Illumination and detection on two sides of object

Industry

CPC
G01N2021/8841

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/8841Illumination and detection on two sides of object

Industries

Patents Grantslast 30 patents

Information Patent Grant
Single pass automated vehicle inspection system and method
- Patent number 12,140,501
- Issue date Nov 12, 2024
- UVEYE LTD.
- Ohad Hever
- G01 - MEASURING TESTING
Information Patent Grant
Product inspection system and method
- Patent number 12,117,404
- Issue date Oct 15, 2024
- TE CONNECTIVITY SOLUTIONS GmbH
- Lei (Alex) Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Image capturing unit and inspection system
- Patent number 12,038,386
- Issue date Jul 16, 2024
- ROBIT INC.
- Masahiro Arai
- G01 - MEASURING TESTING
Information Patent Grant
Device for recognizing defects in finished surface of product
- Patent number 11,940,389
- Issue date Mar 26, 2024
- Fu Tai Hua Industry (Shenzhen) Co., Ltd.
- Liu-Bin Hu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor inspection tool system and method for wafer edge insp...
- Patent number 11,828,713
- Issue date Nov 28, 2023
- Camtek Ltd.
- Carmel Yehuda Drillman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tubular body inner surface inspection apparatus and tubular body in...
- Patent number 11,428,647
- Issue date Aug 30, 2022
- Nippon Steel Corporation
- Toshio Akagi
- G01 - MEASURING TESTING
Information Patent Grant
Method and a machine for checking the quality of a product
- Patent number 11,327,027
- Issue date May 10, 2022
- BOBST MEX SA
- Alexandre Pauchard
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for high-speed surface relief measurement
- Patent number 11,231,375
- Issue date Jan 25, 2022
- Wisconsin Alumni Research Foundation
- Soongyu Yi
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing electrode by switching contact region of r...
- Patent number 11,196,033
- Issue date Dec 7, 2021
- Toyota Jidosha Kabushiki Kaisha
- Shigeru Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrode manufacture by switching contact region of roll surface u...
- Patent number 11,031,582
- Issue date Jun 8, 2021
- Toyota Jidosha Kabushiki Kaisha
- Shigeru Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microneedle array imaging device, microneedle array imaging method,...
- Patent number 10,922,805
- Issue date Feb 16, 2021
- FUJIFILM Corporation
- Takashi Murooka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Object multi-perspective inspection apparatus and method therefor
- Patent number 10,788,429
- Issue date Sep 29, 2020
- ABB Schweiz AG
- Martin Kefer
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid inspection system and inspection method for dosage
- Patent number 10,782,250
- Issue date Sep 22, 2020
- Yong-Kwan Shin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods, apparatus, and systems for inspecting holes in transparent...
- Patent number 10,768,121
- Issue date Sep 8, 2020
- The Boeing Company
- Elizabeth Ann Paton
- G01 - MEASURING TESTING
Information Patent Grant
Object multi-perspective inspection apparatus and method therefor
- Patent number 10,488,346
- Issue date Nov 26, 2019
- ABB Schweiz AG
- Martin Kefer
- G01 - MEASURING TESTING
Information Patent Grant
Lighting apparatus for conveyors
- Patent number 10,401,303
- Issue date Sep 3, 2019
- P & P OPTICA INC.
- Alexander Baran-Harper
- G01 - MEASURING TESTING
Information Patent Grant
Detection and identification of opaqueness of vehicle windows
- Patent number 10,053,059
- Issue date Aug 21, 2018
- Ford Global Technologies, LLC
- Reid William Kaufman Worthen
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Apparatus and a method for inspecting a light transmissive optical...
- Patent number 9,970,884
- Issue date May 15, 2018
- Hong Kong Applied Science and Technology Research Institute Company Limited
- Vladislav Nikitin
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Device and method for surface profilometry for the control of wafer...
- Patent number 9,958,261
- Issue date May 1, 2018
- UNITY SEMICONDUCTOR
- Gilles Fresquet
- G01 - MEASURING TESTING
