation and deflection of ray or beam
Industries

Patents Grantslast 30 patents

  • Information Patent Grant

    Cathode ray tube
    • Patent number 4,933,597
    • Issue date Jun 12, 1990
    • Sony Corporation
    • Takehiro Kakizaki
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Cathode ray tube which is small and uses a small amount of power
    • Patent number 4,910,429
    • Issue date Mar 20, 1990
    • Sony Corporation
    • Takehiro Kakizaki
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Image pickup tube
    • Patent number 4,713,588
    • Issue date Dec 15, 1987
    • Hitachi, Ltd.
    • Shigehiko Takayama
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Cathode ray tube
    • Patent number 4,707,634
    • Issue date Nov 17, 1987
    • Sony Corporation
    • Takehiro Kakizaki
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Imaging system having an improved electrostatic yoke and method of...
    • Patent number 4,695,775
    • Issue date Sep 22, 1987
    • RCA Corporation
    • Ira G. Ritzman
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Image pick-up tube
    • Patent number 4,658,182
    • Issue date Apr 14, 1987
    • Sony Corporation
    • Shoji Araki
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Cathode ray tube having a zig-zag shaped deflection electrode
    • Patent number 4,656,387
    • Issue date Apr 7, 1987
    • Sony Corporation
    • Shoji Araki
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Cathode ray tube
    • Patent number 4,651,050
    • Issue date Mar 17, 1987
    • Sony Corporation
    • Susumu Tagawa
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Elimination of landing errors in electron-optical system of mixed f...
    • Patent number 4,205,253
    • Issue date May 27, 1980
    • Sony Corporation
    • Takehiro Kakizaki
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Cathode-ray tube having electrostatic focusing and electrostatic de...
    • Patent number 3,952,227
    • Issue date Apr 20, 1976
    • U.S. Philips Corporation
    • Willem Meijndert Van Alphen
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    3922580
    • Patent number 3,922,580
    • Issue date Nov 25, 1975
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    3896339
    • Patent number 3,896,339
    • Issue date Jul 22, 1975
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3890529
    • Patent number 3,890,529
    • Issue date Jun 17, 1975
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    3794876
    • Patent number 3,794,876
    • Issue date Feb 26, 1974
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Grant

    3774070
    • Patent number 3,774,070
    • Issue date Nov 20, 1973
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    3731136
    • Patent number 3,731,136
    • Issue date May 1, 1973
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    3721931
    • Patent number 3,721,931
    • Issue date Mar 20, 1973
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    3423625
    • Patent number 3,423,625
    • Issue date Jan 21, 1969
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Grant

    2911563
    • Patent number 2,911,563
    • Issue date Nov 3, 1959
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    2841641
    • Patent number 2,841,641
    • Issue date Jul 1, 1958
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Grant

    2587420
    • Patent number 2,587,420
    • Issue date Feb 26, 1952
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2552357
    • Patent number 2,552,357
    • Issue date May 8, 1951
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2212396
    • Patent number 2,212,396
    • Issue date Aug 20, 1940
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    2197523
    • Patent number 2,197,523
    • Issue date Apr 16, 1940
    • H01 - BASIC ELECTRIC ELEMENTS