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GPHYSICS G01Measuring instruments G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS TARIFF METERING APPARATUS MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR G01D1/00Measuring arrangements giving results other than momentary value of variable, of general application

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G01D1/04giving integrated values

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Patents Grantslast 30 patents

Information Patent Grant
Azimuth estimation device
- Patent number 12,111,159
- Issue date Oct 8, 2024
- Honda Motor Co., Ltd.
- Tomoyuki Hosoya
- G01 - MEASURING TESTING
Information Patent Grant
Generation of an output signal value from sensor signal values of a...
- Patent number 12,031,846
- Issue date Jul 9, 2024
- Infineon Technologies AG
- Wolfgang Granig
- G01 - MEASURING TESTING
Information Patent Grant
Resolver signal processing device, drive apparatus, resolver signal...
- Patent number 11,754,421
- Issue date Sep 12, 2023
- TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
- Chikara Morito
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Sensor device management method and sensor device management system
- Patent number 10,996,076
- Issue date May 4, 2021
- Hitachi, Ltd.
- Rintaro Katayama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for measuring signal pulse energy
- Patent number 6,901,337
- Issue date May 31, 2005
- Hamamatsu Photonics K.K.
- Eiichi Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Capacitance-based position sensor with integrating demodulator
- Patent number 6,657,444
- Issue date Dec 2, 2003
- Hewlett-Packard Development Company, L.P.
- Donald J. Fasen
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for determining the position of a rotating cogwheel
- Patent number 5,721,486
- Issue date Feb 24, 1998
- AB Elektronik GmbH
- Peter Pape
- G01 - MEASURING TESTING
Information Patent Grant
Detecting and processing circuitry for magnetostriction type torque...
- Patent number 5,419,207
- Issue date May 30, 1995
- Unisia Jecs Corporation
- Nobuaki Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Circuit for processing sensor signals
- Patent number 5,408,143
- Issue date Apr 18, 1995
- Deutsche-Thomson-Brandt GmbH
- Gunter Gleim
- G01 - MEASURING TESTING
Information Patent Grant
Safety device for an automobile vehicle
- Patent number 5,402,343
- Issue date Mar 28, 1995
- Mazda Motor Corporation
- Mineharu Shibata
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method for the imaging of casing morphology by twice integrating ma...
- Patent number 5,397,985
- Issue date Mar 14, 1995
- Mobil Oil Corporation
- W. David Kennedy
- E21 - EARTH DRILLING MINING
Information Patent Grant
Disposable electronic monitor device
- Patent number 5,313,848
- Issue date May 24, 1994
- Sensitech, Inc.
- Ernest M. Santin
- G01 - MEASURING TESTING
Information Patent Grant
Device for measuring the number of revolutions of the shaft of a pe...
- Patent number 5,172,048
- Issue date Dec 15, 1992
- Fiat Auto SpA
- Eraldo Giaccardi
- G01 - MEASURING TESTING
Information Patent Grant
Solid state accumulating altimeter
- Patent number 4,694,694
- Issue date Sep 22, 1987
- Vertical Instruments, Inc.
- Connor G. Vlakancic
- G01 - MEASURING TESTING
Information Patent Grant
Optical encoder improvement
- Patent number 4,472,629
- Issue date Sep 18, 1984
- Xerox Corporation
- Donald L. Ort
- G01 - MEASURING TESTING
Information Patent Grant
Fatigue cycle sensor and method
- Patent number 4,317,373
- Issue date Mar 2, 1982
- Michael J. Goes
- G01 - MEASURING TESTING
Information Patent Grant
Display and processor for time-varying electric signal
- Patent number 4,267,574
- Issue date May 12, 1981
- Transidyne General Corporation
- Jan A. Vanden Broek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vent accumulator for hydraulic integrator
- Patent number 4,248,046
- Issue date Feb 3, 1981
- Unit Rig & Equipment Co.
- Robert M. Fornell
- G01 - MEASURING TESTING
Information Patent Grant
Exposure detecting device
- Patent number 4,229,733
- Issue date Oct 21, 1980
- Tulenko; Thomas N.
- Thomas N. Tulenko
- G08 - SIGNALLING
Information Patent Grant
Integrating circuit
- Patent number 4,223,271
- Issue date Sep 16, 1980
- Ricoh Company, Ltd.
- Masamichi Furukawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Valley sensor for an electrophoretic analyzer
- Patent number 4,118,781
- Issue date Oct 3, 1978
- Corning Glass Works
- Donald P. Brezinski
- G01 - MEASURING TESTING
Information Patent Grant
Circuit arrangement for the frequency analysis of a signal
- Patent number 4,062,020
- Issue date Dec 6, 1977
- Siemens Aktiengesellschaft
- Kurt Berglund
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Temperature function integrator
- Patent number 4,061,033
- Issue date Dec 6, 1977
- Development Finance Corporation
- Peter Anthony Nixon
- G01 - MEASURING TESTING
Information Patent Grant
Automatic graphing apparatus
- Patent number 3,965,477
- Issue date Jun 22, 1976
- James Hambleton
- G01 - MEASURING TESTING
Information Patent Grant
3818204
- Patent number 3,818,204
- Issue date Jun 18, 1974
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
3750187
- Patent number 3,750,187
- Issue date Jul 31, 1973
- G01 - MEASURING TESTING
Information Patent Grant
3742515
- Patent number 3,742,515
- Issue date Jun 26, 1973
- G01 - MEASURING TESTING
Information Patent Grant
3489886
- Patent number 3,489,886
- Issue date Jan 13, 1970
- G01 - MEASURING TESTING
Information Patent Grant
3360723
- Patent number 3,360,723
- Issue date Dec 26, 1967
- G01 - MEASURING TESTING
Information Patent Grant
3283646
- Patent number 3,283,646
- Issue date Nov 8, 1966
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...