Information Patent Grant
Pill inspection apparatus and pill inspection method
- Patent number 9,958,400
- Issue date May 1, 2018
- Panasonic Healthcare Holdings Co., Ltd.
- Takanobu Tanimoto
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Particulate matter detection apparatus
- Patent number 9,880,104
- Issue date Jan 30, 2018
- Shenzhen China Star Optoelectronics Technology Co., Ltd.
- Hui Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing liquid crystal display device and inspectio...
- Patent number 9,863,762
- Issue date Jan 9, 2018
- Samsung Display Co., Ltd.
- Yong-Woon Lim
- G02 - OPTICS
Information Patent Grant
Panel inspection apparatus and method
- Patent number 9,810,640
- Issue date Nov 7, 2017
- CHENG MEI INSTRUMENT TECHNOLOGY CO., LTD.
- Chao-Yi Yeh
- G01 - MEASURING TESTING
Information Patent Grant
Upper surface foreign material detecting device of ultra-thin trans...
- Patent number 9,733,196
- Issue date Aug 15, 2017
- Nanoprotech Co., Ltd.
- Hyung Seok Lee
- G01 - MEASURING TESTING
Information Patent Grant
Visual inspection apparatus
- Patent number 9,261,463
- Issue date Feb 16, 2016
- UENO SEIKI CO., LTD.
- Kazunari Shiraishi
- G01 - MEASURING TESTING
Information Patent Grant
Prepreg production method
- Patent number 9,180,653
- Issue date Nov 10, 2015
- Toray Industries, Inc.
- Daiki Minamida
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Night vision device test apparatus
- Patent number 9,110,034
- Issue date Aug 18, 2015
- L-3 Communications Corp.
- Brian W. Cranton
- G01 - MEASURING TESTING
Information Patent Grant
Camera web support
- Patent number 8,593,635
- Issue date Nov 26, 2013
- Hewlett-Packard Development Company, L.P.
- Paul C. Ray
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Method of monitoring fabrication processing including edge bead rem...
- Patent number 8,492,178
- Issue date Jul 23, 2013
- Rudolph Technologies, Inc.
- Alan Carlson
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting edge of semiconductor wafer
- Patent number 8,194,241
- Issue date Jun 5, 2012
- Shibaura Mechatronics Corporation
- Yoshinori Hayashi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATED OPTICAL INSPECTION TOOL
- Publication number 20240377334
- Publication date Nov 14, 2024
- Applied Materials, Inc.
- Mark Anthony Lee
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING FULL CONTAINERS
- Publication number 20240280504
- Publication date Aug 22, 2024
- Heuft Systemtechnik GmbH
- Bernhard HEUFT
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR OPTICAL INSPECTING THREE OR MORE SIDES OF...
- Publication number 20240230552
- Publication date Jul 11, 2024
- BESI Switzerland AG
- Ralf WEISE
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR AUTOMATIC INSPECTION OF VEHICLES
- Publication number 20240230473
- Publication date Jul 11, 2024
- SPINFRAME TECHNOLOGIES LTD
- Ori Yakov DANGUR
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS
- Publication number 20240201102
- Publication date Jun 20, 2024
- NEC Corporation
- Shoji YACHIDA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR AUTOMATIC INSPECTION OF VEHICLES
- Publication number 20240133772
- Publication date Apr 25, 2024
- SPINFRAME TECHNOLOGIES LTD
- Ori Yakov DANGUR
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR INSPECTING THE SURFACE OF A TRANSPARENT OBJECT, AND CORR...
- Publication number 20240102940
- Publication date Mar 28, 2024
- ISRA VISION AG
- Josef DROSTE
- G01 - MEASURING TESTING
Information Patent Application
GLASS INSPECTION EQUIPMENT AND METHOD OF GLASS INSPECTION
- Publication number 20240027363
- Publication date Jan 25, 2024
- SAMSUNG DISPLAY CO., LTD.
- YUNKU KANG
- G01 - MEASURING TESTING
Information Patent Application
VISUAL INSPECTION SYSTEM FOR ANNULAR PRODUCT
- Publication number 20230298153
- Publication date Sep 21, 2023
- DAIICHI JITSUGYO VISWILL CO., LTD.
- Koji MATSUI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED OPTICAL DOUBLE-SIDED INSPECTION APPARATUS
- Publication number 20230213457
- Publication date Jul 6, 2023
- Feng Chia University
- Yee Siang GAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Product Inspection System and Method
