in embedded memories

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G11C2029/0401

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GPHYSICS G11Information storage G11CSTATIC STORES

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G11C2029/0401in embedded memories

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Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for testing inaccessible interface circuits i...
- Patent number 12,196,805
- Issue date Jan 14, 2025
- RAMBUS INC.
- Frederick A. Ware
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit having test circuitry for memory sub-systems
- Patent number 12,181,522
- Issue date Dec 31, 2024
- NXP USA, INC.
- Alexander Hoefler
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory array detection circuit and detection method, and memory
- Patent number 12,014,788
- Issue date Jun 18, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Weijie Cheng
- G11 - INFORMATION STORAGE
Information Patent Grant
Reclaimable semiconductor device package and associated systems and...
- Patent number 11,854,635
- Issue date Dec 26, 2023
- Micron Technology, Inc.
- Yueping Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Digital circuit testing and analysis module, system and method thereof
- Patent number 11,688,482
- Issue date Jun 27, 2023
- Numascale AS
- Thibaut Palfer-Sollier
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit with embedded memory modules
- Patent number 11,587,636
- Issue date Feb 21, 2023
- NXP USA, INC.
- Wenbin Yang
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory controller with integrated test circuitry
- Patent number 11,567,120
- Issue date Jan 31, 2023
- RAMBUS INC.
- Frederick A. Ware
- G01 - MEASURING TESTING
Information Patent Grant
Embedded memory device and method for embedding memory device in a...
- Patent number 11,562,993
- Issue date Jan 24, 2023
- Intel Corporation
- Andrew Collins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system involving degradation of non-volatile memory base...
- Patent number 11,538,539
- Issue date Dec 27, 2022
- Western Digital Technologies, Inc.
- Jay Sarkar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cache array macro micro-masking
- Patent number 11,449,397
- Issue date Sep 20, 2022
- International Business Machines Corporation
- Gregory J. Fredeman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory device with improved sensing structure
- Patent number 11,367,497
- Issue date Jun 21, 2022
- Micron Technology, Inc.
- Alberto Troia
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory controller with integrated test circuitry
- Patent number 11,307,243
- Issue date Apr 19, 2022
- RAMBUS INC.
- Frederick A. Ware
- G11 - INFORMATION STORAGE
Information Patent Grant
Field recovery of graphics on-die memory
- Patent number 11,302,413
- Issue date Apr 12, 2022
- Intel Corporation
- Altug Koker
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in-self-test circuits and methods using pipeline registers
- Patent number 11,257,562
- Issue date Feb 22, 2022
- Intel Corporation
- Tze Sin Tan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor apparatus for compensating for degradation and semico...
- Patent number 11,170,871
- Issue date Nov 9, 2021
- SK hynix Inc.
- Woongrae Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Nonvolatile memory device and method of processing in memory (PIM)...
- Patent number 11,164,632
- Issue date Nov 2, 2021
- Samsung Electronics Co., Ltd.
- Se-Hwan Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor memory device
- Patent number 11,156,658
- Issue date Oct 26, 2021
- Micron Technology, Inc.
- Chiaki Dono
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for accessing configurable memory during hard...
- Patent number 11,086,788
- Issue date Aug 10, 2021
- Intel Corporation
- Jun Pin Tan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor apparatus for compensating for degradation and semico...
- Patent number 11,081,205
- Issue date Aug 3, 2021
- SK hynix Inc.
- Woongrae Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Embedded memory device and method for embedding memory device in a...
- Patent number 11,018,124
- Issue date May 25, 2021
- Intel Corporation
