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G01N2021/8928
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G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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G01N2021/8928
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Patents Grants
last 30 patents
Information
Patent Grant
Fume determination method, substrate processing method, and substra...
Patent number
11,011,398
Issue date
May 18, 2021
SCREEN Holdings Co., Ltd.
Toru Endo
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
8,563,958
Issue date
Oct 22, 2013
Hitachi High-Technologies Corporation
Kazuo Takahashi
G01 - MEASURING TESTING
Information
Patent Grant
Thin-film inspection apparatus and inspection method
Patent number
8,497,991
Issue date
Jul 30, 2013
Mitsubishi Heavy Industries, Ltd.
Satoshi Sakai
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for measuring haze of sheet materials or other...
Patent number
8,184,294
Issue date
May 22, 2012
Honeywell International Inc.
Tarja T. Shakespeare
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
8,101,935
Issue date
Jan 24, 2012
Hitachi High-Technologies Corporation
Kazuo Takahashi
G01 - MEASURING TESTING
Information
Patent Grant
Method for measuring the degree of crosslinking of pressure sensiti...
Patent number
7,405,828
Issue date
Jul 29, 2008
Daxon Technology Inc.
Yi-Hui Tan
G01 - MEASURING TESTING
Information
Patent Grant
Method to grain inspect directionally solidified castings
Patent number
7,034,931
Issue date
Apr 25, 2006
United Technologies Corporation
Howard B. Jones
G01 - MEASURING TESTING
Information
Patent Grant
Method for identifying materials, impurities and related defects wi...
Patent number
6,239,870
Issue date
May 29, 2001
Heuft Systemtechnik GmbH
Bernhard Heuft
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
FUME DETERMINATION METHOD, SUBSTRATE PROCESSING METHOD, AND SUBSTRA...
Publication number
20190172737
Publication date
Jun 6, 2019
SCREEN Holdings Co., Ltd.
Toru ENDO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20120154797
Publication date
Jun 21, 2012
Hitachi High-Technologies Corporation
Kazuo Takahashi
G01 - MEASURING TESTING
Information
Patent Application
THIN-FILM INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20110194113
Publication date
Aug 11, 2011
MITSUBISHI HEAVY INDUSTRIES, LTD.
Satoshi Sakai
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR MEASURING HAZE OF SHEET MATERIALS OR OTHER...
Publication number
20100226524
Publication date
Sep 9, 2010
Honeywell International Inc.
Tarja T. Shakespeare
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20090140180
Publication date
Jun 4, 2009
Hitachi High-Technologies Corporation
Kazuo Takahashi
G01 - MEASURING TESTING
Information
Patent Application
Method for measuring the degree of crosslinking of pressure sensiti...
Publication number
20070139650
Publication date
Jun 21, 2007
Daxon Technology Inc.
Yi-Hui Tan
G01 - MEASURING TESTING
Information
Patent Application
Method to grain inspect directionally solidified castings
Publication number
20040263832
Publication date
Dec 30, 2004
Howard B. Jones
G01 - MEASURING TESTING