- Publication number 20230021095
- Publication date Jan 19, 2023
- Tyco Electronics (Shanghai) Co. Ltd.
- Lei (Alex) Zhou
- G01 - MEASURING TESTING
Information Patent Application
SENSORS, IMAGING SYSTEMS, AND METHODS FOR FORMING A SENSOR
- Publication number 20220397536
- Publication date Dec 15, 2022
- KLA Corporation
- Steve Zamek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE FOR RECOGNIZING DEFECTS IN FINISHED SURFACE OF PRODUCT
- Publication number 20220373470
- Publication date Nov 24, 2022
- FU TAI HUA INDUSTRY (SHENZHEN) CO., LTD.
- LIU-BIN HU
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20220357285
- Publication date Nov 10, 2022
- Hitachi High-Tech Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Application
Electronic Device Valuation System
- Publication number 20220136977
- Publication date May 5, 2022
- Mintit Co., Ltd.
- Sung Lack CHO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR MANUFACTURING ELECTRODE BY SWITCHING CONTACT REGION OF R...
- Publication number 20210249643
- Publication date Aug 12, 2021
- Toyota Jidosha Kabushiki Kaisha
- Shigeru SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TUBULAR BODY INNER SURFACE INSPECTION APPARATUS AND TUBULAR BODY IN...
- Publication number 20210208085
- Publication date Jul 8, 2021
- NIPPON STEEL CORPORATION
- Toshio AKAGI
- G01 - MEASURING TESTING
Information Patent Application
DETECTION OF DAMAGE TO OPTICAL ELEMENT OF ILLUMINATION SYSTEM
- Publication number 20210003511
- Publication date Jan 7, 2021
- CONTINENTAL AUTOMOTIVE SYSTEMS, INC.
- Jacob A. Bergam
- G01 - MEASURING TESTING
Information Patent Application
GLASS PROCESSING APPARATUS AND METHODS
- Publication number 20200378899
- Publication date Dec 3, 2020
- Corning Incorporated
- Yongjin Cho
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for High-Speed Surface Relief Measurement
- Publication number 20200371043
- Publication date Nov 26, 2020
- Wisconsin Alumni Research Foundation
- Soongyu Yi
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND A MACHINE FOR CHECKING THE QUALITY OF A PRODUCT
- Publication number 20200240926
- Publication date Jul 30, 2020
- BOBST MEX SA
- Alexandre PAUCHARD
- G01 - MEASURING TESTING
Information Patent Application
INSPECTING A SLAB OF MATERIAL
- Publication number 20200191550
- Publication date Jun 18, 2020
- Applejack 199 L.P.
- Wojciech Jan WALECKI
- G01 - MEASURING TESTING
Information Patent Application
OBJECT MULTI-PERSPECTIVE INSPECTION APPARATUS AND METHOD THEREFOR
- Publication number 20200132609
- Publication date Apr 30, 2020
- ABB Schweiz AG
- Martin Kefer
- G01 - MEASURING TESTING
Information Patent Application
METHODS, APPARATUS, AND SYSTEMS FOR INSPECTING HOLES IN TRANSPARENT...
- Publication number 20190360945
- Publication date Nov 28, 2019
- The Boeing Company
- Elizabeth Ann Paton
- G01 - MEASURING TESTING
Information Patent Application
Cosmetic Evaluation Box for Used Electronics
- Publication number 20190277769
- Publication date Sep 12, 2019
- GDT, INC.
- Tu Nguyen
- G01 - MEASURING TESTING
Information Patent Application
OBJECT MULTI-PERSPECTIVE INSPECTION APPARATUS AND METHOD THEREFOR
- Publication number 20180188184
- Publication date Jul 5, 2018
- ABB Schweiz AG
- Martin Kefer
- G01 - MEASURING TESTING
Information Patent Application
Cosmetic Evaluation Box for Used Electronics
- Publication number 20170328839
- Publication date Nov 16, 2017
- GDT, INC.
- Tu Nguyen
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR SURFACE PROFILOMETRY FOR THE CONTROL OF WAFER...
- Publication number 20170299376
- Publication date Oct 19, 2017
- FOGALE NANOTECH
- Gilles FRESQUET
- G01 - MEASURING TESTING
Information Patent Application
HYBRID INSPECTION SYSTEM AND INSPECTION METHOD FOR DOSAGE
- Publication number 20170219497
- Publication date Aug 3, 2017
- Yong-Kwan Shin
- G01 - MEASURING TESTING
Information Patent Application
PARTICULATE MATTER DETECTION APPARATUS
- Publication number 20170184510
- Publication date Jun 29, 2017
- Shenzhen China Star Optoelectronics Technology Co., Ltd.
- Hui CHEN
- G01 - MEASURING TESTING

