If number of errors grow, augment sampling rate for testing

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CPC
G05B2219/32199

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GPHYSICS G05Controlling systems G05BCONTROL OR REGULATING SYSTEMS IN GENERAL FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS G05B2219/00Program-control systems

Current Industry

G05B2219/32199If number of errors grow, augment sampling rate for testing

Industries

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If number of errors grow, augment sampling rate for testing

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Fab management with dynamic sampling plans, optimized wafer measure...

Auto defect screening using adaptive machine learning in semiconduc...

Auto defect screening using adaptive machine learning in semiconduc...

Sampling data processing device, sampling data processing method, a...

Method for using real-time APC information for an enhanced lot samp...

Method of performing measurement sampling of lots in a manufacturin...

Data collection method, substrate processing apparatus, and substra...

Method and apparatus for adaptive sampling based on process covariance

Systems, methods and computer program products for constructing sam...

Adjusting a trace data rate based upon a tool state

Method and apparatus for determining a sampling plan based on defec...

Systems, methods and computer program products for constructing sam...

Self-improving work instruction system

Patents Applicationslast 30 patents

Method for Controlling a Production Process for Producing Components

FAB MANAGEMENT WITH DYNAMIC SAMPLING PLANS, OPTIMIZED WAFER MEASURE...

AUTO DEFECT SCREENING USING ADAPTIVE MACHINE LEARNING IN SEMICONDUC...

METHOD FOR USING REAL-TIME APC INFORMATION FOR AN ENHANCED LOT SAMP...

METHOD FOR USING REAL-TIME APC INFORMATION FOR AN ENHANCED LOT SAMP...

METHOD OF PERFORMING MEASUREMENT SAMPLING OF LOTS IN A MANUFACTURIN...

DATA COLLECTION METHOD, SUBSTRATE PROCESSING APPARATUS, AND SUBSTRA...

Systems, methods and computer program products for constructing sam...

System for dynamically monitoring the stability of semiconductor ma...