Membership
Tour
Register
Log in
for two degrees of freedom of movement of a single mass
Follow
Industry
CPC
G01P2015/082
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01P
MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
Current Industry
G01P2015/082
for two degrees of freedom of movement of a single mass
Industries
Overview
Organizations
People
Information
Impact
Please log in for detailed analytics
Patents Grants
last 30 patents
Information
Patent Grant
Dual-operating accelerometer
Patent number
11,852,650
Issue date
Dec 26, 2023
STMicroelectronics S.r.l.
Francesco Rizzini
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Vibration rectification error correction circuit, physical quantity...
Patent number
11,808,572
Issue date
Nov 7, 2023
Seiko Epson Corporation
Masayoshi Todorokihara
G01 - MEASURING TESTING
Information
Patent Grant
Single proof mass based three-axis accelerometer
Patent number
11,493,533
Issue date
Nov 8, 2022
MEMSIC Semiconductor (TIANJIN) Co., Ltd.
Leyue Jiang
G01 - MEASURING TESTING
Information
Patent Grant
Capacitive microelectromechanical device and method for forming a c...
Patent number
11,422,151
Issue date
Aug 23, 2022
Infineon Technologies AG
Thoralf Kautzsch
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Fiber-optic acceleration sensor having lever arm
Patent number
11,243,224
Issue date
Feb 8, 2022
FOS4X GMBH
Sascha Kienitz
G01 - MEASURING TESTING
Information
Patent Grant
Composite sensor and manufacturing method thereof
Patent number
11,243,226
Issue date
Feb 8, 2022
AUTOCHIPS WUHAN CO., LTD.
Senlin Li
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Microelectromechanical or/and nanoelectromechanical device with out...
Patent number
11,156,459
Issue date
Oct 26, 2021
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Federico Maspero
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Single proof mass based three-axis accelerometer
Patent number
11,150,265
Issue date
Oct 19, 2021
MEMSIC Semiconductor (TIANJIN) Co., Ltd.
Leyue Jiang
G01 - MEASURING TESTING
Information
Patent Grant
Torsional oscillator micro electro mechanical systems accelerometer
Patent number
11,112,246
Issue date
Sep 7, 2021
United States Government as represented by the Secretary of the Army
Clinton Blankenship
G01 - MEASURING TESTING
Information
Patent Grant
Inertial sensor with suspension spring structure surrounding anchor
Patent number
11,029,327
Issue date
Jun 8, 2021
NXP USA, INC.
Andrew C. McNeil
G01 - MEASURING TESTING
Information
Patent Grant
Resonant sensor device
Patent number
10,955,434
Issue date
Mar 23, 2021
Yokogawa Electric Corporation
Shigeto Iwai
G01 - MEASURING TESTING
Information
Patent Grant
Physical quantity sensor, electronic apparatus, and vehicle
Patent number
10,866,260
Issue date
Dec 15, 2020
Seiko Epson Corporation
Tetsuya Otsuki
G01 - MEASURING TESTING
Information
Patent Grant
MEMS pendulum accelerometer having two measurement ranges
Patent number
10,866,261
Issue date
Dec 15, 2020
SAFRAN ELECTRONICS & DEFENSE
Vincent Ragot
G01 - MEASURING TESTING
Information
Patent Grant
Reducing thermal expansion induced errors in a magnetic circuit ass...
Patent number
10,859,593
Issue date
Dec 8, 2020
Honeywell International Inc.
Paul W. Dwyer
G01 - MEASURING TESTING
Information
Patent Grant
Micromechanical component for a pressure sensor device
Patent number
10,845,262
Issue date
Nov 24, 2020
Robert Bosch GmbH
Jochen Reinmuth
G01 - MEASURING TESTING
Information
Patent Grant
Acceleration event detection and differential sensory devices and m...
Patent number
10,775,403
Issue date
Sep 15, 2020
Omnitek Partners LLC
Jahangir S Rastegar
F42 - AMMUNITION BLASTING
Information
Patent Grant
Micromechanical spring for a sensor element
Patent number
10,739,373
Issue date
Aug 11, 2020
Robert Bosch GmbH
Monika Koster
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Capacitive microelectromechanical device and method for forming a c...
Patent number
10,684,306
Issue date
Jun 16, 2020
Infineon Technologies AG
Steffen Bieselt
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Physical quantity detector, physical quantity detection device, ele...
Patent number
10,677,813
Issue date
Jun 9, 2020
Seiko Epson Corporation
Kenta Sato
G01 - MEASURING TESTING
Information
Patent Grant
System and method for pulse-width modulation using an adjustable co...
