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G06T2207/10061
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IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
G06T2207/00
Indexing scheme for image analysis or image enhancement
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G06T2207/10061
from scanning electron microscope
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Patents Grants
last 30 patents
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Patent Grant
Semiconductor overlay measurements using machine learning
Patent number
11,967,058
Issue date
Apr 23, 2024
KLA Corporation
Arpit Yati
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for image enhancement for a multi-beam charged-...
Patent number
11,961,700
Issue date
Apr 16, 2024
ASML Netherlands B.V.
Maikel Robert Goosen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Generative adversarial networks (GANs) for simulating specimen images
Patent number
11,961,219
Issue date
Apr 16, 2024
KLA Corp.
Bjorn Brauer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for determining striation properties of fatigue striations a...
Patent number
11,954,845
Issue date
Apr 9, 2024
Airbus (S.A.S.)
Klaus Schertler
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Metrology of semiconductor devices in electron micrographs using fa...
Patent number
11,947,270
Issue date
Apr 2, 2024
FEI Company
Umesh Adiga
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for pre-detecting defective porous polymer substrate for sep...
Patent number
11,940,368
Issue date
Mar 26, 2024
LG ENERGY SOLUTION, LTD.
Won-Sik Bae
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Microscopy imaging method for 3D tomography with predictive drift t...
Patent number
11,923,168
Issue date
Mar 5, 2024
FIBICS INCORPORATED
Michael William Phaneuf
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Integrated circuit layout validation using machine learning
Patent number
11,914,941
Issue date
Feb 27, 2024
Taiwan Semiconductor Manufacturing Company Limited
Rachid Salik
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection apparatus adjustment system and inspection apparatus adj...
Patent number
11,898,968
Issue date
Feb 13, 2024
HITACHI HIGH-TECH CORPORATION
Taichi Maeda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Automated application of drift correction to sample studied under e...
Patent number
11,902,665
Issue date
Feb 13, 2024
PROTOCHIPS, INC.
Franklin Stampley Walden
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Accelerated segmentation for reverse engineering of integrated circ...
Patent number
11,893,742
Issue date
Feb 6, 2024
University of Florida Research Foundation, Incorporated
Damon Woodard
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Material properties from two-dimensional image
Patent number
11,885,757
Issue date
Jan 30, 2024
BP Corporation North America Inc.
Glen L. Gettemy
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection method and system
Patent number
11,880,971
Issue date
Jan 23, 2024
ASML Netherlands B.V.
Wei Fang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system for determining plant leaf surface roughness
Patent number
11,880,994
Issue date
Jan 23, 2024
Zhejiang University
Hui Fang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for rendering SEM images and predicting defect im...
Patent number
11,880,193
Issue date
Jan 23, 2024
KLA Corporation
Arpit Yati
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Build material handling unit for a powder module for an apparatus f...
Patent number
11,878,463
Issue date
Jan 23, 2024
CONCEPT LASER GMBH
Dominik Eideloth
B22 - CASTING POWDER METALLURGY
Information
Patent Grant
Systems, methods and devices for processing batches of coins utiliz...
Patent number
11,875,626
Issue date
Jan 16, 2024
Christopher J. Rourk
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method implemented by a data processing apparatus, and charged part...
Patent number
11,861,817
Issue date
Jan 2, 2024
FEI Company
Remco Schoenmakers
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Determination of defects and/or edge roughness in a specimen based...
Patent number
11,854,184
Issue date
Dec 26, 2023
Applied Materials Israel Ltd.
Shalom Elkayam
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Image processing system
Patent number
11,852,599
Issue date
Dec 26, 2023
HITACHI HIGH-TECH CORPORATION
Nobuhiro Okai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Medical image analysis using machine learning and an anatomical vector
Patent number
11,847,819
Issue date
Dec 19, 2023
Brainlab AG
Stefan Vilsmeier
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for adaptive alignment
Patent number
11,842,420
Issue date
Dec 12, 2023
ASML Netherlands B.V.