- Andrew Collins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method for testing three-dimensional memory device
- Patent number 10,998,079
- Issue date May 4, 2021
- Yangtze Memory Technologies Co., Ltd.
- Jong Jun Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Nonvolatile memory device and method of processing in memory (PIM)...
- Patent number 10,971,230
- Issue date Apr 6, 2021
- Samsung Electronics Co., Ltd.
- Se-Hwan Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatuses and methods for memory testing and repair
- Patent number 10,878,933
- Issue date Dec 29, 2020
- Micron Technology, Inc.
- Joe M. Jeddeloh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Secure device state apparatus and method and lifecycle management
- Patent number 10,872,154
- Issue date Dec 22, 2020
- Google LLC
- Marius Schilder
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Post-packaging environment recovery of graphics on-die memory
- Patent number 10,762,978
- Issue date Sep 1, 2020
- Intel Corporation
- Altug Koker
- G11 - INFORMATION STORAGE
Information Patent Grant
Byte enable memory built-in self-test (MBIST) algorithm
- Patent number 10,748,641
- Issue date Aug 18, 2020
- QUALCOMM Incorporated
- Greg Seok
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory controller with integrated test circuitry
- Patent number 10,725,099
- Issue date Jul 28, 2020
- RAMBUS INC.
- Frederick A. Ware
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and system for a storage (SSD) drive-level failure and healt...
- Patent number 10,726,930
- Issue date Jul 28, 2020
- Western Digital Technologies, Inc.
- Jay Sarkar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, method and computer-accessible medium for automated identif...
- Patent number 10,699,795
- Issue date Jun 30, 2020
- Cadence Design Systems, Inc.
- Norman Card
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit including efficient clocking for testing memory interface
- Patent number 10,685,730
- Issue date Jun 16, 2020
- Seagate Technology LLC
- Komal Shah
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
MEMORY ARRAY DETECTION CIRCUIT AND DETECTION METHOD, AND MEMORY
- Publication number 20230352111
- Publication date Nov 2, 2023
- ChangXin Memory Technologies, Inc.
- Weijie CHENG
- G11 - INFORMATION STORAGE
Information Patent Application
METHODS AND APPARATUS FOR TESTING INACCESSIBLE INTERFACE CIRCUITS I...
- Publication number 20230266385
- Publication date Aug 24, 2023
- Rambus Inc.
- Frederick A. Ware
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY CONTROLLER WITH INTEGRATED TEST CIRCUITRY
- Publication number 20220283219
- Publication date Sep 8, 2022
- Rambus Inc.
- Frederick A. Ware
- G11 - INFORMATION STORAGE
Information Patent Application
INTEGRATED CIRCUIT WITH EMBEDDED MEMORY MODULES
- Publication number 20220199182
- Publication date Jun 23, 2022
- NXP USA, Inc.
- Wenbin Yang
- G11 - INFORMATION STORAGE
Information Patent Application
A digital circuit testing and analysis module, system and method th...
- Publication number 20210295939
- Publication date Sep 23, 2021
- NUMASCALE AS
- Thibaut PALFER-SOLLIER
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE WITH IMPROVED SENSING STRUCTURE
- Publication number 20210287757
- Publication date Sep 16, 2021
- Micron Technology, Inc.
- Alberto Troia
- G11 - INFORMATION STORAGE
Information Patent Application
EMBEDDED MEMORY DEVICE AND METHOD FOR EMBEDDING MEMORY DEVICE IN A...
- Publication number 20210225828
- Publication date Jul 22, 2021
- Intel Corporation
- Andrew Collins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NONVOLATILE MEMORY DEVICE AND METHOD OF PROCESSING IN MEMORY (PIM)...
- Publication number 20210183446
- Publication date Jun 17, 2021
- Samsung Electronics Co., Ltd.
- SE-HWAN PARK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CACHE ARRAY MACRO MICRO-MASKING
- Publication number 20210073087
- Publication date Mar 11, 2021
- International Business Machines Corporation
- Gregory J. FREDEMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY CONTROLLER WITH INTEGRATED TEST CIRCUITRY
- Publication number 20210033665
- Publication date Feb 4, 2021
- Rambus Inc.
- Frederick A. Ware
- G11 - INFORMATION STORAGE