Illumination and detection on two sides of object

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Single pass automated vehicle inspection system and method

Product inspection system and method

Image capturing unit and inspection system

Device for recognizing defects in finished surface of product

Semiconductor inspection tool system and method for wafer edge insp...

Tubular body inner surface inspection apparatus and tubular body in...

Method and a machine for checking the quality of a product

Apparatus for high-speed surface relief measurement

Method for manufacturing electrode by switching contact region of r...

Electrode manufacture by switching contact region of roll surface u...

Microneedle array imaging device, microneedle array imaging method,...

Object multi-perspective inspection apparatus and method therefor

Hybrid inspection system and inspection method for dosage

Methods, apparatus, and systems for inspecting holes in transparent...

Object multi-perspective inspection apparatus and method therefor

Lighting apparatus for conveyors

Detection and identification of opaqueness of vehicle windows

Apparatus and a method for inspecting a light transmissive optical...

Device and method for surface profilometry for the control of wafer...

Pill inspection apparatus and pill inspection method

Particulate matter detection apparatus

Method of manufacturing liquid crystal display device and inspectio...

Panel inspection apparatus and method

Upper surface foreign material detecting device of ultra-thin trans...

Visual inspection apparatus

Prepreg production method

Night vision device test apparatus

Camera web support

Method of monitoring fabrication processing including edge bead rem...

Apparatus and method for inspecting edge of semiconductor wafer

Patents Applicationslast 30 patents

AUTOMATED OPTICAL INSPECTION TOOL

METHOD AND APPARATUS FOR INSPECTING FULL CONTAINERS

APPARATUS AND METHOD FOR OPTICAL INSPECTING THREE OR MORE SIDES OF...

SYSTEM AND METHOD FOR AUTOMATIC INSPECTION OF VEHICLES

INSPECTION APPARATUS

SYSTEM AND METHOD FOR AUTOMATIC INSPECTION OF VEHICLES

DEVICE FOR INSPECTING THE SURFACE OF A TRANSPARENT OBJECT, AND CORR...

GLASS INSPECTION EQUIPMENT AND METHOD OF GLASS INSPECTION

VISUAL INSPECTION SYSTEM FOR ANNULAR PRODUCT

AUTOMATED OPTICAL DOUBLE-SIDED INSPECTION APPARATUS

Product Inspection System and Method

SENSORS, IMAGING SYSTEMS, AND METHODS FOR FORMING A SENSOR

DEVICE FOR RECOGNIZING DEFECTS IN FINISHED SURFACE OF PRODUCT

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

Electronic Device Valuation System

METHOD FOR MANUFACTURING ELECTRODE BY SWITCHING CONTACT REGION OF R...

TUBULAR BODY INNER SURFACE INSPECTION APPARATUS AND TUBULAR BODY IN...

DETECTION OF DAMAGE TO OPTICAL ELEMENT OF ILLUMINATION SYSTEM

GLASS PROCESSING APPARATUS AND METHODS

Apparatus for High-Speed Surface Relief Measurement

METHOD AND A MACHINE FOR CHECKING THE QUALITY OF A PRODUCT

INSPECTING A SLAB OF MATERIAL

OBJECT MULTI-PERSPECTIVE INSPECTION APPARATUS AND METHOD THEREFOR

METHODS, APPARATUS, AND SYSTEMS FOR INSPECTING HOLES IN TRANSPARENT...

Cosmetic Evaluation Box for Used Electronics

OBJECT MULTI-PERSPECTIVE INSPECTION APPARATUS AND METHOD THEREFOR

Cosmetic Evaluation Box for Used Electronics

DEVICE AND METHOD FOR SURFACE PROFILOMETRY FOR THE CONTROL OF WAFER...

HYBRID INSPECTION SYSTEM AND INSPECTION METHOD FOR DOSAGE

PARTICULATE MATTER DETECTION APPARATUS