Wei Fang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of measuring a semiconductor device
Patent number
11,830,176
Issue date
Nov 28, 2023
NANYA TECHNOLOGY CORPORATION
Kai Lee
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Artificial intelligence cloud diagnosis platform
Patent number
11,817,215
Issue date
Nov 14, 2023
WUHAN LANDING INTELLIGENCE MEDICAL CO., LTD.
Xiaorong Sun
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system for semiconductor wafer defect review
Patent number
11,816,411
Issue date
Nov 14, 2023
Taiwan Semiconductor Manufacturing Co., Ltd
Chung-Pin Chou
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods of determining aberrations of a charged particle beam, and...
Patent number
11,810,753
Issue date
Nov 7, 2023
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Dominik Ehberger
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Defect detection device, defect detection method, and defect observ...
Patent number
11,802,841
Issue date
Oct 31, 2023
HITACHI HIGH-TECH CORPORATION
Yuji Takagi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Image analysis system and image analysis method for obtaining objec...
Patent number
11,798,185
Issue date
Oct 24, 2023
Winbond Electronics Corp.
Tung-Yu Wu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Detecting defects in semiconductor specimens using weak labeling
Patent number
11,790,515
Issue date
Oct 17, 2023
Applied Materials Israel Ltd.
Irad Peleg
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system for scanning wafer
Patent number
11,783,469
Issue date
Oct 10, 2023
Taiwan Semiconductor Manufacturing Company Ltd.
Pei-Hsuan Lee
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
DEFECT DETECTING DEVICE AND METHOD
Publication number
20240127426
Publication date
Apr 18, 2024
Samsung Electronics Co., Ltd.
Sungwook HWANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Inspection System and Non-Transitory Computer-Readable Medium
Publication number
20240127417
Publication date
Apr 18, 2024
HITACHI HIGH-TECH CORPORATION
Takehiro HIRAI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEFECT DETECTION DEVICE AND METHOD THEREOF
Publication number
20240127425
Publication date
Apr 18, 2024
Samsung Electronics Co., Ltd.
Sungwook HWANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR DETECTING DEFECTS ON WAFERS, SYSTEM FOR DETECTING DEFECT...
Publication number
20240112323
Publication date
Apr 4, 2024
United Semiconductor (Xiamen) Co., Ltd.
Yu Peng Hong
G01 - MEASURING TESTING
Information
Patent Application
METHOD IMPLEMENTED BY A DATA PROCESSING APPARATUS, AND CHARGED PART...
Publication number
20240095897
Publication date
Mar 21, 2024
FEI Company
Remco Schoenmakers
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SEGMENTATION OR CROSS SECTIONS OF HIGH ASPECT RATIO STRUCTURES
Publication number
20240087134
Publication date
Mar 14, 2024
Carl Zeiss SMT GMBH
Dmitry Klochkov
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND APPARATUS FOR PARTICLE BEAM-INDUCED PROCESSING OF A DEFE...
Publication number
20240069434
Publication date
Feb 29, 2024
Carl Zeiss SMT GMBH
Christian Rensing
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Automated Selection And Model Training For Charged Particle Microsc...
Publication number
20240071051
Publication date
Feb 29, 2024
FEI Company
John Francis Flanagan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
NOISE DIAGNOSTICS FOR AN ELECTRON BEAM INSPECTION SYSTEM WITH SWATHING
Publication number
20240068967
Publication date
Feb 29, 2024
KLA Corporation
Bo Xiong
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
NEURAL NETWORK DEVICE AND SYSTEM AND OPERATING METHOD OF THE NEURAL...
Publication number
20240071033
Publication date
Feb 29, 2024
Samsung Electronics Co., Ltd.
HOJOON LEE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DATA-DRIVEN PREDICTION AND IDENTIFICATION OF FAILURE MODES BASED ON...
Publication number
20240062356
Publication date
Feb 22, 2024
ASML NETHERLANDS B.V.
Huina XU
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEDICAL IMAGE ANALYSIS USING MACHINE LEARNING AND AN ANATOMICAL VECTOR
Publication number
20240062517
Publication date
Feb 22, 2024
Brainlab AG
Stefan Vilsmeier
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MACHINE LEARNING-BASED SYSTEMS AND METHODS FOR GENERATING SYNTHETIC...
