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Gas fillings ; Maintaining the desired pressure within the tube
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CPC
H01J47/005
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H
ELECTRICITY
H01
Electric elements
H01J
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J47/00
Tubes for determining the presence, intensity, density or energy of radiation or particles
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H01J47/005
Gas fillings ; Maintaining the desired pressure within the tube
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Patents Grants
last 30 patents
Information
Patent Grant
Particle detector having improved performance and service life
Patent number
12,224,167
Issue date
Feb 11, 2025
ADAPTAS SOLUTIONS PTY LTD
Russell Jurek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Muon detector for muon tomography
Patent number
12,105,230
Issue date
Oct 1, 2024
KoBold Metals Company
Jean-Luc Gauvreau
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Particle detector having improved performance and service life
Patent number
11,848,180
Issue date
Dec 19, 2023
ADAPTAS SOLUTIONS PTY LTD
Russell Jurek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Dosimetry apparatus, systems, and methods
Patent number
10,545,248
Issue date
Jan 28, 2020
Mirion Technologies, Inc.
Jukka Kahilainen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Probe assembly for attaching a chromatography device to a mass spec...
Patent number
10,354,852
Issue date
Jul 16, 2019
Micromass UK Limited
Steve O'Brien
G01 - MEASURING TESTING
Information
Patent Grant
Probe assembly for attaching a chromatography device to a mass spec...
Patent number
10,037,875
Issue date
Jul 31, 2018
Micromass UK Limited
Steve O'Brien
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Dosimetry apparatus, systems, and methods
Patent number
9,134,430
Issue date
Sep 15, 2015
MIRION TECHNOLOGIES INC.
Jukka Kahilainen
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Dosimetry apparatus, systems, and methods
Patent number
8,841,622
Issue date
Sep 23, 2014
Mirion Technologies, Inc.
Jukka Kahilainen
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Detection apparatus and methods utilizing ion mobility spectrometry
Patent number
8,841,609
Issue date
Sep 23, 2014
Autoclear LLC
Dao Hinh Nguyen
G01 - MEASURING TESTING
Information
Patent Grant
Dosimeter for ionizing radiation
Patent number
5,079,427
Issue date
Jan 7, 1992
bv Optische Industrie"De Oude Delft"
Hugo Vlasbloem
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High pressure xenon ionization detector
Patent number
4,880,983
Issue date
Nov 14, 1989
Yale University
John K. Markey
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mixed media for kinestatic charge detectors
Patent number
4,879,469
Issue date
Nov 7, 1989
University of North Carolina
Frank A. DiBianca
G01 - MEASURING TESTING
Information
Patent Grant
Detector for bremsstrahlung-isochromatic-spectroscopy (BIS)
Patent number
4,871,915
Issue date
Oct 3, 1989
Kernforschungsanlage Julich GmbH
Kevin C. Prince
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Wire chamber
Patent number
4,857,740
Issue date
Aug 15, 1989
The United States of American as represented by the United States Department...
Muzaffer Atac
G01 - MEASURING TESTING
Information
Patent Grant
Ionization chamber
Patent number
4,695,731
Issue date
Sep 22, 1987
U.S. Philips Corporation
Keith J. Larkin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Rhenium lined Geiger-Mueller tube
Patent number
4,684,806
Issue date
Aug 4, 1987
Nicholas M. Mitrofanov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Way to prolong the service life of proportional counters
Patent number
4,571,196
Issue date
Feb 18, 1986
Outokumpu Oy
Heikki J. Sipila
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Radiation counter
Patent number
4,527,084
Issue date
Jul 2, 1985
Naoaki Wakayama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ethylene quenched multi-cathode Geiger-Mueller tube with sleeve-and...
Patent number
4,501,988
Issue date
Feb 26, 1985
Harshaw/Filtrol Partnership
Nicholas M. Mitrofanov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Gas mixtures for gas-filled radiation detectors
Patent number
4,309,307
Issue date
Jan 5, 1982
The United States of America as represented by the United States Department o...
Loucas G. Christophorou
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Gas mixtures for gas-filled particle detectors
Patent number
4,201,692
Issue date
May 6, 1980
The United States of America as represented by the United States Department o...
Loucas G. Christophorou
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
PARTICLE DETECTOR HAVING IMPROVED PERFORMANCE AND SERVICE LIFE
Publication number
20240063004
Publication date
Feb 22, 2024
ADAPTAS SOLUTIONS PTY LTD
Russell Jurek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MUON DETECTOR FOR MUON TOMOGRAPHY
Publication number
20230258827
Publication date
Aug 17, 2023
KoBold Metals Company
Jean-Luc Gauvreau
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PARTICLE DETECTOR HAVING IMPROVED PERFORMANCE AND SERVICE LIFE
Publication number
20210074531
Publication date
Mar 11, 2021
ADAPTAS SOLUTIONS PTY LTD
Russell Jurek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PROBE ASSEMBLY FOR ATTACHING A CHROMATOGRAPHY DEVICE TO A MASS SPEC...
Publication number
20180358216
Publication date
Dec 13, 2018
Micromass UK Limited
Steve O'Brien
G01 - MEASURING TESTING
Information
Patent Application
DETECTION APPARATUS AND METHODS UTILIZING ION MOBILITY SPECTROMETRY
Publication number
20140117222
Publication date
May 1, 2014
Autoclear LLC
Dao Hinh Nguyen
G01 - MEASURING TESTING
Information
Patent Application
Dosimetry Apparatus, Systems, and Methods
Publication number
20130334432
Publication date
Dec 19, 2013
MIRION TECHNOLOGIES INC.
Jukka Kahilainen
G01 - MEASURING TESTING
Information
Patent Application
DOSIMETRY APPARATUS , SYSTEMS, AND METHODS
Publication number
20110024640
Publication date
Feb 3, 2011
MIRION TECHNOLOGIES INC.
Jukka Kahilainen
G01 - MEASURING TESTING
Information
Patent Application
Ionization chamber
Publication number
20040056206
Publication date
Mar 25, 2004
CONSTELLATION TECHNOLOGY CORPORATION
Alexander I. Bolozdynya
G01 - MEASURING TESTING