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G01N2021/0106

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/0106General arrangement of respective parts

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Detection device and detection method
- Patent number 12,140,531
- Issue date Nov 12, 2024
- BEIJING BOE HEALTH TECHNOLOGY CO., LTD.
- Hongquan Li
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Light source and biochemical analyzer
- Patent number 11,906,420
- Issue date Feb 20, 2024
- HITACHI HIGH-TECH CORPORATION
- Yoshifumi Sekiguchi
- G01 - MEASURING TESTING
Information Patent Grant
Enhanced material detection by stereo beam profile analysis
- Patent number 11,906,421
- Issue date Feb 20, 2024
- trinamiX GmbH
- Patrick Schindler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Object inspection apparatus and object inspection method using same
- Patent number 11,908,123
- Issue date Feb 20, 2024
- Koh Young Technology Inc.
- Choung Min Jung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Protective cover for chamberless point sensor
- Patent number 11,860,092
- Issue date Jan 2, 2024
- Kidde Technologies, Inc.
- David L. Lincoln
- G08 - SIGNALLING
Information Patent Grant
Test apparatus for measuring particle plugging of a simulated fracture
- Patent number 11,761,274
- Issue date Sep 19, 2023
- Halliburton Energy Services, Inc.
- Dale E. Jamison
- G01 - MEASURING TESTING
Information Patent Grant
Cartridge and detection method
- Patent number 11,754,491
- Issue date Sep 12, 2023
- Sysmex Corporation
- Kazuyoshi Horii
- G01 - MEASURING TESTING
Information Patent Grant
Fast measurement method for micro-nano deep groove structure based...
- Patent number 11,733,034
- Issue date Aug 22, 2023
- Zhejiang University
- Kexin Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for placing components
- Patent number 11,530,978
- Issue date Dec 20, 2022
- Totems Position SARL
- Toni Orhanovic
- G01 - MEASURING TESTING
Information Patent Grant
Laser irradiation apparatus with polarizing plate
- Patent number 11,488,827
- Issue date Nov 1, 2022
- JSW AKTINA SYSTEM CO., LTD.
- Hiroaki Imamura
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Maintenance method of gas detecting device
- Patent number 11,442,003
- Issue date Sep 13, 2022
- RADIANT INNOVATION INC.
- Shao-Yun Yu
- G01 - MEASURING TESTING
Information Patent Grant
Selective plane illumination in the conventional inverted microscop...
- Patent number 11,385,451
- Issue date Jul 12, 2022
- The Regents of the University of California
- Per Niklas Hedde
- G01 - MEASURING TESTING
Information Patent Grant
Connectors for colorimetric sensors
- Patent number 11,333,612
- Issue date May 17, 2022
- Specific Technologies, LLC
- Richard Shu-Chung Huang
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement device and method
- Patent number 11,300,507
- Issue date Apr 12, 2022
- Hefei BOE Optoelectronics Technology Co., Ltd.
- Hongqiao Xu
- G01 - MEASURING TESTING
Information Patent Grant
Dry slide assay using reduced reading window
- Patent number 11,293,879
- Issue date Apr 5, 2022
- Ortho-Clinical Diagnostics, Inc.
- Zhong Ding
- G01 - MEASURING TESTING
Information Patent Grant
Laminated fluorescent sensor comprising a sealable sensor housing a...
- Patent number 11,255,787
- Issue date Feb 22, 2022
- SHAANXI NORMAL UNIVERSITY
- Yu Fang
- G01 - MEASURING TESTING
Information Patent Grant
In-situ full wafer metrology system
- Patent number 11,204,312
- Issue date Dec 21, 2021
- Applied Materials, Inc.
- Ami Sade
- G01 - MEASURING TESTING
Information Patent Grant
Hydrogel-based transparent soils for plant growth and in vivo root...
- Patent number 11,197,435
- Issue date Dec 14, 2021
- Iowa State University Research Foundation, Inc.
- Ludovico Cademartiri
- G01 - MEASURING TESTING
Information Patent Grant
Extended convolutional neural network for document analysis
- Patent number 11,151,829
- Issue date Oct 19, 2021
- IDEMIA Identity & Security Germany AG
- Norbert Wendt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems, devices, and methods for combined wafer and photomask insp...
- Patent number 11,125,677
- Issue date Sep 21, 2021
- Nanotronics Imaging, Inc.
