Global scatter; Total scatter, excluding reflections

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G01N2021/4702

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

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G01N2021/4702Global scatter; Total scatter, excluding reflections

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Patents Grantslast 30 patents

Information Patent Grant
Cancer diagnosis by refractive index multifractality
- Patent number 11,530,985
- Issue date Dec 20, 2022
- Nanoscope Technologies, LLC
- Samarendra Kumar Mohanty
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Condensation irradiation system
- Patent number 10,513,946
- Issue date Dec 24, 2019
- Rolls-Royce PLC
- Matthew Baird
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Grant
Analysis method for supporting classification
- Patent number 10,401,275
- Issue date Sep 3, 2019
- Siemens Healthcare Diagnostics Products GmbH
- Barbara Kavsek
- G01 - MEASURING TESTING
Information Patent Grant
Method for imaging 1-D nanomaterials
- Patent number 10,267,682
- Issue date Apr 23, 2019
- Tsinghua University
- Wen-Yun Wu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Imaging systems for optical computing devices
- Patent number 9,528,931
- Issue date Dec 27, 2016
- Halliburton Energy Services, Inc.
- Robert Paul Freese
- E21 - EARTH DRILLING MINING
Information Patent Grant
Methods for using light reflection patterns to determine diving ang...
- Patent number 7,499,171
- Issue date Mar 3, 2009
- Weyerhaeuser NR Company
- Chih-Lin Huang
- G01 - MEASURING TESTING
Information Patent Grant
In-situ monitoring on an ion implanter
- Patent number 7,078,712
- Issue date Jul 18, 2006
- Axcelis Technologies, Inc.
- Alexander S. Perel
- G01 - MEASURING TESTING
Information Patent Grant
Enhanced fluorescence detection of samples in capillary column
- Patent number 5,484,571
- Issue date Jan 16, 1996
- Beckman Instruments, Inc.
- Stephen L. Pentoney
- G01 - MEASURING TESTING
Information Patent Grant
Device for the qualitative and/or quantitative determination of the...
- Patent number 5,408,312
- Issue date Apr 18, 1995
- Yoon-Ok; Kim
- Ralph H. Pries
- G01 - MEASURING TESTING
Information Patent Grant
Detecting a radiation signal
- Patent number 5,292,483
- Issue date Mar 8, 1994
- Beckman Instruments, Inc.
- Wilbur I. Kaye
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for imaging a physical parameter in turbid med...
- Patent number 5,203,339
- Issue date Apr 20, 1993
- The Government of the United States of America as represented by the Secretar...
- Alexander Knuttel
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for determining the effective surface roughness of polish...
- Patent number 4,972,092
- Issue date Nov 20, 1990
- Deutsche Forschungsanstalt fur Luftund Raumfahrt
- Dirk-Roger Schmitt
- G02 - OPTICS
Information Patent Grant
Method and apparatus for detecting foreign particle
- Patent number 4,965,454
- Issue date Oct 23, 1990
- Hitachi, Ltd.
- Toshihiko Yamauchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for optically measuring characteristics of a t...
- Patent number 4,873,430
- Issue date Oct 10, 1989
- International Business Machines Corporation
- Anthony Juliana
- G01 - MEASURING TESTING
Information Patent Grant
Optically based measurement of fluid parameters
- Patent number 4,690,560
- Issue date Sep 1, 1987
- Commonwealth Scientific and Industrial Research Organization
- Clive K. Coogan
- G01 - MEASURING TESTING
Information Patent Grant
Optical apparatus for identifying the individual multiparametric pr...
- Patent number 4,606,636
- Issue date Aug 19, 1986
- Universite de Saint-Etienne
- Jean Monin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FLUID HANDLING DEVICE, FLUID HANDLING SYSTEM AND LIQUID DETECTION M...
- Publication number 20220034806
- Publication date Feb 3, 2022
- ENPLAS CORPORATION
- Nobuya SUNAGA
- G01 - MEASURING TESTING
Information Patent Application
OPTIC DISTRIBUTION METER
- Publication number 20170067824
- Publication date Mar 9, 2017
- National Central University
- Tsung-Hsun YANG
- G01 - MEASURING TESTING
Information Patent Application
IMAGING SYSTEMS FOR OPTICAL COMPUTING DEVICES
- Publication number 20160266036
- Publication date Sep 15, 2016
- Halliburton Energy Services Inc.
- Robert Paul Freese
- G01 - MEASURING TESTING
Information Patent Application
Methods For Using Light Reflection Patterns To Determine Diving Ang...
- Publication number 20080246971
- Publication date Oct 9, 2008
- Weyerhaeuser Co.
- Chih-Lin Huang
- G01 - MEASURING TESTING
Information Patent Application
In-situ monitoring on an ion implanter
- Publication number 20050205807
- Publication date Sep 22, 2005
- Alexander S. Perel
- G01 - MEASURING TESTING
Information Patent Application
Reflected ultraviolet light measuring device
- Publication number 20050104004
- Publication date May 19, 2005
- KANSAI PAINT CO., LTD.
- Tohru Takeuchi
- G01 - MEASURING TESTING

Global scatter; Total scatter, excluding reflections

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Cancer diagnosis by refractive index multifractality

Condensation irradiation system

Analysis method for supporting classification

Method for imaging 1-D nanomaterials

Imaging systems for optical computing devices

Methods for using light reflection patterns to determine diving ang...

In-situ monitoring on an ion implanter

Enhanced fluorescence detection of samples in capillary column

Device for the qualitative and/or quantitative determination of the...

Detecting a radiation signal

Method and apparatus for imaging a physical parameter in turbid med...

Apparatus for determining the effective surface roughness of polish...

Method and apparatus for detecting foreign particle

Method and apparatus for optically measuring characteristics of a t...

Optically based measurement of fluid parameters

Optical apparatus for identifying the individual multiparametric pr...

Patents Applicationslast 30 patents

FLUID HANDLING DEVICE, FLUID HANDLING SYSTEM AND LIQUID DETECTION M...

OPTIC DISTRIBUTION METER

IMAGING SYSTEMS FOR OPTICAL COMPUTING DEVICES

Methods For Using Light Reflection Patterns To Determine Diving Ang...

In-situ monitoring on an ion implanter

Reflected ultraviolet light measuring device