Publication number
20240062362
Publication date
Feb 22, 2024
ASML NETHERLANDS B.V.
Zhe WANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
Publication number
20240054633
Publication date
Feb 15, 2024
NuFlare Technology, Inc.
Shinji SUGIHARA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
APPARATUS AND METHOD FOR DETERMINING THREE DIMENSIONAL DATA BASED O...
Publication number
20240054669
Publication date
Feb 15, 2024
ASML NETHERLANDS B.V.
Tim HOUBEN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
FULLY AUTOMATED SEM SAMPLING SYSTEM FOR E-BEAM IMAGE ENHANCEMENT
Publication number
20240046620
Publication date
Feb 8, 2024
ASML NETHERLANDS B.V.
Wentian ZHOU
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
System for Deriving Electrical Characteristics and Non-Transitory C...
Publication number
20240020816
Publication date
Jan 18, 2024
HITACHI HIGH-TECH CORPORATION
Heita KIMIZUKA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SEM IMAGE ENHANCEMENT
Publication number
20240005463
Publication date
Jan 4, 2024
ASML NETHERLANDS B.V.
Shakeeb Bin HASAN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMAGE PROCESSING METHOD AND SYSTEM THEREOF
Publication number
20240005476
Publication date
Jan 4, 2024
Samsung Electronics Co., Ltd.
Min Su KANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
APPARATUS AND METHODS TO GENERATE DEBLURRING MODEL AND DEBLUR IMAGE
Publication number
20240005457
Publication date
Jan 4, 2024
ASML NETHERLANDS B.V.
Hairong LEI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEMS AND METHODS OF METADATA AND IMAGE MANAGEMENT FOR REVIEWING...
Publication number
20230418863
Publication date
Dec 28, 2023
PROTOCHIPS, INC.
Franklin Stampley Walden
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM AND METHOD FOR DETECTING DEFECTS ON A WAFER AND RELATED NON-...
Publication number
20230411224
Publication date
Dec 21, 2023
Taiwan Semiconductor Manufacturing company Ltd.
SHIH-CHANG WANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
LIVE-ASSISTED IMAGE ACQUISITION METHOD AND SYSTEM WITH CHARGED PART...
Publication number
20230395351
Publication date
Dec 7, 2023
FEI Company
Pavel Potocek
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND FLUORESCENCE MICROSCOPE FOR DETERMINING THE LOCATION OF...
Publication number
20230384223
Publication date
Nov 30, 2023
Abberior Instruments GmbH
Benjamin HARKE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND SYSTEM FOR SEMICONDUCTOR WAFER DEFECT REVIEW
Publication number
20230385502
Publication date
Nov 30, 2023
Taiwan Semiconductor Manufacturing Co., Ltd.
Chung-Pin CHOU
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR PRE-DETECTING DEFECTIVE POROUS POLYMER SUBSTRATE FOR SEP...
Publication number
20230384200
Publication date
Nov 30, 2023
LG ENERGY SOLUTION, LTD.
Won-Sik BAE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Electron Microscope and Calibration Method
Publication number
20230386782
Publication date
Nov 30, 2023
JEOL Ltd.
Yuji Konyuba
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MANUFACTURING PROCESS WITH ATOMIC LEVEL INSPECTION
Publication number
20230386941
Publication date
Nov 30, 2023
Taiwan Semiconductor Manufacturing Company, Ltd.
I-Che Lee
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND SYSTEM FOR SCANNING WAFER
Publication number
20230386013
Publication date
Nov 30, 2023
Taiwan Semiconductor Manufacturing company Ltd.
PEI-HSUAN LEE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
LAYOUT-BASED WAFER DEFECT IDENTIFICATION AND CLASSIFICATION
Publication number
20230386015
Publication date
Nov 30, 2023
Siemens Industry Software Inc.
Nataraj Akkiraju
G06 - COMPUTING CALCULATING COUNTING