- Randolph E. Griffith
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting apparatus and processing apparatus including the same
- Patent number 11,105,752
- Issue date Aug 31, 2021
- Disco Corporation
- Tomoaki Sugiyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods of assessing a coating microstructure
- Patent number 11,099,002
- Issue date Aug 24, 2021
- General Electric Company
- Esha Sen Gupta
- G01 - MEASURING TESTING
Information Patent Grant
Fluid flow cell including a spherical lens
- Patent number 11,029,245
- Issue date Jun 8, 2021
- MARQMETRIX, INC.
- Giora Proskurowski
- G01 - MEASURING TESTING
Information Patent Grant
Gas injection device
- Patent number 11,002,663
- Issue date May 11, 2021
- JIANGSU LEUVEN INSTRUMMENTS CO LTD
- Kaidong Xu
- G01 - MEASURING TESTING
Information Patent Grant
Gas sensor module
- Patent number 10,928,312
- Issue date Feb 23, 2021
- Sensirion AG
- Martin Winger
- G01 - MEASURING TESTING
Information Patent Grant
Biosensor, manufacturing method thereof and biosensing method
- Patent number 10,908,091
- Issue date Feb 2, 2021
- Beijing BOE Optoelectronics Technology Co., Ltd
- Yue Geng
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Systems and methods for modifying and enhancing explosives by irrad...
- Patent number 10,883,805
- Issue date Jan 5, 2021
- The United States of America, as represented by the Secretary of the Navy
- Eric J. Miklaszewski
- F42 - AMMUNITION BLASTING
Information Patent Grant
Automated substrate loading
- Patent number 10,802,260
- Issue date Oct 13, 2020
- Rarecyte, Inc.
- Steve Quarre
- G01 - MEASURING TESTING
Information Patent Grant
Calibration insert, and mount of the same
- Patent number 10,801,947
- Issue date Oct 13, 2020
- Endress + Hauser Conducta GmbH + Co. KG
- Ralf Bernhard
- G01 - MEASURING TESTING
Information Patent Grant
Inspection-beam shaping on a sample surface at an oblique angle of...
- Patent number 10,732,424
- Issue date Aug 4, 2020
- KLA Corporation
- Zhiwei Xu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DETECTION SYSTEMS AND RELATED METHODS OF ANALYZING A FLUID
- Publication number 20240319072
- Publication date Sep 26, 2024
- Saudi Arabian Oil Company
- Nada Ibrahim Alruwaii
- G01 - MEASURING TESTING
Information Patent Application
An FTIR-based Sensor System for Monitoring Gas, Vapor, or Fluid Emi...
- Publication number 20240280479
- Publication date Aug 22, 2024
- Lightsense Technology, Inc.
- John Coates
- G01 - MEASURING TESTING
Information Patent Application
Geological Sample Scanning System
- Publication number 20240241037
- Publication date Jul 18, 2024
- PlotLogic Pty Ltd
- Matthew Garlan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
PHOTOACOUSTIC DEVICES AND SYSTEMS INCLUDING ONE OR MORE LIGHT GUIDE...
- Publication number 20240210359
- Publication date Jun 27, 2024
- QUALCOMM Incorporated
- Sumit AGRAWAL
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR POSITIONING OF A VISUAL PRODUCTION LINE INSPE...
- Publication number 20240171838
- Publication date May 23, 2024
- INSPEKTO A.M.V. LTD.
- HAREL BOREN
- G01 - MEASURING TESTING
Information Patent Application
ENHANCED MATERIAL DETECTION BY STEREO BEAM PROFILE ANALYSIS
- Publication number 20240011891
- Publication date Jan 11, 2024
- trinamiX GmbH
- Patrick SCHINDLER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR INSTALLING ONE OR MORE OPTICAL ELEMENTS IN A HOUSING
- Publication number 20230366808
- Publication date Nov 16, 2023
- Endress + Hauser Conducta GmbH + Co. KG
- Ralf Bernhard
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEM AND OPTICAL CONSTRUCTION
- Publication number 20230314307
- Publication date Oct 5, 2023
- 3M Innovative Properties Company
- Bharat R. Acharya
- G01 - MEASURING TESTING
Information Patent Application
LABEL-FREE QUANTIFICATION OF CELL SURFACE MEMBRANE PROTEIN BINDING...
- Publication number 20230278032
- Publication date Sep 7, 2023
- Arizona Board of Regents on behalf of Arizona State University
- Shaopeng WANG
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL CONCENTRATE MONITORING FOR MEMBRANE SCALING MITIGATION
- Publication number 20230280266
- Publication date Sep 7, 2023
- Colorado School Of Mines