Patent number
10,673,368
Issue date
Jun 2, 2020
The Boeing Company
Douglas C. Cameron
G01 - MEASURING TESTING
Information
Patent Grant
Multi-axis accelerometers with reduced cross-axis sensitivity
Patent number
10,634,696
Issue date
Apr 28, 2020
Khalifa University of Science and Technology
Zakriya Mohammed
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Out-of plane-accelerometer
Patent number
10,598,689
Issue date
Mar 24, 2020
SAFRAN COLIBRYS SA
Pascal Zwahlen
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Very low power microelectromechanical devices for the internet of e...
Patent number
10,580,605
Issue date
Mar 3, 2020
University of Utah Research Foundation
Massood Tabib-Azar
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical sensor device, sensor apparatus and cable
Patent number
10,551,255
Issue date
Feb 4, 2020
Fugro Technology B.V.
Martijn Matthijssen
G01 - MEASURING TESTING
Information
Patent Grant
Dynamic self-calibration of an accelerometer system
Patent number
10,495,664
Issue date
Dec 3, 2019
Northrop Grumman Systems Corporation
Robert E. Stewart
G01 - MEASURING TESTING
Information
Patent Grant
Three-axis inertial sensor for detecting linear acceleration forces
Patent number
10,429,407
Issue date
Oct 1, 2019
NXP USA, INC.
Jun Tang
G01 - MEASURING TESTING
Information
Patent Grant
Miniature hermetic acceleration detection device
Patent number
10,422,813
Issue date
Sep 24, 2019
Circor Aerospace, Inc.
Brent Salamone
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Accelerometer
Patent number
10,401,378
Issue date
Sep 3, 2019
Honeywell International Inc.
Paul W. Dwyer
G01 - MEASURING TESTING
Information
Patent Grant
Free mass MEMS accelerometer
Patent number
10,352,960
Issue date
Jul 16, 2019
Garmin International, Inc.
Kirill V. Shcheglov
G01 - MEASURING TESTING
Information
Patent Grant
Microelectromechanical device with at least one translationally gui...
Patent number
10,315,916
Issue date
Jun 11, 2019
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Federico Maspero
B81 - MICRO-STRUCTURAL TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
DUAL-OPERATING ACCELEROMETER
Publication number
20240027490
Publication date
Jan 25, 2024
STMicroelectronics S.r.l.
Francesco RIZZINI
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
DUAL-OPERATING ACCELEROMETER
Publication number
20230266356
Publication date
Aug 24, 2023
STMicroelectronics S.r.l.
Francesco RIZZINI
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
CAPACITIVE MICROELECTROMECHANICAL DEVICE AND METHOD FOR FORMING A C...
Publication number
20220326275
Publication date
Oct 13, 2022
INFINEON TECHNOLOGIES AG
Thoralf KAUTZSCH
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
SINGLE PROOF MASS BASED THREE-AXIS ACCELEROMETER
Publication number
20210405084
Publication date
Dec 30, 2021
MEMSIC Semiconductor (TIANJIN) Co., Ltd.
Leyue Jiang
G01 - MEASURING TESTING
Information
Patent Application
TORSIONAL OSCILLATOR MICRO ELECTRO MECHANICAL SYSTEMS ACCELEROMETER
Publication number
20200393247
Publication date
Dec 17, 2020
United States Government as Represented by the Secretary of the Army
CLINTON BLANKENSHIP
G01 - MEASURING TESTING
Information
Patent Application
CAPACITIVE MICROELECTROMECHANICAL DEVICE AND METHOD FOR FORMING A C...
Publication number
20200300886
Publication date
Sep 24, 2020
INFINEON TECHNOLOGIES AG
Thoralf KAUTZSCH
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
FIBER-OPTIC ACCELERATION SENSOR HAVING LEVER ARM
Publication number
20200233008
Publication date
Jul 23, 2020
fos4X GmbH
Sascha KIENITZ
G01 - MEASURING TESTING
Information
Patent Application
RESONANT SENSOR DEVICE
Publication number
20200166538
Publication date
May 28, 2020
YOKOGAWA ELECTRIC CORPORATION
Shigeto IWAI
G01 - MEASURING TESTING
Information
Patent Application
INERTIAL SENSOR WITH SUSPENSION SPRING STRUCTURE SURROUNDING ANCHOR
Publication number
20200132713
Publication date
Apr 30, 2020
NXP USA, Inc.
Andrew C. McNeil
G01 - MEASURING TESTING
Information
Patent Application
VIBRATION RECTIFICATION ERROR CORRECTION CIRCUIT, PHYSICAL QUANTITY...
Publication number
20190331491
Publication date
Oct 31, 2019
SEIKO EPSON CORPORATION
Masayoshi TODOROKIHARA
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR PULSE-WIDTH MODULATION USING AN ADJUSTABLE CO...
