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Measuring instruments
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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G01N2015/0216
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Patents Grants
last 30 patents
Information
Patent Grant
Ultrasonic particle size measurement device and ultrasonic measurem...
Patent number
10,101,256
Issue date
Oct 16, 2018
National University Corporation Kyoto Institute of Technology
Tomohisa Norisuye
G01 - MEASURING TESTING
Information
Patent Grant
Method of characterizing interactions and screening for effectors
Patent number
9,658,156
Issue date
May 23, 2017
WYATT TECHNOLOGY CORPORATION
Amy D. Hanlon
G01 - MEASURING TESTING
Information
Patent Grant
Particle beam forming device
Patent number
9,574,984
Issue date
Feb 21, 2017
Fuji Electric Co., Ltd.
Naoki Takeda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of characterizing interactions and screening for effectors
Patent number
9,459,207
Issue date
Oct 4, 2016
WYATT TECHNOLOGY CORPORATION
Amy D. Hanlon
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatuses for detection of positional freedom of part...
Patent number
9,176,152
Issue date
Nov 3, 2015
Arryx, Inc.
Christopher Knutson
G01 - MEASURING TESTING
Information
Patent Grant
Particulate detection and calibration of sensors
Patent number
8,351,035
Issue date
Jan 8, 2013
Thermo Fisher Scientific Inc.
Kevin J. Goohs
G01 - MEASURING TESTING
Information
Patent Grant
Automatic sampling and dilution apparatus for use in a polymer anal...
Patent number
8,322,199
Issue date
Dec 4, 2012
The Administrators of the Tulane Educational Fund
Wayne F. Reed
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for measuring nanoparticles
Patent number
8,274,654
Issue date
Sep 25, 2012
Shimadzu Corporation
Yukihisa Wada
G01 - MEASURING TESTING
Information
Patent Grant
Method and systems for particle characterization using optical sens...
Patent number
8,154,723
Issue date
Apr 10, 2012
Sharp Laboratories of America, Inc.
Yongji Fu
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for the analysis of movement in a scattering medium
Patent number
7,782,458
Issue date
Aug 24, 2010
Formulaction
Patrick Snabre
G01 - MEASURING TESTING
Information
Patent Grant
Method of analysis in optical measurements
Patent number
7,626,698
Issue date
Dec 1, 2009
Shimadzu Corporation
Naoji Moriya
G01 - MEASURING TESTING
Information
Patent Grant
Circuit board production method and its apparatus
Patent number
7,355,143
Issue date
Apr 8, 2008
Hitachi, Ltd.
Hiroyuki Nakano
G01 - MEASURING TESTING
Information
Patent Grant
Method for noise cancellation by spectral flattening of laser outpu...
Patent number
7,295,585
Issue date
Nov 13, 2007
Research Electro-Optics, Inc.
Jon C. Sandberg
G01 - MEASURING TESTING
Information
Patent Grant
Method of measuring properties of dispersed particles in a containe...
Patent number
7,268,874
Issue date
Sep 11, 2007
INFM Istituto Nazionale per La Fisica Della Materia
Doriano Brogioli
G01 - MEASURING TESTING
Information
Patent Grant
Optical detection of particles in a liquid medium
Patent number
7,209,231
Issue date
Apr 24, 2007
Rusteck Ltd.
Stanislav Rastopov
G01 - MEASURING TESTING
Information
Patent Grant
Particle size distribution analyzer
Patent number
7,151,602
Issue date
Dec 19, 2006
Horiba, Ltd.
Tetsushi Yamaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Signal processing method for in-situ, scanned-beam particle monitoring
Patent number
6,906,799
Issue date
Jun 14, 2005
Inficon, Inc.
Michel P. Bonin
G01 - MEASURING TESTING
Information
Patent Grant
Inspection method for microorganisms and the like, and unit therefor
Patent number
6,792,132
Issue date
Sep 14, 2004
Hakuju Institute For Health Science Co., Ltd.
Akikuni Hara
G01 - MEASURING TESTING
Information
Patent Grant
Characterizing powders using frequency-domain photon migration
Patent number
6,771,370
Issue date
Aug 3, 2004
The Texas A&M University System
Eva M. Sevick-Muraca
G01 - MEASURING TESTING
Information
Patent Grant
Non-invasive method and low-coherence apparatus system analysis and...
Patent number
6,738,144
Issue date
May 18, 2004
University of Central Florida
Aristide Dogariu
G01 - MEASURING TESTING
Information
Patent Grant
Fluorescence intensity and lifetime distribution analysis
Patent number
6,690,463
Issue date
Feb 10, 2004
Evotec BioSystems AG
Peet Kask
G01 - MEASURING TESTING
Information
Patent Grant
Automatic mixing and dilution methods for online characterization o...
Patent number
6,653,150
Issue date
Nov 25, 2003
The Administrators of the Tulane Educational Fund
Wayne F. Reed
G01 - MEASURING TESTING
Information
Patent Grant
Optical detection system and method for determining particle size d...
Patent number
6,281,973
Issue date
Aug 28, 2001
Microtrac, Inc.
Michael N. Trainer
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for measuring particle size distribution and method for a...
Patent number
6,191,853
Issue date
Feb 20, 2001
Horiba, Ltd.
Tetsuji Yamaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Detector for determining particle size distribution in an oscillati...
Patent number
6,094,266
Issue date
Jul 25, 2000
Honeywell Inc.
Michael N. Trainer
G01 - MEASURING TESTING
Information
Patent Grant
Miniature, submersible, versatile, light scattering probe for absol...