Patents Applicationslast 30 patents

Information Patent Application
UPDATING BLENDING COEFFICIENTS IN REAL-TIME FOR VIRTUAL OUTPUT OF A...
- Publication number 20250020485
- Publication date Jan 16, 2025
- Honeywell International Inc.
- Christopher J. Mauer
- G01 - MEASURING TESTING
Information Patent Application
Inertial Measurement Device
- Publication number 20240210209
- Publication date Jun 27, 2024
- SEIKO EPSON CORPORATION
- Yasunori HIYOSHI
- G01 - MEASURING TESTING
Information Patent Application
RESOLVER SIGNAL PROCESSING DEVICE, DRIVE APPARATUS, RESOLVER SIGNAL...
- Publication number 20210270638
- Publication date Sep 2, 2021
- TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
- Chikara MORITO
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
GENERATION OF AN OUTPUT SIGNAL VALUE FROM SENSOR SIGNAL VALUES OF A...
- Publication number 20200408564
- Publication date Dec 31, 2020
- INFINEON TECHNOLOGIES AG
- Wolfgang Granig
- G01 - MEASURING TESTING
Information Patent Application
SENSOR DEVICE MANAGEMENT METHOD AND SENSOR DEVICE MANAGEMENT SYSTEM
- Publication number 20190368893
- Publication date Dec 5, 2019
- Hitachi, Ltd
- Rintaro Katayama
- G01 - MEASURING TESTING
Information Patent Application
System, Method and Apparatus for Cumulative Sensing
- Publication number 20170248442
- Publication date Aug 31, 2017
- Nokia Technologies Oy
- Ilya Borisovich GARTSEEV
- G01 - MEASURING TESTING
Information Patent Application
Measuring Arrangement with Large Dynamic Measuring Range
- Publication number 20100063780
- Publication date Mar 11, 2010
- Endress + Hauser Conducta Gesellschaft fur Mess- und Regeltechnik mbH + Co. KG
- Martin Gehrke
- G01 - MEASURING TESTING
Information Patent Application
Capacitance-based position sensor with integrating demodulator
- Publication number 20030222661
- Publication date Dec 4, 2003
- Donald J. Fasen
- G01 - MEASURING TESTING
Information Patent Application
Capacitance-based position sensor with integrating demodulator
- Publication number 20030132764
- Publication date Jul 17, 2003
- Donald J. Fasen
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for measuring signal pulse energy
- Publication number 20030033097
- Publication date Feb 13, 2003
- Hamamatsu Photonics K.K.
- Eiichi Tanaka
- G01 - MEASURING TESTING

giving integrated values

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Azimuth estimation device

Generation of an output signal value from sensor signal values of a...

Resolver signal processing device, drive apparatus, resolver signal...

Sensor device management method and sensor device management system

Method and apparatus for measuring signal pulse energy

Capacitance-based position sensor with integrating demodulator

Method and device for determining the position of a rotating cogwheel

Detecting and processing circuitry for magnetostriction type torque...

Circuit for processing sensor signals

Safety device for an automobile vehicle

Method for the imaging of casing morphology by twice integrating ma...

Disposable electronic monitor device

Device for measuring the number of revolutions of the shaft of a pe...

Solid state accumulating altimeter

Optical encoder improvement

Fatigue cycle sensor and method

Display and processor for time-varying electric signal

Vent accumulator for hydraulic integrator

Exposure detecting device

Integrating circuit

Valley sensor for an electrophoretic analyzer

Circuit arrangement for the frequency analysis of a signal

Temperature function integrator

Automatic graphing apparatus

3818204

3750187

3742515

3489886

3360723

3283646

Patents Applicationslast 30 patents

UPDATING BLENDING COEFFICIENTS IN REAL-TIME FOR VIRTUAL OUTPUT OF A...

Inertial Measurement Device

RESOLVER SIGNAL PROCESSING DEVICE, DRIVE APPARATUS, RESOLVER SIGNAL...

GENERATION OF AN OUTPUT SIGNAL VALUE FROM SENSOR SIGNAL VALUES OF A...

SENSOR DEVICE MANAGEMENT METHOD AND SENSOR DEVICE MANAGEMENT SYSTEM

System, Method and Apparatus for Cumulative Sensing

Measuring Arrangement with Large Dynamic Measuring Range

Capacitance-based position sensor with integrating demodulator

Capacitance-based position sensor with integrating demodulator

Method and apparatus for measuring signal pulse energy