Information Patent Application
Method and System Involving Degradation of Non-Volatile Memory Base...
- Publication number 20200342945
- Publication date Oct 29, 2020
- Western Digital Technologies, Inc.
- Jay SARKAR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EMBEDDED MEMORY DEVICE AND METHOD FOR EMBEDDING MEMORY DEVICE IN A...
- Publication number 20200075567
- Publication date Mar 5, 2020
- Intel Corporation
- Andrew Collins
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR CONTROLLING OPERATIONS OF MEMORY DEVICE, ASSOCIATED MEMO...
- Publication number 20190371369
- Publication date Dec 5, 2019
- SILICON MOTION INC
- Yu-Wei Chyan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Memory Controller with Integrated Test Circuitry
- Publication number 20190277909
- Publication date Sep 12, 2019
- RAMBUS INC.
- Frederick A. Ware
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MEMORY SYSTEM AND OPERATING METHOD THEREOF
- Publication number 20190221279
- Publication date Jul 18, 2019
- SK HYNIX INC.
- Jong-Min LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR CONTROLLING OPERATIONS OF MEMORY DEVICE, ASSOCIATED MEMO...
- Publication number 20190147920
- Publication date May 16, 2019
- SILICON MOTION INC
- Yu-Wei Chyan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ULTRA HIGH CAPACITY SOLID STATE DRIVE
- Publication number 20190079891
- Publication date Mar 14, 2019
- NGD Systems, Inc.
- Richard Mataya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STRUCTURE AND METHOD FOR TESTING THREE-DIMENSIONAL MEMORY DEVICE
- Publication number 20190057756
- Publication date Feb 21, 2019
- Yangtze Memory Technologies Co., Ltd.
- Jong Jun Kim
- G11 - INFORMATION STORAGE
Information Patent Application
Built-In-Self-Test Circuits And Methods Using Pipeline Registers
- Publication number 20190043601
- Publication date Feb 7, 2019
- Intel Corporation
- Tze Sin Tan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DYNAMIC MANAGEMENT OF PROGRAMMING STATES TO IMPROVE ENDURANCE
- Publication number 20190035457
- Publication date Jan 31, 2019
- SanDisk Technologies LLC
- Nian Niles Yang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR APPARATUS FOR COMPENSATING FOR DEGRADATION AND SEMICO...
- Publication number 20180322938
- Publication date Nov 8, 2018
- SK HYNIX INC.
- Woongrae KIM
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20180277514
- Publication date Sep 27, 2018
- Toshiba Memory Corporation
- Masaji IWAMOTO.
- G11 - INFORMATION STORAGE
Information Patent Application
REPAIR DEVICE AND SEMICONDUCTOR DEVICE INCLUDING THE REPAIR DEVICE
- Publication number 20180261297
- Publication date Sep 13, 2018
- SK HYNIX INC.
- Sang Hee KIM
- G11 - INFORMATION STORAGE
Information Patent Application
VERIFICATION OF STORAGE MEDIA UPON DEPLOYMENT
- Publication number 20180226137
- Publication date Aug 9, 2018
- Western Digital Technologies, Inc.
- Christopher Squires
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DYNAMIC WINDOW TO IMPROVE NAND ENDURANCE
- Publication number 20180196612
- Publication date Jul 12, 2018
- Intel Corporation
- Kiran Pangal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUSES AND METHODS FOR MEMORY TESTING AND REPAIR
- Publication number 20180190367
- Publication date Jul 5, 2018
- Micron Technology, Inc.
- Joe M. Jeddeloh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY APPARATUS FOR IN-CHIP ERROR CORRECTION
- Publication number 20180189132
- Publication date Jul 5, 2018
- Samsung Electronics Co., Ltd.
- Krishna T. Malladi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RETENTION MINIMUM VOLTAGE DETERMINATION TECHNIQUES
- Publication number 20180166145
- Publication date Jun 14, 2018
- Intel Corporation
- Minki CHO
- G11 - INFORMATION STORAGE
Information Patent Application
RECLAIMABLE SEMICONDUCTOR DEVICE PACKAGE AND ASSOCIATED SYSTEMS AND...
- Publication number 20180090223
- Publication date Mar 29, 2018
- Micron Technology, Inc.
- Yueping Li
- G11 - INFORMATION STORAGE
Information Patent Application
Devices, systems, and methods for increasing endurance on a storage...
- Publication number 20180067666
- Publication date Mar 8, 2018
- Smart IOPS, Inc.
- Manuel Antonio d'Abreu
- G06 - COMPUTING CALCULATING COUNTING

