Identify parameters with highest probability of failure

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G05B2219/32224

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GPHYSICS G05Controlling systems G05BCONTROL OR REGULATING SYSTEMS IN GENERAL FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS G05B2219/00Program-control systems

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G05B2219/32224Identify parameters with highest probability of failure

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Patents Grantslast 30 patents

Information Patent Grant
Faulty variable identification technique for data-driven fault dete...
- Patent number 11,966,217
- Issue date Apr 23, 2024
- Emerson Process Management Power & Water Solutions, Inc.
- Xu Cheng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data management and mining to correlate wafer alignment, design, de...
- Patent number 11,088,039
- Issue date Aug 10, 2021
- Applied Materials, Inc.
- Raman K. Nurani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adaptive value capture for process monitoring
- Patent number 9,905,483
- Issue date Feb 27, 2018
- Advantest Corporation
- Henry Arnold
- G05 - CONTROLLING REGULATING
Information Patent Grant
Knowledge-based statistical method and system to determine reliabil...
- Patent number 7,660,699
- Issue date Feb 9, 2010
- Semiconductor Manufacturing International (Shanghai) Corporation
- Wei-Ting Kary Chien
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Maintenance management of a machine
- Patent number 7,496,475
- Issue date Feb 24, 2009
- Solar Turbines Incorporated
- Brian Dara Byrne
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Yield/quality improvement using calculated failure rate derived fro...
- Patent number 6,947,871
- Issue date Sep 20, 2005
- Hitachi Global Storage Technologies Netherlands, B.V.
- Youping Deng
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method of and apparatus for extracting abnormal factors in a proces...
- Patent number 6,061,640
- Issue date May 9, 2000
- Matsushita Electric Industrial Co., Ltd.
- Masayuki Tanaka
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
Maintenance Recommendation System and Maintenance Recommendation Me...
- Publication number 20210405610
- Publication date Dec 30, 2021
- Hitachi, Ltd
- Takayuki UCHIDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR USE IN IMPROVING OPERATION OF UTILITY EQUIP...
- Publication number 20120290103
- Publication date Nov 15, 2012
- Quang Binh Dam
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD AND APPARATUS FOR SUPERVISING INTEGRATED TRIP MARGIN OF FACI...
- Publication number 20120022912
- Publication date Jan 26, 2012
- BNF Technology Inc.
- Kitae Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and System for Detecting Faults in a Process Plant
- Publication number 20080188972
- Publication date Aug 7, 2008
- Fisher-Rosemount Systems, Inc.
- John P. Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Maintenance management of a machine
- Publication number 20080133178
- Publication date Jun 5, 2008
- Solar Turbines Incorporated
- Brian Dara Byrne
- G05 - CONTROLLING REGULATING
Information Patent Application
Knowledge-based statistical method and system to determine reliabil...
- Publication number 20070032973
- Publication date Feb 8, 2007
- Semiconductor Manufacturing International (Shanghai) Corporation
- Wei-Ting Kary Chien
- G05 - CONTROLLING REGULATING
Information Patent Application
Yield/quality improvement using calculated failure rate derived fro...
- Publication number 20050071103
- Publication date Mar 31, 2005
- Youping Deng
- G05 - CONTROLLING REGULATING

Identify parameters with highest probability of failure

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Faulty variable identification technique for data-driven fault dete...

Data management and mining to correlate wafer alignment, design, de...

Adaptive value capture for process monitoring

Knowledge-based statistical method and system to determine reliabil...

Maintenance management of a machine

Yield/quality improvement using calculated failure rate derived fro...

Method of and apparatus for extracting abnormal factors in a proces...

Patents Applicationslast 30 patents

Maintenance Recommendation System and Maintenance Recommendation Me...

SYSTEMS AND METHODS FOR USE IN IMPROVING OPERATION OF UTILITY EQUIP...

METHOD AND APPARATUS FOR SUPERVISING INTEGRATED TRIP MARGIN OF FACI...

Method and System for Detecting Faults in a Process Plant

Maintenance management of a machine

Knowledge-based statistical method and system to determine reliabil...

Yield/quality improvement using calculated failure rate derived fro...