Patent number
6,052,184
Issue date
Apr 18, 2000
The Administrators of the Tulane Educational Fund
Wayne F. Reed
G01 - MEASURING TESTING
Information
Patent Grant
Particle flow monitor and metering system
Patent number
6,023,324
Issue date
Feb 8, 2000
Comco, Inc.
John L. Myers
G01 - MEASURING TESTING
Information
Patent Grant
Fiber-optic imaging probe
Patent number
5,973,779
Issue date
Oct 26, 1999
Rafat R. Ansari
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Cross-correlation method and apparatus for suppressing the effects...
Patent number
5,956,139
Issue date
Sep 21, 1999
Ohio Aerospace Institute
William V. Meyer
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for determining the shape characteristics of p...
Patent number
5,764,358
Issue date
Jun 9, 1998
Technische Universiteit Delft
Camiel Marie Godfried Heffels
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ULTRASONIC PARTICLE SIZE MEASUREMENT DEVICE AND ULTRASONIC MEASUREM...
Publication number
20180031464
Publication date
Feb 1, 2018
National University Corporation Kyoto Institute of Technology
Tomohisa NORISUYE
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUSES FOR DETECTION OF POSITIONAL FREEDOM OF PART...
Publication number
20130274119
Publication date
Oct 17, 2013
Arryx, Inc.
Christopher Knutson
C40 - COMBINATORIAL CHEMISTRY
Information
Patent Application
HOLOGRAPHIC FLUCTUATION MICROSCOPY APPARATUS AND METHOD FOR DETERMI...
Publication number
20130260396
Publication date
Oct 3, 2013
Arryx, Inc.
Osman Akcakir
C40 - COMBINATORIAL CHEMISTRY
Information
Patent Application
METHOD OF CHARACTERIZING INTERACTIONS AND SCREENING FOR EFFECTORS
Publication number
20130215424
Publication date
Aug 22, 2013
Wyatt Technology Corporation
Amy D. Hanlon
G01 - MEASURING TESTING
Information
Patent Application
PARTICULATE DETECTION AND CALIBRATION OF SENSORS
Publication number
20100315638
Publication date
Dec 16, 2010
Kevin J. Goohs
G01 - MEASURING TESTING
Information
Patent Application
Method and systems for particle characteruzation using optical sens...
Publication number
20100253943
Publication date
Oct 7, 2010
Yongji Fu
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR MEASURING NANOPARTICLES
Publication number
20100177311
Publication date
Jul 15, 2010
Yukihisa Wada
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR OPTICAL MEASUREMENT
Publication number
20100149532
Publication date
Jun 17, 2010
Naoji Moriya
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF ANALYSIS IN OPTICAL MEASUREMENTS
Publication number
20090128809
Publication date
May 21, 2009
Naoji Moriya
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR DETERMINING PARTICLE CHARACTERISTICS BY M...
Publication number
20080221814
Publication date
Sep 11, 2008
Michael Trainer
G02 - OPTICS
Information
Patent Application
METHODS AND APPARATUS FOR DETERMINING PARTICLE CHARACTERISTICS BY M...
Publication number
20080218738
Publication date
Sep 11, 2008
Michael Trainer
G02 - OPTICS
Information
Patent Application
Method and Device for the Analysis of Movement in a Scattering Medium
Publication number
20080043233
Publication date
Feb 21, 2008
Patrick Snabre
G01 - MEASURING TESTING
Information
Patent Application
Automatic sampling and dilution apparatus for use in a polymer anal...
Publication number
20080008623
Publication date
Jan 10, 2008
The Administrators of the Tulane Educational Fund
Wayne F. Reed
G01 - MEASURING TESTING
Information
Patent Application
Methods and Apparatus for Determining Particle Characteristics by M...
Publication number
20070206203
Publication date
Sep 6, 2007
Michael Trainer
G02 - OPTICS
Information
Patent Application
Method of measuring properties of particles immersed in a body and...
Publication number
20040239932
Publication date
Dec 2, 2004
Doriano Brogioli
G01 - MEASURING TESTING
Information
Patent Application
Particle size distribution analyzer
Publication number
20040227941
Publication date
Nov 18, 2004
Tetsuji Yamaguchi
G01 - MEASURING TESTING
Information
Patent Application
Particle size distribution analyzer
Publication number
20040100630
Publication date
May 27, 2004
Tetsushi Yamaguchi
G01 - MEASURING TESTING
Information
Patent Application
Optical detection of particles in a liquid medium
Publication number
20040070756
Publication date
Apr 15, 2004
Stanislav Rastopov
G01 - MEASURING TESTING
Information
Patent Application
Method for noise cancellation by spectral flattening of laser outpu...
Publication number
20040051869
Publication date
Mar 18, 2004
Jon C. Sandberg
G01 - MEASURING TESTING
Information
Patent Application
Automatic mixing and dilution methods and apparatus for online char...
Publication number
20040004717
Publication date
Jan 8, 2004
Wayne F. Reed
G01 - MEASURING TESTING
Information
Patent Application
Characterizing powders using frequency-domain photon migration
Publication number
20030117622
Publication date
Jun 26, 2003
Eva M. Sevick-Muraca
G01 - MEASURING TESTING
Information
Patent Application
Signal processing method for in-situ, scanned-beam particle monitoring
Publication number
20030076494
Publication date
Apr 24, 2003
Inficon, Inc.
Michel P. Bonin
G01 - MEASURING TESTING
Information
Patent Application
Fluorescence intensity and lifetime distribution analysis
Publication number
20020063863
Publication date
May 30, 2002
Peet Kask
G01 - MEASURING TESTING