in embedded memories

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Methods and apparatus for testing inaccessible interface circuits i...

Integrated circuit having test circuitry for memory sub-systems

Memory array detection circuit and detection method, and memory

Reclaimable semiconductor device package and associated systems and...

Digital circuit testing and analysis module, system and method thereof

Integrated circuit with embedded memory modules

Memory controller with integrated test circuitry

Embedded memory device and method for embedding memory device in a...

Method and system involving degradation of non-volatile memory base...

Cache array macro micro-masking

Memory device with improved sensing structure

Memory controller with integrated test circuitry

Field recovery of graphics on-die memory

Built-in-self-test circuits and methods using pipeline registers

Semiconductor apparatus for compensating for degradation and semico...

Nonvolatile memory device and method of processing in memory (PIM)...

Semiconductor memory device

Methods and apparatus for accessing configurable memory during hard...

Semiconductor apparatus for compensating for degradation and semico...

Embedded memory device and method for embedding memory device in a...

Structure and method for testing three-dimensional memory device

Nonvolatile memory device and method of processing in memory (PIM)...

Apparatuses and methods for memory testing and repair

Secure device state apparatus and method and lifecycle management

Post-packaging environment recovery of graphics on-die memory

Byte enable memory built-in self-test (MBIST) algorithm

Memory controller with integrated test circuitry

Method and system for a storage (SSD) drive-level failure and healt...

System, method and computer-accessible medium for automated identif...

Circuit including efficient clocking for testing memory interface

Patents Applicationslast 30 patents

MEMORY ARRAY DETECTION CIRCUIT AND DETECTION METHOD, AND MEMORY

METHODS AND APPARATUS FOR TESTING INACCESSIBLE INTERFACE CIRCUITS I...

MEMORY CONTROLLER WITH INTEGRATED TEST CIRCUITRY

INTEGRATED CIRCUIT WITH EMBEDDED MEMORY MODULES

A digital circuit testing and analysis module, system and method th...

MEMORY DEVICE WITH IMPROVED SENSING STRUCTURE

EMBEDDED MEMORY DEVICE AND METHOD FOR EMBEDDING MEMORY DEVICE IN A...

NONVOLATILE MEMORY DEVICE AND METHOD OF PROCESSING IN MEMORY (PIM)...

CACHE ARRAY MACRO MICRO-MASKING

MEMORY CONTROLLER WITH INTEGRATED TEST CIRCUITRY

Method and System Involving Degradation of Non-Volatile Memory Base...

EMBEDDED MEMORY DEVICE AND METHOD FOR EMBEDDING MEMORY DEVICE IN A...

METHOD FOR CONTROLLING OPERATIONS OF MEMORY DEVICE, ASSOCIATED MEMO...

Memory Controller with Integrated Test Circuitry

MEMORY SYSTEM AND OPERATING METHOD THEREOF

METHOD FOR CONTROLLING OPERATIONS OF MEMORY DEVICE, ASSOCIATED MEMO...

ULTRA HIGH CAPACITY SOLID STATE DRIVE

STRUCTURE AND METHOD FOR TESTING THREE-DIMENSIONAL MEMORY DEVICE

Built-In-Self-Test Circuits And Methods Using Pipeline Registers

DYNAMIC MANAGEMENT OF PROGRAMMING STATES TO IMPROVE ENDURANCE

SEMICONDUCTOR APPARATUS FOR COMPENSATING FOR DEGRADATION AND SEMICO...

SEMICONDUCTOR DEVICE

REPAIR DEVICE AND SEMICONDUCTOR DEVICE INCLUDING THE REPAIR DEVICE

VERIFICATION OF STORAGE MEDIA UPON DEPLOYMENT

DYNAMIC WINDOW TO IMPROVE NAND ENDURANCE

APPARATUSES AND METHODS FOR MEMORY TESTING AND REPAIR

MEMORY APPARATUS FOR IN-CHIP ERROR CORRECTION

RETENTION MINIMUM VOLTAGE DETERMINATION TECHNIQUES

RECLAIMABLE SEMICONDUCTOR DEVICE PACKAGE AND ASSOCIATED SYSTEMS AND...

Devices, systems, and methods for increasing endurance on a storage...