- Johan Vanneste
- G01 - MEASURING TESTING
Information Patent Application
DISEASE DIAGNOSIS KIT, DISEASE DIAGNOSIS METHOD USING THE DISEASE D...
- Publication number 20230266230
- Publication date Aug 24, 2023
- Kyungpook National University Industry-Academic Cooperation Foundation
- Sungwook Nam
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
INFRARED SIGNAL CAPTURE AND ANALYSIS
- Publication number 20230175957
- Publication date Jun 8, 2023
- AngioLytics LLC
- Darius S. Francescatti
- G01 - MEASURING TESTING
Information Patent Application
RAPID DIAGNOSTICS FOR ANALYTE/BIOMARKER DETECTION BY RAMAN TECHNOLO...
- Publication number 20230175968
- Publication date Jun 8, 2023
- Agency for Science, Technology and Research
- Malini Olivo
- G01 - MEASURING TESTING
Information Patent Application
FLUORESCENCE MICROSCOPE SYSTEM AND METHOD
- Publication number 20230161143
- Publication date May 25, 2023
- Leica Microsystems CMS GmbH
- Kai RITSCHEL
- G01 - MEASURING TESTING
Information Patent Application
MICROSCOPIC OPTICAL IMAGING SYSTEM FOR LIVING CELL
- Publication number 20230152210
- Publication date May 18, 2023
- CLINX SCIENCE INSTRUMENTS CO., LTD
- Debao CHU
- G02 - OPTICS
Information Patent Application
SEMICONDUCTOR LASER INSPECTION APPARATUS
- Publication number 20230143906
- Publication date May 11, 2023
- Mitsubishi Electric Corporation
- Yohei MIKAMI
- G01 - MEASURING TESTING
Information Patent Application
TEST DEVICE, TEST KIT, AND TEST METHOD
- Publication number 20230120219
- Publication date Apr 20, 2023
- ICST CORPORATION
- Masaaki SEKI
- G01 - MEASURING TESTING
Information Patent Application
FAST MEASUREMENT METHOD FOR MICRO-NANO DEEP GROOVE STRUCTURE BASED...
- Publication number 20230118227
- Publication date Apr 20, 2023
- ZHEJIANG UNIVERSITY
- Kexin Zhang
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR OPTICALLY IDENTIFYING SURFACES
- Publication number 20230105753
- Publication date Apr 6, 2023
- 4Art Holding AG
- Kai Zeh
- F21 - LIGHTING
Information Patent Application
SYSTEM FOR EVALUATING GRAIN IN GRAIN HANDLING SYSTEMS
- Publication number 20230082011
- Publication date Mar 16, 2023
- SUKUP MANUFACTURING CO.
- Casey Scott Heilskov
- G01 - MEASURING TESTING
Information Patent Application
Screening Test Paper Reading System
- Publication number 20220299445
- Publication date Sep 22, 2022
- Cheng-Hao KO
- G01 - MEASURING TESTING
Information Patent Application
Light Source and Biochemical Analyzer
- Publication number 20220214266
- Publication date Jul 7, 2022
- Hitachi High-Tech Corporation
- Yoshifumi SEKIGUCHI
- G01 - MEASURING TESTING
Information Patent Application
PROTECTIVE COVER FOR CHAMBERLESS POINT SENSOR
- Publication number 20210404955
- Publication date Dec 30, 2021
- Kidde Technologies, Inc.
- David L. Lincoln
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR POSITIONING OF A VISUAL PRODUCTION LINE INSPE...
- Publication number 20210344820
- Publication date Nov 4, 2021
- INSPEKTO A.M.V. LTD.
- HAREL BOREN
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
Optical Measurement Device and Method
- Publication number 20210285875
- Publication date Sep 16, 2021
- Hongqiao XU
- G01 - MEASURING TESTING
Information Patent Application
IN-SITU FULL WAFER METROLOGY SYSTEM
- Publication number 20210285865
- Publication date Sep 16, 2021
- Applied Materials, Inc.
- Ami Sade
- G01 - MEASURING TESTING
Information Patent Application
OBJECT INSPECTION APPARATUS AND OBJECT INSPECTION METHOD USING SAME
- Publication number 20210279859
- Publication date Sep 9, 2021
- KOH YOUNG TECHNOLOGY INC.
- Choung Min JUNG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FLIPPER APPARATUS AND OBJECT INSPECTION METHOD USING SAME
- Publication number 20210278338
- Publication date Sep 9, 2021
- KOH YOUNG TECHNOLOGY INC.
- Choung Min JUNG
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS OF ASSESSING A COATING MICROSTRUCTURE
- Publication number 20210172726
- Publication date Jun 10, 2021
- GENERAL ELECTRIC COMPANY
- Esha Sen Gupta
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR PLACING COMPONENTS
- Publication number 20210140873
- Publication date May 13, 2021
- Toni ORHANOVIC
- G01 - MEASURING TESTING