Publication number
20190294200
Publication date
Sep 26, 2019
The Boeing Company
Douglas C. Cameron
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DYNAMIC SELF-CALIBRATION OF AN ACCELEROMETER SYSTEM
Publication number
20190049485
Publication date
Feb 14, 2019
Northrop Grumman Systems Corporation
Robert E. Stewart
G01 - MEASURING TESTING
Information
Patent Application
SMART ACCELEROMETER CANTILEVER
Publication number
20190004083
Publication date
Jan 3, 2019
Intell IP Corporation
Sonja Koller
G01 - MEASURING TESTING
Information
Patent Application
MEMS PENDULUM ACCELEROMETER HAVING TWO MEASUREMENT RANGES
Publication number
20180335445
Publication date
Nov 22, 2018
SAFRAN ELECTRONICS & DEFENSE
Vincent RAGOT
G01 - MEASURING TESTING
Information
Patent Application
PHYSICAL QUANTITY DETECTOR, PHYSICAL QUANTITY DETECTION DEVICE, ELE...
Publication number
20180267078
Publication date
Sep 20, 2018
SEIKO EPSON CORPORATION
Kenta SATO
G01 - MEASURING TESTING
Information
Patent Application
DYNAMIC QUANTITY SENSOR
Publication number
20180246141
Publication date
Aug 30, 2018
Denso Corporation
Eiichi TAKETANI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
OPTICAL SENSOR DEVICE, SENSOR APPARATUS AND CABLE
Publication number
20180149532
Publication date
May 31, 2018
FUGRO TECHNOLOGY B.V.
Martijn MATTHIJSSEN
G01 - MEASURING TESTING
Information
Patent Application
MEMS MASS-SPRING-DAMPER SYSTEMS USING AN OUT-OF-PLANE SUSPENSION SC...
Publication number
20180023952
Publication date
Jan 25, 2018
King Abdullah University of Science and Technology
Ahmed KAMAL SAID ABDEL AZIZ
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MICROELECTROMECHANICAL OR/AND NANOELECTROMECHANICAL DEVICE WITH OUT...
Publication number
20170363424
Publication date
Dec 21, 2017
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Federico MASPERO
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
DYNAMIC SELF-CALIBRATION OF AN ACCELEROMETER SYSTEM
Publication number
20170269122
Publication date
Sep 21, 2017
Northrop Grumman Systems Corporation
Robert E. Stewart
G01 - MEASURING TESTING
Information
Patent Application
MOBILE DEVICE, METHOD FOR CONTROLLING MOBILE DEVICE, AND NON-TRANSI...
Publication number
20170195853
Publication date
Jul 6, 2017
KYOCERA CORPORATION
Shigeki TANABE
G01 - MEASURING TESTING
Information
Patent Application
MINIATURE HERMETIC ACCELERATION DETECTION DEVICE
Publication number
20170059607
Publication date
Mar 2, 2017
CIRCOR AEROSPACE, INC.
Brent SALAMONE
G01 - MEASURING TESTING
Information
Patent Application
CAPACITANCE DETECTION CIRCUIT
Publication number
20140300375
Publication date
Oct 9, 2014
Fuji Electric Co., Ltd.
Masami Kishiro
G01 - MEASURING TESTING
Information
Patent Application
ACCELEROMETER
Publication number
20140290364
Publication date
Oct 2, 2014
Oren Levy
G01 - MEASURING TESTING
Information
Patent Application
RANGE-DEPENDENT BIAS CALIBRATION OF AN ACCELEROMETER SENSOR SYSTEM
Publication number
20140236522
Publication date
Aug 21, 2014
NORTHROP GRUMMAN SYSTEMS CORPORATION
MICHAEL D. BULATOWICZ
G01 - MEASURING TESTING
Information
Patent Application
RANGE-DEPENDENT BIAS CALIBRATION OF AN ACCELEROMETER SENSOR SYSTEM
Publication number
20140230520
Publication date
Aug 21, 2014
Michael D. BULATOWICZ
G01 - MEASURING TESTING
Information
Patent Application
RESONANT SENSOR WITH ASYMMETRIC GAPPED CANTILEVERS
Publication number
20140183669
Publication date
Jul 3, 2014
Wayne State University
Yong Xu
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
PHYSICAL QUANTITY DETECTING DEVICE, ELECTRONIC APPARATUS, AND MOVIN...
Publication number
20140123754
Publication date
May 8, 2014
SEIKO EPSON CORPORATION
Jun WATANABE
G01 - MEASURING TESTING
Information
Patent Application
DYNAMIC SELF-CALIBRATION OF AN ACCELEROMETER SYSTEM
Publication number
20140096587
Publication date
Apr 10, 2014
Northrop Grumman Systems Corporation
Robert E. Stewart
G01 - MEASURING TESTING
Information
Patent Application
TRI-AXIAL MEMS INERTIAL SENSOR
Publication number
20140090468
Publication date
Apr 3, 2014
ADVANCED NUMICRO SYSTEMS, INC.
Yee-Chung Fu
B81 - MICRO-STRUCTURAL TECHNOLOGY