General arrangement of respective parts

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Detection device and detection method

Light source and biochemical analyzer

Enhanced material detection by stereo beam profile analysis

Object inspection apparatus and object inspection method using same

Protective cover for chamberless point sensor

Test apparatus for measuring particle plugging of a simulated fracture

Cartridge and detection method

Fast measurement method for micro-nano deep groove structure based...

Device and method for placing components

Laser irradiation apparatus with polarizing plate

Maintenance method of gas detecting device

Selective plane illumination in the conventional inverted microscop...

Connectors for colorimetric sensors

Optical measurement device and method

Dry slide assay using reduced reading window

Laminated fluorescent sensor comprising a sealable sensor housing a...

In-situ full wafer metrology system

Hydrogel-based transparent soils for plant growth and in vivo root...

Extended convolutional neural network for document analysis

Systems, devices, and methods for combined wafer and photomask insp...

Inspecting apparatus and processing apparatus including the same

Systems and methods of assessing a coating microstructure

Fluid flow cell including a spherical lens

Gas injection device

Gas sensor module

Biosensor, manufacturing method thereof and biosensing method

Systems and methods for modifying and enhancing explosives by irrad...

Automated substrate loading

Calibration insert, and mount of the same

Inspection-beam shaping on a sample surface at an oblique angle of...

Patents Applicationslast 30 patents

DETECTION SYSTEMS AND RELATED METHODS OF ANALYZING A FLUID

An FTIR-based Sensor System for Monitoring Gas, Vapor, or Fluid Emi...

Geological Sample Scanning System

PHOTOACOUSTIC DEVICES AND SYSTEMS INCLUDING ONE OR MORE LIGHT GUIDE...

SYSTEM AND METHOD FOR POSITIONING OF A VISUAL PRODUCTION LINE INSPE...

ENHANCED MATERIAL DETECTION BY STEREO BEAM PROFILE ANALYSIS

METHOD FOR INSTALLING ONE OR MORE OPTICAL ELEMENTS IN A HOUSING

OPTICAL SYSTEM AND OPTICAL CONSTRUCTION

LABEL-FREE QUANTIFICATION OF CELL SURFACE MEMBRANE PROTEIN BINDING...

OPTICAL CONCENTRATE MONITORING FOR MEMBRANE SCALING MITIGATION

DISEASE DIAGNOSIS KIT, DISEASE DIAGNOSIS METHOD USING THE DISEASE D...

INFRARED SIGNAL CAPTURE AND ANALYSIS

RAPID DIAGNOSTICS FOR ANALYTE/BIOMARKER DETECTION BY RAMAN TECHNOLO...

FLUORESCENCE MICROSCOPE SYSTEM AND METHOD

MICROSCOPIC OPTICAL IMAGING SYSTEM FOR LIVING CELL

SEMICONDUCTOR LASER INSPECTION APPARATUS

TEST DEVICE, TEST KIT, AND TEST METHOD

FAST MEASUREMENT METHOD FOR MICRO-NANO DEEP GROOVE STRUCTURE BASED...

DEVICE FOR OPTICALLY IDENTIFYING SURFACES

SYSTEM FOR EVALUATING GRAIN IN GRAIN HANDLING SYSTEMS

Screening Test Paper Reading System

Light Source and Biochemical Analyzer

PROTECTIVE COVER FOR CHAMBERLESS POINT SENSOR

SYSTEM AND METHOD FOR POSITIONING OF A VISUAL PRODUCTION LINE INSPE...

Optical Measurement Device and Method

IN-SITU FULL WAFER METROLOGY SYSTEM

OBJECT INSPECTION APPARATUS AND OBJECT INSPECTION METHOD USING SAME

FLIPPER APPARATUS AND OBJECT INSPECTION METHOD USING SAME

SYSTEMS AND METHODS OF ASSESSING A COATING MICROSTRUCTURE

DEVICE AND METHOD FOR PLACING COMPONENTS